JP4917852B2 - パネル支持機構及び検査装置 - Google Patents
パネル支持機構及び検査装置 Download PDFInfo
- Publication number
- JP4917852B2 JP4917852B2 JP2006224387A JP2006224387A JP4917852B2 JP 4917852 B2 JP4917852 B2 JP 4917852B2 JP 2006224387 A JP2006224387 A JP 2006224387A JP 2006224387 A JP2006224387 A JP 2006224387A JP 4917852 B2 JP4917852 B2 JP 4917852B2
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- JP
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- Prior art keywords
- plate
- panel
- support mechanism
- positioning
- panel support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000007689 inspection Methods 0.000 title claims description 64
- 239000000758 substrate Substances 0.000 claims description 48
- 230000001105 regulatory effect Effects 0.000 claims description 16
- 238000009434 installation Methods 0.000 claims description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 52
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
Description
前記実施形態では、図1,2に基づいてパネル支持機構1の例を説明したが、このパネル支持機構1の構成は一例であって、他の構成のパネル支持機構でもよい。前記位置決め機構7を取り付けることができる構造のパネル支持機構であれば、本発明を適用することができ、前記同様の作用、効果を奏することができる。
Claims (5)
- 検査対象板の電極と接触子とを互いに接触させるために、当該検査対象板を正確に位置決めして支持するパネル支持機構であって、
装置本体側に取り付けられる固定ベースと、
当該固定ベース上に4つ組み合わせて矩形状にかつ前記検査対象板の寸法に合わせて移動可能に配置された可動ベースと、
当該各可動ベースのいずれかに設けられ前記検査対象板の縁部に当接して当該検査対象板を位置決めするストッパピンと、
当該ストッパピンに対向する位置に前記検査対象板を挟んで設けられ当該ストッパピンと相まって前記検査対象板を挟み持つパネルクランプと、
前記ストッパピン又はパネルクランプを支持した状態で前記可動ベースに取り付けられる位置決め機構とを備え、
前記位置決め機構が、前記ストッパピン又はパネルクランプを支持する基板と、前記検査対象板の縁部に当接する前記ストッパピン又はパネルクランプを支持した前記基板を、前記検査対象板の縁部に並行な方向には移動可能にかつ前記縁部に直交する方向には設定位置で固定して支持する位置規制プレートと、当該位置規制プレートに並行に配設されて当該位置規制プレートに支持された前記基板を、前記検査対象板の縁部に並行な方向の位置決めをして支持する位置決めプレートとを備えて構成されたことを特徴とするパネル支持機構。 - 請求項1に記載のパネル支持機構において、
前記基板が、前記検査対象板の縁部に並行な方向に長く形成された、当該基板を前記位置規制プレートに固定するネジを通す長穴と、前記基板を前記位置決めプレートに固定するネジを通して前記検査対象板の縁部に並行な方向の位置決めをする円穴とを備え、
前記位置規制プレートが、前記基板の長穴に通されたネジがねじ込まれるネジ穴を、前記検査対象板の縁部に並行な方向に複数備え、
前記位置決めプレートが、前記基板の円穴に通されたネジがねじ込まれるネジ穴を、前記基板の設置位置に合わせて1又は複数備えたことを特徴とするパネル支持機構。 - 請求項1又は2に記載のパネル支持機構において、
前記位置決めプレートに嵌合部が設けられると共に、前記可動ベースに前記位置決めプレートの嵌合部が嵌合する被嵌合部が設けられ、
前記ネジ穴の配設位置を変えた複数の前記位置決めプレートを適宜付け替えることを特徴とするパネル支持機構。 - 請求項3に記載のパネル支持機構において、
前記嵌合部が、前記位置決めプレートの両端に設けられたピン穴で構成され、
前記被嵌合部が、前記可動ベースに設けられた2つの嵌合ピンで構成されたることを特徴とするパネル支持機構。 - 検査対象板の電極と接触子とを互いに接触させて通電試験を行う検査装置において、
前記検査対象板を正確に位置決めして支持するパネル支持機構を備え、
当該パネル支持機構として前記請求項1ないし4のいずれか1項に記載のパネル支持機構を用いたことを特徴とする検査装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006224387A JP4917852B2 (ja) | 2006-08-21 | 2006-08-21 | パネル支持機構及び検査装置 |
TW096119998A TWI328686B (en) | 2006-08-21 | 2007-06-04 | Panel supporting mechanism and inspection apparatus |
KR1020070063273A KR100822023B1 (ko) | 2006-08-21 | 2007-06-26 | 패널 지지기구 및 검사 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006224387A JP4917852B2 (ja) | 2006-08-21 | 2006-08-21 | パネル支持機構及び検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008046085A JP2008046085A (ja) | 2008-02-28 |
JP4917852B2 true JP4917852B2 (ja) | 2012-04-18 |
Family
ID=39179954
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006224387A Active JP4917852B2 (ja) | 2006-08-21 | 2006-08-21 | パネル支持機構及び検査装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4917852B2 (ja) |
KR (1) | KR100822023B1 (ja) |
TW (1) | TWI328686B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100843951B1 (ko) | 2008-04-15 | 2008-07-03 | 오상협 | 백라이트 유닛 지그 팔레트 |
CN109031712B (zh) * | 2018-07-17 | 2024-04-05 | 武汉精测电子集团股份有限公司 | 一种通用型电子屏幕定位载具 |
KR102112555B1 (ko) * | 2019-11-21 | 2020-05-19 | 케이맥(주) | 이종 사이즈 디스플레이 패널 검사 장치 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4280312B2 (ja) | 1996-12-25 | 2009-06-17 | 株式会社日本マイクロニクス | プローブユニット |
JP3919320B2 (ja) | 1998-02-19 | 2007-05-23 | 株式会社日本マイクロニクス | 検査ステージ |
JP3350899B2 (ja) * | 1999-08-31 | 2002-11-25 | 株式会社双晶テック | プローブブロックの支持枠体 |
KR100560162B1 (ko) * | 2004-03-31 | 2006-03-10 | 주식회사 디이엔티 | 평면 디스플레이 검사장치 |
JP4570930B2 (ja) * | 2004-10-22 | 2010-10-27 | 株式会社日本マイクロニクス | パネルの検査装置に用いられる電気的接続装置 |
-
2006
- 2006-08-21 JP JP2006224387A patent/JP4917852B2/ja active Active
-
2007
- 2007-06-04 TW TW096119998A patent/TWI328686B/zh active
- 2007-06-26 KR KR1020070063273A patent/KR100822023B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
TW200813452A (en) | 2008-03-16 |
KR100822023B1 (ko) | 2008-04-15 |
KR20080017246A (ko) | 2008-02-26 |
JP2008046085A (ja) | 2008-02-28 |
TWI328686B (en) | 2010-08-11 |
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