DE69301393D1 - Fassung zum testen von integrierten schaltkreisen - Google Patents

Fassung zum testen von integrierten schaltkreisen

Info

Publication number
DE69301393D1
DE69301393D1 DE69301393T DE69301393T DE69301393D1 DE 69301393 D1 DE69301393 D1 DE 69301393D1 DE 69301393 T DE69301393 T DE 69301393T DE 69301393 T DE69301393 T DE 69301393T DE 69301393 D1 DE69301393 D1 DE 69301393D1
Authority
DE
Germany
Prior art keywords
version
integrated circuits
testing integrated
testing
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69301393T
Other languages
English (en)
Other versions
DE69301393T2 (de
Inventor
Juan Rios
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Co
Original Assignee
Minnesota Mining and Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining and Manufacturing Co filed Critical Minnesota Mining and Manufacturing Co
Publication of DE69301393D1 publication Critical patent/DE69301393D1/de
Application granted granted Critical
Publication of DE69301393T2 publication Critical patent/DE69301393T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K5/00—Casings, cabinets or drawers for electric apparatus
    • H05K5/02—Details
    • H05K5/03—Covers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
    • H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00013—Fully indexed content
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Lead Frames For Integrated Circuits (AREA)
DE69301393T 1992-03-27 1993-02-11 Fassung zum testen von integrierten schaltkreisen Expired - Fee Related DE69301393T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/859,149 US5247250A (en) 1992-03-27 1992-03-27 Integrated circuit test socket
PCT/US1993/001215 WO1993020675A1 (en) 1992-03-27 1993-02-11 Integrated circuit test socket

Publications (2)

Publication Number Publication Date
DE69301393D1 true DE69301393D1 (de) 1996-03-07
DE69301393T2 DE69301393T2 (de) 1996-05-30

Family

ID=25330174

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69301393T Expired - Fee Related DE69301393T2 (de) 1992-03-27 1993-02-11 Fassung zum testen von integrierten schaltkreisen

Country Status (7)

Country Link
US (1) US5247250A (de)
EP (1) EP0632950B1 (de)
JP (1) JP3214858B2 (de)
KR (1) KR950701186A (de)
DE (1) DE69301393T2 (de)
ES (1) ES2082636T3 (de)
WO (1) WO1993020675A1 (de)

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US7073254B2 (en) 1993-11-16 2006-07-11 Formfactor, Inc. Method for mounting a plurality of spring contact elements
US20020053734A1 (en) 1993-11-16 2002-05-09 Formfactor, Inc. Probe card assembly and kit, and methods of making same
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US5493237A (en) * 1994-05-27 1996-02-20 The Whitaker Corporation Integrated circuit chip testing apparatus
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USRE40209E1 (en) 1994-06-13 2008-04-01 Matsushita Electric Industrial Co., Ltd. Cell potential measurement apparatus having a plurality of microelectrodes
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JP2857838B2 (ja) 1994-12-01 1999-02-17 日本航空電子工業株式会社 パッケージ用ソケットコネクタ
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US5647756A (en) * 1995-12-19 1997-07-15 Minnesota Mining And Manufacturing Integrated circuit test socket having toggle clamp lid
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US6459042B1 (en) * 1999-12-17 2002-10-01 Autoliv Asp, Inc. Electrical connector with an electrical component holder
US6353329B1 (en) 2000-03-14 2002-03-05 3M Innovative Properties Company Integrated circuit test socket lid assembly
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JP2001326046A (ja) * 2000-05-17 2001-11-22 Enplas Corp コンタクトピン集合体、コンタクトピン組立体及び電気部品用ソケット
US7254889B1 (en) * 2000-09-08 2007-08-14 Gabe Cherian Interconnection devices
JP4721580B2 (ja) * 2001-09-11 2011-07-13 株式会社センサータ・テクノロジーズジャパン ソケット
JP4439151B2 (ja) * 2001-10-31 2010-03-24 株式会社リコー Ｉｃソケット
US7077665B2 (en) * 2002-03-19 2006-07-18 Enplas Corporation Contact pin and socket for electrical parts
JP3531644B2 (ja) * 2002-05-31 2004-05-31 沖電気工業株式会社 半導体ソケットおよび該ソケットのプローブ交換方法
US7170306B2 (en) * 2003-03-12 2007-01-30 Celerity Research, Inc. Connecting a probe card and an interposer using a compliant connector
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US7273386B2 (en) * 2004-07-28 2007-09-25 Hewlett-Packard Development Company, L.P. Pin shroud
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US20070230142A1 (en) * 2006-03-29 2007-10-04 Engel John B Zero parts strain relief
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US7473101B2 (en) * 2006-05-05 2009-01-06 International Business Machines Corporation Connector for mezzanine mounting of a printed wiring board
JP4749359B2 (ja) * 2007-02-28 2011-08-17 スリーエム カンパニー コンタクト及びそれを用いた集積回路用ソケット
JP4658081B2 (ja) * 2007-03-06 2011-03-23 新科實業有限公司 プローブ組立体、バーの研磨装置、およびバーの研磨方法
TWM324868U (en) * 2007-05-07 2008-01-01 Hon Hai Prec Ind Co Ltd Electrical connector
CN201075475Y (zh) * 2007-05-28 2008-06-18 富士康(昆山)电脑接插件有限公司 电连接器
TWM342638U (en) * 2008-03-10 2008-10-11 Hon Hai Prec Ind Co Ltd Electrical connector
TWM344658U (en) * 2008-03-31 2008-11-11 Hon Hai Prec Ind Co Ltd Electrical connector
TWM350847U (en) * 2008-07-21 2009-02-11 Hon Hai Prec Ind Co Ltd Electrical connector
US7637750B1 (en) * 2008-07-22 2009-12-29 Hon Hai Precision Ind. Co., Ltd. Electrical connector system with protective plate
TWM405098U (en) * 2010-10-27 2011-06-01 Hon Hai Prec Ind Co Ltd Electrical connector
RU2674582C1 (ru) * 2017-10-20 2018-12-11 Акционерное общество "Ангстрем" (АО "Ангстрем") Контактное устройство
JP7281250B2 (ja) * 2018-05-11 2023-05-25 株式会社アドバンテスト 試験用キャリア
KR102566041B1 (ko) * 2019-11-05 2023-08-16 주식회사 프로웰 반도체 소자 테스트 장치
CN114731019A (zh) * 2019-11-21 2022-07-08 株式会社友华 插座及工具
CN115436675A (zh) * 2021-06-04 2022-12-06 迪科特测试科技(苏州)有限公司 测试装置及其探针组件
KR102594175B1 (ko) * 2021-08-17 2023-10-26 미르텍알앤디 주식회사 반도체 테스트 소켓 및 그 제조 방법

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Also Published As

Publication number Publication date
US5247250A (en) 1993-09-21
EP0632950A1 (de) 1995-01-11
ES2082636T3 (es) 1996-03-16
KR950701186A (ko) 1995-02-20
EP0632950B1 (de) 1996-01-24
WO1993020675A1 (en) 1993-10-14
JP3214858B2 (ja) 2001-10-02
DE69301393T2 (de) 1996-05-30
JPH07505255A (ja) 1995-06-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee