AU2003303828A1 - Tcp handling device and positional deviation correcting method for the same - Google Patents

Tcp handling device and positional deviation correcting method for the same

Info

Publication number
AU2003303828A1
AU2003303828A1 AU2003303828A AU2003303828A AU2003303828A1 AU 2003303828 A1 AU2003303828 A1 AU 2003303828A1 AU 2003303828 A AU2003303828 A AU 2003303828A AU 2003303828 A AU2003303828 A AU 2003303828A AU 2003303828 A1 AU2003303828 A1 AU 2003303828A1
Authority
AU
Australia
Prior art keywords
same
handling device
positional deviation
deviation correcting
correcting method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003303828A
Other languages
English (en)
Other versions
AU2003303828A8 (en
Inventor
Kenji Higashiyama
Hiroyuki Kaneko
Syuuichi Kaneko
Hisashi Murano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JAPAN ENGINEERING Co Ltd
Advantest Corp
Original Assignee
JAPAN ENGINEERING CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JAPAN ENGINEERING CO Ltd filed Critical JAPAN ENGINEERING CO Ltd
Publication of AU2003303828A8 publication Critical patent/AU2003303828A8/xx
Publication of AU2003303828A1 publication Critical patent/AU2003303828A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AU2003303828A 2003-01-31 2003-01-31 Tcp handling device and positional deviation correcting method for the same Abandoned AU2003303828A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2003/001033 WO2004068154A1 (ja) 2003-01-31 2003-01-31 Ｔｃｐハンドリング装置および当該装置における位置ずれ補正方法

Publications (2)

Publication Number Publication Date
AU2003303828A8 AU2003303828A8 (en) 2004-08-23
AU2003303828A1 true AU2003303828A1 (en) 2004-08-23

Family

ID=32800848

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003303828A Abandoned AU2003303828A1 (en) 2003-01-31 2003-01-31 Tcp handling device and positional deviation correcting method for the same

Country Status (5)

Country Link
JP (1) JP4098306B2 (ja)
CN (1) CN100472220C (ja)
AU (1) AU2003303828A1 (ja)
TW (1) TWI247122B (ja)
WO (1) WO2004068154A1 (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007074509A1 (ja) * 2005-12-27 2007-07-05 Advantest Corporation Ｔｃｐハンドリング装置およびｔｃｐハンドリング装置における接続端子の位置合わせ方法
JPWO2007077621A1 (ja) * 2006-01-04 2009-06-04 株式会社アドバンテスト Ｔｃｐハンドリング装置
KR20090073223A (ko) * 2006-11-09 2009-07-02 가부시키가이샤 아드반테스트 Ｔｃｐ 핸들링 장치 및 그 장치에서의 접속단자의 위치맞춤 방법
WO2008126173A1 (ja) * 2007-03-13 2008-10-23 Advantest Corporation Ｔｃｐハンドリング装置
JPWO2008120520A1 (ja) * 2007-03-29 2010-07-15 株式会社アドバンテスト Ｔｃｐハンドリング装置
WO2008120519A1 (ja) * 2007-03-29 2008-10-09 Advantest Corporation Ｔｃｐハンドリング装置
WO2008120518A1 (ja) * 2007-03-29 2008-10-09 Advantest Corporation Ｔｃｐハンドリング装置
WO2008132935A1 (ja) * 2007-04-19 2008-11-06 Advantest Corporation Ｔｃｐハンドリング装置
KR101162912B1 (ko) * 2009-10-27 2012-07-06 주식회사 탑 엔지니어링 어레이기판 검사장치 및 어레이기판 검사방법
JP2012068032A (ja) * 2010-09-21 2012-04-05 Tesetsuku:Kk Ｔｃｐ試験装置
KR101273523B1 (ko) * 2010-12-22 2013-06-14 주식회사 루셈 모터를 이용한 테이프 캐리어 패키지의 정렬 보정 장치

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01282831A (ja) * 1988-05-09 1989-11-14 Nec Corp Ｔａｂｉｃのハンドリング装置
JPH10185996A (ja) * 1996-12-25 1998-07-14 Ando Electric Co Ltd Ｔａｂハンドラのｉｃチップの接触位置決め機構
TW523854B (en) * 2001-03-27 2003-03-11 Ando Electric TCP handler

Also Published As

Publication number Publication date
CN1745311A (zh) 2006-03-08
AU2003303828A8 (en) 2004-08-23
TWI247122B (en) 2006-01-11
JPWO2004068154A1 (ja) 2006-05-25
TW200422631A (en) 2004-11-01
WO2004068154A1 (ja) 2004-08-12
JP4098306B2 (ja) 2008-06-11
CN100472220C (zh) 2009-03-25

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Legal Events

Date Code Title Description
TH Corrigenda

Free format text: IN VOL 18, NO 37, PAGE(S) 9222 UNDER THE HEADING APPLICATIONS OPI - NAME INDEX UNDER THE NAME JAPANENGINEERING CO.,LTD., APPLICATION NO. 2003303828, UNDER INID (71) CORRECT THE NAME TO READ ADVANTEST CORPORATION; JAPAN ENGINEERING CO.,LTD.

MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase