FR2676844A1 - Dispositif de memoire a semiconducteurs avec redondance. - Google Patents

Dispositif de memoire a semiconducteurs avec redondance. Download PDF

Info

Publication number
FR2676844A1
FR2676844A1 FR9108672A FR9108672A FR2676844A1 FR 2676844 A1 FR2676844 A1 FR 2676844A1 FR 9108672 A FR9108672 A FR 9108672A FR 9108672 A FR9108672 A FR 9108672A FR 2676844 A1 FR2676844 A1 FR 2676844A1
Authority
FR
France
Prior art keywords
memory device
transfer path
path
detection signal
semiconductor memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
FR9108672A
Other languages
English (en)
French (fr)
Inventor
Jang Hyun-Soon
Lee Kyu-Chan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of FR2676844A1 publication Critical patent/FR2676844A1/fr
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/842—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by introducing a delay in a signal path

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
FR9108672A 1991-05-24 1991-07-10 Dispositif de memoire a semiconducteurs avec redondance. Pending FR2676844A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910008454A KR940002272B1 (ko) 1991-05-24 1991-05-24 리던던시 기능을 가지는 반도체 메모리 장치

Publications (1)

Publication Number Publication Date
FR2676844A1 true FR2676844A1 (fr) 1992-11-27

Family

ID=19314872

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9108672A Pending FR2676844A1 (fr) 1991-05-24 1991-07-10 Dispositif de memoire a semiconducteurs avec redondance.

Country Status (7)

Country Link
JP (1) JPH04346000A (enExample)
KR (1) KR940002272B1 (enExample)
DE (1) DE4124572A1 (enExample)
FR (1) FR2676844A1 (enExample)
GB (1) GB2256070A (enExample)
IT (1) IT1251003B (enExample)
TW (1) TW217455B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR960013858B1 (ko) * 1994-02-03 1996-10-10 현대전자산업 주식회사 데이타 출력버퍼 제어회로
KR0172844B1 (ko) * 1995-12-11 1999-03-30 문정환 반도체 메모리 소자의 리페어 회로
GB9609834D0 (en) * 1996-05-10 1996-07-17 Memory Corp Plc Semiconductor device
KR100400307B1 (ko) 2001-05-09 2003-10-01 주식회사 하이닉스반도체 로오 리페어회로를 가진 반도체 메모리 장치
KR100414738B1 (ko) * 2001-12-21 2004-01-13 주식회사 하이닉스반도체 퓨즈를 이용한 비트라인 센싱 제어 장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59117792A (ja) * 1982-12-24 1984-07-07 Hitachi Ltd 冗長回路を備えた半導体記憶装置
EP0124900A2 (en) * 1983-05-06 1984-11-14 Nec Corporation Reduntant type memory circuit with an improved clock generator
EP0242981A2 (en) * 1986-03-20 1987-10-28 Fujitsu Limited Semiconductor memory device having redundancy circuit portion
US4905192A (en) * 1987-03-31 1990-02-27 Kabushiki Kaisha Toshiba Semiconductor memory cell

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4546455A (en) * 1981-12-17 1985-10-08 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor device
JP2776835B2 (ja) * 1988-07-08 1998-07-16 株式会社日立製作所 欠陥救済用の冗長回路を有する半導体メモリ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59117792A (ja) * 1982-12-24 1984-07-07 Hitachi Ltd 冗長回路を備えた半導体記憶装置
EP0124900A2 (en) * 1983-05-06 1984-11-14 Nec Corporation Reduntant type memory circuit with an improved clock generator
EP0242981A2 (en) * 1986-03-20 1987-10-28 Fujitsu Limited Semiconductor memory device having redundancy circuit portion
US4905192A (en) * 1987-03-31 1990-02-27 Kabushiki Kaisha Toshiba Semiconductor memory cell

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 008, no. 245 (P - 312) 10 November 1984 (1984-11-10) *

Also Published As

Publication number Publication date
GB9116165D0 (en) 1991-09-11
IT1251003B (it) 1995-04-28
KR940002272B1 (ko) 1994-03-19
ITMI912229A0 (it) 1991-08-08
DE4124572A1 (de) 1992-11-26
ITMI912229A1 (it) 1993-02-08
TW217455B (enExample) 1993-12-11
DE4124572C2 (enExample) 1993-07-01
GB2256070A (en) 1992-11-25
JPH04346000A (ja) 1992-12-01
KR920022148A (ko) 1992-12-19

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