WO2009031404A1 - 伝送回路、送信器、受信器、および、試験装置 - Google Patents

伝送回路、送信器、受信器、および、試験装置 Download PDF

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Publication number
WO2009031404A1
WO2009031404A1 PCT/JP2008/064758 JP2008064758W WO2009031404A1 WO 2009031404 A1 WO2009031404 A1 WO 2009031404A1 JP 2008064758 W JP2008064758 W JP 2008064758W WO 2009031404 A1 WO2009031404 A1 WO 2009031404A1
Authority
WO
WIPO (PCT)
Prior art keywords
unit
transport signal
transmission circuit
receiver unit
transmitter unit
Prior art date
Application number
PCT/JP2008/064758
Other languages
English (en)
French (fr)
Inventor
Daisuke Watanabe
Toshiyuki Okayasu
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009531178A priority Critical patent/JPWO2009031404A1/ja
Publication of WO2009031404A1 publication Critical patent/WO2009031404A1/ja
Priority to US12/700,703 priority patent/US8278962B2/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/4508—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using bipolar transistors as the active amplifying circuit
    • H03F3/45085—Long tailed pairs
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/24—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages
    • H03F3/245—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages with semiconductor devices only
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • H03F3/45636—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by using feedback means
    • H03F3/45641—Measuring at the loading circuit of the differential amplifier
    • H03F3/45659—Controlling the loading circuit of the differential amplifier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/423—Amplifier output adaptation especially for transmission line coupling purposes, e.g. impedance adaptation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/543—A transmission line being used as coupling element between two amplifying stages
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45521—Indexing scheme relating to differential amplifiers the FBC comprising op amp stages, e.g. cascaded stages of the dif amp and being coupled between the LC and the IC

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
  • Logic Circuits (AREA)
  • Amplifiers (AREA)
  • Transmitters (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)

Abstract

　送信信号を出力する送信器と、送信信号を受け取る受信器とを備える伝送回路であって、受信器は、送信器が出力する送信信号のコモンレベルを制御するフィードバック信号を送信器に対して供給し、送信器は、出力する送信信号のコモンレベルを、受信器から受け取ったフィードバック信号に応じて制御する伝送回路を提供する。受信器は、送信信号に応じて動作する受信部と、受信部に入力される送信信号がコモンレベルとして有するべき基準レベルを生成する基準レベル生成部と、受信部に入力される送信信号のコモンレベルと、基準レベルとを比較し、比較結果に応じたフィードバック信号を生成する比較部とを有する。
PCT/JP2008/064758 2007-09-04 2008-08-19 伝送回路、送信器、受信器、および、試験装置 WO2009031404A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009531178A JPWO2009031404A1 (ja) 2007-09-04 2008-08-19 伝送回路、送信器、受信器、および、試験装置
US12/700,703 US8278962B2 (en) 2007-09-04 2010-02-04 Transfer circuit, transmitter, receiver and test apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007229462 2007-09-04
JP2007-229462 2007-09-04

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/700,703 Continuation US8278962B2 (en) 2007-09-04 2010-02-04 Transfer circuit, transmitter, receiver and test apparatus

Publications (1)

Publication Number Publication Date
WO2009031404A1 true WO2009031404A1 (ja) 2009-03-12

Family

ID=40428724

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/064758 WO2009031404A1 (ja) 2007-09-04 2008-08-19 伝送回路、送信器、受信器、および、試験装置

Country Status (4)

Country Link
US (1) US8278962B2 (ja)
JP (1) JPWO2009031404A1 (ja)
TW (1) TWI378248B (ja)
WO (1) WO2009031404A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014500652A (ja) * 2010-11-08 2014-01-09 フジツウ テクノロジー ソリューションズ インタレクチュアル プロパティ ゲーエムベーハー ２つの電子装置間の信号伝送のマッチング方法及びコンピュータシステムと周辺装置を有する装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120189044A1 (en) * 2011-01-24 2012-07-26 David Soriano Fosas Switching Transistor States to Communicate Faulty Wire in Cable
EP3226624A1 (en) * 2016-03-31 2017-10-04 Intel IP Corporation Transceiver, transmitter, receiver and method for determining a minimum supply voltage for receivers and transmitters
JP6695574B2 (ja) * 2016-07-29 2020-05-20 ザインエレクトロニクス株式会社 送信装置および送受信システム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004172980A (ja) * 2002-11-20 2004-06-17 Fujitsu Ltd バッファ回路装置
JP2005311411A (ja) * 2004-04-16 2005-11-04 Matsushita Electric Ind Co Ltd 線路状態検出装置、並びに平衡伝送システムの送信装置及び受信装置
JP2007040849A (ja) * 2005-08-03 2007-02-15 Advantest Corp 測定装置、及び試験装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5144225A (en) * 1989-03-31 1992-09-01 Schlumberger Technologies, Inc. Methods and apparatus for acquiring data from intermittently failing circuits
JPH10322143A (ja) 1997-05-21 1998-12-04 Toshiba Corp Ａｃ結合回路
US6789224B2 (en) * 2000-01-18 2004-09-07 Advantest Corporation Method and apparatus for testing semiconductor devices
US6812691B2 (en) * 2002-07-12 2004-11-02 Formfactor, Inc. Compensation for test signal degradation due to DUT fault
JP2004328614A (ja) * 2003-04-28 2004-11-18 Alps Electric Co Ltd 不平衡信号補正方法
JP2005098981A (ja) * 2003-08-27 2005-04-14 Nec Corp 半導体集積回路装置、測定結果管理システム、及び管理サーバ
JP4351941B2 (ja) 2004-03-26 2009-10-28 株式会社アドバンテスト 試験装置及び試験方法
US8139759B2 (en) * 2004-04-16 2012-03-20 Panasonic Corporation Line state detecting apparatus and transmitting apparatus and receiving apparatus of balanced transmission system
US7652494B2 (en) * 2005-07-01 2010-01-26 Apple Inc. Operating an integrated circuit at a minimum supply voltage
US7398169B2 (en) * 2006-02-27 2008-07-08 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
WO2008056609A1 (fr) * 2006-11-10 2008-05-15 Nec Corporation Circuit de test en parallèle et procédé et dispositif semi-conducteur
WO2009150695A1 (ja) * 2008-06-09 2009-12-17 株式会社アドバンテスト 試験装置
US8067943B2 (en) * 2009-03-24 2011-11-29 Advantest Corporation Test apparatus, calibration method, program, and recording medium

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004172980A (ja) * 2002-11-20 2004-06-17 Fujitsu Ltd バッファ回路装置
JP2005311411A (ja) * 2004-04-16 2005-11-04 Matsushita Electric Ind Co Ltd 線路状態検出装置、並びに平衡伝送システムの送信装置及び受信装置
JP2007040849A (ja) * 2005-08-03 2007-02-15 Advantest Corp 測定装置、及び試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014500652A (ja) * 2010-11-08 2014-01-09 フジツウ テクノロジー ソリューションズ インタレクチュアル プロパティ ゲーエムベーハー ２つの電子装置間の信号伝送のマッチング方法及びコンピュータシステムと周辺装置を有する装置

Also Published As

Publication number Publication date
TW200916807A (en) 2009-04-16
US20100208780A1 (en) 2010-08-19
TWI378248B (en) 2012-12-01
JPWO2009031404A1 (ja) 2010-12-09
US8278962B2 (en) 2012-10-02

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