DE60042353D1 - Zusammensetzungen für eine planarisierende Antireflexschicht - Google Patents
Zusammensetzungen für eine planarisierende AntireflexschichtInfo
- Publication number
- DE60042353D1 DE60042353D1 DE60042353T DE60042353T DE60042353D1 DE 60042353 D1 DE60042353 D1 DE 60042353D1 DE 60042353 T DE60042353 T DE 60042353T DE 60042353 T DE60042353 T DE 60042353T DE 60042353 D1 DE60042353 D1 DE 60042353D1
- Authority
- DE
- Germany
- Prior art keywords
- compositions
- antireflective layer
- planarizing
- planarizing antireflective
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/151—Matting or other surface reflectivity altering material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Materials For Photolithography (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Paints Or Removers (AREA)
- Laminated Bodies (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/264,061 US6316165B1 (en) | 1999-03-08 | 1999-03-08 | Planarizing antireflective coating compositions |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE60042353D1 true DE60042353D1 (de) | 2009-07-23 |
Family
ID=23004401
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60042353T Expired - Lifetime DE60042353D1 (de) | 1999-03-08 | 2000-02-29 | Zusammensetzungen für eine planarisierende Antireflexschicht |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6316165B1 (enExample) |
| EP (1) | EP1035442B1 (enExample) |
| JP (1) | JP4789300B2 (enExample) |
| KR (1) | KR100869484B1 (enExample) |
| DE (1) | DE60042353D1 (enExample) |
| TW (1) | TWI253544B (enExample) |
Families Citing this family (98)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6773864B1 (en) * | 1991-11-15 | 2004-08-10 | Shipley Company, L.L.C. | Antihalation compositions |
| US6528235B2 (en) | 1991-11-15 | 2003-03-04 | Shipley Company, L.L.C. | Antihalation compositions |
| US6472128B2 (en) * | 1996-04-30 | 2002-10-29 | Shipley Company, L.L.C. | Antihalation compositions |
| US6165697A (en) * | 1991-11-15 | 2000-12-26 | Shipley Company, L.L.C. | Antihalation compositions |
| US6316165B1 (en) * | 1999-03-08 | 2001-11-13 | Shipley Company, L.L.C. | Planarizing antireflective coating compositions |
| US6323287B1 (en) * | 1999-03-12 | 2001-11-27 | Arch Specialty Chemicals, Inc. | Hydroxy-amino thermally cured undercoat for 193 NM lithography |
| KR100465864B1 (ko) * | 1999-03-15 | 2005-01-24 | 주식회사 하이닉스반도체 | 유기 난반사방지 중합체 및 그의 제조방법 |
| KR100804873B1 (ko) | 1999-06-10 | 2008-02-20 | 얼라이드시그날 인코퍼레이티드 | 포토리소그래피용 sog 반사방지 코팅 |
| US6824879B2 (en) | 1999-06-10 | 2004-11-30 | Honeywell International Inc. | Spin-on-glass anti-reflective coatings for photolithography |
| US6890448B2 (en) * | 1999-06-11 | 2005-05-10 | Shipley Company, L.L.C. | Antireflective hard mask compositions |
| US7220281B2 (en) * | 1999-08-18 | 2007-05-22 | Intrinsic Therapeutics, Inc. | Implant for reinforcing and annulus fibrosis |
| US20040034134A1 (en) * | 1999-08-26 | 2004-02-19 | Lamb James E. | Crosslinkable fill compositions for uniformly protecting via and contact holes |
| WO2001015211A1 (en) * | 1999-08-26 | 2001-03-01 | Brewer Science | Improved fill material for dual damascene processes |
| KR100557585B1 (ko) * | 1999-10-29 | 2006-03-03 | 주식회사 하이닉스반도체 | 레지스트 플로우 공정용 포토레지스트 조성물 및 이를 이용한 컨택홀의 형성방법 |
| JP4654544B2 (ja) * | 2000-07-12 | 2011-03-23 | 日産化学工業株式会社 | リソグラフィー用ギャップフィル材形成組成物 |
| TW556047B (en) | 2000-07-31 | 2003-10-01 | Shipley Co Llc | Coated substrate, method for forming photoresist relief image, and antireflective composition |
| KR20090057142A (ko) | 2000-08-17 | 2009-06-03 | 롬 앤드 하스 일렉트로닉 머트어리얼즈, 엘.엘.씨 | 내에칭성 반사방지 코팅 조성물 |
| KR100734249B1 (ko) * | 2000-09-07 | 2007-07-02 | 삼성전자주식회사 | 축합환의 방향족 환을 포함하는 보호기를 가지는 감광성폴리머 및 이를 포함하는 레지스트 조성물 |
| TWI281940B (en) * | 2000-09-19 | 2007-06-01 | Shipley Co Llc | Antireflective composition |
| US7132219B2 (en) * | 2001-02-02 | 2006-11-07 | Brewer Science Inc. | Polymeric antireflective coatings deposited by plasma enhanced chemical vapor deposition |
| TW576859B (en) * | 2001-05-11 | 2004-02-21 | Shipley Co Llc | Antireflective coating compositions |
| KR20030006956A (ko) * | 2001-05-11 | 2003-01-23 | 쉬플리 캄파니, 엘.엘.씨. | 반사방지 코팅 조성물 |
| GB0114265D0 (en) | 2001-06-12 | 2001-08-01 | Ciba Sc Holding Ag | Polymeric material containing a latent acid |
| US6703169B2 (en) | 2001-07-23 | 2004-03-09 | Applied Materials, Inc. | Method of preparing optically imaged high performance photomasks |
| US7326509B2 (en) * | 2001-08-20 | 2008-02-05 | Nissan Chemical Industries, Ltd. | Composition for forming anti-reflective coating for use in lithography |
| TW591341B (en) * | 2001-09-26 | 2004-06-11 | Shipley Co Llc | Coating compositions for use with an overcoated photoresist |
| WO2003034152A1 (en) | 2001-10-10 | 2003-04-24 | Nissan Chemical Industries, Ltd. | Composition for forming antireflection film for lithography |
| KR20040066124A (ko) | 2001-11-15 | 2004-07-23 | 허니웰 인터내셔널 인코포레이티드 | 포토리소그라피용 스핀온 반사 방지 피막 |
| US7070914B2 (en) * | 2002-01-09 | 2006-07-04 | Az Electronic Materials Usa Corp. | Process for producing an image using a first minimum bottom antireflective coating composition |
| US20030215736A1 (en) * | 2002-01-09 | 2003-11-20 | Oberlander Joseph E. | Negative-working photoimageable bottom antireflective coating |
| WO2003071357A1 (en) * | 2002-02-19 | 2003-08-28 | Nissan Chemical Industries, Ltd. | Composition for forming anti-reflection coating |
| TW523807B (en) * | 2002-03-21 | 2003-03-11 | Nanya Technology Corp | Method for improving photolithography pattern profile |
| US8012670B2 (en) | 2002-04-11 | 2011-09-06 | Rohm And Haas Electronic Materials Llc | Photoresist systems |
| US6852474B2 (en) * | 2002-04-30 | 2005-02-08 | Brewer Science Inc. | Polymeric antireflective coatings deposited by plasma enhanced chemical vapor deposition |
| US7265431B2 (en) * | 2002-05-17 | 2007-09-04 | Intel Corporation | Imageable bottom anti-reflective coating for high resolution lithography |
| JP3852593B2 (ja) | 2002-07-17 | 2006-11-29 | 日産化学工業株式会社 | 反射防止膜形成組成物 |
| JP3597523B2 (ja) * | 2002-08-27 | 2004-12-08 | 東京応化工業株式会社 | リソグラフィー用下地材 |
| US20050173803A1 (en) * | 2002-09-20 | 2005-08-11 | Victor Lu | Interlayer adhesion promoter for low k materials |
| US20040067437A1 (en) * | 2002-10-06 | 2004-04-08 | Shipley Company, L.L.C. | Coating compositions for use with an overcoated photoresist |
| US7323289B2 (en) * | 2002-10-08 | 2008-01-29 | Brewer Science Inc. | Bottom anti-reflective coatings derived from small core molecules with multiple epoxy moieties |
| KR20040044369A (ko) | 2002-11-20 | 2004-05-28 | 쉬플리 캄파니, 엘.엘.씨. | 다층 포토레지스트 시스템 |
| JP2004177952A (ja) * | 2002-11-20 | 2004-06-24 | Rohm & Haas Electronic Materials Llc | 多層フォトレジスト系 |
| WO2004074938A1 (ja) * | 2003-02-21 | 2004-09-02 | Nissan Chemical Industries, Ltd. | アクリル系ポリマーを含有するリソグラフィー用ギャップフィル材形成組成物 |
| US7794919B2 (en) | 2003-04-02 | 2010-09-14 | Nissan Chemical Industries, Ltd. | Composition for forming underlayer coating for lithography containing epoxy compound and carboxylic acid compound |
| CN1774673B (zh) | 2003-04-17 | 2010-09-29 | 日产化学工业株式会社 | 多孔质下层膜和用于形成多孔质下层膜的形成下层膜的组合物 |
| JP4105036B2 (ja) * | 2003-05-28 | 2008-06-18 | 信越化学工業株式会社 | レジスト下層膜材料ならびにパターン形成方法 |
| JP4069025B2 (ja) * | 2003-06-18 | 2008-03-26 | 信越化学工業株式会社 | レジスト下層膜材料ならびにパターン形成方法 |
| US7361447B2 (en) * | 2003-07-30 | 2008-04-22 | Hynix Semiconductor Inc. | Photoresist polymer and photoresist composition containing the same |
| TWI363251B (en) | 2003-07-30 | 2012-05-01 | Nissan Chemical Ind Ltd | Sublayer coating-forming composition for lithography containing compound having protected carboxy group |
| US7303855B2 (en) * | 2003-10-03 | 2007-12-04 | Shin-Etsu Chemical Co., Ltd. | Photoresist undercoat-forming material and patterning process |
| TWI360726B (en) * | 2003-10-30 | 2012-03-21 | Nissan Chemical Ind Ltd | Sublayer coating-forming composition containing de |
| US8053159B2 (en) | 2003-11-18 | 2011-11-08 | Honeywell International Inc. | Antireflective coatings for via fill and photolithography applications and methods of preparation thereof |
| US7416821B2 (en) * | 2004-03-12 | 2008-08-26 | Fujifilm Electronic Materials, U.S.A., Inc. | Thermally cured undercoat for lithographic application |
| US20050255410A1 (en) | 2004-04-29 | 2005-11-17 | Guerrero Douglas J | Anti-reflective coatings using vinyl ether crosslinkers |
| EP1600814A3 (en) * | 2004-05-18 | 2008-12-17 | Rohm and Haas Electronic Materials, L.L.C. | Coating compositions for use with an overcoated photoresist |
| US7427464B2 (en) * | 2004-06-22 | 2008-09-23 | Shin-Etsu Chemical Co., Ltd. | Patterning process and undercoat-forming material |
| US7687223B2 (en) | 2004-11-01 | 2010-03-30 | Nissan Chemical Industries, Ltd. | Underlayer coating forming composition for lithography containing cyclodextrin compound |
| US20060255315A1 (en) * | 2004-11-19 | 2006-11-16 | Yellowaga Deborah L | Selective removal chemistries for semiconductor applications, methods of production and uses thereof |
| EP1850180A4 (en) | 2005-01-21 | 2009-12-30 | Nissan Chemical Ind Ltd | COMPOSITION FOR FORMING A LAYERING LINEOGRAPHY FILM CONTAINING A CARBOXYL PROTECTED COMPOSITION |
| EP1691238A3 (en) | 2005-02-05 | 2009-01-21 | Rohm and Haas Electronic Materials, L.L.C. | Coating compositions for use with an overcoated photoresist |
| TWI340296B (en) * | 2005-03-20 | 2011-04-11 | Rohm & Haas Elect Mat | Coating compositions for use with an overcoated photoresist |
| CN102621814A (zh) | 2005-04-19 | 2012-08-01 | 日产化学工业株式会社 | 用于形成光交联固化的抗蚀剂下层膜的抗蚀剂下层膜形成组合物 |
| EP1762895B1 (en) * | 2005-08-29 | 2016-02-24 | Rohm and Haas Electronic Materials, L.L.C. | Antireflective Hard Mask Compositions |
| KR100696539B1 (ko) * | 2005-10-11 | 2007-03-19 | 삼성에스디아이 주식회사 | 플라즈마 디스플레이 패널의 제조 방법 |
| JP4666166B2 (ja) * | 2005-11-28 | 2011-04-06 | 信越化学工業株式会社 | レジスト下層膜材料及びパターン形成方法 |
| JP5110283B2 (ja) * | 2005-12-06 | 2012-12-26 | 日産化学工業株式会社 | 光架橋硬化のレジスト下層膜を形成するためのケイ素含有レジスト下層膜形成組成物 |
| US7745104B2 (en) | 2006-08-10 | 2010-06-29 | Shin-Etsu Chemical Co., Ltd. | Bottom resist layer composition and patterning process using the same |
| US7914974B2 (en) | 2006-08-18 | 2011-03-29 | Brewer Science Inc. | Anti-reflective imaging layer for multiple patterning process |
| KR101423057B1 (ko) | 2006-08-28 | 2014-07-25 | 닛산 가가쿠 고교 가부시키 가이샤 | 액상첨가제를 포함하는 레지스트 하층막 형성 조성물 |
| EP2085822A4 (en) | 2006-10-12 | 2011-03-16 | Nissan Chemical Ind Ltd | SEMICONDUCTOR ELEMENT PROCESSING PROCESS USING A SUB-RESISTANT FILM CURED BY PHOTO-NETWORKING |
| US7727705B2 (en) * | 2007-02-23 | 2010-06-01 | Fujifilm Electronic Materials, U.S.A., Inc. | High etch resistant underlayer compositions for multilayer lithographic processes |
| US8642246B2 (en) | 2007-02-26 | 2014-02-04 | Honeywell International Inc. | Compositions, coatings and films for tri-layer patterning applications and methods of preparation thereof |
| JP4809376B2 (ja) | 2007-03-09 | 2011-11-09 | 信越化学工業株式会社 | 反射防止膜材料およびこれを用いたパターン形成方法 |
| JP4809378B2 (ja) | 2007-03-13 | 2011-11-09 | 信越化学工業株式会社 | レジスト下層膜材料およびこれを用いたパターン形成方法 |
| US8017296B2 (en) * | 2007-05-22 | 2011-09-13 | Az Electronic Materials Usa Corp. | Antireflective coating composition comprising fused aromatic rings |
| JP5177137B2 (ja) | 2007-05-23 | 2013-04-03 | Jsr株式会社 | レジスト下層膜形成用組成物 |
| JP5357186B2 (ja) | 2008-01-29 | 2013-12-04 | ブルーワー サイエンス アイ エヌ シー. | 多重暗視野露光によるハードマスクのパターン形成のためのオントラックプロセス |
| US8859673B2 (en) * | 2008-02-25 | 2014-10-14 | Honeywell International, Inc. | Processable inorganic and organic polymer formulations, methods of production and uses thereof |
| US7989144B2 (en) * | 2008-04-01 | 2011-08-02 | Az Electronic Materials Usa Corp | Antireflective coating composition |
| US7932018B2 (en) * | 2008-05-06 | 2011-04-26 | Az Electronic Materials Usa Corp. | Antireflective coating composition |
| US20100119980A1 (en) * | 2008-11-13 | 2010-05-13 | Rahman M Dalil | Antireflective Coating Composition Comprising Fused Aromatic Rings |
| US20100119979A1 (en) * | 2008-11-13 | 2010-05-13 | Rahman M Dalil | Antireflective Coating Composition Comprising Fused Aromatic Rings |
| US9640396B2 (en) | 2009-01-07 | 2017-05-02 | Brewer Science Inc. | Spin-on spacer materials for double- and triple-patterning lithography |
| US20100316949A1 (en) * | 2009-06-10 | 2010-12-16 | Rahman M Dalil | Spin On Organic Antireflective Coating Composition Comprising Polymer with Fused Aromatic Rings |
| US8557877B2 (en) | 2009-06-10 | 2013-10-15 | Honeywell International Inc. | Anti-reflective coatings for optically transparent substrates |
| US8486609B2 (en) * | 2009-12-23 | 2013-07-16 | Az Electronic Materials Usa Corp. | Antireflective coating composition and process thereof |
| KR101860170B1 (ko) * | 2011-02-28 | 2018-05-21 | 제이에스알 가부시끼가이샤 | 레지스트 하층막 형성용 조성물, 패턴 형성 방법 및 레지스트 하층막 |
| US8864898B2 (en) | 2011-05-31 | 2014-10-21 | Honeywell International Inc. | Coating formulations for optical elements |
| KR101922280B1 (ko) * | 2011-10-12 | 2018-11-26 | 제이에스알 가부시끼가이샤 | 패턴 형성 방법 및 레지스트 하층막 형성용 조성물 |
| US10331032B2 (en) | 2012-04-23 | 2019-06-25 | Brewer Science, Inc. | Photosensitive, developer-soluble bottom anti-reflective coating material |
| EP2770373A1 (en) | 2013-02-20 | 2014-08-27 | Imec | Conformal anti-reflective coating |
| WO2015069646A1 (en) * | 2013-11-08 | 2015-05-14 | Tokyo Electron Limited | Method for chemical polishing and planarization |
| JP2015152745A (ja) * | 2014-02-13 | 2015-08-24 | 大日本印刷株式会社 | 光配向性を有する熱硬化性組成物、配向層、配向層付基材、位相差板およびデバイス |
| JP5668881B1 (ja) * | 2014-04-14 | 2015-02-12 | 大日本印刷株式会社 | 光配向性を有する熱硬化性組成物、配向層、配向層付基材、位相差板およびデバイス |
| US9601325B2 (en) | 2014-06-24 | 2017-03-21 | Rohm And Haas Electronic Materials Llc | Aromatic resins for underlayers |
| EP3194502A4 (en) | 2015-04-13 | 2018-05-16 | Honeywell International Inc. | Polysiloxane formulations and coatings for optoelectronic applications |
| KR102421597B1 (ko) * | 2015-07-14 | 2022-07-18 | 에스케이이노베이션 주식회사 | 신규한 레지스트 하층막 형성용 중합체, 이를 포함하는 레지스트 하층막 형성용 조성물 및 이를 이용한 레지스트 패턴의 형성 방법 |
| KR102808380B1 (ko) * | 2020-01-31 | 2025-05-16 | 닛산 가가쿠 가부시키가이샤 | Euv레지스트 하층막 형성 조성물 |
Family Cites Families (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4060656A (en) | 1973-04-02 | 1977-11-29 | Teijin Limited | Support for photosensitive resin |
| US4370405A (en) | 1981-03-30 | 1983-01-25 | Hewlett-Packard Company | Multilayer photoresist process utilizing an absorbant dye |
| US4362809A (en) | 1981-03-30 | 1982-12-07 | Hewlett-Packard Company | Multilayer photoresist process utilizing an absorbant dye |
| US4910122A (en) | 1982-09-30 | 1990-03-20 | Brewer Science, Inc. | Anti-reflective coating |
| US4621042A (en) * | 1985-08-16 | 1986-11-04 | Rca Corporation | Absorptive planarizing layer for optical lithography |
| US4668606A (en) * | 1985-11-20 | 1987-05-26 | Eastman Kodak Company | Positive photoresist with antireflection coating having thermal stability |
| WO1990003598A1 (en) | 1988-09-28 | 1990-04-05 | Brewer Science, Inc. | Multifunctional photolithographic compositions |
| US6165697A (en) * | 1991-11-15 | 2000-12-26 | Shipley Company, L.L.C. | Antihalation compositions |
| US5234990A (en) * | 1992-02-12 | 1993-08-10 | Brewer Science, Inc. | Polymers with intrinsic light-absorbing properties for anti-reflective coating applications in deep ultraviolet microlithography |
| WO1994019396A1 (en) | 1992-02-12 | 1994-09-01 | Brewer Science, Inc. | Polymers with intrinsic light-absorbing properties |
| JP2694097B2 (ja) * | 1992-03-03 | 1997-12-24 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 反射防止コーティング組成物 |
| SG52770A1 (en) | 1992-07-10 | 1998-09-28 | Hoechst Celanese Corp | Metal ion reduction in top anti-reflective coatings for photoresists |
| US5498748A (en) * | 1993-07-20 | 1996-03-12 | Wako Pure Chemical Industries, Ltd. | Anthracene derivatives |
| JP3382028B2 (ja) * | 1993-09-10 | 2003-03-04 | 株式会社東芝 | 薄膜形成方法 |
| JP2803549B2 (ja) | 1993-12-21 | 1998-09-24 | 信越化学工業株式会社 | 光反射性防止材料及びパターン形成方法 |
| US5597868A (en) | 1994-03-04 | 1997-01-28 | Massachusetts Institute Of Technology | Polymeric anti-reflective compounds |
| US5607824A (en) * | 1994-07-27 | 1997-03-04 | International Business Machines Corporation | Antireflective coating for microlithography |
| US5663036A (en) * | 1994-12-13 | 1997-09-02 | International Business Machines Corporation | Microlithographic structure with an underlayer film comprising a thermolyzed azide |
| US5837417A (en) * | 1994-12-30 | 1998-11-17 | Clariant Finance (Bvi) Limited | Quinone diazide compositions containing low metals p-cresol oligomers and process of producing the composition |
| JPH08241858A (ja) * | 1995-01-25 | 1996-09-17 | Toshiba Corp | 半導体の反射防止膜及びこの反射防止膜を用いた半導体の製造方法 |
| US5693691A (en) | 1995-08-21 | 1997-12-02 | Brewer Science, Inc. | Thermosetting anti-reflective coatings compositions |
| JP3781471B2 (ja) * | 1996-03-13 | 2006-05-31 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 反射防止組成物及びこれを用いる感光膜の形成方法 |
| JP3827762B2 (ja) * | 1996-03-26 | 2006-09-27 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 反射防止組成物及びレジストパターン形成方法 |
| US5741626A (en) * | 1996-04-15 | 1998-04-21 | Motorola, Inc. | Method for forming a dielectric tantalum nitride layer as an anti-reflective coating (ARC) |
| US5886102A (en) * | 1996-06-11 | 1999-03-23 | Shipley Company, L.L.C. | Antireflective coating compositions |
| US5652317A (en) * | 1996-08-16 | 1997-07-29 | Hoechst Celanese Corporation | Antireflective coatings for photoresist compositions |
| US5652297A (en) | 1996-08-16 | 1997-07-29 | Hoechst Celanese Corporation | Aqueous antireflective coatings for photoresist compositions |
| EP0861855B1 (en) * | 1996-09-18 | 2006-06-21 | AZ Electronic Materials USA Corp. | Light-absorbing polymer, method for synthesizing the same, and film-forming composition and antireflection film prepared using said polymer |
| US5733714A (en) * | 1996-09-30 | 1998-03-31 | Clariant Finance (Bvi) Limited | Antireflective coating for photoresist compositions |
| JPH10120940A (ja) * | 1996-10-18 | 1998-05-12 | Fuji Photo Film Co Ltd | 反射防止膜用組成物 |
| US6468718B1 (en) * | 1999-02-04 | 2002-10-22 | Clariant Finance (Bvi) Limited | Radiation absorbing polymer, composition for radiation absorbing coating, radiation absorbing coating and application thereof as anti-reflective coating |
| JP3851414B2 (ja) * | 1997-06-04 | 2006-11-29 | 富士写真フイルム株式会社 | 反射防止膜材料組成物及びこれを用いたレジストパターン形成方法 |
| JP3473887B2 (ja) * | 1997-07-16 | 2003-12-08 | 東京応化工業株式会社 | 反射防止膜形成用組成物及びそれを用いたレジストパターンの形成方法 |
| US5919599A (en) | 1997-09-30 | 1999-07-06 | Brewer Science, Inc. | Thermosetting anti-reflective coatings at deep ultraviolet |
| JP4053631B2 (ja) * | 1997-10-08 | 2008-02-27 | Azエレクトロニックマテリアルズ株式会社 | 反射防止膜又は光吸収膜用組成物及びこれに用いる重合体 |
| US5935760A (en) * | 1997-10-20 | 1999-08-10 | Brewer Science Inc. | Thermosetting polyester anti-reflective coatings for multilayer photoresist processes |
| WO1999025766A2 (en) * | 1997-11-13 | 1999-05-27 | H.B. Fuller Licensing & Financing, Inc. | Radiation curable compositions comprising metallocene polyolefins |
| US6391786B1 (en) * | 1997-12-31 | 2002-05-21 | Lam Research Corporation | Etching process for organic anti-reflective coating |
| US20020102483A1 (en) * | 1998-09-15 | 2002-08-01 | Timothy Adams | Antireflective coating compositions |
| JP3852889B2 (ja) * | 1998-09-24 | 2006-12-06 | 富士写真フイルム株式会社 | フォトレジスト用反射防止膜材料組成物 |
| US6114085A (en) * | 1998-11-18 | 2000-09-05 | Clariant Finance (Bvi) Limited | Antireflective composition for a deep ultraviolet photoresist |
| US6316165B1 (en) * | 1999-03-08 | 2001-11-13 | Shipley Company, L.L.C. | Planarizing antireflective coating compositions |
| US6106995A (en) * | 1999-08-12 | 2000-08-22 | Clariant Finance (Bvi) Limited | Antireflective coating material for photoresists |
| TW556047B (en) * | 2000-07-31 | 2003-10-01 | Shipley Co Llc | Coated substrate, method for forming photoresist relief image, and antireflective composition |
-
1999
- 1999-03-08 US US09/264,061 patent/US6316165B1/en not_active Expired - Lifetime
-
2000
- 2000-02-25 KR KR1020000009313A patent/KR100869484B1/ko not_active Expired - Lifetime
- 2000-02-29 EP EP00301634A patent/EP1035442B1/en not_active Revoked
- 2000-02-29 DE DE60042353T patent/DE60042353D1/de not_active Expired - Lifetime
- 2000-03-04 TW TW089103901A patent/TWI253544B/zh not_active IP Right Cessation
- 2000-03-08 JP JP2000063610A patent/JP4789300B2/ja not_active Expired - Lifetime
-
2001
- 2001-09-15 US US09/952,880 patent/US6855466B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000294504A (ja) | 2000-10-20 |
| EP1035442A3 (en) | 2001-05-02 |
| US6855466B2 (en) | 2005-02-15 |
| TWI253544B (en) | 2006-04-21 |
| EP1035442A2 (en) | 2000-09-13 |
| US20020022196A1 (en) | 2002-02-21 |
| KR20010006699A (ko) | 2001-01-26 |
| KR100869484B1 (ko) | 2008-11-19 |
| EP1035442B1 (en) | 2009-06-10 |
| US6316165B1 (en) | 2001-11-13 |
| JP4789300B2 (ja) | 2011-10-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE60042353D1 (de) | Zusammensetzungen für eine planarisierende Antireflexschicht | |
| DE60027505D1 (de) | Schleifmittelzusammensetzung | |
| DE60031531D1 (de) | Hochgefüllte unterschicht für antihaftgegenstand | |
| DE60014907D1 (de) | Schleifmittelzusammensetzung | |
| DE60025791D1 (de) | Ellipsometer | |
| DE60109664D1 (de) | Polierzusammensetzung | |
| EP1081205A4 (en) | RESIN COMPOSITIONS | |
| DE69930832D1 (de) | Benutzung einer zusammensetzung für eine antireflexunterschicht | |
| DE60016903D1 (de) | Antiperspirant-zusammensetzungen | |
| NO20014412L (no) | Forbindelser nyttige som anti-inflammatoriske midler | |
| DE60016295D1 (de) | Harzzusammensetzung | |
| DE69922267D1 (de) | Bewegliches zusammensetzspiel | |
| DE60105523D1 (de) | Antireflektionsbeschichtungszusammensetzung | |
| DE60007694D1 (de) | Beschichtungszusammensetzung | |
| ATE305470T1 (de) | Naphthyridinverbindungen | |
| DE69905968D1 (de) | Eine Fotoresistzusammensetzung | |
| DE60004535D1 (de) | Halbleitende polyvinylidenfluorid-harzzusammensetzungen | |
| DE60035257D1 (de) | Mehrachsige turbine | |
| DE60021076D1 (de) | Temporäre schutzüberzuge für poymere gegenstände | |
| DE69932109D1 (de) | Antireflektierende Schichten | |
| DE60001022D1 (de) | Beschichtungszusammensetzung für eine Schutzschicht für Bildaufzeichnungsmaterialien | |
| DE60013921D1 (de) | Polieraufschlämmung | |
| DE60041671D1 (de) | Poliervorrichtung | |
| DE60013905D1 (de) | Lichtstreuende harzzusammensetzung | |
| EP1178788A4 (en) | INNOVATIVE DIPHENYLETHYLENE COMPOUNDS |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8363 | Opposition against the patent |