DE3672391D1 - Vorrichtung zum funktionstest gedruckter schaltungen. - Google Patents

Vorrichtung zum funktionstest gedruckter schaltungen.

Info

Publication number
DE3672391D1
DE3672391D1 DE8686104774T DE3672391T DE3672391D1 DE 3672391 D1 DE3672391 D1 DE 3672391D1 DE 8686104774 T DE8686104774 T DE 8686104774T DE 3672391 T DE3672391 T DE 3672391T DE 3672391 D1 DE3672391 D1 DE 3672391D1
Authority
DE
Germany
Prior art keywords
printed circuits
function testing
testing printed
function
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686104774T
Other languages
English (en)
Inventor
Ltd Chiba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Graphtec Corp
Original Assignee
Graphtec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Graphtec Corp filed Critical Graphtec Corp
Application granted granted Critical
Publication of DE3672391D1 publication Critical patent/DE3672391D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/10—Locating faults in cables, transmission lines, or networks by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8686104774T 1985-04-19 1986-04-08 Vorrichtung zum funktionstest gedruckter schaltungen. Expired - Lifetime DE3672391D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60082237A JPS61262671A (ja) 1985-04-19 1985-04-19 フアンクシヨンテスト方法とフアンクシヨンテスタ

Publications (1)

Publication Number Publication Date
DE3672391D1 true DE3672391D1 (de) 1990-08-09

Family

ID=13768799

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686104774T Expired - Lifetime DE3672391D1 (de) 1985-04-19 1986-04-08 Vorrichtung zum funktionstest gedruckter schaltungen.

Country Status (6)

Country Link
EP (1) EP0202447B1 (de)
JP (1) JPS61262671A (de)
KR (1) KR900002325B1 (de)
CN (1) CN1007090B (de)
CA (1) CA1250957A (de)
DE (1) DE3672391D1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2857989A (en) * 1988-01-27 1989-07-27 Nec Home Electronics Ltd. Inspection system for floppy disk drive unit control circuit of electronic appliance
JPH058476U (ja) * 1991-07-19 1993-02-05 グラフテツク株式会社 フアンクシヨンテスタ
WO2002091182A2 (en) * 2001-05-08 2002-11-14 Teradyne, Inc. Facilitating comparisons between simulated and actual behavior of electronic devices
CN104730445B (zh) * 2013-12-19 2017-12-08 致伸科技股份有限公司 电路板的测试系统
CN105403823A (zh) * 2014-09-11 2016-03-16 苏州奥特美自动化技术有限公司 一种测试b超机主板的方法及其程序
CN106680695A (zh) * 2017-02-28 2017-05-17 珠海拓优电子有限公司 一针两线防四线测试治具
CN109738788B (zh) * 2019-01-02 2021-06-01 深圳市大族数控科技股份有限公司 飞针测试机测试方法、装置、飞针测试机及存储介质
CN109581132B (zh) * 2019-01-23 2024-04-16 厦门芯泰达集成电路有限公司 一种集成电路测试座的探针脚测试装置
EP3702793A1 (de) * 2019-03-01 2020-09-02 Mitsubishi Electric R & D Centre Europe B.V. Verfahren und vorrichtung zum überwachen des gate-signals eines leistungshalbleiters
CN111857309B (zh) * 2020-07-08 2022-06-07 苏州浪潮智能科技有限公司 一种cpu供电转接装置及主板
CN113567829A (zh) * 2021-06-18 2021-10-29 合肥联宝信息技术有限公司 一种电路板的测试方法及装置
CN113985260A (zh) * 2021-12-06 2022-01-28 苏州奥特美自动化技术有限公司 一种fct多功能矩阵测试板卡

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1586173A (de) * 1968-08-19 1970-02-13
JPS58149575A (ja) * 1982-02-27 1983-09-05 Fanuc Ltd 座標系原点設定方式

Also Published As

Publication number Publication date
EP0202447B1 (de) 1990-07-04
CN1007090B (zh) 1990-03-07
KR900002325B1 (ko) 1990-04-11
EP0202447A1 (de) 1986-11-26
KR860008461A (ko) 1986-11-15
JPS61262671A (ja) 1986-11-20
CN86102660A (zh) 1986-10-15
CA1250957A (en) 1989-03-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee