JP2004310024A5 - - Google Patents
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- Publication number
- JP2004310024A5 JP2004310024A5 JP2003388306A JP2003388306A JP2004310024A5 JP 2004310024 A5 JP2004310024 A5 JP 2004310024A5 JP 2003388306 A JP2003388306 A JP 2003388306A JP 2003388306 A JP2003388306 A JP 2003388306A JP 2004310024 A5 JP2004310024 A5 JP 2004310024A5
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- line
- crystal display
- inspection
- lines
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004973 liquid crystal related substance Substances 0.000 claims description 99
- 238000007689 inspection Methods 0.000 claims description 92
- 238000012360 testing method Methods 0.000 claims description 59
- 238000000034 method Methods 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 9
- 230000005540 biological transmission Effects 0.000 claims description 4
- 239000010410 layer Substances 0.000 description 21
- 239000010409 thin film Substances 0.000 description 15
- 239000010408 film Substances 0.000 description 14
- 238000011179 visual inspection Methods 0.000 description 13
- 239000003990 capacitor Substances 0.000 description 10
- 238000003860 storage Methods 0.000 description 8
- 230000001681 protective effect Effects 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 239000011651 chromium Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 4
- 230000010287 polarization Effects 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- 229910000838 Al alloy Inorganic materials 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 229910001080 W alloy Inorganic materials 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- MGRWKWACZDFZJT-UHFFFAOYSA-N molybdenum tungsten Chemical compound [Mo].[W] MGRWKWACZDFZJT-UHFFFAOYSA-N 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 238000009966 trimming Methods 0.000 description 2
- 229910000599 Cr alloy Inorganic materials 0.000 description 1
- 229910001182 Mo alloy Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020020071920A KR100895311B1 (ko) | 2002-11-19 | 2002-11-19 | 액정 표시 장치 및 그 검사 방법 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004310024A JP2004310024A (ja) | 2004-11-04 |
| JP2004310024A5 true JP2004310024A5 (enExample) | 2006-11-09 |
| JP4657598B2 JP4657598B2 (ja) | 2011-03-23 |
Family
ID=32291782
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003388306A Expired - Lifetime JP4657598B2 (ja) | 2002-11-19 | 2003-11-18 | 液晶表示装置及びその検査方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7580107B2 (enExample) |
| JP (1) | JP4657598B2 (enExample) |
| KR (1) | KR100895311B1 (enExample) |
| CN (1) | CN100474083C (enExample) |
| TW (1) | TW200411302A (enExample) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100951357B1 (ko) * | 2003-08-19 | 2010-04-08 | 삼성전자주식회사 | 액정 표시 장치 |
| KR20050053883A (ko) * | 2003-12-03 | 2005-06-10 | 삼성전자주식회사 | 표시 장치용 박막 트랜지스터 표시판 |
| US8013816B2 (en) * | 2004-06-30 | 2011-09-06 | Samsung Mobile Display Co., Ltd. | Light emitting display |
| TWI382264B (zh) | 2004-07-27 | 2013-01-11 | Samsung Display Co Ltd | 薄膜電晶體陣列面板及包括此面板之顯示器裝置 |
| KR101100883B1 (ko) * | 2004-11-08 | 2012-01-02 | 삼성전자주식회사 | 박막 트랜지스터 표시판 |
| KR101096722B1 (ko) * | 2004-11-10 | 2011-12-22 | 엘지디스플레이 주식회사 | 액정표시패널 및 그 제조방법 |
| CN100346221C (zh) * | 2004-11-12 | 2007-10-31 | 友达光电股份有限公司 | 液晶显示面板及其测试方法 |
| KR20060072318A (ko) * | 2004-12-23 | 2006-06-28 | 엘지.필립스 엘시디 주식회사 | 액정 표시 패널 및 그 제조방법 |
| CN100489605C (zh) * | 2004-12-29 | 2009-05-20 | 友达光电股份有限公司 | 显示面板的识别芯片及其制造方法 |
| KR100663029B1 (ko) * | 2004-12-31 | 2006-12-28 | 엘지.필립스 엘시디 주식회사 | 액정표시장치 , 그 제조방법 및 액정표시장치 검사방법 |
| KR101093229B1 (ko) * | 2005-01-06 | 2011-12-13 | 삼성전자주식회사 | 어레이 기판 및 이를 갖는 표시장치 |
| KR101219037B1 (ko) * | 2005-07-01 | 2013-01-09 | 삼성디스플레이 주식회사 | 박막 표시판 및 그 제조 방법 |
| CN100468130C (zh) * | 2005-09-09 | 2009-03-11 | 鸿富锦精密工业（深圳）有限公司 | 液晶显示器分区定位测试方法 |
| TWI322318B (en) | 2005-12-12 | 2010-03-21 | Au Optronics Corp | Active matrix substrate |
| CN100399175C (zh) * | 2005-12-29 | 2008-07-02 | 友达光电股份有限公司 | 主动组件阵列基板 |
| TWI301201B (en) * | 2006-03-15 | 2008-09-21 | Au Optronics Corp | Display circuits |
| CN100414574C (zh) * | 2006-03-23 | 2008-08-27 | 友达光电股份有限公司 | 显示器电路 |
| CN100422828C (zh) * | 2006-08-29 | 2008-10-01 | 友达光电股份有限公司 | 测试液晶显示器的方法 |
| TWI408633B (zh) * | 2007-02-14 | 2013-09-11 | Innolux Corp | 具有修復電路佈局之顯示裝置 |
| JP5138999B2 (ja) * | 2007-08-01 | 2013-02-06 | 三菱電機株式会社 | 表示装置 |
| US8125606B2 (en) * | 2007-08-31 | 2012-02-28 | Nlt Technologies, Ltd. | Display device with branched terminal electrode |
| TWI365317B (en) * | 2008-03-20 | 2012-06-01 | Chunghwa Picture Tubes Ltd | Active device array substrate |
| JP5339273B2 (ja) * | 2008-07-11 | 2013-11-13 | 株式会社ジャパンディスプレイ | 表示装置 |
| US8502227B2 (en) * | 2008-07-23 | 2013-08-06 | Sharp Kabushiki Kaisha | Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device |
| TWI392911B (zh) * | 2009-03-13 | 2013-04-11 | Au Optronics Corp | 顯示面板及其線路檢查方法 |
| CN101577078B (zh) * | 2009-06-22 | 2011-04-27 | 福建捷联电子有限公司 | 液晶显示器的全自动调整测试系统 |
| KR200458155Y1 (ko) * | 2009-11-03 | 2012-01-20 | 윤종철 | 전선거치대 |
| US9741277B2 (en) | 2012-07-02 | 2017-08-22 | E Ink Holdings Inc. | Test structure of display panel and test structure of tested display panel |
| TWI467269B (zh) | 2012-07-02 | 2015-01-01 | E Ink Holdings Inc | 顯示面板的測試結構及其測試方法與測試後的測試結構 |
| JP6051011B2 (ja) | 2012-10-22 | 2016-12-21 | 株式会社ジャパンディスプレイ | 液晶表示装置およびその製造方法 |
| CN104238152A (zh) * | 2013-06-17 | 2014-12-24 | 北京京东方光电科技有限公司 | 一种cog测试方法 |
| KR102058611B1 (ko) * | 2013-07-05 | 2019-12-24 | 삼성디스플레이 주식회사 | 검사 장치와, 이를 이용한 배선 및 원장 검사 방법 |
| KR102090159B1 (ko) | 2013-11-22 | 2020-03-18 | 삼성디스플레이 주식회사 | 표시 패널 및 이의 제조 방법 |
| CN104035217B (zh) * | 2014-05-21 | 2016-08-24 | 深圳市华星光电技术有限公司 | 显示器阵列基板的外围测试线路以及液晶显示面板 |
| JP6463065B2 (ja) * | 2014-10-09 | 2019-01-30 | 三菱電機株式会社 | アレイ基板およびこれを備える液晶表示パネルならびにアレイ基板の検査方法 |
| KR102296073B1 (ko) * | 2015-01-06 | 2021-08-31 | 삼성디스플레이 주식회사 | 액정 표시 장치 |
| KR102356028B1 (ko) * | 2015-02-06 | 2022-01-26 | 삼성디스플레이 주식회사 | 표시 장치 |
| KR102392889B1 (ko) * | 2015-08-07 | 2022-05-03 | 엘지디스플레이 주식회사 | 표시장치 |
| KR102645333B1 (ko) * | 2016-08-23 | 2024-03-12 | 삼성디스플레이 주식회사 | 표시장치 |
| CN106653771B (zh) * | 2016-12-30 | 2019-06-18 | 惠科股份有限公司 | 一种显示面板及制程 |
| CN108573997B (zh) | 2017-03-14 | 2023-12-01 | 三星显示有限公司 | 显示装置 |
| CN107154232A (zh) * | 2017-05-27 | 2017-09-12 | 厦门天马微电子有限公司 | 阵列基板、显示面板和显示面板的测试方法 |
| CN107945721B (zh) * | 2017-11-29 | 2021-09-28 | 武汉天马微电子有限公司 | 一种显示面板及其点屏测试方法、显示装置 |
| KR102503732B1 (ko) | 2017-11-30 | 2023-02-27 | 삼성디스플레이 주식회사 | 표시 장치 |
| KR102607389B1 (ko) * | 2018-03-12 | 2023-11-28 | 삼성디스플레이 주식회사 | 표시 장치 및 이의 신호 라인 검사 방법 |
| KR102499175B1 (ko) * | 2018-04-06 | 2023-02-13 | 티씨엘 차이나 스타 옵토일렉트로닉스 테크놀로지 컴퍼니 리미티드 | 표시장치 |
| TWI678689B (zh) * | 2018-10-12 | 2019-12-01 | 友達光電股份有限公司 | 顯示裝置及其修補方法 |
| KR102772270B1 (ko) | 2018-11-15 | 2025-02-24 | 삼성디스플레이 주식회사 | 표시 장치 |
| TWI718772B (zh) | 2019-11-20 | 2021-02-11 | 元太科技工業股份有限公司 | 顯示裝置 |
| KR102744149B1 (ko) * | 2020-05-04 | 2024-12-20 | 삼성디스플레이 주식회사 | 게이트 검사부 및 이를 포함하는 표시 장치 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4840459A (en) | 1987-11-03 | 1989-06-20 | General Electric Co. | Matrix addressed flat panel liquid crystal display device with dual ended auxiliary repair lines for address line repair |
| JPH04233514A (ja) | 1990-12-28 | 1992-08-21 | Sharp Corp | アクティブマトリクス基板 |
| JP2758103B2 (ja) * | 1992-04-08 | 1998-05-28 | シャープ株式会社 | アクティブマトリクス基板及びその製造方法 |
| JPH07146481A (ja) | 1993-11-25 | 1995-06-06 | Hitachi Ltd | 液晶表示基板 |
| JP3213472B2 (ja) * | 1994-04-26 | 2001-10-02 | シャープ株式会社 | アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置 |
| JP3557475B2 (ja) * | 1994-09-22 | 2004-08-25 | カシオ計算機株式会社 | ドライバ回路を備えた液晶表示装置 |
| JPH08201841A (ja) | 1994-11-24 | 1996-08-09 | Toshiba Electron Eng Corp | 表示装置及びその検査方法 |
| TW331599B (en) * | 1995-09-26 | 1998-05-11 | Toshiba Co Ltd | Array substrate for LCD and method of making same |
| KR100281058B1 (ko) * | 1997-11-05 | 2001-02-01 | 구본준, 론 위라하디락사 | 액정표시장치 |
| US6214879B1 (en) | 1998-03-24 | 2001-04-10 | Virginia Commonwealth University | Allosteric inhibitors of pyruvate kinase |
| JP3667548B2 (ja) * | 1998-03-27 | 2005-07-06 | シャープ株式会社 | アクティブマトリクス型液晶表示パネル及びその検査方法 |
| JPH11352505A (ja) | 1998-06-12 | 1999-12-24 | Matsushita Electric Ind Co Ltd | 液晶表示装置 |
| KR100278612B1 (ko) * | 1998-07-07 | 2001-01-15 | 윤종용 | 엘씨디 패널 |
| KR100293982B1 (ko) * | 1998-08-03 | 2001-07-12 | 윤종용 | 액정패널 |
| JP3025257B1 (ja) * | 1999-02-25 | 2000-03-27 | 松下電器産業株式会社 | 表示パネル |
| JP2000321591A (ja) * | 1999-05-14 | 2000-11-24 | Nec Corp | 液晶表示装置 |
| JP2001005027A (ja) * | 1999-06-24 | 2001-01-12 | Matsushita Electric Ind Co Ltd | 液晶表示装置およびそれを用いた液晶表示応用機器 |
| JP4106193B2 (ja) | 2000-03-06 | 2008-06-25 | 株式会社 日立ディスプレイズ | 液晶表示装置及びその製造方法 |
| TW527513B (en) * | 2000-03-06 | 2003-04-11 | Hitachi Ltd | Liquid crystal display device and manufacturing method thereof |
| JP2001264788A (ja) | 2000-03-14 | 2001-09-26 | Sharp Corp | 配線電極の接続方法、液晶表示装置用基板の製造方法と液晶表示装置用基板の欠陥修正方法、および液晶表示装置の製造方法、並びにそれに用いる加工装置 |
| JP2001265248A (ja) * | 2000-03-14 | 2001-09-28 | Internatl Business Mach Corp <Ibm> | アクティブ・マトリックス表示装置、及び、その検査方法 |
| JP5053479B2 (ja) | 2000-09-14 | 2012-10-17 | 株式会社ジャパンディスプレイセントラル | マトリクスアレイ基板及びその製造方法 |
| JP2002196352A (ja) | 2000-12-07 | 2002-07-12 | Koninkl Philips Electronics Nv | 予備配線を有する液晶表示装置 |
| KR100494685B1 (ko) * | 2000-12-30 | 2005-06-13 | 비오이 하이디스 테크놀로지 주식회사 | 액정표시장치의 패널내 배선의 결함 테스트 방법 |
-
2002
- 2002-11-19 KR KR1020020071920A patent/KR100895311B1/ko not_active Expired - Lifetime
-
2003
- 2003-07-11 TW TW092118991A patent/TW200411302A/zh unknown
- 2003-07-12 CN CNB031327877A patent/CN100474083C/zh not_active Expired - Lifetime
- 2003-07-15 US US10/619,665 patent/US7580107B2/en not_active Expired - Lifetime
- 2003-11-18 JP JP2003388306A patent/JP4657598B2/ja not_active Expired - Lifetime
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