DE3019850C2 - - Google Patents

Info

Publication number
DE3019850C2
DE3019850C2 DE3019850A DE3019850A DE3019850C2 DE 3019850 C2 DE3019850 C2 DE 3019850C2 DE 3019850 A DE3019850 A DE 3019850A DE 3019850 A DE3019850 A DE 3019850A DE 3019850 C2 DE3019850 C2 DE 3019850C2
Authority
DE
Germany
Prior art keywords
film
sio
oxide film
substrate
films
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3019850A
Other languages
German (de)
English (en)
Other versions
DE3019850A1 (de
Inventor
Ytasuda Hachiohji Tokyo/Tokio Jp Yuji
Takaaki Stanford Calif. Us Hagiwara
Ryuji Kodaira Tokyo/Tokio Jp Kondo
Shinichi Kokubunji Tokyo/Tokio Jp Minami
Yokichi Hachiohji Tokyo/Tokio Jp Itoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE3019850A1 publication Critical patent/DE3019850A1/de
Application granted granted Critical
Publication of DE3019850C2 publication Critical patent/DE3019850C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/07—Guard rings and cmos
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/117—Oxidation, selective
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/141—Self-alignment coat gate

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Non-Volatile Memory (AREA)
  • Element Separation (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
DE19803019850 1979-05-25 1980-05-23 Halbleitervorrichtung und verfahren zu ihrer herstellung Granted DE3019850A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6394179A JPS55156370A (en) 1979-05-25 1979-05-25 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
DE3019850A1 DE3019850A1 (de) 1980-11-27
DE3019850C2 true DE3019850C2 (enEXAMPLES) 1992-02-06

Family

ID=13243870

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19803019850 Granted DE3019850A1 (de) 1979-05-25 1980-05-23 Halbleitervorrichtung und verfahren zu ihrer herstellung

Country Status (3)

Country Link
US (3) US4586238A (enEXAMPLES)
JP (1) JPS55156370A (enEXAMPLES)
DE (1) DE3019850A1 (enEXAMPLES)

Families Citing this family (37)

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US5348898A (en) * 1979-05-25 1994-09-20 Hitachi, Ltd. Semiconductor device and method for manufacturing the same
JPS55156370A (en) * 1979-05-25 1980-12-05 Hitachi Ltd Manufacture of semiconductor device
US5252505A (en) * 1979-05-25 1993-10-12 Hitachi, Ltd. Method for manufacturing a semiconductor device
JPS5736844A (en) * 1980-08-15 1982-02-27 Hitachi Ltd Semiconductor device
JPS57114283A (en) * 1981-01-08 1982-07-16 Toshiba Corp Non-volatile semiconductive memory
EP0061512B1 (de) * 1981-04-01 1985-09-18 Deutsche ITT Industries GmbH Integrierte Schaltungsanordnung zum Schreiben, Lesen und Löschen von Speichermatrizen mit Isolierschicht-Feldeffekttransistoren nichtflüchtigen Speicherverhaltens
US4516313A (en) * 1983-05-27 1985-05-14 Ncr Corporation Unified CMOS/SNOS semiconductor fabrication process
NL8304256A (nl) * 1983-12-09 1985-07-01 Philips Nv Halfgeleiderinrichting.
KR940011426B1 (ko) * 1985-07-26 1994-12-15 가부시기가이샤 히다찌세이사꾸쇼 반도체 기억 장치
JPH0789569B2 (ja) * 1986-03-26 1995-09-27 株式会社日立製作所 半導体集積回路装置及びその製造方法
US4922311A (en) * 1987-12-04 1990-05-01 American Telephone And Telegraph Company Folded extended window field effect transistor
US5057448A (en) * 1988-02-26 1991-10-15 Hitachi, Ltd. Method of making a semiconductor device having DRAM cells and floating gate memory cells
JP2654449B2 (ja) * 1988-06-09 1997-09-17 株式会社日立製作所 半導体集積回路装置及びその製造方法
JPH0271499A (ja) * 1988-09-06 1990-03-12 Hitachi Ltd 半導体記憶装置
JP2515009B2 (ja) * 1989-01-13 1996-07-10 株式会社東芝 不揮発性半導体メモリの製造方法
JPH0338475U (enEXAMPLES) * 1989-08-24 1991-04-15
JP2572653B2 (ja) * 1989-12-29 1997-01-16 セイコーエプソン株式会社 半導体装置の製造方法
US5624741A (en) * 1990-05-31 1997-04-29 E. I. Du Pont De Nemours And Company Interconnect structure having electrical conduction paths formable therein
JPH04123471A (ja) 1990-09-14 1992-04-23 Oki Electric Ind Co Ltd 半導体記憶装置のデータ書込みおよび消去方法
US5286992A (en) * 1990-09-28 1994-02-15 Actel Corporation Low voltage device in a high voltage substrate
JP3266644B2 (ja) * 1991-04-08 2002-03-18 テキサス インスツルメンツ インコーポレイテツド ゲートアレイ装置
US5514616A (en) * 1991-08-26 1996-05-07 Lsi Logic Corporation Depositing and densifying glass to planarize layers in semi-conductor devices based on CMOS structures
US5619063A (en) * 1993-07-07 1997-04-08 Actel Corporation Edgeless, self-aligned, differential oxidation enhanced and difusion-controlled minimum-geometry antifuse and method of fabrication
US5498895A (en) * 1993-07-07 1996-03-12 Actel Corporation Process ESD protection devices for use with antifuses
US5369054A (en) * 1993-07-07 1994-11-29 Actel Corporation Circuits for ESD protection of metal-to-metal antifuses during processing
DE69330564T2 (de) * 1993-12-15 2002-06-27 Stmicroelectronics S.R.L., Agrate Brianza Integrierte Schaltung die eine EEPROM-Zelle und einen MOS-Transistor enthält
US5783470A (en) * 1995-12-14 1998-07-21 Lsi Logic Corporation Method of making CMOS dynamic random-access memory structures and the like
US5824596A (en) * 1996-08-08 1998-10-20 National Semiconductor Corporation POCl3 process flow for doping polysilicon without forming oxide pillars or gate oxide shorts
US5909049A (en) * 1997-02-11 1999-06-01 Actel Corporation Antifuse programmed PROM cell
JP4014708B2 (ja) * 1997-08-21 2007-11-28 株式会社ルネサステクノロジ 半導体集積回路装置の設計方法
JP3408466B2 (ja) * 1999-08-23 2003-05-19 エヌイーシーマイクロシステム株式会社 半導体記憶装置
JP2001332561A (ja) * 2000-05-22 2001-11-30 Nec Corp バイポーラトランジスタおよびその製造方法
TW497151B (en) * 2001-09-21 2002-08-01 Mosel Vitelic Inc Method for producing semiconductor with increased threshold voltage uniformity of transistor
JP4547852B2 (ja) * 2002-09-04 2010-09-22 富士ゼロックス株式会社 電気部品の製造方法
KR100623633B1 (ko) * 2004-05-19 2006-09-18 이태복 고 내압용 반도체 소자의 제조방법
JP4991134B2 (ja) * 2005-09-15 2012-08-01 ルネサスエレクトロニクス株式会社 半導体装置およびその製造方法
CN109524457B (zh) * 2017-09-20 2021-11-02 联华电子股份有限公司 半导体装置

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1153428A (en) * 1965-06-18 1969-05-29 Philips Nv Improvements in Semiconductor Devices.
US3882469A (en) * 1971-11-30 1975-05-06 Texas Instruments Inc Non-volatile variable threshold memory cell
US3853633A (en) * 1972-12-04 1974-12-10 Motorola Inc Method of making a semi planar insulated gate field-effect transistor device with implanted field
US3983572A (en) * 1973-07-09 1976-09-28 International Business Machines Semiconductor devices
US4027380A (en) * 1974-06-03 1977-06-07 Fairchild Camera And Instrument Corporation Complementary insulated gate field effect transistor structure and process for fabricating the structure
US4053798A (en) * 1975-02-20 1977-10-11 Matsushita Electronics Corporation Negative resistance device
JPS51147976A (en) * 1975-06-02 1976-12-18 Ncr Co Nnchannel silicone added polysilicon gate semiconductor device and method of producing same
JPS5228229A (en) * 1975-08-28 1977-03-03 Mitsubishi Electric Corp Semiconductor memory
JPS5286083A (en) * 1976-01-12 1977-07-16 Hitachi Ltd Production of complimentary isolation gate field effect transistor
JPS52131483A (en) * 1976-04-28 1977-11-04 Hitachi Ltd Mis-type semiconductor device
US4099069A (en) * 1976-10-08 1978-07-04 Westinghouse Electric Corp. Circuit producing a common clear signal for erasing selected arrays in a mnos memory system
US4179311A (en) * 1977-01-17 1979-12-18 Mostek Corporation Method of stabilizing semiconductor device by converting doped poly-Si to polyoxides
JPS53102684A (en) * 1977-02-18 1978-09-07 Mitsubishi Electric Corp Semiconductor memory device
JPS53124084A (en) * 1977-04-06 1978-10-30 Hitachi Ltd Semiconductor memory device containing floating type poly silicon layer and its manufacture
DE2746234A1 (de) * 1977-10-14 1979-04-19 Itt Ind Gmbh Deutsche Feldeffekt-speichertransistor und speichermatrix
JPS5457875A (en) * 1977-10-17 1979-05-10 Hitachi Ltd Semiconductor nonvolatile memory device
US4384399A (en) * 1978-03-20 1983-05-24 Texas Instruments Incorporated Method of making a metal programmable MOS read only memory device
US4385432A (en) * 1978-05-18 1983-05-31 Texas Instruments Incorporated Closely-spaced double level conductors for MOS read only
JPS5529116A (en) * 1978-08-23 1980-03-01 Hitachi Ltd Manufacture of complementary misic
US4377818A (en) * 1978-11-02 1983-03-22 Texas Instruments Incorporated High density electrically programmable ROM
NL7903158A (nl) * 1979-04-23 1980-10-27 Philips Nv Werkwijze voor het vervaardigen van een veldeffekt- transistor met geisoleerde poortelektrode, en transistor vervaardigd door toepassing van een derge- lijke werkwijze.
JPS55156370A (en) * 1979-05-25 1980-12-05 Hitachi Ltd Manufacture of semiconductor device
US4306916A (en) * 1979-09-20 1981-12-22 American Microsystems, Inc. CMOS P-Well selective implant method
KR910009739B1 (ko) * 1988-07-13 1991-11-29 삼성전자 주식회사 반도체장치의 제조방법

Also Published As

Publication number Publication date
JPS55156370A (en) 1980-12-05
JPH0219980B2 (enEXAMPLES) 1990-05-07
US5114870A (en) 1992-05-19
DE3019850A1 (de) 1980-11-27
US4851364A (en) 1989-07-25
US4586238A (en) 1986-05-06

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Legal Events

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OB Request for examination as to novelty
OC Search report available
8128 New person/name/address of the agent

Representative=s name: STREHL, P., DIPL.-ING. DIPL.-WIRTSCH.-ING. SCHUEBE

8110 Request for examination paragraph 44
8125 Change of the main classification

Ipc: G11C 17/06

D2 Grant after examination
8364 No opposition during term of opposition