CN1145066C - 平板显示器或探针块的支撑框架 - Google Patents
平板显示器或探针块的支撑框架 Download PDFInfo
- Publication number
- CN1145066C CN1145066C CNB001179705A CN00117970A CN1145066C CN 1145066 C CN1145066 C CN 1145066C CN B001179705 A CNB001179705 A CN B001179705A CN 00117970 A CN00117970 A CN 00117970A CN 1145066 C CN1145066 C CN 1145066C
- Authority
- CN
- China
- Prior art keywords
- deckle board
- inside surface
- along
- move
- deckle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/88—Mounting, supporting, spacing, or insulating of electrodes or of electrode assemblies
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Automatic Cycles, And Cycles In General (AREA)
Abstract
Description
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24510499A JP3350899B2 (ja) | 1999-08-31 | 1999-08-31 | プローブブロックの支持枠体 |
JP245104/1999 | 1999-08-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1291728A CN1291728A (zh) | 2001-04-18 |
CN1145066C true CN1145066C (zh) | 2004-04-07 |
Family
ID=17128684
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB001179705A Expired - Lifetime CN1145066C (zh) | 1999-08-31 | 2000-06-06 | 平板显示器或探针块的支撑框架 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6450469B1 (zh) |
EP (1) | EP1081497A3 (zh) |
JP (1) | JP3350899B2 (zh) |
KR (1) | KR20010020825A (zh) |
CN (1) | CN1145066C (zh) |
IT (1) | IT1320603B1 (zh) |
TW (1) | TW459140B (zh) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7073768B2 (en) * | 2002-07-12 | 2006-07-11 | John Piscovich | Device and method for setting a frame |
JP3457938B2 (ja) * | 2000-10-16 | 2003-10-20 | 株式会社双晶テック | 表示基板又は回路基板の検査装置における表示基板又は回路基板の交換方法 |
TW509329U (en) * | 2001-04-19 | 2002-11-01 | Hannstar Display Corp | Electrified rack |
KR20020091691A (ko) * | 2001-05-31 | 2002-12-06 | 주식회사 현대 디스플레이 테크놀로지 | 액정표시장치 테스트 프레임 |
CN1309248C (zh) * | 2002-08-02 | 2007-04-04 | Nec液晶技术株式会社 | 显示器和显示板的支撑框架及其制造方法 |
US20040051693A1 (en) * | 2002-09-12 | 2004-03-18 | Ming-Jian Chen | Electronic screen having display panel displayed in changeable length-width ratio |
US7012583B2 (en) * | 2003-02-07 | 2006-03-14 | Shimadzu Corporation | Apparatus and method for testing pixels of flat panel display |
US7319335B2 (en) | 2004-02-12 | 2008-01-15 | Applied Materials, Inc. | Configurable prober for TFT LCD array testing |
US6833717B1 (en) | 2004-02-12 | 2004-12-21 | Applied Materials, Inc. | Electron beam test system with integrated substrate transfer module |
US7355418B2 (en) * | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
JP4790997B2 (ja) * | 2004-03-26 | 2011-10-12 | 株式会社日本マイクロニクス | プローブ装置 |
JP4570930B2 (ja) * | 2004-10-22 | 2010-10-27 | 株式会社日本マイクロニクス | パネルの検査装置に用いられる電気的接続装置 |
KR100776177B1 (ko) * | 2004-12-17 | 2007-11-16 | 주식회사 디이엔티 | 평판 표시패널 검사장치용 워크 테이블 |
US7535238B2 (en) * | 2005-04-29 | 2009-05-19 | Applied Materials, Inc. | In-line electron beam test system |
US20070018062A1 (en) * | 2005-07-20 | 2007-01-25 | Theodor Calinescu | Universal wall mount bracket for displays |
KR100748072B1 (ko) * | 2005-08-01 | 2007-08-09 | 가부시키가이샤 니혼 마이크로닉스 | 표시패널의 전기검사장치 |
JP4916712B2 (ja) * | 2005-12-16 | 2012-04-18 | 株式会社日本マイクロニクス | 表示パネル検査装置 |
CN102353890B (zh) * | 2006-03-14 | 2014-09-24 | 应用材料公司 | 减小多个柱状电子束测试系统中的串扰的方法 |
US7602199B2 (en) | 2006-05-31 | 2009-10-13 | Applied Materials, Inc. | Mini-prober for TFT-LCD testing |
US7786742B2 (en) | 2006-05-31 | 2010-08-31 | Applied Materials, Inc. | Prober for electronic device testing on large area substrates |
JP4917852B2 (ja) * | 2006-08-21 | 2012-04-18 | 株式会社日本マイクロニクス | パネル支持機構及び検査装置 |
GB0711626D0 (en) * | 2007-06-18 | 2007-07-25 | Barco Nv | Support for direct light displays |
KR100911236B1 (ko) * | 2007-08-22 | 2009-08-06 | 주식회사 플라켐 | 블록형 엘이디 조명장치 |
JP4845897B2 (ja) * | 2008-01-15 | 2011-12-28 | 株式会社東芝 | サンプルステージ |
KR100920383B1 (ko) * | 2009-01-29 | 2009-10-07 | 주식회사 에이디피엔지니어링 | 평판표시소자 제조장치 |
JP5470456B2 (ja) * | 2010-06-17 | 2014-04-16 | シャープ株式会社 | 点灯検査装置 |
KR101102556B1 (ko) | 2010-06-30 | 2012-01-03 | (주)이노셈코리아 | 맞춤형 소비전력 및 멀티형성을 갖는 탈·부착식 led 모듈 |
CN102455528B (zh) * | 2010-10-27 | 2015-01-07 | 纬创资通股份有限公司 | 结合上下盖外观件的平面显示器 |
TWI435294B (zh) * | 2010-12-03 | 2014-04-21 | Wistron Corp | 無膠框結構的平面顯示器 |
US20130128513A1 (en) * | 2011-11-18 | 2013-05-23 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Mold for Back Frame and Bracing Piece, Method for Manufacturing Back Frame, and Backlight System |
CN102830517B (zh) * | 2012-08-28 | 2015-02-18 | 深圳市华星光电技术有限公司 | 一种背框和液晶显示装置 |
US8850992B1 (en) * | 2013-05-22 | 2014-10-07 | Itoro Akpaffiong | Portable articulated support frame for supporting objects on a user's lap |
KR102242643B1 (ko) * | 2014-10-30 | 2021-04-22 | 주성엔지니어링(주) | 유기 발광 장치 |
CN104360510B (zh) * | 2014-11-24 | 2018-02-16 | 合肥鑫晟光电科技有限公司 | 一种检测用探针块及其检测装置 |
KR102608599B1 (ko) | 2018-08-16 | 2023-12-01 | 삼성디스플레이 주식회사 | 압력 센서를 테스트하는 장치 및 방법 그리고 이를 이용한 표시 장치 |
KR102081610B1 (ko) * | 2019-04-17 | 2020-02-26 | 우리마이크론(주) | 원장 패널 이송 장치, 디스플레이 패널 검사 장치 및 디스플레이 패널 검사 설비 |
WO2020213901A1 (ko) * | 2019-04-17 | 2020-10-22 | 우리마이크론(주) | 원장 패널 이송 장치, 디스플레이 패널 검사 장치 및 디스플레이 패널 검사 설비 |
KR102097455B1 (ko) * | 2019-07-01 | 2020-04-07 | 우리마이크론(주) | 디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치 |
JP7250182B2 (ja) * | 2019-07-01 | 2023-03-31 | メガセン・カンパニー・リミテッド | ディスプレイパネル検査のためのプローブブロック組立体、この制御方法およびディスプレイパネル検査装置 |
KR102097456B1 (ko) * | 2019-07-01 | 2020-04-07 | 우리마이크론(주) | 디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치 |
KR102154760B1 (ko) * | 2020-03-30 | 2020-09-10 | 우리마이크론(주) | 디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치 |
KR102154758B1 (ko) * | 2020-03-30 | 2020-09-10 | 우리마이크론(주) | 디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3612508A (en) * | 1970-04-08 | 1971-10-12 | Gen Motors Corp | Heater core fixture for face soldering |
JPS5391376A (en) * | 1977-01-24 | 1978-08-11 | Hirohide Yano | Device for inspecting printed board |
US5003254A (en) * | 1989-11-02 | 1991-03-26 | Huntron, Inc. | Multi-axis universal circuit board test fixture |
JPH0996802A (ja) * | 1995-10-03 | 1997-04-08 | Sharp Corp | 液晶パネル製造用治具 |
JP3592831B2 (ja) * | 1996-02-26 | 2004-11-24 | 株式会社日本マイクロニクス | プローブユニット及びその調節方法 |
US5954106A (en) * | 1998-05-18 | 1999-09-21 | Huang; Jin Lai | Work bench having an adjustable guide |
US6150833A (en) * | 1999-02-03 | 2000-11-21 | Industrial Technology Research Institute | LCD panel power-up test fixture and method of using |
-
1999
- 1999-08-31 JP JP24510499A patent/JP3350899B2/ja not_active Expired - Lifetime
-
2000
- 2000-04-26 TW TW089107918A patent/TW459140B/zh not_active IP Right Cessation
- 2000-05-05 US US09/566,010 patent/US6450469B1/en not_active Expired - Fee Related
- 2000-05-05 EP EP00303804A patent/EP1081497A3/en not_active Withdrawn
- 2000-05-10 KR KR1020000024824A patent/KR20010020825A/ko not_active Application Discontinuation
- 2000-06-06 CN CNB001179705A patent/CN1145066C/zh not_active Expired - Lifetime
- 2000-08-25 IT IT2000TO000817A patent/IT1320603B1/it active
Also Published As
Publication number | Publication date |
---|---|
EP1081497A2 (en) | 2001-03-07 |
KR20010020825A (ko) | 2001-03-15 |
US6450469B1 (en) | 2002-09-17 |
JP3350899B2 (ja) | 2002-11-25 |
CN1291728A (zh) | 2001-04-18 |
JP2001074599A (ja) | 2001-03-23 |
ITTO20000817A1 (it) | 2002-02-25 |
EP1081497A3 (en) | 2004-05-12 |
TW459140B (en) | 2001-10-11 |
IT1320603B1 (it) | 2003-12-10 |
ITTO20000817A0 (it) | 2000-08-25 |
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C14 | Grant of patent or utility model | ||
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Owner name: JAPAN MICRONIX CO LTD Free format text: FORMER OWNER: EDITEC ENGINEERING CO., LTD. Effective date: 20061124 Owner name: EDITEC ENGINEERING CO., LTD. Free format text: FORMER OWNER: DOUBLE-CRYSTAL TECHNOLOGY CO., LTD.; EDITEC ENGINEERING CO., LTD. Effective date: 20061124 |
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Effective date of registration: 20061124 Address after: Tokyo, Japan Patentee after: Kabushiki Kaisha NIHON MICRONICS Address before: Tokyo, Japan Patentee before: Aditech Engineering Co.,Ltd. Effective date of registration: 20061124 Address after: Tokyo, Japan Patentee after: Aditech Engineering Co.,Ltd. Address before: Kanagawa Co-patentee before: Aditech Engineering Co.,Ltd. Patentee before: Soshotech Co.,Ltd. |
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