DE69731053D1 - Prüfung von Schaltungen mit Schmitt-Eingängen - Google Patents

Prüfung von Schaltungen mit Schmitt-Eingängen

Info

Publication number
DE69731053D1
DE69731053D1 DE69731053T DE69731053T DE69731053D1 DE 69731053 D1 DE69731053 D1 DE 69731053D1 DE 69731053 T DE69731053 T DE 69731053T DE 69731053 T DE69731053 T DE 69731053T DE 69731053 D1 DE69731053 D1 DE 69731053D1
Authority
DE
Germany
Prior art keywords
testing
circuits
schmitt inputs
schmitt
inputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69731053T
Other languages
English (en)
Other versions
DE69731053T2 (de
Inventor
Mitsuya Ohie
Kazutoshi Inoue
Toshihide Nagatome
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Publication of DE69731053D1 publication Critical patent/DE69731053D1/de
Application granted granted Critical
Publication of DE69731053T2 publication Critical patent/DE69731053T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Logic Circuits (AREA)
DE69731053T 1996-10-03 1997-07-02 Prüfung von Schaltungen mit Schmitt-Eingängen Expired - Fee Related DE69731053T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP26283696 1996-10-03
JP26283696A JP3527814B2 (ja) 1996-10-03 1996-10-03 集積回路

Publications (2)

Publication Number Publication Date
DE69731053D1 true DE69731053D1 (de) 2004-11-11
DE69731053T2 DE69731053T2 (de) 2005-10-20

Family

ID=17381299

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69731053T Expired - Fee Related DE69731053T2 (de) 1996-10-03 1997-07-02 Prüfung von Schaltungen mit Schmitt-Eingängen

Country Status (7)

Country Link
US (1) US5936448A (de)
EP (1) EP0838689B1 (de)
JP (1) JP3527814B2 (de)
KR (1) KR100413636B1 (de)
CN (1) CN1182881A (de)
DE (1) DE69731053T2 (de)
TW (1) TW344030B (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2777717B1 (fr) * 1998-04-17 2002-12-06 Sextant Avionique Circuit pour l'acquisition de signaux analogiques binaires
JP4686124B2 (ja) * 2002-12-06 2011-05-18 三星電子株式会社 装置の構成をテストする方法および半導体装置
KR100510502B1 (ko) 2002-12-06 2005-08-26 삼성전자주식회사 반도체 장치 및 상기 반도체 장치를 테스트하는 방법
US7475320B2 (en) * 2003-08-19 2009-01-06 International Business Machines Corporation Frequency modification techniques that adjust an operating frequency to compensate for aging electronic components
JP2006322732A (ja) * 2005-05-17 2006-11-30 Oki Electric Ind Co Ltd 半導体集積回路
KR20090111324A (ko) * 2007-03-29 2009-10-26 가부시키가이샤 어드밴티스트 시험 장치 및 전자 디바이스
US8237443B2 (en) * 2007-11-16 2012-08-07 Baker Hughes Incorporated Position sensor for a downhole completion device
US8274303B2 (en) * 2010-08-30 2012-09-25 Freescale Semiconductor, Inc. Schmitt trigger with test circuit and method for testing
US8344779B2 (en) 2010-08-30 2013-01-01 Freescale Semiconductor, Inc. Comparator circuit with hysteresis, test circuit, and method for testing
US8836366B2 (en) * 2011-10-07 2014-09-16 Apple Inc. Method for testing integrated circuits with hysteresis
US9500700B1 (en) * 2013-11-15 2016-11-22 Xilinx, Inc. Circuits for and methods of testing the operation of an input/output port
CN109727447B (zh) * 2016-06-15 2021-09-07 湖南工业大学 机车速度检测信号过滤方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57182660A (en) * 1981-05-08 1982-11-10 Fuji Xerox Co Ltd Inputting circuit
JPS58169069A (ja) * 1982-03-31 1983-10-05 Fujitsu Ltd ヒステリシス入力回路の試験装置
JPS61223671A (ja) * 1985-03-29 1986-10-04 Toshiba Corp シユミツトトリガ入力バツフア回路
US5479607A (en) * 1985-08-22 1995-12-26 Canon Kabushiki Kaisha Video data processing system

Also Published As

Publication number Publication date
EP0838689B1 (de) 2004-10-06
JP3527814B2 (ja) 2004-05-17
EP0838689A2 (de) 1998-04-29
JPH10111343A (ja) 1998-04-28
KR19980032300A (ko) 1998-07-25
US5936448A (en) 1999-08-10
CN1182881A (zh) 1998-05-27
DE69731053T2 (de) 2005-10-20
KR100413636B1 (ko) 2004-04-03
TW344030B (en) 1998-11-01
EP0838689A3 (de) 1998-09-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee