KR940016883U - 테스터 이상감지회로 - Google Patents

테스터 이상감지회로

Info

Publication number
KR940016883U
KR940016883U KR2019920024364U KR920024364U KR940016883U KR 940016883 U KR940016883 U KR 940016883U KR 2019920024364 U KR2019920024364 U KR 2019920024364U KR 920024364 U KR920024364 U KR 920024364U KR 940016883 U KR940016883 U KR 940016883U
Authority
KR
South Korea
Prior art keywords
tester
detection circuit
abnormality detection
abnormality
circuit
Prior art date
Application number
KR2019920024364U
Other languages
English (en)
Other versions
KR950007191Y1 (ko
Inventor
배정환
Original Assignee
엘지일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지일렉트론 주식회사 filed Critical 엘지일렉트론 주식회사
Priority to KR92024364U priority Critical patent/KR950007191Y1/ko
Publication of KR940016883U publication Critical patent/KR940016883U/ko
Application granted granted Critical
Publication of KR950007191Y1 publication Critical patent/KR950007191Y1/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR92024364U 1992-12-04 1992-12-04 테스터 이상감지회로 KR950007191Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92024364U KR950007191Y1 (ko) 1992-12-04 1992-12-04 테스터 이상감지회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92024364U KR950007191Y1 (ko) 1992-12-04 1992-12-04 테스터 이상감지회로

Publications (2)

Publication Number Publication Date
KR940016883U true KR940016883U (ko) 1994-07-25
KR950007191Y1 KR950007191Y1 (ko) 1995-09-02

Family

ID=19345664

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92024364U KR950007191Y1 (ko) 1992-12-04 1992-12-04 테스터 이상감지회로

Country Status (1)

Country Link
KR (1) KR950007191Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100372881B1 (ko) * 2001-04-02 2003-02-19 미래산업 주식회사 테스트 핸들러의 자동 소켓 오프 방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100372881B1 (ko) * 2001-04-02 2003-02-19 미래산업 주식회사 테스트 핸들러의 자동 소켓 오프 방법

Also Published As

Publication number Publication date
KR950007191Y1 (ko) 1995-09-02

Similar Documents

Publication Publication Date Title
DE69229389D1 (de) Testsystem für Schaltkreise
DE69410873T2 (de) Tropfendetektorschaltung
DE69328348T2 (de) Stromerfassungsschaltung
DE69315731T2 (de) Signalerkennungsschaltung
DE69404570D1 (de) Kurzschlussdetektor für Messwertaufnehmer
DE69127149T2 (de) Schaltungsprüf-Verfahren
BR9301246A (pt) Dispositivo de deteccao de falhas
DE69413154T2 (de) Detektionsschaltung
DE68928600D1 (de) Erweiterte Prüfschaltung
KR940016883U (ko) 테스터 이상감지회로
KR940008829U (ko) 제로 크로스 검출 회로
DE4392104T1 (de) Spannungsmeßschaltung
KR940019773U (ko) 컨버터 고장검출회로
DE9319199U1 (de) Prüfschaltung
KR900003239U (ko) 연소기의 이상상태 검지회로
KR920010629U (ko) 파워 페일 감지회로
KR890005806U (ko) 국선 감지회로
KR950012297U (ko) 펄스출력결과 이상검출 회로
KR940004509U (ko) 레벨 검출 회로
KR940005517U (ko) 열차감지회로
KR900019124U (ko) 현장기기의 이벤트 시퀀스 검출회로
KR900007116U (ko) 이상전압 검출회로
KR950009579U (ko) 회로검사 장치
KR890016780U (ko) 전압 탐지회로
KR940004500U (ko) 롬 테스트회로

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20040820

Year of fee payment: 10

LAPS Lapse due to unpaid annual fee