KR0165105B1 - 개량된 검사 회로 - Google Patents

개량된 검사 회로 Download PDF

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Publication number
KR0165105B1
KR0165105B1 KR1019890012886A KR890012886A KR0165105B1 KR 0165105 B1 KR0165105 B1 KR 0165105B1 KR 1019890012886 A KR1019890012886 A KR 1019890012886A KR 890012886 A KR890012886 A KR 890012886A KR 0165105 B1 KR0165105 B1 KR 0165105B1
Authority
KR
South Korea
Prior art keywords
input
output
test
circuit
inspection
Prior art date
Application number
KR1019890012886A
Other languages
English (en)
Korean (ko)
Other versions
KR900005474A (ko
Inventor
디. 웨이트셀 쥬니어 리
Original Assignee
엔. 라이스 머레트
텍사스 인스트루먼츠 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엔. 라이스 머레트, 텍사스 인스트루먼츠 인코포레이티드 filed Critical 엔. 라이스 머레트
Publication of KR900005474A publication Critical patent/KR900005474A/ko
Application granted granted Critical
Publication of KR0165105B1 publication Critical patent/KR0165105B1/ko

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/318525—Test of flip-flops or latches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
KR1019890012886A 1988-09-07 1989-09-06 개량된 검사 회로 KR0165105B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US24151188A 1988-09-07 1988-09-07
US241,511 1988-09-07

Publications (2)

Publication Number Publication Date
KR900005474A KR900005474A (ko) 1990-04-14
KR0165105B1 true KR0165105B1 (ko) 1999-04-15

Family

ID=22910976

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890012886A KR0165105B1 (ko) 1988-09-07 1989-09-06 개량된 검사 회로

Country Status (4)

Country Link
EP (1) EP0358371B1 (de)
JP (2) JPH032577A (de)
KR (1) KR0165105B1 (de)
DE (1) DE68928600T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE504041C2 (sv) * 1995-03-16 1996-10-21 Ericsson Telefon Ab L M Integrerat kretsarrangemang för provning
JP2009216619A (ja) * 2008-03-12 2009-09-24 Texas Instr Japan Ltd 半導体集積回路装置
EP2624000A4 (de) 2010-09-27 2014-08-06 Fujitsu Ltd Integrierte schaltung
TWI416145B (zh) * 2011-11-03 2013-11-21 Winbond Electronics Corp 積體電路及其測試方法
EP2722680B1 (de) * 2012-10-19 2018-10-10 IMEC vzw Übergangsverzögerungsdetektor für Verbindungstest
CN113377592B (zh) * 2021-06-28 2022-07-29 昆山国显光电有限公司 芯片的检测方法及装置、计算机可读存储介质及电子设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58155599A (ja) * 1982-03-10 1983-09-16 Hitachi Ltd メモリテスタ−
US4618956A (en) * 1983-09-29 1986-10-21 Tandem Computers Incorporated Method of operating enhanced alu test hardware
US4594711A (en) * 1983-11-10 1986-06-10 Texas Instruments Incorporated Universal testing circuit and method
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
GB8501143D0 (en) * 1985-01-17 1985-02-20 Plessey Co Plc Integrated circuits
US4734921A (en) * 1986-11-25 1988-03-29 Grumman Aerospace Corporation Fully programmable linear feedback shift register
JP2628154B2 (ja) * 1986-12-17 1997-07-09 富士通株式会社 半導体集積回路

Also Published As

Publication number Publication date
JP3529762B2 (ja) 2004-05-24
JPH032577A (ja) 1991-01-08
DE68928600T2 (de) 1998-07-02
EP0358371A3 (de) 1992-02-26
EP0358371A2 (de) 1990-03-14
JP2002236145A (ja) 2002-08-23
DE68928600D1 (de) 1998-04-16
KR900005474A (ko) 1990-04-14
EP0358371B1 (de) 1998-03-11

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