JP2006513585A - 検査可能な静電気放電保護回路 - Google Patents

検査可能な静電気放電保護回路 Download PDF

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Publication number
JP2006513585A
JP2006513585A JP2005510021A JP2005510021A JP2006513585A JP 2006513585 A JP2006513585 A JP 2006513585A JP 2005510021 A JP2005510021 A JP 2005510021A JP 2005510021 A JP2005510021 A JP 2005510021A JP 2006513585 A JP2006513585 A JP 2006513585A
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Japan
Prior art keywords
bonding pad
pad
gate
esd protection
protection circuit
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JP2005510021A
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English (en)
Japanese (ja)
Inventor
ウィリアムズ、リチャード
コーネル、マイケル
チャン、ワイ・シェン
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Skyworks Solutions Hong Kong Ltd
Advanced Analogic Technologies Inc
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Advanced Analogic Technologies Hong Kong Ltd
Advanced Analogic Technologies Inc
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Publication of JP2006513585A publication Critical patent/JP2006513585A/ja
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KR101986711B1 (ko) * 2017-12-12 2019-09-30 (주) 트리노테크놀로지 정전기 보호 기능을 구비한 전력 반도체 장치
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JP7197646B1 (ja) 2021-07-28 2022-12-27 聯嘉光電股▲ふん▼有限公司 電気的検出位置を有する垂直型発光ダイオードチップパッケージ
JP2023018845A (ja) * 2021-07-28 2023-02-09 聯嘉光電股▲ふん▼有限公司 電気的検出位置を有する垂直型発光ダイオードチップパッケージ
JP2023018836A (ja) * 2021-07-28 2023-02-09 聯嘉光電股▲ふん▼有限公司 複数のテスト端子及び並列接続部品を有する発光ダイオードパッケージ

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US7432555B2 (en) 2008-10-07
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US20050202577A1 (en) 2005-09-15
WO2004059734A1 (en) 2004-07-15
EP1573811A4 (en) 2010-01-06
US20040119118A1 (en) 2004-06-24
AU2003297407A1 (en) 2004-07-22
US20050194643A1 (en) 2005-09-08
EP1573811A1 (en) 2005-09-14
US7329551B2 (en) 2008-02-12
KR20050085826A (ko) 2005-08-29

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