DE69420456T2 - Festkörper-Bildaufnahmevorrichtung mit reduziertem Schmiereffekt und Herstellungsverfahren - Google Patents

Festkörper-Bildaufnahmevorrichtung mit reduziertem Schmiereffekt und Herstellungsverfahren

Info

Publication number
DE69420456T2
DE69420456T2 DE69420456T DE69420456T DE69420456T2 DE 69420456 T2 DE69420456 T2 DE 69420456T2 DE 69420456 T DE69420456 T DE 69420456T DE 69420456 T DE69420456 T DE 69420456T DE 69420456 T2 DE69420456 T2 DE 69420456T2
Authority
DE
Germany
Prior art keywords
imaging device
manufacturing process
solid state
state imaging
smear effect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69420456T
Other languages
English (en)
Other versions
DE69420456D1 (de
Inventor
Harada Kouichi
Furukawa Junichi
Wada Kazushi
Sarai Takaaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Application granted granted Critical
Publication of DE69420456D1 publication Critical patent/DE69420456D1/de
Publication of DE69420456T2 publication Critical patent/DE69420456T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14887—Blooming suppression
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14806—Structural or functional details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14831—Area CCD imagers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
DE69420456T 1993-05-17 1994-05-16 Festkörper-Bildaufnahmevorrichtung mit reduziertem Schmiereffekt und Herstellungsverfahren Expired - Lifetime DE69420456T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP11485993 1993-05-17
JP20335893 1993-08-17
JP27244193 1993-10-29
JP33362593A JP3456000B2 (ja) 1993-05-17 1993-12-27 固体撮像素子及びその製造方法

Publications (2)

Publication Number Publication Date
DE69420456D1 DE69420456D1 (de) 1999-10-14
DE69420456T2 true DE69420456T2 (de) 2000-03-02

Family

ID=27470208

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69420456T Expired - Lifetime DE69420456T2 (de) 1993-05-17 1994-05-16 Festkörper-Bildaufnahmevorrichtung mit reduziertem Schmiereffekt und Herstellungsverfahren

Country Status (5)

Country Link
US (3) US5614741A (de)
EP (1) EP0625799B1 (de)
JP (1) JP3456000B2 (de)
KR (1) KR100280793B1 (de)
DE (1) DE69420456T2 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
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JP3456000B2 (ja) * 1993-05-17 2003-10-14 ソニー株式会社 固体撮像素子及びその製造方法
JPH09172156A (ja) * 1995-12-20 1997-06-30 Toshiba Corp 固体撮像素子及びその製造方法
JPH10173158A (ja) * 1996-12-05 1998-06-26 Denso Corp 光センサｉｃ
KR100239412B1 (ko) * 1996-12-28 2000-01-15 김영환 고체 촬상 소자 및 그의 제조 방법
JP3547280B2 (ja) * 1997-02-25 2004-07-28 松下電器産業株式会社 固体撮像装置
JP3447510B2 (ja) * 1997-04-09 2003-09-16 Ｎｅｃエレクトロニクス株式会社 固体撮像素子、その製造方法及び固体撮像装置
JP3702611B2 (ja) * 1997-10-06 2005-10-05 ソニー株式会社 固体撮像素子及びその製造方法
JP3426935B2 (ja) * 1997-10-21 2003-07-14 三洋電機株式会社 固体撮像素子及び固体撮像素子の製造方法
US6169317B1 (en) * 1998-02-13 2001-01-02 Canon Kabushiki Kaisha Photoelectric conversion device and image sensor
JP3204216B2 (ja) * 1998-06-24 2001-09-04 日本電気株式会社 固体撮像装置およびその製造方法
JP3284986B2 (ja) * 1998-12-04 2002-05-27 日本電気株式会社 光電変換素子およびそれを用いた固体撮像装置
JP4433528B2 (ja) * 1998-12-08 2010-03-17 ソニー株式会社 固体撮像素子及びその製造方法
JP3319419B2 (ja) * 1999-02-24 2002-09-03 日本電気株式会社 固体撮像装置
US6288434B1 (en) * 1999-05-14 2001-09-11 Tower Semiconductor, Ltd. Photodetecting integrated circuits with low cross talk
JP3541155B2 (ja) * 2000-02-17 2004-07-07 シャープ株式会社 固体撮像装置およびその製造方法
WO2004079825A1 (ja) * 2003-03-06 2004-09-16 Sony Corporation 固体撮像素子及びその製造方法、並びに固体撮像素子の駆動方法
JP2005191400A (ja) * 2003-12-26 2005-07-14 Fuji Film Microdevices Co Ltd 固体撮像素子及び固体撮像素子の製造方法
JP4725049B2 (ja) 2004-07-29 2011-07-13 ソニー株式会社 固体撮像装置およびその製造方法
JP2006049451A (ja) * 2004-08-03 2006-02-16 Sony Corp 固体撮像素子及び固体撮像素子の駆動方法
CN101010806A (zh) * 2004-08-20 2007-08-01 皇家飞利浦电子股份有限公司 具有钝化层的微电子系统
US7205627B2 (en) * 2005-02-23 2007-04-17 International Business Machines Corporation Image sensor cells
US7683407B2 (en) * 2005-08-01 2010-03-23 Aptina Imaging Corporation Structure and method for building a light tunnel for use with imaging devices
JP2009295918A (ja) * 2008-06-09 2009-12-17 Panasonic Corp 固体撮像装置及びその製造方法
US8987788B2 (en) 2011-09-26 2015-03-24 Semiconductor Components Industries, Llc Metal-strapped CCD image sensors
EP2797312B1 (de) * 2011-12-21 2019-05-29 Sharp Kabushiki Kaisha Bildgebungsvorrichtung und elektronische informationsvorrichtung
US9848142B2 (en) 2015-07-10 2017-12-19 Semiconductor Components Industries, Llc Methods for clocking an image sensor

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6350057A (ja) * 1986-08-20 1988-03-02 Toshiba Corp 固体撮像装置の製造方法
JPS63136665A (ja) * 1986-11-28 1988-06-08 Toshiba Corp 固体撮像装置およびその製造方法
JPH0624232B2 (ja) * 1987-03-19 1994-03-30 株式会社東芝 固体撮像装置の製造方法
JPS6415969A (en) * 1987-07-09 1989-01-19 Toshiba Corp Solid-state image sensing device and manufacture thereof
US5264374A (en) * 1987-09-04 1993-11-23 Kabushiki Kaisha Toshiba Method of manufacturing a solid state image sensing device
JPH0214570A (ja) * 1988-07-01 1990-01-18 Matsushita Electron Corp 固体撮像装置及びその製造方法
JP2822393B2 (ja) * 1988-07-30 1998-11-11 ソニー株式会社 固体撮像装置及びその駆動方法
JPH04181774A (ja) * 1990-11-16 1992-06-29 Sony Corp 固体撮像装置
JPH04216672A (ja) * 1990-12-14 1992-08-06 Sony Corp 固体撮像装置
DE69218469T2 (de) * 1991-01-17 1997-11-06 Sony Corp CCD-Bildaufnahmevorrichtung
JP3200899B2 (ja) * 1991-11-21 2001-08-20 ソニー株式会社 固体撮像装置
KR930017195A (ko) * 1992-01-23 1993-08-30 오가 노리오 고체촬상소자 및 그 제법
DE4203792A1 (de) * 1992-02-10 1993-08-12 Bayer Ag Verbessertes verfahren zur herstellung von gegebenenfalls substituierten benzaldehyden
KR100259063B1 (ko) * 1992-06-12 2000-06-15 김영환 Ccd 영상소자
JPH069481A (ja) * 1992-06-22 1994-01-18 Tosoh Corp α，β−不飽和カルボニル化合物の製造方法
JP2970307B2 (ja) * 1993-05-17 1999-11-02 日本電気株式会社 固体撮像装置の製造方法
JP3456000B2 (ja) * 1993-05-17 2003-10-14 ソニー株式会社 固体撮像素子及びその製造方法
US5492852A (en) * 1993-10-07 1996-02-20 Nec Corporation Method for fabricating a solid imaging device having improved smear and breakdown voltage characteristics

Also Published As

Publication number Publication date
JPH07226496A (ja) 1995-08-22
US5763292A (en) 1998-06-09
JP3456000B2 (ja) 2003-10-14
KR100280793B1 (ko) 2001-02-01
EP0625799B1 (de) 1999-09-08
EP0625799A1 (de) 1994-11-23
US5614741A (en) 1997-03-25
KR940027154A (ko) 1994-12-10
US5929470A (en) 1999-07-27
DE69420456D1 (de) 1999-10-14

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