DE68928600D1 - Erweiterte Prüfschaltung - Google Patents

Erweiterte Prüfschaltung

Info

Publication number
DE68928600D1
DE68928600D1 DE68928600T DE68928600T DE68928600D1 DE 68928600 D1 DE68928600 D1 DE 68928600D1 DE 68928600 T DE68928600 T DE 68928600T DE 68928600 T DE68928600 T DE 68928600T DE 68928600 D1 DE68928600 D1 DE 68928600D1
Authority
DE
Germany
Prior art keywords
test circuit
extended test
extended
circuit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68928600T
Other languages
English (en)
Other versions
DE68928600T2 (de
Inventor
Lee D Whetsel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of DE68928600D1 publication Critical patent/DE68928600D1/de
Publication of DE68928600T2 publication Critical patent/DE68928600T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/318525—Test of flip-flops or latches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
DE68928600T 1988-09-07 1989-08-22 Erweiterte Prüfschaltung Expired - Fee Related DE68928600T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US24151188A 1988-09-07 1988-09-07

Publications (2)

Publication Number Publication Date
DE68928600D1 true DE68928600D1 (de) 1998-04-16
DE68928600T2 DE68928600T2 (de) 1998-07-02

Family

ID=22910976

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68928600T Expired - Fee Related DE68928600T2 (de) 1988-09-07 1989-08-22 Erweiterte Prüfschaltung

Country Status (4)

Country Link
EP (1) EP0358371B1 (de)
JP (2) JPH032577A (de)
KR (1) KR0165105B1 (de)
DE (1) DE68928600T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE504041C2 (sv) * 1995-03-16 1996-10-21 Ericsson Telefon Ab L M Integrerat kretsarrangemang för provning
JP2009216619A (ja) * 2008-03-12 2009-09-24 Texas Instr Japan Ltd 半導体集積回路装置
EP2624000A4 (de) 2010-09-27 2014-08-06 Fujitsu Ltd Integrierte schaltung
TWI416145B (zh) * 2011-11-03 2013-11-21 Winbond Electronics Corp 積體電路及其測試方法
EP2722680B1 (de) * 2012-10-19 2018-10-10 IMEC vzw Übergangsverzögerungsdetektor für Verbindungstest
CN113377592B (zh) * 2021-06-28 2022-07-29 昆山国显光电有限公司 芯片的检测方法及装置、计算机可读存储介质及电子设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58155599A (ja) * 1982-03-10 1983-09-16 Hitachi Ltd メモリテスタ−
US4618956A (en) * 1983-09-29 1986-10-21 Tandem Computers Incorporated Method of operating enhanced alu test hardware
US4594711A (en) * 1983-11-10 1986-06-10 Texas Instruments Incorporated Universal testing circuit and method
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
GB8501143D0 (en) * 1985-01-17 1985-02-20 Plessey Co Plc Integrated circuits
US4734921A (en) * 1986-11-25 1988-03-29 Grumman Aerospace Corporation Fully programmable linear feedback shift register
JP2628154B2 (ja) * 1986-12-17 1997-07-09 富士通株式会社 半導体集積回路

Also Published As

Publication number Publication date
JP3529762B2 (ja) 2004-05-24
JPH032577A (ja) 1991-01-08
DE68928600T2 (de) 1998-07-02
EP0358371A3 (de) 1992-02-26
EP0358371A2 (de) 1990-03-14
JP2002236145A (ja) 2002-08-23
KR0165105B1 (ko) 1999-04-15
KR900005474A (ko) 1990-04-14
EP0358371B1 (de) 1998-03-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee