CN1129214C - Ic插座及ic测试装置 - Google Patents

Ic插座及ic测试装置 Download PDF

Info

Publication number
CN1129214C
CN1129214C CN99811988A CN99811988A CN1129214C CN 1129214 C CN1129214 C CN 1129214C CN 99811988 A CN99811988 A CN 99811988A CN 99811988 A CN99811988 A CN 99811988A CN 1129214 C CN1129214 C CN 1129214C
Authority
CN
China
Prior art keywords
pipe
socket
bottom plate
hole
shell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN99811988A
Other languages
English (en)
Chinese (zh)
Other versions
CN1323457A (zh
Inventor
渡边文男
竹下觉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of CN1323457A publication Critical patent/CN1323457A/zh
Application granted granted Critical
Publication of CN1129214C publication Critical patent/CN1129214C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
CN99811988A 1999-11-17 1999-11-17 Ic插座及ic测试装置 Expired - Fee Related CN1129214C (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1999/006404 WO2001037381A1 (fr) 1999-11-17 1999-11-17 Douille de circuit integre et testeur de circuit integre

Publications (2)

Publication Number Publication Date
CN1323457A CN1323457A (zh) 2001-11-21
CN1129214C true CN1129214C (zh) 2003-11-26

Family

ID=14237317

Family Applications (1)

Application Number Title Priority Date Filing Date
CN99811988A Expired - Fee Related CN1129214C (zh) 1999-11-17 1999-11-17 Ic插座及ic测试装置

Country Status (6)

Country Link
US (1) US6464511B1 (fr)
JP (1) JP3527724B2 (fr)
KR (1) KR100373152B1 (fr)
CN (1) CN1129214C (fr)
DE (1) DE19983903T1 (fr)
WO (1) WO2001037381A1 (fr)

Families Citing this family (110)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1795906B1 (fr) 2000-06-16 2009-10-28 Nhk Spring Co.Ltd. Sonde de microcontact
WO2002010675A1 (fr) * 2000-07-31 2002-02-07 Lecroy Corporation Pointe a ressort souple de sonde pour une sonde de test electrique
US20030176113A1 (en) * 2000-09-22 2003-09-18 Yuichiro Sasaki Spring element, press-clamped connector, and holder with probe for electro-acoustic component
KR100562602B1 (ko) * 2000-10-26 2006-03-17 신에츠 폴리머 가부시키가이샤 압접 협지형 커넥터 및 그 접속 구조
JP3443687B2 (ja) * 2001-02-19 2003-09-08 株式会社エンプラス 電気部品用ソケット
JP3767810B2 (ja) * 2001-04-27 2006-04-19 株式会社ヨコオ スプリングコネクタ
GB0119480D0 (en) 2001-08-09 2001-10-03 Jagotec Ag Novel compositions
US6565395B1 (en) * 2001-12-21 2003-05-20 Northrop Grumman Corporation Electrical connection to a coil spring through a local interference fit for connection to a vibratory rotation sensor and method of forming the same
US6685492B2 (en) * 2001-12-27 2004-02-03 Rika Electronics International, Inc. Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition
CN1327575C (zh) * 2001-12-28 2007-07-18 日本发条株式会社 测试用插座
JP3899075B2 (ja) * 2002-03-05 2007-03-28 リカ デンシ アメリカ， インコーポレイテッド 電子パッケージと試験機器をインターフェースするための装置
DE10211798A1 (de) * 2002-03-16 2004-05-19 Festo Ag & Co. Kontaktierungseinrichtung für Ventilantriebe und damit ausgestattete Ventilanordnung
US6966783B2 (en) * 2002-07-09 2005-11-22 Enplas Corporation Contact pin and socket for electrical parts provided with contact pin
US6902410B2 (en) * 2002-07-15 2005-06-07 Enplas Corporation Contact unit and socket for electrical parts
US6844749B2 (en) 2002-07-18 2005-01-18 Aries Electronics, Inc. Integrated circuit test probe
US6720511B2 (en) * 2002-09-05 2004-04-13 Litton Systems, Inc. One-piece semi-rigid electrical contact
KR100898068B1 (ko) * 2002-09-06 2009-05-18 삼성에스디아이 주식회사 이차전지 테스트용 프로브
US20040077225A1 (en) * 2002-10-21 2004-04-22 L & K Precision Industry Co., Ltd. Electrical connector with movable pin
US6894565B1 (en) * 2002-12-03 2005-05-17 Silicon Laboratories, Inc. Fast settling power amplifier regulator
US6846184B2 (en) * 2003-01-24 2005-01-25 High Connection Density Inc. Low inductance electrical contacts and LGA connector system
US6758682B1 (en) * 2003-02-13 2004-07-06 Itt Manufacturing Enterprises, Inc. Pogo contact
US6897730B2 (en) * 2003-03-04 2005-05-24 Silicon Laboratories Inc. Method and apparatus for controlling the output power of a power amplifier
US20060121754A1 (en) * 2003-06-13 2006-06-08 Milos Krejcik Conforming Lid Socket for Leaded Surface Mount Packages
US6866519B2 (en) * 2003-07-10 2005-03-15 Wei-Fang Fan Adaptable resilient pin assembly for BGA based IC encapsulation
JP2005050738A (ja) * 2003-07-31 2005-02-24 Jst Mfg Co Ltd 電気コネクタ
US6776668B1 (en) * 2003-08-01 2004-08-17 Tyco Electronics Corporation Low profile coaxial board-to-board connector
KR100546361B1 (ko) * 2003-08-08 2006-01-26 삼성전자주식회사 반도체 소자 검사장치의 포고 핀 및 그 운용방법
CN2682639Y (zh) * 2003-11-20 2005-03-02 上海莫仕连接器有限公司 压接式导电端子
CN2682641Y (zh) * 2003-11-20 2005-03-02 上海莫仕连接器有限公司 压接式导电端子
US6783405B1 (en) * 2003-11-28 2004-08-31 Chuan Yi Precision Industry Co., Ltd. Terminal for electric connector for communication apparatus
US7315176B2 (en) * 2004-06-16 2008-01-01 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
US7114996B2 (en) * 2004-09-08 2006-10-03 Advanced Interconnections Corporation Double-pogo converter socket terminal
US7690925B2 (en) * 2005-02-24 2010-04-06 Advanced Interconnections Corp. Terminal assembly with pin-retaining socket
JP4471941B2 (ja) * 2005-03-10 2010-06-02 山一電機株式会社 半導体装置用ソケット
JP4886997B2 (ja) * 2005-04-06 2012-02-29 株式会社エンプラス 電気部品用ソケット
US7790987B2 (en) * 2005-04-27 2010-09-07 Sony Computer Entertainment Inc. Methods and apparatus for interconnecting a ball grid array to a printed circuit board
US20060245150A1 (en) * 2005-04-29 2006-11-02 Tingbao Chen Interconnect Cartridge
KR100773250B1 (ko) 2005-06-09 2007-11-05 주식회사 유니테스트 반도체 테스트 인터페이스 및 이를 이용한 반도체 테스트장치
JP2007033438A (ja) * 2005-06-23 2007-02-08 Toto Ltd プローブカード用ガイド部材およびプローブカード
US7108535B1 (en) 2005-07-12 2006-09-19 Spansion, Llc Integrated circuit test socket
JP4487261B2 (ja) * 2005-09-09 2010-06-23 エルピーダメモリ株式会社 Ｉｃソケット
TWM289241U (en) * 2005-10-07 2006-04-01 Lotes Co Ltd Electric connector
US7671613B1 (en) 2006-01-06 2010-03-02 Lecroy Corporation Probing blade conductive connector for use with an electrical test probe
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
US9140724B1 (en) 2006-01-06 2015-09-22 Lecroy Corporation Compensating resistance probing tip optimized adapters for use with specific electrical test probes
US7297004B1 (en) * 2006-02-06 2007-11-20 Antares Advanced Test Technologies, Inc. Crimped tube electrical test socket pin
TWM307751U (en) * 2006-06-05 2007-03-11 Hon Hai Prec Ind Co Ltd Pogo pin
US20080009148A1 (en) * 2006-07-07 2008-01-10 Glenn Goodman Guided pin and plunger
US7425142B1 (en) * 2007-03-16 2008-09-16 Ad-Tech Medical Instrument Corp. Electrical connector for an in-body multi-contact medical electrode device
US7602201B2 (en) * 2007-06-22 2009-10-13 Qualitau, Inc. High temperature ceramic socket configured to test packaged semiconductor devices
JP2009036679A (ja) * 2007-08-02 2009-02-19 Yamaichi Electronics Co Ltd 半導体装置用ソケット
JP4495200B2 (ja) * 2007-09-28 2010-06-30 山一電機株式会社 半導体装置用ソケット
KR100944259B1 (ko) * 2007-11-23 2010-02-24 리노공업주식회사 반도체 칩 테스트용 검사 소켓
CN102126488A (zh) * 2007-12-04 2011-07-20 株式会社万都 压力传感器
MY151561A (en) * 2007-12-06 2014-06-13 Test Tooling Solutions M Sdn Bhd Eco contactor
JP5083327B2 (ja) * 2007-12-27 2012-11-28 山一電機株式会社 半導体装置用ソケット
TWI367330B (en) * 2008-05-22 2012-07-01 King Yuan Electronics Co Ltd Probe socket, and probe card
JP4427598B1 (ja) * 2008-10-30 2010-03-10 株式会社東芝 スタッキングコネクタ、電子機器
JP2010118275A (ja) * 2008-11-13 2010-05-27 Yamaichi Electronics Co Ltd 半導体装置用ソケット
US8324919B2 (en) * 2009-03-27 2012-12-04 Delaware Capital Formation, Inc. Scrub inducing compliant electrical contact
TWI420120B (zh) * 2009-08-27 2013-12-21 Leeno Ind Inc 半導體晶片測試插座
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
CN102263338A (zh) * 2010-05-25 2011-11-30 鸿富锦精密工业（深圳）有限公司 中央处理器插座
DE102011105036B4 (de) * 2010-06-21 2015-06-18 Caetec Gmbh Steckverbinder für mobiles Messtechnik-Modulsystem
WO2011162362A1 (fr) 2010-06-25 2011-12-29 日本発條株式会社 Sonde de contact et unité de sonde
JP5530312B2 (ja) * 2010-09-03 2014-06-25 株式会社エンプラス 電気部品用ソケット
KR101105655B1 (ko) 2010-11-09 2012-01-25 (주)마이크로컨텍솔루션 컨텍
US8808010B2 (en) * 2011-06-06 2014-08-19 Interconnect Devices, Inc. Insulated metal socket
KR101249858B1 (ko) * 2011-08-30 2013-04-05 주식회사 엘지실트론 상정반 가압 유닛 및 이를 포함한 양면 연마 장치
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
JP5842528B2 (ja) * 2011-10-14 2016-01-13 オムロン株式会社 接触子
JP5822735B2 (ja) 2012-01-16 2015-11-24 株式会社ヨコオ 防水機能付きスプリングコネクタ
CN103378432B (zh) * 2012-04-17 2016-08-24 珠海格力电器股份有限公司 连接器及滑动门板结构及空调
US9153890B2 (en) * 2012-04-18 2015-10-06 R+DCircuits, Inc. Singulated elastomer electrical contactor for high performance interconnect systems and method for the same
US10359447B2 (en) * 2012-10-31 2019-07-23 Formfactor, Inc. Probes with spring mechanisms for impeding unwanted movement in guide holes
JP2015004614A (ja) * 2013-06-21 2015-01-08 株式会社ミタカ コンタクトプローブ
US9702680B2 (en) 2013-07-18 2017-07-11 Dynaenergetics Gmbh & Co. Kg Perforation gun components and system
CN103487616A (zh) * 2013-09-27 2014-01-01 昆山迈致治具科技有限公司 一种用于移动终端天线检测的探针
CN203631800U (zh) * 2013-11-26 2014-06-04 番禺得意精密电子工业有限公司 电连接器
CN203942062U (zh) * 2014-02-27 2014-11-12 番禺得意精密电子工业有限公司 电连接器
JP6361174B2 (ja) * 2014-03-06 2018-07-25 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6231690B2 (ja) * 2014-08-08 2017-11-15 日本発條株式会社 接続端子
CN104485536B (zh) * 2014-12-05 2017-01-11 苏州慧捷自动化科技有限公司 一种参数测试头
JP6443081B2 (ja) * 2015-01-28 2018-12-26 住友電装株式会社 コネクタ装置
US11293736B2 (en) 2015-03-18 2022-04-05 DynaEnergetics Europe GmbH Electrical connector
US9784549B2 (en) 2015-03-18 2017-10-10 Dynaenergetics Gmbh & Co. Kg Bulkhead assembly having a pivotable electric contact component and integrated ground apparatus
US9887478B2 (en) * 2015-04-21 2018-02-06 Varian Semiconductor Equipment Associates, Inc. Thermally insulating electrical contact probe
GB2539964A (en) 2015-07-03 2017-01-04 Sevcon Ltd Electronics assembly
JP6553472B2 (ja) * 2015-09-30 2019-07-31 株式会社ヨコオ コンタクタ
US9748686B1 (en) * 2016-02-15 2017-08-29 Texas Instruments Incorporated BGA spring probe pin design
JP6515877B2 (ja) * 2016-06-17 2019-05-22 オムロン株式会社 プローブピン
TWI598594B (zh) * 2016-09-20 2017-09-11 中華精測科技股份有限公司 插銷式探針
JP2018084438A (ja) * 2016-11-21 2018-05-31 株式会社エンプラス 電気接触子及び電気部品用ソケット
HUP1700051A2 (hu) 2017-02-02 2018-08-28 Equip Test Kft Kontaktáló eszköz, fejegység ahhoz, valamint eljárások kontaktáló eszköz és fejegység elõállítására
SG11202002099QA (en) * 2017-09-08 2020-04-29 Enplas Corp Electric connection socket
US10367279B2 (en) * 2017-10-26 2019-07-30 Xilinx, Inc. Pusher pin having a non-electrically conductive portion
JP7063609B2 (ja) * 2017-12-26 2022-05-09 株式会社エンプラス プローブピン及びソケット
CN108649361A (zh) * 2018-05-03 2018-10-12 京东方科技集团股份有限公司 一种辅助连接器
US11339614B2 (en) 2020-03-31 2022-05-24 DynaEnergetics Europe GmbH Alignment sub and orienting sub adapter
US10950966B2 (en) * 2018-10-26 2021-03-16 American Mine Research, Inc. Safety stab technology
CN109787012B (zh) 2019-02-27 2022-03-25 深圳市泰科汉泽精密电子有限公司 弹簧探针
CN110190430A (zh) * 2019-05-30 2019-08-30 深圳市力为电气有限公司 一种免焊连接器
US11158966B2 (en) * 2020-03-26 2021-10-26 TE Connectivity Services Gmbh Collapsable alignment member
US11539167B2 (en) 2020-09-17 2022-12-27 Carlisle Interconnect Technologies, Inc. Adjustable push on connector/adaptor
US11502440B2 (en) * 2020-10-23 2022-11-15 Carlisle Interconnect Technologies, Inc. Multiport connector interface system
US11777244B2 (en) * 2021-02-22 2023-10-03 Te Connectivity Solutions Gmbh Socket connector having array of socket contacts
CN113009196B (zh) * 2021-03-02 2022-03-18 上海捷策创电子科技有限公司 一种芯片测试用探针和芯片测试装置
US11713625B2 (en) 2021-03-03 2023-08-01 DynaEnergetics Europe GmbH Bulkhead
KR102642002B1 (ko) * 2021-07-20 2024-02-27 김철군 더블 포고핀 및 이를 이용하는 테스트 소켓
CN114295873A (zh) * 2021-12-23 2022-04-08 苏州斯丹德电子科技有限公司 一种电路系统用具有压力调节机构的探针测试装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2648120B2 (ja) 1995-02-08 1997-08-27 山一電機株式会社 表面接触形接続器
JPH10214649A (ja) * 1997-01-30 1998-08-11 Yokowo Co Ltd スプリングコネクタおよび該スプリングコネクタを用いた装置
ATE176966T1 (de) * 1997-02-04 1999-03-15 Durtal Sa Federkontaktelement
JPH1126112A (ja) * 1997-07-04 1999-01-29 Tokyo Eletec Kk プリント基板用ターミナル及びｉｃソケット
JP3256174B2 (ja) * 1997-12-12 2002-02-12 株式会社ヨコオ ボールグリッドアレイ用ソケット
JP4086390B2 (ja) 1997-12-26 2008-05-14 ユニテクノ株式会社 電子部品用接触子
JP2002501289A (ja) * 1998-01-05 2002-01-15 ライカ エレクトロニクス インターナショナル、 インコーポレイテッド 同軸接点組立体装置

Also Published As

Publication number Publication date
DE19983903T1 (de) 2002-02-28
WO2001037381A1 (fr) 2001-05-25
CN1323457A (zh) 2001-11-21
JP3527724B2 (ja) 2004-05-17
KR20010106474A (ko) 2001-11-29
KR100373152B1 (ko) 2003-02-25
US6464511B1 (en) 2002-10-15

Similar Documents

Publication Publication Date Title
CN1129214C (zh) Ic插座及ic测试装置
JP6711469B2 (ja) プローブ
CN1255686C (zh) 导电接触单元系统
CN1315135C (zh) 顺应性电接触件
US8721372B2 (en) Contact and electrical connecting apparatus
TWI412747B (zh) 檢查用插座
KR100640626B1 (ko) 포고 핀 및 이를 포함하는 테스트 소켓
CN110462408B (zh) 接触式探针及探针单元
WO2020122006A1 (fr) Sonde
KR102208381B1 (ko) 검사프로브 및 그의 제조방법, 그리고 그를 지지하는 검사소켓
KR102473943B1 (ko) 테스트 소켓용 핀 및 이를 포함하는 테스트 소켓
CN108627677B (zh) 弹性卡销以及具有其的测试插座
JP2002022768A (ja) 集積回路パッケージ検査用ポゴピン
US6814585B2 (en) Electrical connector with resilient contact
CN117741190A (zh) 测试座
KR20090067572A (ko) 포고핀
KR200430815Y1 (ko) 검사용 탐침 장치
KR100371681B1 (ko) 상호 접속 접점 장치
KR102058378B1 (ko) 인터포저 및 그의 제조방법, 그리고 그를 이용한 프로브카드
KR20050108647A (ko) 포고핀 및 이를 이용한 테스트장치
JP4465250B2 (ja) 検査ユニット及びそれを用いた検査装置
KR20200057579A (ko) 탄성접촉형 양방향 도전성 모듈
JPH10282142A (ja) 回路試験プローブ
KR102594175B1 (ko) 반도체 테스트 소켓 및 그 제조 방법
EP3696555B1 (fr) Dispositif de sonde d'une structure flottante

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20031126

Termination date: 20101117