JP2005285160A5 - - Google Patents

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Publication number
JP2005285160A5
JP2005285160A5 JP2004093310A JP2004093310A JP2005285160A5 JP 2005285160 A5 JP2005285160 A5 JP 2005285160A5 JP 2004093310 A JP2004093310 A JP 2004093310A JP 2004093310 A JP2004093310 A JP 2004093310A JP 2005285160 A5 JP2005285160 A5 JP 2005285160A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004093310A
Other versions
JP4351941B2 (ja
JP2005285160A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2004093310A external-priority patent/JP4351941B2/ja
Priority to JP2004093310A priority Critical patent/JP4351941B2/ja
Priority to PCT/JP2005/004370 priority patent/WO2005093443A1/ja
Priority to CN2005800091989A priority patent/CN1934455B/zh
Priority to AT05720641T priority patent/ATE483169T1/de
Priority to DE602005023850T priority patent/DE602005023850D1/de
Priority to EP05720641A priority patent/EP1742074B1/en
Priority to EP10075008A priority patent/EP2233936A1/en
Priority to KR1020067022252A priority patent/KR20070027539A/ko
Priority to US11/083,114 priority patent/US7549099B2/en
Priority to TW094108755A priority patent/TWI353454B/zh
Publication of JP2005285160A publication Critical patent/JP2005285160A/ja
Publication of JP2005285160A5 publication Critical patent/JP2005285160A5/ja
Publication of JP4351941B2 publication Critical patent/JP4351941B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004093310A 2004-03-26 2004-03-26 試験装置及び試験方法 Expired - Fee Related JP4351941B2 (ja)

Priority Applications (10)

Application Number Priority Date Filing Date Title
JP2004093310A JP4351941B2 (ja) 2004-03-26 2004-03-26 試験装置及び試験方法
EP10075008A EP2233936A1 (en) 2004-03-26 2005-03-11 Test device and test method
CN2005800091989A CN1934455B (zh) 2004-03-26 2005-03-11 测试装置与测试方法
AT05720641T ATE483169T1 (de) 2004-03-26 2005-03-11 Testeinrichtung und testverfahren
DE602005023850T DE602005023850D1 (de) 2004-03-26 2005-03-11 Testeinrichtung und testverfahren
EP05720641A EP1742074B1 (en) 2004-03-26 2005-03-11 Test device and test method
PCT/JP2005/004370 WO2005093443A1 (ja) 2004-03-26 2005-03-11 試験装置及び試験方法
KR1020067022252A KR20070027539A (ko) 2004-03-26 2005-03-11 시험 장치 및 시험 방법
US11/083,114 US7549099B2 (en) 2004-03-26 2005-03-17 Testing apparatus and testing method
TW094108755A TWI353454B (en) 2004-03-26 2005-03-22 Testing device and testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004093310A JP4351941B2 (ja) 2004-03-26 2004-03-26 試験装置及び試験方法

Publications (3)

Publication Number Publication Date
JP2005285160A JP2005285160A (ja) 2005-10-13
JP2005285160A5 true JP2005285160A5 (ja) 2007-07-05
JP4351941B2 JP4351941B2 (ja) 2009-10-28

Family

ID=35056313

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004093310A Expired - Fee Related JP4351941B2 (ja) 2004-03-26 2004-03-26 試験装置及び試験方法

Country Status (9)

Country Link
US (1) US7549099B2 (ja)
EP (2) EP1742074B1 (ja)
JP (1) JP4351941B2 (ja)
KR (1) KR20070027539A (ja)
CN (1) CN1934455B (ja)
AT (1) ATE483169T1 (ja)
DE (1) DE602005023850D1 (ja)
TW (1) TWI353454B (ja)
WO (1) WO2005093443A1 (ja)

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JP4724774B2 (ja) * 2007-03-29 2011-07-13 富士通株式会社 半導体回路装置、メモリテスト回路及び半導体回路装置の試験方法
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JP5124019B2 (ja) * 2008-06-09 2013-01-23 株式会社アドバンテスト 試験装置
CN102057288B (zh) * 2008-06-10 2014-02-12 爱德万测试株式会社 测试模块、测试装置及测试方法
KR100942953B1 (ko) 2008-06-30 2010-02-17 주식회사 하이닉스반도체 데이터 전달 회로 및 그를 포함하는 반도체 메모리 장치
JP5208211B2 (ja) * 2008-07-09 2013-06-12 株式会社アドバンテスト 試験装置、及び試験方法
CN102317803A (zh) * 2008-07-09 2012-01-11 爱德万测试株式会社 测试装置、测试方法和移相器
CN102099700A (zh) 2008-08-01 2011-06-15 株式会社爱德万测试 测试装置
CN102124357A (zh) * 2008-08-19 2011-07-13 爱德万测试株式会社 测试装置及测试方法
KR101214035B1 (ko) * 2008-09-04 2012-12-20 가부시키가이샤 어드밴티스트 시험 장치, 송신 장치, 수신 장치, 시험 방법, 송신 방법, 및 수신 방법
US8819474B2 (en) * 2009-04-03 2014-08-26 Intel Corporation Active training of memory command timing
JP5202738B2 (ja) * 2010-07-12 2013-06-05 株式会社アドバンテスト 測定回路および試験装置
CN102854451A (zh) * 2011-06-29 2013-01-02 鸿富锦精密工业（深圳）有限公司 印刷电路板的信号群延迟分析系统及方法
CN103116124B (zh) * 2011-11-17 2016-05-18 国民技术股份有限公司 可自校准内部晶振的芯片、晶振校准测试系统及校准方法
CN103280241B (zh) * 2013-04-22 2018-05-01 北京大学深圳研究生院 存储器的测试电路及方法
CN103235254B (zh) * 2013-04-25 2016-03-02 杭州和利时自动化有限公司 一种可编程逻辑器件的检测方法和检测系统
CN105807134A (zh) * 2014-12-31 2016-07-27 无锡华润矽科微电子有限公司 频率测试仪及频率测试系统
CN104836576B (zh) * 2015-04-30 2018-11-02 华南理工大学 一种改进高频畸变波形相位检测的锁相环
CN107703437B (zh) * 2017-09-14 2019-08-13 西安交通大学 一种基于半频静电激振的高频体模态谐振器测试方法
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CN108614206B (zh) * 2018-04-03 2020-08-04 上海华力微电子有限公司 一种芯片测试装置、测试方法及测试板
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CN112965910B (zh) * 2021-03-19 2024-06-21 携程旅游信息技术（上海）有限公司 自动化回归测试方法、装置、电子设备、存储介质
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