CN100472220C - Tcp处理装置以及在该装置中的位置不正补正方法 - Google Patents

Tcp处理装置以及在该装置中的位置不正补正方法 Download PDF

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Publication number
CN100472220C
CN100472220C CNB03826028XA CN03826028A CN100472220C CN 100472220 C CN100472220 C CN 100472220C CN B03826028X A CNB03826028X A CN B03826028XA CN 03826028 A CN03826028 A CN 03826028A CN 100472220 C CN100472220 C CN 100472220C
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CN
China
Prior art keywords
tcp
mentioned
malposition
osculating element
carrying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB03826028XA
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English (en)
Chinese (zh)
Other versions
CN1745311A (zh
Inventor
金子修一
东山健二
金子浩之
村野寿
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JAPAN ENGINEERING Co Ltd
Advantest Corp
Original Assignee
JAPAN ENGINEERING Co Ltd
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JAPAN ENGINEERING Co Ltd, Advantest Corp filed Critical JAPAN ENGINEERING Co Ltd
Publication of CN1745311A publication Critical patent/CN1745311A/zh
Application granted granted Critical
Publication of CN100472220C publication Critical patent/CN100472220C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CNB03826028XA 2003-01-31 2003-01-31 Tcp处理装置以及在该装置中的位置不正补正方法 Expired - Fee Related CN100472220C (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2003/001033 WO2004068154A1 (ja) 2003-01-31 2003-01-31 Ｔｃｐハンドリング装置および当該装置における位置ずれ補正方法

Publications (2)

Publication Number Publication Date
CN1745311A CN1745311A (zh) 2006-03-08
CN100472220C true CN100472220C (zh) 2009-03-25

Family

ID=32800848

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB03826028XA Expired - Fee Related CN100472220C (zh) 2003-01-31 2003-01-31 Tcp处理装置以及在该装置中的位置不正补正方法

Country Status (5)

Country Link
JP (1) JP4098306B2 (ja)
CN (1) CN100472220C (ja)
AU (1) AU2003303828A1 (ja)
TW (1) TWI247122B (ja)
WO (1) WO2004068154A1 (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007074509A1 (ja) * 2005-12-27 2007-07-05 Advantest Corporation Ｔｃｐハンドリング装置およびｔｃｐハンドリング装置における接続端子の位置合わせ方法
JPWO2007077621A1 (ja) * 2006-01-04 2009-06-04 株式会社アドバンテスト Ｔｃｐハンドリング装置
KR20090073223A (ko) * 2006-11-09 2009-07-02 가부시키가이샤 아드반테스트 Ｔｃｐ 핸들링 장치 및 그 장치에서의 접속단자의 위치맞춤 방법
WO2008126173A1 (ja) * 2007-03-13 2008-10-23 Advantest Corporation Ｔｃｐハンドリング装置
JPWO2008120520A1 (ja) * 2007-03-29 2010-07-15 株式会社アドバンテスト Ｔｃｐハンドリング装置
WO2008120519A1 (ja) * 2007-03-29 2008-10-09 Advantest Corporation Ｔｃｐハンドリング装置
WO2008120518A1 (ja) * 2007-03-29 2008-10-09 Advantest Corporation Ｔｃｐハンドリング装置
WO2008132935A1 (ja) * 2007-04-19 2008-11-06 Advantest Corporation Ｔｃｐハンドリング装置
KR101162912B1 (ko) * 2009-10-27 2012-07-06 주식회사 탑 엔지니어링 어레이기판 검사장치 및 어레이기판 검사방법
JP2012068032A (ja) * 2010-09-21 2012-04-05 Tesetsuku:Kk Ｔｃｐ試験装置
KR101273523B1 (ko) * 2010-12-22 2013-06-14 주식회사 루셈 모터를 이용한 테이프 캐리어 패키지의 정렬 보정 장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1378261A (zh) * 2001-03-27 2002-11-06 安藤电气株式会社 一种载带封装处理器

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01282831A (ja) * 1988-05-09 1989-11-14 Nec Corp Ｔａｂｉｃのハンドリング装置
JPH10185996A (ja) * 1996-12-25 1998-07-14 Ando Electric Co Ltd Ｔａｂハンドラのｉｃチップの接触位置決め機構

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1378261A (zh) * 2001-03-27 2002-11-06 安藤电气株式会社 一种载带封装处理器

Also Published As

Publication number Publication date
CN1745311A (zh) 2006-03-08
AU2003303828A8 (en) 2004-08-23
TWI247122B (en) 2006-01-11
JPWO2004068154A1 (ja) 2006-05-25
AU2003303828A1 (en) 2004-08-23
TW200422631A (en) 2004-11-01
WO2004068154A1 (ja) 2004-08-12
JP4098306B2 (ja) 2008-06-11

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C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090325

Termination date: 20110131