TWI247122B - TCP handling device and positional deviation correcting method for the same - Google Patents

TCP handling device and positional deviation correcting method for the same Download PDF

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Publication number
TWI247122B
TWI247122B TW093101820A TW93101820A TWI247122B TW I247122 B TWI247122 B TW I247122B TW 093101820 A TW093101820 A TW 093101820A TW 93101820 A TW93101820 A TW 93101820A TW I247122 B TWI247122 B TW I247122B
Authority
TW
Taiwan
Prior art keywords
tcp
contact portion
vertical axis
positional deviation
tape
Prior art date
Application number
TW093101820A
Other languages
English (en)
Chinese (zh)
Other versions
TW200422631A (en
Inventor
Syuuichi Kaneko
Kenji Higashiyama
Hiroyuki Kaneko
Hisashi Murano
Original Assignee
Japan Engineering Co Ltd
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Engineering Co Ltd, Advantest Corp filed Critical Japan Engineering Co Ltd
Publication of TW200422631A publication Critical patent/TW200422631A/zh
Application granted granted Critical
Publication of TWI247122B publication Critical patent/TWI247122B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW093101820A 2003-01-31 2004-01-28 TCP handling device and positional deviation correcting method for the same TWI247122B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2003/001033 WO2004068154A1 (ja) 2003-01-31 2003-01-31 Ｔｃｐハンドリング装置および当該装置における位置ずれ補正方法

Publications (2)

Publication Number Publication Date
TW200422631A TW200422631A (en) 2004-11-01
TWI247122B true TWI247122B (en) 2006-01-11

Family

ID=32800848

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093101820A TWI247122B (en) 2003-01-31 2004-01-28 TCP handling device and positional deviation correcting method for the same

Country Status (5)

Country Link
JP (1) JP4098306B2 (ja)
CN (1) CN100472220C (ja)
AU (1) AU2003303828A1 (ja)
TW (1) TWI247122B (ja)
WO (1) WO2004068154A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI456212B (zh) * 2010-09-21 2014-10-11 Tesec Kk Ｔｃｐ測試裝置

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007074509A1 (ja) * 2005-12-27 2007-07-05 Advantest Corporation Ｔｃｐハンドリング装置およびｔｃｐハンドリング装置における接続端子の位置合わせ方法
JPWO2007077621A1 (ja) * 2006-01-04 2009-06-04 株式会社アドバンテスト Ｔｃｐハンドリング装置
KR20090073223A (ko) * 2006-11-09 2009-07-02 가부시키가이샤 아드반테스트 Ｔｃｐ 핸들링 장치 및 그 장치에서의 접속단자의 위치맞춤 방법
WO2008126173A1 (ja) * 2007-03-13 2008-10-23 Advantest Corporation Ｔｃｐハンドリング装置
JPWO2008120520A1 (ja) * 2007-03-29 2010-07-15 株式会社アドバンテスト Ｔｃｐハンドリング装置
WO2008120519A1 (ja) * 2007-03-29 2008-10-09 Advantest Corporation Ｔｃｐハンドリング装置
WO2008120518A1 (ja) * 2007-03-29 2008-10-09 Advantest Corporation Ｔｃｐハンドリング装置
WO2008132935A1 (ja) * 2007-04-19 2008-11-06 Advantest Corporation Ｔｃｐハンドリング装置
KR101162912B1 (ko) * 2009-10-27 2012-07-06 주식회사 탑 엔지니어링 어레이기판 검사장치 및 어레이기판 검사방법
KR101273523B1 (ko) * 2010-12-22 2013-06-14 주식회사 루셈 모터를 이용한 테이프 캐리어 패키지의 정렬 보정 장치

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01282831A (ja) * 1988-05-09 1989-11-14 Nec Corp Ｔａｂｉｃのハンドリング装置
JPH10185996A (ja) * 1996-12-25 1998-07-14 Ando Electric Co Ltd Ｔａｂハンドラのｉｃチップの接触位置決め機構
TW523854B (en) * 2001-03-27 2003-03-11 Ando Electric TCP handler

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI456212B (zh) * 2010-09-21 2014-10-11 Tesec Kk Ｔｃｐ測試裝置

Also Published As

Publication number Publication date
CN1745311A (zh) 2006-03-08
AU2003303828A8 (en) 2004-08-23
JPWO2004068154A1 (ja) 2006-05-25
AU2003303828A1 (en) 2004-08-23
TW200422631A (en) 2004-11-01
WO2004068154A1 (ja) 2004-08-12
JP4098306B2 (ja) 2008-06-11
CN100472220C (zh) 2009-03-25

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MM4A Annulment or lapse of patent due to non-payment of fees