JP2005518478A5 - - Google Patents
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- Publication number
- JP2005518478A5 JP2005518478A5 JP2003568120A JP2003568120A JP2005518478A5 JP 2005518478 A5 JP2005518478 A5 JP 2005518478A5 JP 2003568120 A JP2003568120 A JP 2003568120A JP 2003568120 A JP2003568120 A JP 2003568120A JP 2005518478 A5 JP2005518478 A5 JP 2005518478A5
- Authority
- JP
- Japan
- Prior art keywords
- patterned
- aperture mask
- deposition
- organic semiconductor
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000151 deposition Methods 0.000 claims 7
- 230000008021 deposition Effects 0.000 claims 6
- 239000000758 substrate Substances 0.000 claims 5
- 239000004065 semiconductor Substances 0.000 claims 4
- 239000013078 crystal Substances 0.000 claims 3
- 238000003776 cleavage reaction Methods 0.000 claims 1
- 238000005137 deposition process Methods 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 230000007017 scission Effects 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/076,003 US20030151118A1 (en) | 2002-02-14 | 2002-02-14 | Aperture masks for circuit fabrication |
| PCT/US2003/001751 WO2003069014A1 (en) | 2002-02-14 | 2003-01-21 | Aperture masks for circuit fabrication |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005518478A JP2005518478A (ja) | 2005-06-23 |
| JP2005518478A5 true JP2005518478A5 (enExample) | 2006-03-09 |
Family
ID=27660170
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003568120A Pending JP2005518478A (ja) | 2002-02-14 | 2003-01-21 | 回路製作用アパーチャマスク |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US20030151118A1 (enExample) |
| EP (2) | EP2060654A1 (enExample) |
| JP (1) | JP2005518478A (enExample) |
| KR (1) | KR20040091037A (enExample) |
| CN (1) | CN1633515B (enExample) |
| AT (1) | ATE431440T1 (enExample) |
| AU (1) | AU2003209312A1 (enExample) |
| DE (1) | DE60327597D1 (enExample) |
| WO (1) | WO2003069014A1 (enExample) |
Families Citing this family (68)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE60126779T2 (de) | 2000-03-24 | 2007-12-13 | Cymbet Corp., Elk River | Herstellung bei niedriger temperatur von dünnschicht- energiespeichervorrichtungen |
| US6897164B2 (en) * | 2002-02-14 | 2005-05-24 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
| US6821348B2 (en) * | 2002-02-14 | 2004-11-23 | 3M Innovative Properties Company | In-line deposition processes for circuit fabrication |
| US6667215B2 (en) | 2002-05-02 | 2003-12-23 | 3M Innovative Properties | Method of making transistors |
| US7088145B2 (en) * | 2002-12-23 | 2006-08-08 | 3M Innovative Properties Company | AC powered logic circuitry |
| US7294209B2 (en) | 2003-01-02 | 2007-11-13 | Cymbet Corporation | Apparatus and method for depositing material onto a substrate using a roll-to-roll mask |
| US7603144B2 (en) | 2003-01-02 | 2009-10-13 | Cymbet Corporation | Active wireless tagging system on peel and stick substrate |
| US6906436B2 (en) | 2003-01-02 | 2005-06-14 | Cymbet Corporation | Solid state activity-activated battery device and method |
| US7279777B2 (en) * | 2003-05-08 | 2007-10-09 | 3M Innovative Properties Company | Organic polymers, laminates, and capacitors |
| US7098525B2 (en) * | 2003-05-08 | 2006-08-29 | 3M Innovative Properties Company | Organic polymers, electronic devices, and methods |
| JP2005042133A (ja) * | 2003-07-22 | 2005-02-17 | Seiko Epson Corp | 蒸着マスク及びその製造方法、表示装置及びその製造方法、表示装置を備えた電子機器 |
| US20070178710A1 (en) * | 2003-08-18 | 2007-08-02 | 3M Innovative Properties Company | Method for sealing thin film transistors |
| US20050079418A1 (en) * | 2003-10-14 | 2005-04-14 | 3M Innovative Properties Company | In-line deposition processes for thin film battery fabrication |
| US7211351B2 (en) | 2003-10-16 | 2007-05-01 | Cymbet Corporation | Lithium/air batteries with LiPON as separator and protective barrier and method |
| US20050130422A1 (en) * | 2003-12-12 | 2005-06-16 | 3M Innovative Properties Company | Method for patterning films |
| US7078937B2 (en) | 2003-12-17 | 2006-07-18 | 3M Innovative Properties Company | Logic circuitry powered by partially rectified ac waveform |
| US6882897B1 (en) * | 2004-01-05 | 2005-04-19 | Dennis S. Fernandez | Reconfigurable garment definition and production method |
| CN1957487A (zh) | 2004-01-06 | 2007-05-02 | Cymbet公司 | 具有一个或者更多个可限定层的层式阻挡物结构和方法 |
| CN100431169C (zh) * | 2004-01-15 | 2008-11-05 | 松下电器产业株式会社 | 场效应晶体管及使用该晶体管的显示器件 |
| CN102097458B (zh) | 2004-06-04 | 2013-10-30 | 伊利诺伊大学评议会 | 用于制造并组装可印刷半导体元件的方法和设备 |
| TWI270741B (en) * | 2004-07-28 | 2007-01-11 | Remarkable Ltd | Mask for decreasing the fabrication cost and method for design the same |
| US7399668B2 (en) * | 2004-09-30 | 2008-07-15 | 3M Innovative Properties Company | Method for making electronic devices having a dielectric layer surface treatment |
| US20060128165A1 (en) * | 2004-12-13 | 2006-06-15 | 3M Innovative Properties Company | Method for patterning surface modification |
| US7679686B2 (en) * | 2004-12-30 | 2010-03-16 | E. I. Du Pont De Nemours And Company | Electronic device comprising a gamma correction unit, a process for using the electronic device, and a data processing system readable medium |
| US7211679B2 (en) * | 2005-03-09 | 2007-05-01 | 3M Innovative Properties Company | Perfluoroether acyl oligothiophene compounds |
| US7151276B2 (en) * | 2005-03-09 | 2006-12-19 | 3M Innovative Properties Company | Semiconductors containing perfluoroether acyl oligothiophene compounds |
| US7667929B2 (en) * | 2005-04-04 | 2010-02-23 | Hitachi Global Storage Technologies Netherlands B.V. | Apparatus, method and system for fabricating a patterned media imprint master |
| JP5159053B2 (ja) * | 2005-06-30 | 2013-03-06 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| US7776478B2 (en) | 2005-07-15 | 2010-08-17 | Cymbet Corporation | Thin-film batteries with polymer and LiPON electrolyte layers and method |
| WO2007011900A1 (en) | 2005-07-15 | 2007-01-25 | Cymbet Corporation | Thin-film batteries with soft and hard electrolyte layers and method |
| US7319153B2 (en) * | 2005-07-29 | 2008-01-15 | 3M Innovative Properties Company | 6,13-Bis(thienyl)pentacene compounds |
| US7615501B2 (en) * | 2005-08-11 | 2009-11-10 | 3M Innovative Properties Company | Method for making a thin film layer |
| US20070137568A1 (en) * | 2005-12-16 | 2007-06-21 | Schreiber Brian E | Reciprocating aperture mask system and method |
| US7763114B2 (en) * | 2005-12-28 | 2010-07-27 | 3M Innovative Properties Company | Rotatable aperture mask assembly and deposition system |
| KR100687761B1 (ko) * | 2006-03-06 | 2007-02-27 | 한국전자통신연구원 | 대량생산을 위한 분자 전자 소자 제조용 소자 홀더 및 이를이용한 분자 전자 소자의 제조 방법 |
| US7667230B2 (en) * | 2006-03-31 | 2010-02-23 | 3M Innovative Properties Company | Electronic devices containing acene-thiophene copolymers |
| US7608679B2 (en) * | 2006-03-31 | 2009-10-27 | 3M Innovative Properties Company | Acene-thiophene copolymers |
| US7666968B2 (en) * | 2006-04-21 | 2010-02-23 | 3M Innovative Properties Company | Acene-thiophene copolymers with silethynly groups |
| US7495251B2 (en) * | 2006-04-21 | 2009-02-24 | 3M Innovative Properties Company | Electronic devices containing acene-thiophene copolymers with silylethynyl groups |
| TWI325744B (en) * | 2006-08-28 | 2010-06-01 | Ind Tech Res Inst | Electronic devices integrated on a single substrate and method for fabricating the same |
| US20080121877A1 (en) * | 2006-11-27 | 2008-05-29 | 3M Innovative Properties Company | Thin film transistor with enhanced stability |
| US7655127B2 (en) * | 2006-11-27 | 2010-02-02 | 3M Innovative Properties Company | Method of fabricating thin film transistor |
| US7879688B2 (en) * | 2007-06-29 | 2011-02-01 | 3M Innovative Properties Company | Methods for making electronic devices with a solution deposited gate dielectric |
| US20090001356A1 (en) * | 2007-06-29 | 2009-01-01 | 3M Innovative Properties Company | Electronic devices having a solution deposited gate dielectric |
| KR101167546B1 (ko) * | 2007-09-10 | 2012-07-20 | 가부시키가이샤 알박 | 증착 장치 |
| WO2009079004A1 (en) | 2007-12-18 | 2009-06-25 | Lumimove, Inc., Dba Crosslink | Flexible electroluminescent devices and systems |
| US20090321775A1 (en) * | 2008-06-26 | 2009-12-31 | Ghulam Hasnain | LED with Reduced Electrode Area |
| EP2338131A1 (en) * | 2008-09-15 | 2011-06-29 | Nxp B.V. | Method of manufacturing a plurality of ics and transponders |
| JP5724342B2 (ja) * | 2009-12-10 | 2015-05-27 | 大日本印刷株式会社 | パターン配置方法並びにシリコンウェハ及び半導体デバイスの製造方法 |
| KR101693578B1 (ko) * | 2011-03-24 | 2017-01-10 | 삼성디스플레이 주식회사 | 증착 마스크 |
| WO2012158709A1 (en) | 2011-05-16 | 2012-11-22 | The Board Of Trustees Of The University Of Illinois | Thermally managed led arrays assembled by printing |
| US11527774B2 (en) | 2011-06-29 | 2022-12-13 | Space Charge, LLC | Electrochemical energy storage devices |
| US11996517B2 (en) | 2011-06-29 | 2024-05-28 | Space Charge, LLC | Electrochemical energy storage devices |
| US10601074B2 (en) | 2011-06-29 | 2020-03-24 | Space Charge, LLC | Rugged, gel-free, lithium-free, high energy density solid-state electrochemical energy storage devices |
| US9853325B2 (en) | 2011-06-29 | 2017-12-26 | Space Charge, LLC | Rugged, gel-free, lithium-free, high energy density solid-state electrochemical energy storage devices |
| CN103225059A (zh) * | 2012-01-30 | 2013-07-31 | 群康科技(深圳)有限公司 | 阴影掩膜及其补偿设计方法 |
| TWI480398B (zh) * | 2012-01-30 | 2015-04-11 | Innocom Tech Shenzhen Co Ltd | 陰影罩幕及其補償設計方法 |
| US20140069331A1 (en) * | 2012-09-12 | 2014-03-13 | Shenzen China Star Optoelectronics Technology Co., Ltd. | Mask and manufacturing method thereof |
| CN104347789B (zh) * | 2013-08-05 | 2017-08-25 | 国家纳米科学中心 | 垂直型薄膜热电器件的热电臂阵列的制作方法和制作装置 |
| JP6529329B2 (ja) * | 2015-05-01 | 2019-06-12 | 株式会社ブイ・テクノロジー | タッチパネル製造方法、タッチパネルのガラス基板及びタッチパネル製造用マスク |
| CN108026291B (zh) | 2015-09-28 | 2021-04-13 | 3M创新有限公司 | 包含可裂解交联剂的图案化膜制品和方法 |
| CN105353589B (zh) * | 2015-12-01 | 2018-02-23 | 广州杰赛科技股份有限公司 | 一种高效pcb二次曝光方法 |
| CN106435473A (zh) * | 2016-11-11 | 2017-02-22 | 京东方科技集团股份有限公司 | 掩模板及其制作方法、有机发光二极管显示器的制作方法 |
| WO2019173626A1 (en) | 2018-03-07 | 2019-09-12 | Space Charge, LLC | Thin-film solid-state energy-storage devices |
| CN109860062A (zh) * | 2018-11-29 | 2019-06-07 | 华映科技(集团)股份有限公司 | 一种金属氧化物晶体管制作源极漏极的方法 |
| CN110993562B (zh) * | 2019-11-07 | 2023-09-29 | 复旦大学 | 一种基于全硅基掩膜版的薄膜器件的制备方法 |
| JP7749925B2 (ja) * | 2020-03-13 | 2025-10-07 | 大日本印刷株式会社 | 有機デバイスの製造装置の蒸着室の評価方法 |
| JP2022175925A (ja) * | 2021-05-14 | 2022-11-25 | キヤノン株式会社 | 蒸着マスク、及び、有機電子デバイスの製造方法 |
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| US111035A (en) * | 1871-01-17 | Improvement in feed-cutters | ||
| US23090A (en) * | 1859-03-01 | Improvement in harvesters | ||
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| JP3999837B2 (ja) * | 1997-02-10 | 2007-10-31 | Tdk株式会社 | 有機エレクトロルミネッセンス表示装置 |
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| US20020110733A1 (en) * | 2000-08-07 | 2002-08-15 | Johnson Lonnie G. | Systems and methods for producing multilayer thin film energy storage devices |
| KR100382491B1 (ko) * | 2000-11-28 | 2003-05-09 | 엘지전자 주식회사 | 유기 el의 새도우 마스크 |
| JP4092914B2 (ja) * | 2001-01-26 | 2008-05-28 | セイコーエプソン株式会社 | マスクの製造方法、有機エレクトロルミネッセンス装置の製造方法 |
| US6455931B1 (en) * | 2001-05-15 | 2002-09-24 | Raytheon Company | Monolithic microelectronic array structure having substrate islands and its fabrication |
| US6884734B2 (en) * | 2001-11-20 | 2005-04-26 | International Business Machines Corporation | Vapor phase etch trim structure with top etch blocking layer |
| US6897164B2 (en) * | 2002-02-14 | 2005-05-24 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
| US6667215B2 (en) * | 2002-05-02 | 2003-12-23 | 3M Innovative Properties | Method of making transistors |
| US20040087009A1 (en) * | 2002-10-31 | 2004-05-06 | Schembri Carol T. | Array substrates having protective layer |
| US7294209B2 (en) * | 2003-01-02 | 2007-11-13 | Cymbet Corporation | Apparatus and method for depositing material onto a substrate using a roll-to-roll mask |
| JP4280509B2 (ja) * | 2003-01-31 | 2009-06-17 | キヤノン株式会社 | 投影露光用マスク、投影露光用マスクの製造方法、投影露光装置および投影露光方法 |
| US7153180B2 (en) * | 2003-11-13 | 2006-12-26 | Eastman Kodak Company | Continuous manufacture of flat panel light emitting devices |
-
2002
- 2002-02-14 US US10/076,003 patent/US20030151118A1/en not_active Abandoned
-
2003
- 2003-01-21 EP EP08021822A patent/EP2060654A1/en not_active Withdrawn
- 2003-01-21 WO PCT/US2003/001751 patent/WO2003069014A1/en not_active Ceased
- 2003-01-21 AU AU2003209312A patent/AU2003209312A1/en not_active Abandoned
- 2003-01-21 EP EP03707466A patent/EP1474542B1/en not_active Expired - Lifetime
- 2003-01-21 KR KR10-2004-7012543A patent/KR20040091037A/ko not_active Withdrawn
- 2003-01-21 JP JP2003568120A patent/JP2005518478A/ja active Pending
- 2003-01-21 CN CN038040069A patent/CN1633515B/zh not_active Expired - Fee Related
- 2003-01-21 AT AT03707466T patent/ATE431440T1/de not_active IP Right Cessation
- 2003-01-21 DE DE60327597T patent/DE60327597D1/de not_active Expired - Lifetime
-
2005
- 2005-10-25 US US11/258,330 patent/US20060057857A1/en not_active Abandoned
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