DE69223786T2 - Strommessanordnung zum Testen von integrierten Schaltungen - Google Patents

Strommessanordnung zum Testen von integrierten Schaltungen

Info

Publication number
DE69223786T2
DE69223786T2 DE69223786T DE69223786T DE69223786T2 DE 69223786 T2 DE69223786 T2 DE 69223786T2 DE 69223786 T DE69223786 T DE 69223786T DE 69223786 T DE69223786 T DE 69223786T DE 69223786 T2 DE69223786 T2 DE 69223786T2
Authority
DE
Germany
Prior art keywords
integrated circuits
current measuring
measuring arrangement
testing integrated
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69223786T
Other languages
English (en)
Other versions
DE69223786D1 (de
Inventor
Franco Pellegrini
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
STMicroelectronics SRL
SGS Thomson Microelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SRL, SGS Thomson Microelectronics SRL filed Critical STMicroelectronics SRL
Publication of DE69223786D1 publication Critical patent/DE69223786D1/de
Application granted granted Critical
Publication of DE69223786T2 publication Critical patent/DE69223786T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69223786T 1992-09-30 1992-09-30 Strommessanordnung zum Testen von integrierten Schaltungen Expired - Fee Related DE69223786T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP92830543A EP0590221B1 (de) 1992-09-30 1992-09-30 Strommessanordnung zum Testen von integrierten Schaltungen

Publications (2)

Publication Number Publication Date
DE69223786D1 DE69223786D1 (de) 1998-02-05
DE69223786T2 true DE69223786T2 (de) 1998-05-07

Family

ID=8212183

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69223786T Expired - Fee Related DE69223786T2 (de) 1992-09-30 1992-09-30 Strommessanordnung zum Testen von integrierten Schaltungen

Country Status (4)

Country Link
US (1) US5483173A (de)
EP (1) EP0590221B1 (de)
JP (1) JPH06258384A (de)
DE (1) DE69223786T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5726505A (en) * 1995-01-13 1998-03-10 Omron Corporation Device to prevent reverse current flow, rectifier device and solar generator system
US6239604B1 (en) * 1996-10-04 2001-05-29 U.S. Philips Corporation Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof
GB9813982D0 (en) * 1998-06-30 1998-08-26 Mem Limited Residual current detection device
US6441637B1 (en) * 2000-09-26 2002-08-27 Intel Corporation Apparatus and method for power continuity testing in a parallel testing system
US6630685B1 (en) * 2002-06-24 2003-10-07 Micron Technology, Inc. Probe look ahead: testing parts not currently under a probehead
US6894477B1 (en) * 2003-03-04 2005-05-17 Fazaki North America, Inc. Electrical current monitor
AT500263B1 (de) * 2004-03-15 2007-04-15 T I P S Messtechnik Gmbh Verfahren und schaltung zum schutz von prüfkontakten bei der hochstrom-messung von halbleiter-bauelementen
US7511527B1 (en) 2008-01-29 2009-03-31 Texas Instruments Incorporated Methods and apparatus to test power transistors
US8558553B2 (en) 2008-12-16 2013-10-15 Infineon Technologies Austria Ag Methods and apparatus for selecting settings for circuits
JP2010223690A (ja) * 2009-03-23 2010-10-07 Seiko Epson Corp フレキシブル基板、並びに電気光学装置及び電子機器
CN104865515B (zh) * 2015-05-12 2017-10-03 北京航空航天大学 一种多通道集成运算放大器性能参数在线测试系统
DE102017103246B4 (de) 2016-04-08 2020-11-19 Infineon Technologies Ag Vor Überspannungsbedingungen geschützte Stromverteilungsvorrichtung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2874354A (en) * 1954-10-15 1959-02-17 Panellit Inc Calibrating circuit for current measuring systems
US3772595A (en) * 1971-03-19 1973-11-13 Teradyne Inc Method and apparatus for testing a digital logic fet by monitoring currents the device develops in response to input signals
JPS57123424A (en) * 1981-01-26 1982-07-31 Toko Inc Dc power supply device
IT1212808B (it) * 1983-01-31 1989-11-30 Ates Componenti Elettron Dispositivo di protezione per un elemento di potenza di un circuito integrato.

Also Published As

Publication number Publication date
JPH06258384A (ja) 1994-09-16
EP0590221A1 (de) 1994-04-06
DE69223786D1 (de) 1998-02-05
EP0590221B1 (de) 1997-12-29
US5483173A (en) 1996-01-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee