KR100895311B1 - 액정 표시 장치 및 그 검사 방법 - Google Patents

액정 표시 장치 및 그 검사 방법 Download PDF

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Publication number
KR100895311B1
KR100895311B1 KR1020020071920A KR20020071920A KR100895311B1 KR 100895311 B1 KR100895311 B1 KR 100895311B1 KR 1020020071920 A KR1020020071920 A KR 1020020071920A KR 20020071920 A KR20020071920 A KR 20020071920A KR 100895311 B1 KR100895311 B1 KR 100895311B1
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South Korea
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line
gate
liquid crystal
data
signal
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Expired - Lifetime
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KR1020020071920A
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English (en)
Korean (ko)
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KR20040043586A (ko
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문성재
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삼성전자주식회사
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Priority to KR1020020071920A priority Critical patent/KR100895311B1/ko
Priority to TW092118991A priority patent/TW200411302A/zh
Priority to CNB031327877A priority patent/CN100474083C/zh
Priority to US10/619,665 priority patent/US7580107B2/en
Priority to JP2003388306A priority patent/JP4657598B2/ja
Publication of KR20040043586A publication Critical patent/KR20040043586A/ko
Application granted granted Critical
Publication of KR100895311B1 publication Critical patent/KR100895311B1/ko
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
KR1020020071920A 2002-11-19 2002-11-19 액정 표시 장치 및 그 검사 방법 Expired - Lifetime KR100895311B1 (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020020071920A KR100895311B1 (ko) 2002-11-19 2002-11-19 액정 표시 장치 및 그 검사 방법
TW092118991A TW200411302A (en) 2002-11-19 2003-07-11 Liquid crystal display and testing method thereof
CNB031327877A CN100474083C (zh) 2002-11-19 2003-07-12 液晶显示器及其测试方法
US10/619,665 US7580107B2 (en) 2002-11-19 2003-07-15 Liquid crystal display and testing method thereof
JP2003388306A JP4657598B2 (ja) 2002-11-19 2003-11-18 液晶表示装置及びその検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020020071920A KR100895311B1 (ko) 2002-11-19 2002-11-19 액정 표시 장치 및 그 검사 방법

Publications (2)

Publication Number Publication Date
KR20040043586A KR20040043586A (ko) 2004-05-24
KR100895311B1 true KR100895311B1 (ko) 2009-05-07

Family

ID=32291782

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020020071920A Expired - Lifetime KR100895311B1 (ko) 2002-11-19 2002-11-19 액정 표시 장치 및 그 검사 방법

Country Status (5)

Country Link
US (1) US7580107B2 (enExample)
JP (1) JP4657598B2 (enExample)
KR (1) KR100895311B1 (enExample)
CN (1) CN100474083C (enExample)
TW (1) TW200411302A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10615242B2 (en) 2017-03-14 2020-04-07 Samsung Display Co., Ltd. Display apparatus
US10739892B2 (en) 2017-11-30 2020-08-11 Samsung Display Co., Ltd. Display apparatus
US11742357B2 (en) 2018-11-15 2023-08-29 Samsung Display Co., Ltd. Display device

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100951357B1 (ko) * 2003-08-19 2010-04-08 삼성전자주식회사 액정 표시 장치
KR20050053883A (ko) * 2003-12-03 2005-06-10 삼성전자주식회사 표시 장치용 박막 트랜지스터 표시판
US8013816B2 (en) * 2004-06-30 2011-09-06 Samsung Mobile Display Co., Ltd. Light emitting display
TWI382264B (zh) 2004-07-27 2013-01-11 Samsung Display Co Ltd 薄膜電晶體陣列面板及包括此面板之顯示器裝置
KR101100883B1 (ko) * 2004-11-08 2012-01-02 삼성전자주식회사 박막 트랜지스터 표시판
KR101096722B1 (ko) * 2004-11-10 2011-12-22 엘지디스플레이 주식회사 액정표시패널 및 그 제조방법
CN100346221C (zh) * 2004-11-12 2007-10-31 友达光电股份有限公司 液晶显示面板及其测试方法
KR20060072318A (ko) * 2004-12-23 2006-06-28 엘지.필립스 엘시디 주식회사 액정 표시 패널 및 그 제조방법
CN100489605C (zh) * 2004-12-29 2009-05-20 友达光电股份有限公司 显示面板的识别芯片及其制造方法
KR100663029B1 (ko) * 2004-12-31 2006-12-28 엘지.필립스 엘시디 주식회사 액정표시장치 , 그 제조방법 및 액정표시장치 검사방법
KR101093229B1 (ko) * 2005-01-06 2011-12-13 삼성전자주식회사 어레이 기판 및 이를 갖는 표시장치
KR101219037B1 (ko) * 2005-07-01 2013-01-09 삼성디스플레이 주식회사 박막 표시판 및 그 제조 방법
CN100468130C (zh) * 2005-09-09 2009-03-11 鸿富锦精密工业（深圳）有限公司 液晶显示器分区定位测试方法
TWI322318B (en) 2005-12-12 2010-03-21 Au Optronics Corp Active matrix substrate
CN100399175C (zh) * 2005-12-29 2008-07-02 友达光电股份有限公司 主动组件阵列基板
TWI301201B (en) 2006-03-15 2008-09-21 Au Optronics Corp Display circuits
CN100414574C (zh) * 2006-03-23 2008-08-27 友达光电股份有限公司 显示器电路
CN100422828C (zh) * 2006-08-29 2008-10-01 友达光电股份有限公司 测试液晶显示器的方法
TWI408633B (zh) * 2007-02-14 2013-09-11 Innolux Corp 具有修復電路佈局之顯示裝置
JP5138999B2 (ja) * 2007-08-01 2013-02-06 三菱電機株式会社 表示装置
US8125606B2 (en) * 2007-08-31 2012-02-28 Nlt Technologies, Ltd. Display device with branched terminal electrode
TWI365317B (en) * 2008-03-20 2012-06-01 Chunghwa Picture Tubes Ltd Active device array substrate
JP5339273B2 (ja) * 2008-07-11 2013-11-13 株式会社ジャパンディスプレイ 表示装置
WO2010010750A1 (ja) * 2008-07-23 2010-01-28 シャープ株式会社 アクティブマトリクス基板、表示装置、アクティブマトリクス基板の検査方法、および表示装置の検査方法
TWI392911B (zh) * 2009-03-13 2013-04-11 Au Optronics Corp 顯示面板及其線路檢查方法
CN101577078B (zh) * 2009-06-22 2011-04-27 福建捷联电子有限公司 液晶显示器的全自动调整测试系统
KR200458155Y1 (ko) * 2009-11-03 2012-01-20 윤종철 전선거치대
US9741277B2 (en) 2012-07-02 2017-08-22 E Ink Holdings Inc. Test structure of display panel and test structure of tested display panel
TWI467269B (zh) 2012-07-02 2015-01-01 E Ink Holdings Inc 顯示面板的測試結構及其測試方法與測試後的測試結構
JP6051011B2 (ja) 2012-10-22 2016-12-21 株式会社ジャパンディスプレイ 液晶表示装置およびその製造方法
CN104238152A (zh) * 2013-06-17 2014-12-24 北京京东方光电科技有限公司 一种cog测试方法
KR102058611B1 (ko) * 2013-07-05 2019-12-24 삼성디스플레이 주식회사 검사 장치와, 이를 이용한 배선 및 원장 검사 방법
KR102090159B1 (ko) 2013-11-22 2020-03-18 삼성디스플레이 주식회사 표시 패널 및 이의 제조 방법
CN104035217B (zh) * 2014-05-21 2016-08-24 深圳市华星光电技术有限公司 显示器阵列基板的外围测试线路以及液晶显示面板
JP6463065B2 (ja) * 2014-10-09 2019-01-30 三菱電機株式会社 アレイ基板およびこれを備える液晶表示パネルならびにアレイ基板の検査方法
KR102296073B1 (ko) * 2015-01-06 2021-08-31 삼성디스플레이 주식회사 액정 표시 장치
KR102356028B1 (ko) * 2015-02-06 2022-01-26 삼성디스플레이 주식회사 표시 장치
KR102392889B1 (ko) * 2015-08-07 2022-05-03 엘지디스플레이 주식회사 표시장치
KR102645333B1 (ko) * 2016-08-23 2024-03-12 삼성디스플레이 주식회사 표시장치
CN106653771B (zh) * 2016-12-30 2019-06-18 惠科股份有限公司 一种显示面板及制程
CN107154232A (zh) * 2017-05-27 2017-09-12 厦门天马微电子有限公司 阵列基板、显示面板和显示面板的测试方法
CN107945721B (zh) * 2017-11-29 2021-09-28 武汉天马微电子有限公司 一种显示面板及其点屏测试方法、显示装置
KR102607389B1 (ko) * 2018-03-12 2023-11-28 삼성디스플레이 주식회사 표시 장치 및 이의 신호 라인 검사 방법
KR102499175B1 (ko) * 2018-04-06 2023-02-13 티씨엘 차이나 스타 옵토일렉트로닉스 테크놀로지 컴퍼니 리미티드 표시장치
TWI678689B (zh) * 2018-10-12 2019-12-01 友達光電股份有限公司 顯示裝置及其修補方法
TWI718772B (zh) 2019-11-20 2021-02-11 元太科技工業股份有限公司 顯示裝置
KR102744149B1 (ko) * 2020-05-04 2024-12-20 삼성디스플레이 주식회사 게이트 검사부 및 이를 포함하는 표시 장치

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0895527A (ja) * 1994-09-22 1996-04-12 Casio Comput Co Ltd ドライバ回路を備えた液晶表示装置
KR20000007737A (ko) * 1998-07-07 2000-02-07 윤종용 엘씨디 패널
KR20000012919A (ko) * 1998-08-03 2000-03-06 윤종용 액정 패널
KR20000077275A (ko) * 1999-05-14 2000-12-26 가네꼬 히사시 검사용 콘택 패드를 구비한 액정 표시장치
KR20010087355A (ko) * 2000-03-06 2001-09-15 가나이 쓰토무 액정 표시 장치 및 그 제조 방법

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4840459A (en) 1987-11-03 1989-06-20 General Electric Co. Matrix addressed flat panel liquid crystal display device with dual ended auxiliary repair lines for address line repair
JPH04233514A (ja) 1990-12-28 1992-08-21 Sharp Corp アクティブマトリクス基板
JP2758103B2 (ja) * 1992-04-08 1998-05-28 シャープ株式会社 アクティブマトリクス基板及びその製造方法
JPH07146481A (ja) 1993-11-25 1995-06-06 Hitachi Ltd 液晶表示基板
JP3213472B2 (ja) * 1994-04-26 2001-10-02 シャープ株式会社 アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置
JPH08201841A (ja) 1994-11-24 1996-08-09 Toshiba Electron Eng Corp 表示装置及びその検査方法
TW331599B (en) * 1995-09-26 1998-05-11 Toshiba Co Ltd Array substrate for LCD and method of making same
KR100281058B1 (ko) * 1997-11-05 2001-02-01 구본준, 론 위라하디락사 액정표시장치
US6214879B1 (en) 1998-03-24 2001-04-10 Virginia Commonwealth University Allosteric inhibitors of pyruvate kinase
JP3667548B2 (ja) * 1998-03-27 2005-07-06 シャープ株式会社 アクティブマトリクス型液晶表示パネル及びその検査方法
JPH11352505A (ja) 1998-06-12 1999-12-24 Matsushita Electric Ind Co Ltd 液晶表示装置
JP3025257B1 (ja) * 1999-02-25 2000-03-27 松下電器産業株式会社 表示パネル
JP2001005027A (ja) * 1999-06-24 2001-01-12 Matsushita Electric Ind Co Ltd 液晶表示装置およびそれを用いた液晶表示応用機器
JP4106193B2 (ja) 2000-03-06 2008-06-25 株式会社 日立ディスプレイズ 液晶表示装置及びその製造方法
JP2001264788A (ja) 2000-03-14 2001-09-26 Sharp Corp 配線電極の接続方法、液晶表示装置用基板の製造方法と液晶表示装置用基板の欠陥修正方法、および液晶表示装置の製造方法、並びにそれに用いる加工装置
JP2001265248A (ja) * 2000-03-14 2001-09-28 Internatl Business Mach Corp <Ibm> アクティブ・マトリックス表示装置、及び、その検査方法
JP5053479B2 (ja) 2000-09-14 2012-10-17 株式会社ジャパンディスプレイセントラル マトリクスアレイ基板及びその製造方法
JP2002196352A (ja) 2000-12-07 2002-07-12 Koninkl Philips Electronics Nv 予備配線を有する液晶表示装置
KR100494685B1 (ko) * 2000-12-30 2005-06-13 비오이 하이디스 테크놀로지 주식회사 액정표시장치의 패널내 배선의 결함 테스트 방법

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0895527A (ja) * 1994-09-22 1996-04-12 Casio Comput Co Ltd ドライバ回路を備えた液晶表示装置
KR20000007737A (ko) * 1998-07-07 2000-02-07 윤종용 엘씨디 패널
KR20000012919A (ko) * 1998-08-03 2000-03-06 윤종용 액정 패널
KR20000077275A (ko) * 1999-05-14 2000-12-26 가네꼬 히사시 검사용 콘택 패드를 구비한 액정 표시장치
KR20010087355A (ko) * 2000-03-06 2001-09-15 가나이 쓰토무 액정 표시 장치 및 그 제조 방법

Cited By (10)

* Cited by examiner, † Cited by third party
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US10615242B2 (en) 2017-03-14 2020-04-07 Samsung Display Co., Ltd. Display apparatus
US10990233B2 (en) 2017-03-14 2021-04-27 Samsung Display Co., Ltd. Display apparatus
US11360621B2 (en) 2017-03-14 2022-06-14 Samsung Display Co., Ltd. Display apparatus
US11720213B2 (en) 2017-03-14 2023-08-08 Samsung Display Co., Ltd. Display apparatus
US11995277B2 (en) 2017-03-14 2024-05-28 Samsung Display Co., Ltd. Display apparatus
US10739892B2 (en) 2017-11-30 2020-08-11 Samsung Display Co., Ltd. Display apparatus
US11157105B2 (en) 2017-11-30 2021-10-26 Samsung Display Co., Ltd. Display apparatus
US11650683B2 (en) 2017-11-30 2023-05-16 Samsung Display Co., Ltd. Display apparatus
US12019817B2 (en) 2017-11-30 2024-06-25 Samsung Display Co., Ltd. Display apparatus
US11742357B2 (en) 2018-11-15 2023-08-29 Samsung Display Co., Ltd. Display device

Also Published As

Publication number Publication date
CN1503040A (zh) 2004-06-09
JP4657598B2 (ja) 2011-03-23
KR20040043586A (ko) 2004-05-24
CN100474083C (zh) 2009-04-01
US20040095549A1 (en) 2004-05-20
US7580107B2 (en) 2009-08-25
JP2004310024A (ja) 2004-11-04
TW200411302A (en) 2004-07-01

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