DE69031849D1 - Verfahren zum Ebnen von Topologien für integrierte Schaltungen - Google Patents

Verfahren zum Ebnen von Topologien für integrierte Schaltungen

Info

Publication number
DE69031849D1
DE69031849D1 DE69031849T DE69031849T DE69031849D1 DE 69031849 D1 DE69031849 D1 DE 69031849D1 DE 69031849 T DE69031849 T DE 69031849T DE 69031849 T DE69031849 T DE 69031849T DE 69031849 D1 DE69031849 D1 DE 69031849D1
Authority
DE
Germany
Prior art keywords
integrated circuit
circuit structure
oxide layer
portions
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69031849T
Other languages
English (en)
Other versions
DE69031849T2 (de
Inventor
Steven C Avanzino
Jacob D Haskell
Subhash Gupta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Micro Devices Inc
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Publication of DE69031849D1 publication Critical patent/DE69031849D1/de
Application granted granted Critical
Publication of DE69031849T2 publication Critical patent/DE69031849T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/32115—Planarisation
    • H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/31051—Planarisation of the insulating layers
    • H01L21/31053—Planarisation of the insulating layers involving a dielectric removal step
    • H01L21/31055—Planarisation of the insulating layers involving a dielectric removal step the removal being a chemical etching step, e.g. dry etching
    • H01L21/31056—Planarisation of the insulating layers involving a dielectric removal step the removal being a chemical etching step, e.g. dry etching the removal being a selective chemical etching step, e.g. selective dry etching through a mask
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76224—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials
    • H01L21/76229—Concurrent filling of a plurality of trenches having a different trench shape or dimension, e.g. rectangular and V-shaped trenches, wide and narrow trenches, shallow and deep trenches
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/051—Etching
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/959—Mechanical polishing of wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Element Separation (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Drying Of Semiconductors (AREA)
  • Amplifiers (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Formation Of Insulating Films (AREA)
DE69031849T 1989-07-03 1990-06-14 Verfahren zum Ebnen von Topologien für integrierte Schaltungen Expired - Lifetime DE69031849T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/376,176 US4954459A (en) 1988-05-12 1989-07-03 Method of planarization of topologies in integrated circuit structures

Publications (2)

Publication Number Publication Date
DE69031849D1 true DE69031849D1 (de) 1998-02-05
DE69031849T2 DE69031849T2 (de) 1998-07-30

Family

ID=23484000

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69031849T Expired - Lifetime DE69031849T2 (de) 1989-07-03 1990-06-14 Verfahren zum Ebnen von Topologien für integrierte Schaltungen

Country Status (6)

Country Link
US (1) US4954459A (de)
EP (1) EP0407047B9 (de)
JP (1) JPH03116753A (de)
AT (1) ATE161656T1 (de)
DE (1) DE69031849T2 (de)
ES (1) ES2110960T3 (de)

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DE58908781D1 (de) * 1989-09-08 1995-01-26 Siemens Ag Verfahren zur globalen Planarisierung von Oberflächen für integrierte Halbleiterschaltungen.
US5413966A (en) * 1990-12-20 1995-05-09 Lsi Logic Corporation Shallow trench etch
US5290396A (en) * 1991-06-06 1994-03-01 Lsi Logic Corporation Trench planarization techniques
US5248625A (en) * 1991-06-06 1993-09-28 Lsi Logic Corporation Techniques for forming isolation structures
US5252503A (en) * 1991-06-06 1993-10-12 Lsi Logic Corporation Techniques for forming isolation structures
US5225358A (en) * 1991-06-06 1993-07-06 Lsi Logic Corporation Method of forming late isolation with polishing
JP2874486B2 (ja) * 1991-11-29 1999-03-24 ソニー株式会社 ポリッシュ工程を備えたトレンチアイソレーションの形成方法及び半導体装置の製造方法
US5498565A (en) * 1991-11-29 1996-03-12 Sony Corporation Method of forming trench isolation having polishing step and method of manufacturing semiconductor device
US5215937A (en) * 1992-05-07 1993-06-01 Advanced Micro Devices, Inc. Optimizing doping control in short channel MOS
US5212106A (en) * 1992-05-07 1993-05-18 Advanced Micro Devices, Inc. Optimizing doping control in short channel MOS
JP3321864B2 (ja) * 1992-11-24 2002-09-09 ヤマハ株式会社 半導体装置とその製法
JP3256623B2 (ja) * 1993-05-28 2002-02-12 株式会社東芝 半導体装置の製造方法
JPH07235537A (ja) * 1994-02-23 1995-09-05 Mitsubishi Electric Corp 表面が平坦化された半導体装置およびその製造方法
FR2717307B1 (fr) * 1994-03-11 1996-07-19 Maryse Paoli Procede d'isolement de zones actives d'un substrat semi-conducteur par tranchees peu profondes quasi planes, et dispositif correspondant
FR2717306B1 (fr) * 1994-03-11 1996-07-19 Maryse Paoli Procédé d'isolement de zones actives d'un substrat semi-conducteur par tranchées peu profondes, notamment étroites, et dispositif correspondant.
US5516729A (en) * 1994-06-03 1996-05-14 Advanced Micro Devices, Inc. Method for planarizing a semiconductor topography using a spin-on glass material with a variable chemical-mechanical polish rate
US5527423A (en) * 1994-10-06 1996-06-18 Cabot Corporation Chemical mechanical polishing slurry for metal layers
US5663107A (en) * 1994-12-22 1997-09-02 Siemens Aktiengesellschaft Global planarization using self aligned polishing or spacer technique and isotropic etch process
JP3180599B2 (ja) * 1995-01-24 2001-06-25 日本電気株式会社 半導体装置およびその製造方法
FR2734402B1 (fr) * 1995-05-15 1997-07-18 Brouquet Pierre Procede pour l'isolement electrique en micro-electronique, applicable aux cavites etroites, par depot d'oxyde a l'etat visqueux et dispositif correspondant
JP3300203B2 (ja) * 1995-07-04 2002-07-08 松下電器産業株式会社 半導体マスク装置、その製造方法及び半導体装置の製造方法
US5840623A (en) * 1995-10-04 1998-11-24 Advanced Micro Devices, Inc. Efficient and economical method of planarization of multilevel metallization structures in integrated circuits using CMP
JP2687948B2 (ja) * 1995-10-05 1997-12-08 日本電気株式会社 半導体装置の製造方法
US5869385A (en) * 1995-12-08 1999-02-09 Advanced Micro Devices, Inc. Selectively oxidized field oxide region
TW428244B (en) * 1996-04-15 2001-04-01 United Microelectronics Corp Planarization method for self-aligned contact process
US5993686A (en) * 1996-06-06 1999-11-30 Cabot Corporation Fluoride additive containing chemical mechanical polishing slurry and method for use of same
WO1997048132A1 (en) * 1996-06-11 1997-12-18 Advanced Micro Devices, Inc. Method for forming co-planar conductor and insulator features using chemical mechanical planarization
US5851899A (en) * 1996-08-08 1998-12-22 Siemens Aktiengesellschaft Gapfill and planarization process for shallow trench isolation
WO1998007189A1 (en) * 1996-08-13 1998-02-19 Advanced Micro Devices, Inc. Semiconductor trench isolation structure having improved upper surface planarity
US5783489A (en) * 1996-09-24 1998-07-21 Cabot Corporation Multi-oxidizer slurry for chemical mechanical polishing
US6033596A (en) * 1996-09-24 2000-03-07 Cabot Corporation Multi-oxidizer slurry for chemical mechanical polishing
US6039891A (en) 1996-09-24 2000-03-21 Cabot Corporation Multi-oxidizer precursor for chemical mechanical polishing
US6395620B1 (en) * 1996-10-08 2002-05-28 Micron Technology, Inc. Method for forming a planar surface over low density field areas on a semiconductor wafer
US5721172A (en) * 1996-12-02 1998-02-24 Taiwan Semiconductor Manufacturing Company, Ltd. Self-aligned polish stop layer hard masking method for forming planarized aperture fill layers
US5954997A (en) 1996-12-09 1999-09-21 Cabot Corporation Chemical mechanical polishing slurry useful for copper substrates
US6126853A (en) 1996-12-09 2000-10-03 Cabot Microelectronics Corporation Chemical mechanical polishing slurry useful for copper substrates
EP0855739A1 (de) * 1997-01-24 1998-07-29 Texas Instruments Inc. Verfahren zum Ätzen eines abgeschrägten Dielektrikums für das Rückätzen einer Grabenisolation
US5792707A (en) * 1997-01-27 1998-08-11 Chartered Semiconductor Manufacturing Ltd. Global planarization method for inter level dielectric layers of integrated circuits
US6025270A (en) * 1997-02-03 2000-02-15 Taiwan Semiconductor Manufacturing Company, Ltd. Planarization process using tailored etchback and CMP
US5926723A (en) * 1997-03-04 1999-07-20 Advanced Micro Devices, Inc. Generation of a loose planarization mask having relaxed boundary conditions for use in shallow trench isolation processes
KR100253083B1 (ko) * 1997-03-15 2000-04-15 윤종용 반도체용웨이퍼의일렉트론왁스제거를위한왁스세정조성물및이를이용한일렉트론왁스제거방법
US6121143A (en) * 1997-09-19 2000-09-19 3M Innovative Properties Company Abrasive articles comprising a fluorochemical agent for wafer surface modification
DE19741704A1 (de) * 1997-09-22 1999-04-01 Siemens Ag Verfahren zur Erzeugung von Isolationen in einem Substrat
US5880007A (en) * 1997-09-30 1999-03-09 Siemens Aktiengesellschaft Planarization of a non-conformal device layer in semiconductor fabrication
TW398040B (en) * 1997-10-20 2000-07-11 United Microelectronics Corp A method to improve inequivalent metal etching rate
US6087243A (en) * 1997-10-21 2000-07-11 Advanced Micro Devices, Inc. Method of forming trench isolation with high integrity, ultra thin gate oxide
US6395619B2 (en) * 1997-12-05 2002-05-28 Sharp Kabushiki Kaisha Process for fabricating a semiconductor device
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US6057207A (en) * 1998-03-25 2000-05-02 Taiwan Semiconductor Manufacturing Company Shallow trench isolation process using chemical-mechanical polish with self-aligned nitride mask on HDP-oxide
US6004863A (en) * 1998-05-06 1999-12-21 Taiwan Semiconductor Manufacturing Company Non-polishing sacrificial layer etchback planarizing method for forming a planarized aperture fill layer
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US6365523B1 (en) * 1998-10-22 2002-04-02 Taiwan Semiconductor Maufacturing Company Integrated high density plasma chemical vapor deposition (HDP-CVD) method and chemical mechanical polish (CMP) planarizing method for forming patterned planarized aperture fill layers
US6869858B2 (en) * 1999-01-25 2005-03-22 Taiwan Semiconductor Manufacturing Company, Ltd. Shallow trench isolation planarized by wet etchback and chemical mechanical polishing
US6376361B1 (en) 1999-10-18 2002-04-23 Chartered Semiconductor Manufacturing Ltd. Method to remove excess metal in the formation of damascene and dual interconnects
US6291030B1 (en) * 1999-12-21 2001-09-18 Promos Technologies, Inc. Method for reducing capacitance in metal lines using air gaps
KR100363093B1 (ko) * 2000-07-28 2002-12-05 삼성전자 주식회사 반도체 소자의 층간 절연막 평탄화 방법
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Also Published As

Publication number Publication date
ATE161656T1 (de) 1998-01-15
ES2110960T3 (es) 1998-03-01
EP0407047A3 (en) 1991-01-30
EP0407047B1 (de) 1997-12-29
EP0407047B9 (de) 2005-11-30
US4954459A (en) 1990-09-04
EP0407047A2 (de) 1991-01-09
DE69031849T2 (de) 1998-07-30
JPH03116753A (ja) 1991-05-17

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