CN101443669B - 基板检查用夹具及其中的连接电极部的电极结构 - Google Patents
基板检查用夹具及其中的连接电极部的电极结构 Download PDFInfo
- Publication number
- CN101443669B CN101443669B CN2007800174904A CN200780017490A CN101443669B CN 101443669 B CN101443669 B CN 101443669B CN 2007800174904 A CN2007800174904 A CN 2007800174904A CN 200780017490 A CN200780017490 A CN 200780017490A CN 101443669 B CN101443669 B CN 101443669B
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/0675—Needle-like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006135867A JP4041831B2 (ja) | 2006-05-15 | 2006-05-15 | 基板検査用治具及びこの治具における接続電極部の電極構造 |
JP135867/2006 | 2006-05-15 | ||
PCT/JP2007/059685 WO2007132739A1 (ja) | 2006-05-15 | 2007-05-10 | 基板検査用治具及びこの治具における接続電極部の電極構造 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101443669A CN101443669A (zh) | 2009-05-27 |
CN101443669B true CN101443669B (zh) | 2012-01-25 |
Family
ID=38693833
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007800174904A Expired - Fee Related CN101443669B (zh) | 2006-05-15 | 2007-05-10 | 基板检查用夹具及其中的连接电极部的电极结构 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4041831B2 (ja) |
KR (1) | KR101021744B1 (ja) |
CN (1) | CN101443669B (ja) |
TW (1) | TWI442070B (ja) |
WO (1) | WO2007132739A1 (ja) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009250917A (ja) * | 2008-04-10 | 2009-10-29 | Nidec-Read Corp | 基板検査用治具及び検査用接触子 |
JP5504698B2 (ja) * | 2009-06-02 | 2014-05-28 | 日本電産リード株式会社 | 検査用治具及び検査用接触子 |
WO2012108066A1 (ja) * | 2011-02-10 | 2012-08-16 | 日本電産リード株式会社 | 検査治具 |
JP2013100994A (ja) * | 2011-11-07 | 2013-05-23 | Nidec-Read Corp | 基板検査治具、治具ベースユニット及び基板検査装置 |
JP5986397B2 (ja) * | 2012-02-28 | 2016-09-06 | 日本電産リード株式会社 | 検査用治具 |
JP2013257195A (ja) * | 2012-06-12 | 2013-12-26 | Nidec-Read Corp | 基板検査治具及び基板検査装置 |
JP6221358B2 (ja) * | 2013-06-04 | 2017-11-01 | 日本電産リード株式会社 | 基板検査方法、及び基板検査装置 |
JP6283929B2 (ja) * | 2013-10-08 | 2018-02-28 | 日本電産リード株式会社 | 検査用治具及び検査用治具の製造方法 |
CN105510758A (zh) * | 2015-11-27 | 2016-04-20 | 湖北三江航天红峰控制有限公司 | 一种用于低电阻导通的设备 |
KR101656047B1 (ko) | 2016-03-23 | 2016-09-09 | 주식회사 나노시스 | 기판 검사용 지그 |
CN114325296A (zh) | 2020-09-30 | 2022-04-12 | 揖斐电株式会社 | 导通检查用治具和印刷布线板的检查方法 |
KR102245761B1 (ko) * | 2021-01-13 | 2021-04-28 | 엘엠디지털 주식회사 | 멀티 그리드 베이스가 구비된 인쇄회로기판 검사용 지그 |
KR102649845B1 (ko) * | 2023-11-29 | 2024-03-21 | 주식회사 나노시스 | 반도체 소자 테스터 지그 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1482468A (zh) * | 2002-09-13 | 2004-03-17 | 中芯国际集成电路制造(上海)有限公 | 检测探针接触电阻的测试结构与方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH065639Y2 (ja) * | 1986-03-20 | 1994-02-09 | 松下電器産業株式会社 | コンタクトピン |
JPH0656401B2 (ja) * | 1986-12-19 | 1994-07-27 | 東京エレクトロン株式会社 | 検査装置 |
TW392074B (en) * | 1997-11-05 | 2000-06-01 | Feinmetall Gmbh | Test head for microstructures with interface |
JP2001133483A (ja) * | 1999-11-04 | 2001-05-18 | Takashi Nansai | Wストロークプリント基板検査機用治具 |
JP3899075B2 (ja) * | 2002-03-05 | 2007-03-28 | リカ デンシ アメリカ, インコーポレイテッド | 電子パッケージと試験機器をインターフェースするための装置 |
-
2006
- 2006-05-15 JP JP2006135867A patent/JP4041831B2/ja not_active Expired - Fee Related
-
2007
- 2007-05-10 CN CN2007800174904A patent/CN101443669B/zh not_active Expired - Fee Related
- 2007-05-10 WO PCT/JP2007/059685 patent/WO2007132739A1/ja active Application Filing
- 2007-05-10 KR KR1020087027510A patent/KR101021744B1/ko active IP Right Grant
- 2007-05-15 TW TW096117254A patent/TWI442070B/zh not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1482468A (zh) * | 2002-09-13 | 2004-03-17 | 中芯国际集成电路制造(上海)有限公 | 检测探针接触电阻的测试结构与方法 |
Non-Patent Citations (4)
Title |
---|
JP昭62-153579U 1987.09.29 |
JP昭63-154971A 1988.06.28 |
JP特开2001-133483A 2001.05.18 |
JP特开平11-248745A 1999.09.17 |
Also Published As
Publication number | Publication date |
---|---|
KR20080112365A (ko) | 2008-12-24 |
KR101021744B1 (ko) | 2011-03-15 |
JP4041831B2 (ja) | 2008-02-06 |
TW200815776A (en) | 2008-04-01 |
JP2007309648A (ja) | 2007-11-29 |
WO2007132739A1 (ja) | 2007-11-22 |
CN101443669A (zh) | 2009-05-27 |
TWI442070B (zh) | 2014-06-21 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120125 |
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CF01 | Termination of patent right due to non-payment of annual fee |