JP2005527833A5 - - Google Patents

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Publication number
JP2005527833A5
JP2005527833A5 JP2004509399A JP2004509399A JP2005527833A5 JP 2005527833 A5 JP2005527833 A5 JP 2005527833A5 JP 2004509399 A JP2004509399 A JP 2004509399A JP 2004509399 A JP2004509399 A JP 2004509399A JP 2005527833 A5 JP2005527833 A5 JP 2005527833A5
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JP
Japan
Prior art keywords
fluorescence microscope
interest
ray fluorescence
imaging
secondary radiation
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JP2004509399A
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English (en)
Japanese (ja)
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JP2005527833A (ja
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Priority claimed from US10/157,089 external-priority patent/US7245696B2/en
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Publication of JP2005527833A publication Critical patent/JP2005527833A/ja
Publication of JP2005527833A5 publication Critical patent/JP2005527833A5/ja
Pending legal-status Critical Current

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JP2004509399A 2002-05-29 2003-05-29 元素別ｘ線蛍光顕微鏡および動作の方法 Pending JP2005527833A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/157,089 US7245696B2 (en) 2002-05-29 2002-05-29 Element-specific X-ray fluorescence microscope and method of operation
PCT/US2003/016913 WO2003102564A2 (en) 2002-05-29 2003-05-29 Element-specific x-ray fluorescence microscope using multiple imaging systems comprising a zone plate

Publications (2)

Publication Number Publication Date
JP2005527833A JP2005527833A (ja) 2005-09-15
JP2005527833A5 true JP2005527833A5 (enExample) 2006-06-01

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JP2004509399A Pending JP2005527833A (ja) 2002-05-29 2003-05-29 元素別ｘ線蛍光顕微鏡および動作の方法

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US (2) US7245696B2 (enExample)
EP (1) EP1511994A2 (enExample)
JP (1) JP2005527833A (enExample)
KR (1) KR20050010835A (enExample)
CN (1) CN1656373B (enExample)
AU (1) AU2003232417A1 (enExample)
WO (1) WO2003102564A2 (enExample)

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