DE102010032823B4 - Verfahren sowie ein Massenspektrometer zum Nachweis von Ionen oder nachionisierten Neutralteilchen aus Proben - Google Patents

Verfahren sowie ein Massenspektrometer zum Nachweis von Ionen oder nachionisierten Neutralteilchen aus Proben Download PDF

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Publication number
DE102010032823B4
DE102010032823B4 DE102010032823A DE102010032823A DE102010032823B4 DE 102010032823 B4 DE102010032823 B4 DE 102010032823B4 DE 102010032823 A DE102010032823 A DE 102010032823A DE 102010032823 A DE102010032823 A DE 102010032823A DE 102010032823 B4 DE102010032823 B4 DE 102010032823B4
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Prior art keywords
ion beam
mass
ions
ion
decoupled
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German (de)
English (en)
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DE102010032823A1 (de
Inventor
Dr. Niehuis Ewald
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ION TOF TECHNOLOGIES GmbH
ION-TOF TECHNOLOGIES GmbH
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ION TOF TECHNOLOGIES GmbH
ION-TOF TECHNOLOGIES GmbH
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Priority to DE102010032823A priority Critical patent/DE102010032823B4/de
Application filed by ION TOF TECHNOLOGIES GmbH, ION-TOF TECHNOLOGIES GmbH filed Critical ION TOF TECHNOLOGIES GmbH
Priority to CA2806746A priority patent/CA2806746C/en
Priority to KR1020137004099A priority patent/KR101513236B1/ko
Priority to EP13163548.4A priority patent/EP2615624A1/en
Priority to CN201180037512.XA priority patent/CN103038858B/zh
Priority to PCT/EP2011/003803 priority patent/WO2012013354A1/en
Priority to US13/811,455 priority patent/US8785844B2/en
Priority to JP2013521018A priority patent/JP5695193B2/ja
Priority to EP11741111.6A priority patent/EP2599104B1/en
Publication of DE102010032823A1 publication Critical patent/DE102010032823A1/de
Application granted granted Critical
Publication of DE102010032823B4 publication Critical patent/DE102010032823B4/de
Priority to US14/336,252 priority patent/US20140346340A1/en
Priority to JP2015021180A priority patent/JP5890921B2/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE102010032823A 2010-07-30 2010-07-30 Verfahren sowie ein Massenspektrometer zum Nachweis von Ionen oder nachionisierten Neutralteilchen aus Proben Active DE102010032823B4 (de)

Priority Applications (11)

Application Number Priority Date Filing Date Title
DE102010032823A DE102010032823B4 (de) 2010-07-30 2010-07-30 Verfahren sowie ein Massenspektrometer zum Nachweis von Ionen oder nachionisierten Neutralteilchen aus Proben
EP11741111.6A EP2599104B1 (en) 2010-07-30 2011-07-28 Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples
EP13163548.4A EP2615624A1 (en) 2010-07-30 2011-07-28 Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples
CN201180037512.XA CN103038858B (zh) 2010-07-30 2011-07-28 用于检测来自样品的离子或随后电离的中性粒子的方法及质谱仪及其用途
PCT/EP2011/003803 WO2012013354A1 (en) 2010-07-30 2011-07-28 Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples
US13/811,455 US8785844B2 (en) 2010-07-30 2011-07-28 Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples
CA2806746A CA2806746C (en) 2010-07-30 2011-07-28 Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples
KR1020137004099A KR101513236B1 (ko) 2010-07-30 2011-07-28 샘플에서 이온 또는 이어서 이온화된 중성 입자를 검출하기 위한 방법 및 질량 분석계의 사용
JP2013521018A JP5695193B2 (ja) 2010-07-30 2011-07-28 イオン又は後にイオン化される中性粒子を試料から検出する方法、質量分析計、及びその使用
US14/336,252 US20140346340A1 (en) 2010-07-30 2014-07-21 Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples
JP2015021180A JP5890921B2 (ja) 2010-07-30 2015-02-05 イオン又は後にイオン化される中性粒子を試料から検出する方法、質量分析計、及びその使用

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102010032823A DE102010032823B4 (de) 2010-07-30 2010-07-30 Verfahren sowie ein Massenspektrometer zum Nachweis von Ionen oder nachionisierten Neutralteilchen aus Proben

Publications (2)

Publication Number Publication Date
DE102010032823A1 DE102010032823A1 (de) 2012-02-02
DE102010032823B4 true DE102010032823B4 (de) 2013-02-07

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DE102010032823A Active DE102010032823B4 (de) 2010-07-30 2010-07-30 Verfahren sowie ein Massenspektrometer zum Nachweis von Ionen oder nachionisierten Neutralteilchen aus Proben

Country Status (8)

Country Link
US (2) US8785844B2 (zh)
EP (2) EP2615624A1 (zh)
JP (2) JP5695193B2 (zh)
KR (1) KR101513236B1 (zh)
CN (1) CN103038858B (zh)
CA (1) CA2806746C (zh)
DE (1) DE102010032823B4 (zh)
WO (1) WO2012013354A1 (zh)

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JP7078382B2 (ja) * 2017-11-22 2022-05-31 藤太郎 今坂 飛行時間型質量分析装置及び質量分析方法
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Also Published As

Publication number Publication date
JP5890921B2 (ja) 2016-03-22
JP5695193B2 (ja) 2015-04-01
EP2615624A1 (en) 2013-07-17
EP2599104A1 (en) 2013-06-05
CA2806746A1 (en) 2012-02-02
EP2599104B1 (en) 2019-10-30
US20140346340A1 (en) 2014-11-27
WO2012013354A1 (en) 2012-02-02
CN103038858B (zh) 2016-02-17
CA2806746C (en) 2017-02-21
DE102010032823A1 (de) 2012-02-02
US8785844B2 (en) 2014-07-22
CN103038858A (zh) 2013-04-10
KR20130073932A (ko) 2013-07-03
JP2015084347A (ja) 2015-04-30
KR101513236B1 (ko) 2015-04-17
JP2013532886A (ja) 2013-08-19
US20130119249A1 (en) 2013-05-16

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