TW200903683A - TCP handling apparatus - Google Patents
TCP handling apparatus Download PDFInfo
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- TW200903683A TW200903683A TW97107456A TW97107456A TW200903683A TW 200903683 A TW200903683 A TW 200903683A TW 97107456 A TW97107456 A TW 97107456A TW 97107456 A TW97107456 A TW 97107456A TW 200903683 A TW200903683 A TW 200903683A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- Microelectronics & Electronic Packaging (AREA)
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- Environmental & Geological Engineering (AREA)
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- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
200903683 九、發明說明: 【發明所屬之技術領域】 本發明係關於用以測試IC元件之一種的TCP ( Tape Carrier Package)或 c〇F( Chip 〇n Film)(以下將由 Tcp、 COF、及 TAB ( Tape Automated Bonding)封裝技術所封裝 的元件統稱之為「TCP」),所使用之捲帶式封裝管控裝置。 【先前技術】 …在1C元件等的電子元件製造過程中’必須使用用以測 試最終製造出的電子元件或其中間階段的元件等的性能或 功能的測試之電子元件測試裝置,在TCP的情況下係使用 TCP用的測試裝置。 打1文用 TCP測試裝置—般係由下列構成: 及捲帶式封裝管控裝置(以下亦體::頭 二概:式封裝處理器,能夠運送在捲帶(亦包含膜 亦同)上形成複數TCP的搬運帶,將搬運 輸入=測試頭的探針卡的探針,使似的輸出 '二,為V:氣連接’並依序執行複數tcp的測試。 行測試’必須要…正確地執 相接觸,因此必須要執行阶和探針的位=準針確實地 推進㈣準的m錢運帶連同 入穴斯攻接觸壓榨機 獻】〜3),或者使探針 D自的方法(專利文200903683 IX. Description of the Invention: [Technical Field] The present invention relates to TCP (Tape Carrier Package) or c〇F (Chip 〇n Film) for testing one of IC components (hereinafter, Tcp, COF, and TAB) ( Tape Automated Bonding) The packaged components of the package technology are collectively referred to as "TCP", and the tape and reel package control device used. [Prior Art] ...Electronic component test apparatus which must use a test for testing the performance or function of the finally manufactured electronic component or its intermediate stage component in the manufacturing process of an electronic component such as a 1C component, in the case of TCP The lower test system uses TCP. The TCP test device is generally composed of the following: and the tape and tape package control device (the following is also: the first two: package processor, can be transported on the tape (also including the film) The multi-TCP carrying belt will carry the probe of the probe card input to the test head, so that the output of the probe is '2, V: gas connection' and the test of the complex tcp is performed in sequence. The test must be... correctly It is necessary to carry out the contact, so it is necessary to carry out the position of the stage and the probe = the pin is surely advanced (four) the quasi-m-money belt together with the point-in-the-spot contact press (~3), or the method of making the probe D self- Patent
Xy方向移動的方法(專利文Method of moving in the Xy direction (patent text)
2192-9454-PF 5 2009036832192-9454-PF 5 200903683
.但是,在最近的tcp處理器中’為了提高測試效率, :時將複數個(例如2個)TCP交付測試。複數個TCP,係 刀別开:成於同條帶上’所以,無法使各個KP個別移動 而執仃和&針的位置對準。再者,因為探針卡上的探針是 破固定的’所以’無法對應於各TCP而使探針個別地移動。 因此,在上述的情況下,在過去係僅以一 基準來進行位置對準,而g .. Trp gI透的TCP為 J千而另一方的TCP,則預設其位置 對準來進行接觸。 專利文獻1 :實公平6-2271號公報 專利文獻2 :特開平9-92695號公報 專利文獻3 :特開平8-29484號公報 專利文獻4 :特開平1 0-185996號公報 專利文獻5 :特開2002-181888號公報 【發明内容】 發明欲解決的問題 因此,以上述之預設來進行位置對準的Tcp常發生接 觸錯誤,而無法在尚可靠性之下執行接觸。 士 +本發明係有鑑於上述現象,其目的在於提供捲帶式封 衣管控裝置,其能夠在同時測試複數個Tcp的情況下, 低接觸錯誤。 用以解決課題的手段 為達成上述目的,本發明提供一種捲帶式封裝管控裝However, in recent tcp processors, in order to improve test efficiency, multiple (for example, two) TCP delivery tests will be performed. For multiple TCPs, the knife is not open: it is on the same strip. Therefore, it is impossible to move each KP individually and the position of the needle is aligned. Furthermore, since the probe on the probe card is broken, it is impossible to move the probe individually in accordance with each TCP. Therefore, in the above case, in the past, the alignment was performed with only one reference, and the TCP that the g.. Trp gI penetrated was J thousand and the other TCP, and the position alignment was preset to make contact. Patent Document 1: Japanese Unexamined Patent Publication No. Hei No. Hei. No. Hei. No. Hei. No. Hei. SUMMARY OF THE INVENTION PROBLEMS TO BE SOLVED BY THE INVENTION Therefore, Tcp which is aligned by the above-described presets often causes contact errors, and it is impossible to perform contact under reliability. The present invention has been made in view of the above-described phenomenon, and an object thereof is to provide a tape and tape type packaging control device capable of low contact error in the case where a plurality of Tcps are simultaneously tested. Means for Solving the Problem In order to achieve the above object, the present invention provides a tape and reel package control device
2192-9454-PF 6 200903683 置’其係用以搬運形成複數TCP的搬運帶,將該搬運帶對 者具有複數個電性連結於測試頭的連接端子的測定部按 藉由使忒TCP的外部端子和該測定部的 觸’而依序測試複數的ΤΓΡ甘千接 八硬數的TCP,其包括·· η個(η為2以上 整數)該满疋部,使得能夠同時測試複數個π 個測定部之至少r ν 、 7 Α η )個測定部中每一個,設置測定部移 動裝置以使該測定部移動(發明丨)。 再者’因為測定部移動裝置是針對 至少(η-1)個測定邱由〃 y 调州疋邛之 的每 °母—個」設置,所以η個測定部中 的母一者,亦即,所有的 裝置。 心1 J以刀别5又置測定部移動 依據上述發明(發明υ,可以们個測定 使其他的所有測定部獨 疋並 獨立移動。在前者的使所有的測定部都 部移動,以執行對運帶對於被固定的測定 蘇U 對應於該測定部的TCP之位置對準 糟由使設有測定部移動裝置的測定部 並且 同時交付測試的Tcp分 動此夠對於 下,無須使搬運帶移動 订位置對準。在後者的情況 獨立移動,能夠對於同時、定部移動裝置使各測定部 準。藉此,能夠m / 载的TGP分別進行位置對 月b夠使各Tcp I野 子確實地接觸子和各敎部的連接端 “夠相接觸錯誤的降低。 在上迷發明(發明 管控裝置更包含n個推 二::佳,該捲帶式封裳 述各推進器係分別獨立對;各個測定部對應,上 f於該蜊定部接近/遠離(發明2)。2192-9454-PF 6 200903683 "This is used to transport a carrier belt that forms a plurality of TCPs, and the carrier belt has a plurality of measuring portions that are electrically connected to the connection terminals of the test heads by the external portion of the TCP The terminal and the touch of the measuring unit sequentially test a plurality of TCPs of a hard number, including n·(n is an integer of 2 or more), so that a plurality of π can be simultaneously tested. Each of at least r ν , 7 Α η of the measurement units is provided with a measurement unit moving device to move the measurement unit (invention). In addition, since the measuring unit moving device is provided for at least (n-1) measurement of each of the 邱 〃 y y 调 , , y y y y y y y y y y All devices. According to the above invention, it is possible to move all of the other measuring units independently and independently. In the former, all the measuring units are moved to perform the pairing. The positional alignment of the transport belt with respect to the fixed measurement unit U U corresponding to the measurement unit is caused by the transfer of the Tcp provided with the measurement unit of the measurement unit moving device and the simultaneous delivery test. In the latter case, the measurement unit can move independently, and the measurement units can be aligned with the simultaneous and fixed mobile devices. Thereby, the MGP can be placed at the position of the TGP for each of the Tcp I. The contact end of the contact and the jaws is "sufficient to reduce the contact error. In the above invention (the invention control device further includes n push two:: good, the tape-type seal is separately independent; Corresponding to each measurement unit, the upper f is close to/away from the measurement unit (Invention 2).
2192-9454-PF 200903683 存在複數個測定部的情況下,這些連接端子的高产常 有不同,如上述發明(發明2)—般,將個別的=八 ㈣“以㈣’藉由將該移動量對應於連接端子^ 度適當地調整,而能%JL、益A ^ 定部的連接端子^夠最心的接觸壓力將抑對各測 f管” (發明^ 2)中’以此為佳’該捲帶式封 料元,其^可以接近/遠離該測定 複數個推進器;推進單元移動裝置, 達成的該推進單元的鶫翻,处釣 、1 位置(發日月3) 整搬運帶對該測定部的 依據上述發明(發明3),在對於㈠固測定部 個測定部移動裝f At u 自動—地由,進單_移動, 以仃對於固疋的測定部之位置對準。Α 況下即==測定7“個測定部移動裝置的情 個銘叙.早70依據位置偏移的方式而將搬運帶整 移動,而能夠確實地執行位置對準。 穿θ ” : :(發明1〜3)中’以此為佳’該捲帶式封 置包括能夠拍攝該搬運帶的特定部位及該 二影裝置’依據該攝影装置所拍攝的影像, 1寸 彳部端子和該駭部的連接端子的位置偏移 !’依據該位置偏移量,藉由該測定部宜 置偏: 移動’執行該連接端子對於TCP的外部二Λ'貝1疋 (發明4)。 卜。卩鳊子的位置對準2192-9454-PF 200903683 In the case where there are a plurality of measurement sections, the high yield of these connection terminals is often different. As in the above invention (Invention 2), the individual = eight (four) "by (four)" by the amount of movement Corresponding to the connection terminal ^ degree is properly adjusted, and the connection terminal of the %JL, the benefit A ^ fixed part is enough to suppress the contact pressure of each of the measuring tubes" (invention ^ 2) 'this is better' The tape-type sealing material element can be close to/away from the plurality of thrusters; the pushing unit moving device, the reaching of the pushing unit, the fishing, the 1 position (issuing the sun and the moon 3) According to the invention (Invention 3) of the measuring unit, the positional movement of the measurement unit is fixed by the movement of the unit. In other words, ==================================================================================================== In the inventions 1 to 3), the tape-receiving package includes a specific portion capable of photographing the carrier tape and an image captured by the camera device according to the camera device, a 1-inch crotch terminal and the cymbal The position of the connection terminal is shifted! 'According to the positional offset, the measurement unit should be biased: Move 'Execute the connection terminal for the external interface of TCP' (Invention 4). Bu. The position of the dice
2192-9454-PF 200903683 依據上述發明(發明 處理,能夠簡單地 ,s由利用攝影裝置的影像 對準。 丁連接端子對於TCP外部端子的位置 在上述發明(發明4)2192-9454-PF 200903683 According to the above invention (the invention process, it is possible to simply align the image by the image pickup device. The position of the butt connection terminal to the TCP external terminal is the above invention (Invention 4)
的外部端子的位置對 钒仃該連接端子對於TCP 明3)使該推進單 時’更由該推進單元移動裝置(發 在m 可(發明5)。 在上述發明(發明4、 ^ 置為佳(發明β) 以包3複數台該攝影裝 ^ °依據上述發明,& 數個TCP/測定部, _ 因為犯夠同時拍攝複 理時間。 此縮紐取得位置偏移量的相關處 在上述發明(發明6)中 攝影裝置,係可以藉由移Ml二複數台該 ,的位置之端 量’而能夠更正確地執行Tcp和測定部的::的位置偏移 藉由分別移動複數的攝影穿 #準°再者’ 置’只要小小的移動量就可以 攝和裝 移量的取得之相關處理時間。 —位置偏 兮搬(發明4〜7)中,該攝影裝置係能夠插入 4搬運Τ和該測定部之間 八 會因為其他的元件而阻礙…依據上述發明,不 耵兀件而阻礙攝影裝置的 拍攝搬運帶的特定部位以及測定部的特定部:::實: 為能夠__下方無法拍—The position of the external terminal is the same as that of the vanadium crucible. For the TCP connection 3), the propulsion unit is moved by the propulsion unit (invention 5). In the above invention (invention 4, ^ is better) (Invention β) According to the above invention, a plurality of TCP/measurement units, _ because it is sufficient to simultaneously take a photo-recovery time. The correlation of the positional offset of the retraction is as described above. According to the invention (Invention 6), it is possible to more accurately perform the positional shift of the Tcp and the measuring unit by shifting the end amount ' of the position of the M1 and the plurality of positions by moving the plural number of photographs separately Wear #准°再再' Set 'As long as the small amount of movement can be taken and the processing time related to the acquisition of the loading amount. - In the positional shift (Inventions 4 to 7), the camera can be inserted into 4 Between the Τ and the measurement unit, the eight components are blocked by other components. According to the above invention, the specific portion of the imaging conveyance belt of the imaging device and the specific portion of the measurement unit are prevented from being smashed::: Can't shoot below -
2192-9454-PF 200903683 測試墊的接觸 ,丨丁延接端子之尘 ,部的位置資訊。再者,因為可以從近處拍攝搬運帶 定部位,所以能夠精確地取得其位置資料(座標資訊 =;方°,攝〜裝置也可以如過去-般設置在測試頭的内部 之門在明(發明1〜8)中,在該測定部和該測試頭 2間,…面元件用以使兩者電性接觸,該 "面元件,係透過有彈性的導線而電性連接^ 明9)。依據該發明,各測 爾知裝置(發 再者,在上述發明(發明〗〜 測試頭之間’設有介面元件 。測疋部和該 該測m㈣八 者電性接觸,對應於 測定部移動裝置,連同#、8|~ 这各"面凡件,藉由該 明10) 仙該測定部,可以分別獨立移動(發 依據上述發明(發明1(η 應之介面元件一起移動,二各測定部是和其所對 線。因此,即使攝影農置設置在、測試頭^設置有彈性的導 為導線而阻礙該攝影裝置視野。再者,、上部’也不會因 的高度設定成和過去_楛, ,因為可以將測定部 控制在最小限度。’’所以能夠使處理器的設計變更 發明的效果 依據本發明的捲帶式封裝焚 試複數個TCP的情況下, 、s卫裝置,其能夠在同時測 的位置對準’目而降低接:二部分別移動而執行其請2192-9454-PF 200903683 Contact of the test pad, Kenting extended the dust of the terminal, the position information of the part. Furthermore, since the conveyance belt can be photographed from a close position, the position information can be accurately obtained (coordinate information =; square °, the camera can also be set in the interior of the test head as in the past - In the inventions 1 to 8), between the measuring unit and the test head 2, the surface elements are used for electrically contacting the two, and the surface elements are electrically connected through the elastic wires. . According to the invention, each of the measuring devices (in the case of the above invention (invention - test head) is provided with an interface element. The measuring portion and the measuring element (four) are in electrical contact with each other, corresponding to the movement of the measuring portion The device, together with the #, 8|~ each of the "faces", can be independently moved by the measuring unit (the invention is based on the above invention (invention 1 (n should interact with the interface elements, two The measurement unit is aligned with the line. Therefore, even if the imaging unit is installed, the test head is provided with a flexible guide wire to block the field of view of the imaging device. Further, the height of the upper portion is not set to In the past, the measurement unit can be controlled to a minimum. '' Therefore, the effect of the design change of the processor can be changed. According to the tape and reel package of the present invention, when a plurality of TCPs are burned, the s-guard device is used. It can be aligned at the same time to adjust the position and reduce the connection: the two parts move separately and execute their request
2192-9454-PF 10 200903683 【實施方式;] 下文配合圖式,說明本發明之實施型態。 器二:發明-實施型態之捲帶式爾理 式封裝處理器之、推進單面圖’第2圖為同實施型態的捲帶 的捲帶式封裝處理㈣推進單元及、=m3W㈣貫施型態 TrD 俏進早兀及測试頭上部的正面圖。 和測試本it:二:構成:二未顯示的測試本體、 捲帶式封裝處理器2 / 1〇、设於測試頭10上方的 tcp 式封裝處理器2係將形成於搬運帶5上的複數個 二乂付測試,在本實施型態中,係以同時將“固⑽ 父付測試為例。彳曰县,士欢η口 ^ 本發月並不以此為限,例如將4個 上的TCP同時交付測試亦可。 捲帶式封裝處理器2具有捲出捲軸21及捲取捲軸22, :捲軸21上捲了測試前的搬運帶5。搬運帶5從捲出捲 1捲出,在測試後再捲到捲取捲軸2 2上。 捲出捲軸21和捲取捲軸22之間設有3個間隔滾輪 ,23b 23c,用以將從搬運帶5剝離的保護帶51從捲 =捲軸跨越到捲取捲軸22。各間隔滾輪心、 w 分別可以上下移動’以調整保護帶51的張力。 •在捲出捲軸21的下方設有:捲帶導執仏、捲出限制 滾輪25a、内側次鍊輪挪及内側導軌滾輪25c,從捲出播 軸21捲出的搬運帶5,一邊由捲帶導軌…導軌,同時經 由捲出限制滾輪25a、内側次鍊輪25b及内侧導軌滾輪25c2192-9454-PF 10 200903683 [Embodiment] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. Device 2: Invention-implementation type of tape-type packaged processor, propulsion single-sided diagram' Figure 2 is the tape-and-reel package processing of the same type of tape (4) propulsion unit and =m3W (four) The front view of the top of the test head is applied to the TrD. And test this: two: composition: two unshown test body, tape and reel package processor 2 / 1 〇, tcp type package processor 2 set above the test head 10 will be formed on the carrier 5 In this embodiment, the "solid (10) father pay test is taken as an example. Jixian, Shihuan η mouth ^ This month is not limited to this, for example, 4 The TCP simultaneous delivery test may also be performed. The tape and reel package processor 2 has a take-up reel 21 and a take-up reel 22, and the reel 21 is wound with the conveyance belt 5 before the test. The conveyance belt 5 is unwound from the unwinding roll 1. After the test, it is wound onto the take-up reel 22. 2. There are three spacer rollers, 23b 23c, between the take-up reel 21 and the take-up reel 22, and the protective tape 51 for peeling off the transport belt 5 from the roll = reel The winding roller 22 is spanned. Each of the spacer cores and w can be moved up and down to adjust the tension of the protective tape 51. • Below the unwinding reel 21, a reel guide, a retracting roller 25a, and an inner side are provided. The secondary sprocket and the inner guide roller 25c are transported from the take-up and retractable shaft 21 by the take-up guide rail 5 The roll-out restricting roller 25a, the inner secondary sprocket 25b, and the inner guide roller 25c
2192-9454-PF 11 200903683 送往推進單元3。 、在捲取捲軸22的下方也設有捲帶導軌24b、捲取限制 )輪25f外側次鍊輪仏及外側導執滾輪,交付測試 1的搬運τ 5 ’經過外側導軌滾輪㈤、外側次鍊輪Μ 捲取限制滾輪25f,—邊由捲帶導軌挪導軌著,一邊捲 到捲取捲軸2 2上。 ^而且’在内側導軌滾輪25c和外側導執滚輪25d之間, 。又有可以在2軸方向移動的推進單元 方面如第1圖及第3圖所示,在推進單元3的 1 頭1 〇的上部,透過介面元件9設有2個探針卡 盤a、二再者’介面元件20°亦稱之為固定座、測試頌底 盤、測武固定器、頂盤等。 :第2圖所示,本實施型態中的2個探針卡仏,分 別為平面視丰[|]花;乂 η五 以此為限。各探針卡8a、8b 係叹置為》別對應同時交付測試的2自似 複數個探針81。各掇s Qu 匕、有 應於且古 、此的探針81,其配置係對 81係透過冑TCP的測試塾(外部端子)的配置。各探針 過介面元件9和測試頭1Q而和測試本體電性連接。 如第1〜3圖所示,探針卡8在 針卡^ + a係由夾鉗7a所夹住,探 針卞8b係由夹鉗7b所夾住。 链-认 各夹鉗7a、7b係分別由圖未 颏不的驅動機構而可以在χ2192-9454-PF 11 200903683 Send to the propulsion unit 3. The lower outer sprocket and the outer guide roller are also provided on the outer side of the take-up reel 22 under the take-up reel 22, and the outer sprocket and the outer guide roller are delivered to the test 1, and the outer guide roller (5) and the outer sub-chain are passed. The rim is taken up by the take-up reel 25f, which is wound by the take-up reel and is wound onto the take-up reel 2 2 . ^ and 'between the inner guide roller 25c and the outer guide roller 25d. Further, as shown in Figs. 1 and 3, the propulsion unit which is movable in the two-axis direction is provided with two probe chucks a and two through the interface member 9 in the upper portion of the first end of the propulsion unit 3; Furthermore, the interface element 20° is also referred to as a fixed seat, a test cymbal chassis, a test fixture, a top plate, and the like. : As shown in Fig. 2, the two probe cassettes in this embodiment are respectively a plane view abundance [|] flower; η η five is limited thereto. Each of the probe cards 8a and 8b is slid to be a pair of two self-contained probes 81 that are simultaneously delivered for testing. Each of the probes 81 has a configuration of the probe 81 of the 81-series transmission system (external terminal). Each probe is electrically connected to the test body through the interface element 9 and the test head 1Q. As shown in Figs. 1 to 3, the probe card 8 is held by the clamp 7a in the needle card + + a, and the probe 8b is sandwiched by the clamp 7b. Chain-recognition Each of the clamps 7a, 7b can be driven by a drive mechanism that is not shown in the figure.
鈿孩叙m 鞞万向、Y軸方向以及繞著Z 轴移動。因此’探針卡8a,係可蕤 ^ , v ± 你了以錯由夹鉗7a而在X軸 方向、Y軸方向以及繞著Z軸移動 M , + , 而保針卡8b,係可以 藉由夹鉗7b而在X軸方向、γ軸 軸方向以及繞著Z軸移動。钿Children m 鞞 universal, Y-axis direction and move around the Z axis. Therefore, the 'probe card 8a can be 蕤^, v ± you are wrong by the clamp 7a in the X-axis direction, the Y-axis direction and around the Z-axis M, +, and the needle card 8b can be borrowed The clamp 7b moves in the X-axis direction, the γ-axis direction, and around the Z-axis.
2192-9454-PF 12 200903683 、如上所述,因為2個探針卡8a、8b可以分別獨立移動, 、此夠刀別對於同時交付測試的丁 C P進行位置對準。 匕各TCP的測試墊及各探針卡8a、8b的探針81可以 確實地接觸,故能降低接觸錯誤。 _各探針卡8a、8b,係透過有彈性的導線91而和介面 &件9電!·生連接。因此’探針卡8a、化能夠移動而不因為 導線91而妨礙其動作。 如第1及3圖所示’推進單元3具有:推進框% ·机 於料框36的2個推進器3〇a、3〇b;設於推進器_ 的别#又側(第1圖中的左側)的張力鍊輪3 ^設於推進 时30a、30b後段側(第!圖中的右側)設有主鍊輪咖。 各推進器30a、30b具有:和滾珠螺桿32螺合的推進 本體。P 33,使滾珠螺桿32回轉的飼服馬達31 ;設於推 本體部3 3的下端的吸附板3 4。 各推進器3〇a、30b的推進本體部33,透過z轴 的直=動導軌37而設置推進框36’藉由驅動飼服馬達 3卜由直線運動導軌37引導的同時可以在上下方向( =移動。亦即,各推進器,、3〇b可以分別在 向移動。吸附板34係連接於負壓源(圖示省略) 附保持著搬運帶5。 。及2192-9454-PF 12 200903683 As described above, since the two probe cards 8a, 8b can be independently moved, this is sufficient for positional alignment of the D Cs that are simultaneously delivered for testing. The test pads of the respective TCPs and the probes 81 of the probe cards 8a and 8b can be surely contacted, so that contact errors can be reduced. _ Each probe card 8a, 8b is electrically connected to the interface & 9 through a flexible wire 91! · Health connection. Therefore, the probe card 8a can be moved without being hindered by the wire 91. As shown in Figures 1 and 3, the propulsion unit 3 has two propellers 3〇a and 3〇b that are driven by the frame 36 and are placed on the other side of the propeller _ (Fig. 1 The tension sprocket 3 of the left side is provided with a main chain wheel on the rear side of the propulsion 30a, 30b (the right side in the figure!). Each of the pushers 30a, 30b has a propulsion body that is screwed to the ball screw 32. P 33 is a feeding motor 31 for rotating the ball screw 32; and an adsorption plate 34 for pushing the lower end of the main body portion 33. The propulsion main body portion 33 of each of the propellers 3A, 30b is provided with a push frame 36' through the z-axis direct-moving guide rail 37, and is guided by the linear motion guide 37 while being driven in the up-and-down direction ( = movement, that is, each of the pushers, 3〇b can be moved inwardly. The suction plate 34 is connected to a negative pressure source (not shown) and the carrying belt 5 is attached.
在此’推進H 3Ga係將搬運帶5上的於探 a按壓’推進器30b係將搬運帶5上的Tcp對於 ,壓。如上所述製作2個探針卡l8b並設於捲帶式 處理器2的情況下,各個探針卡8a、8b上的探針81的: 2192-9454-PF 13 200903683 高度常有微小的差異。在此情況下,以 運帶5的話,在接觸壓力較高的探針卡的:推進器按壓搬 觸錯誤’或在接觸壓力較高的探針卡的探妾 的問題。因此,如本實施型態,對探針 θ 變形 個別的推進器_、鳩,而可以個別地在二:分別使用 藉由將各推進器3〇a、3〇b的移動下端的位:::而 做適當的調整,而能以最適當的接觸壓將康十:度而 T :8b的探針81按壓。亦即,藉由使用2個推進: 3〇a、30b,此夠吸收各探針卡8a、处的針高度的差異。 在推進框36的背面側,設置了推 、 圖)。藉由該推進平台4,能夠使推進單元千:在4;=5 ::、方:::在著Z軸移動。因此’推進單元3的推進器 3〇b藉由在以吸附板34吸附保持 :使:進單元3如上述般移動,而使得搬運帶!::= 軸:向以及繞著Z軸移動’而能夠執行搬運帶5上 的TCP和探針81的位置對準。 如第1及3圖所示,分別在推進單元3的前段側(第 1圖中的左側)設有第!攝影機6a,在測試頭 有第2攝影機(攝影裝置)此省,在推進單元3^ 段側(第1圖中的右側)設有第3攝影機6c。 後 26a Γ6 " Γ ^ 6C " " ! ^ # 盗26b。払示打孔器26a依據測試結果, 二 置開出1個或複數個孔’退出打孔器26b 在測试中被判斷為不良品的TCP打孔。Here, the "advanced H3Ga system" presses the pusher on the transport belt 5, and the pusher 30b presses the Tcp on the transport belt 5. When the two probe cards 18b are fabricated as described above and provided in the tape reel type processor 2, the probes 81 on the respective probe cards 8a, 8b are: 2192-9454-PF 13 200903683 The height is often slightly different . In this case, in the case of the transport belt 5, the probe of the probe having a high contact pressure has a problem that the pusher presses the touch error or the probe of the contact pressure is high. Therefore, as in the present embodiment, the probes θ are deformed by the individual thrusters _, 鸠, and can be individually used in two: respectively by using the lower end of the movement of each of the thrusters 3〇a, 3〇b: : With proper adjustment, the probe 81 of the T:8b can be pressed with the most appropriate contact pressure. That is, by using two advances: 3〇a, 30b, this is enough to absorb the difference in the height of the needles at each of the probe cards 8a. On the back side of the push frame 36, a push, Fig.) is provided. With the propulsion platform 4, the propulsion unit can be moved by: 4;=5::,::: on the Z axis. Therefore, the pusher 3〇b of the propulsion unit 3 is moved by the suction plate 34 so that the feed unit 3 moves as described above, so that the conveyance belt!::=axis: moves toward and around the Z axis' The alignment of the TCP on the carrier tape 5 and the probe 81 can be performed. As shown in the first and third figures, the first stage side (the left side in Fig. 1) of the propulsion unit 3 is provided with the first! In the camera 6a, in the test head, there is a second camera (photographing device). The third camera 6c is provided on the side of the propulsion unit 3 (the right side in Fig. 1). After 26a Γ6 " Γ ^ 6C "" ! ^ # 盗 26b. The puncher 26a is shown to open one or a plurality of holes in accordance with the test result, and exits the puncher 26b, which is judged to be a defective TCP punch in the test.
2192-9454-PF 200903683 分傅影機6a 影像,顯示於顯示衰置(圖未顯示)使得操作=機拍攝的2192-9454-PF 200903683 The image of the 6A image is displayed on the display fade (not shown) so that the operation = machine shooting
確認。顯示裝置具有影像處理部,以示攝可:目視 此省士、拍攝之影像㈣視器。τ各攝讀I 這些攝影機之中,第丨攝影機6a及第3攝 打的孔之位有無TCP或由禕示打孔器心 位置或數買。另一方面,第2攝 係用以取得Tcp和探針81之間的位置偏移資料。讣 一在本實施型態中,設有2個第2攝影機6, 一側的第2攝影機6b係拍攝探針卡仏的探針 , 應之TCP的測試塾或對準標$,另—側的第 機所對 則拍攝探針卡8b的探針81及其所對應之了列= 對準標記。 r的挪4墊或 各第2攝影機6b、6b,從拍攝的 及測試墊或對準標記的位置資 ζ衣針81 以算出探針81和沿的位置偏移量仏科),並能夠據 61,::機此,,係、分別搭載於攝影機平台61、 1 上’由攝影機平台61、β〗, 在平面視縱橫方向(X軸_γ軸方⑴所具:的促動機而可以 -在平面視縱橫方向(二 攝位於和TCP互相遠離之位 ° 、移動,迠夠拍 針卡8a、8b互相遠離之位’複數個測試墊及位於和探 仰延離之位置的探針81。 处 地求出TCP的測試塾與探針卡8a、8b㈣:^夠精確 移量,而能夠更正禮祕勒/ 之位置偏 確地執行TCP的挪試墊與探針卡8a、8bconfirm. The display device has an image processing unit for viewing: the provincial and the captured image (four) viewer. τ Each reading I Among these cameras, there is no TCP in the position of the third camera and the third tapped hole, or it is bought by the position or number of the puncher. On the other hand, the second camera is used to acquire the positional shift data between the Tcp and the probe 81. In the present embodiment, two second cameras 6 are provided, and the second camera 6b on one side is a probe for photographing the probe cassette, and the TCP test or alignment mark is applied to the other side. The first camera is photographed with the probe 81 of the probe card 8b and its corresponding column = alignment mark. The r 4 pad or each of the second cameras 6b, 6b, from the position of the photographed and test pad or the alignment mark, the needle 81 is calculated to calculate the positional deviation of the probe 81 and the edge, and can be 61, :: This machine is mounted on the camera platform 61, 1 'by the camera platform 61, β〗, and can be used in the vertical and horizontal directions of the plane (X-axis _ γ axis (1): In the plane view vertical and horizontal direction (two shots and TCP are far apart from each other, moving, licking the needle card 8a, 8b away from each other 'a plurality of test pads and the probe 81 located at the position of the probe extension. Find the test TCP of the TCP and the probe cards 8a, 8b (4): ^ can accurately correct the amount of shift, and can correct the position of the riddle / the TCP test pad and the probe card 8a, 8b
2192-9454-PF 15 200903683 的探針81的位置對準。 各攝影機平台6 j、6 j, 八 6b、此,移動,也… 別獨立地使第2攝影機 動。在連動心 地使第2攝影機6b、6b,移 =的情況下,例如第2攝影機此、此,並行移 斜+ 的對應位置的測試墊,以及探 針卡8a、8b的對應位置的探針… 此,:二f攝?二機广 焦點相對準。 探針81及測試塾或對準標記兩者的 夠门t上述’藉由設置複數台第2攝影機6b、6b’,能 夠同時取得2個Tcp 影機6b、6b,只要龍=位置資料’而且因為第2攝 、要稍微移動即可,而能夠縮短位置資料 的取得之相關處理味μ 、 槐气班 時間。但疋,由於空間或成本的關係, 僅§又置1台第2攝影機亦可。 在此’在本實施型態中’探針卡8a、8b和介面元件9 之:有具彈性之導'線9卜但在某些情況下,導線91會造 成第2攝衫機6b、6b’的視野之阻礙。在此種情況下, ; 攝〜機6b 、6b’設置為插入搬運帶5和探針81之 間亦可、。藉由將第2攝影機6b、6b,如此設置,能夠在 視予不被V線91阻礙的情況下,由第2攝影機旰、此, 拍攝:針81及TCP的測試墊或對準標記。 ,如第4及5(a)、5⑴圖所示,第2攝影機讣、 二 刀別5又置於從攝影機平台62、62,延伸之臂63的 剛端部’精由攝影機平纟62 ' 62,所具備的促動機而可以The position of the probe 81 of 2192-9454-PF 15 200903683 is aligned. Each camera platform 6 j, 6 j, 八 6b, this, move, also... The second camera is not independently activated. When the second cameras 6b and 6b are moved to the same position, for example, the second camera, the test pad corresponding to the position of the second camera, and the probes of the corresponding positions of the probe cards 8a and 8b are... This,: two f camera? Two machines wide focus relative. The probe 81 and the test gate or the alignment mark are both gates t. By providing the plurality of second cameras 6b and 6b', it is possible to simultaneously acquire two Tcp cameras 6b and 6b as long as the dragon=position data' Because it is a second shot, it is necessary to move a little, and it is possible to shorten the processing sensibility of the position data acquisition and the squat time. However, due to space or cost, only one second camera can be set. Here, in the present embodiment, the probe cards 8a, 8b and the interface member 9 have a flexible guide line 9 but in some cases, the wire 91 causes the second camera 6b, 6b. 'The obstacle of the vision. In this case, the camera 6b, 6b' is set to be inserted between the carrier tape 5 and the probe 81. By providing the second cameras 6b and 6b in this manner, it is possible to capture the test pads or alignment marks of the needles 81 and TCP by the second camera 视 without being blocked by the V line 91. As shown in Figures 4 and 5(a) and 5(1), the second camera 讣 and the second knives 5 are placed on the rigid end of the arm 63 extending from the camera platform 62, 62. 62, the motives you have
2192-9454-PF 16 200903683 在平面視縱橫方向(x軸-γ轴方向)移動。再者, 圖顯示第2攝影機6b、6b’的退出狀態, ) 示第2攝影機6b 、6b,的插入狀態。 圖顯 第2攝影機6b 、6b,能夠 此,,的上側和下側。因此,如;攝影機 第2攝影機6b 、6b,插入搬運帶 當 由第2攝衫機6b、6b,’能夠同時拍攝 曰 對準標記及探針81的尖端部。藉由 忒墊或 6b’,能夠直接拍攝從下方心 ' 攝影機讣、 (和測試塾的接觸面),所以 、連接端子的尖端部 以之尖端部的位置資1再者//^常精確地取得探針 的測試塾或對準標記,所以能夠二==攝-標資訊)。 于/、位置資料(座 :二述第2攝影機6b,係能 側(搬運π 5)及下側(探針81) 攝上 藉由攝影裝置本身反轉或切仁,、並不以此為限, 拍攝上側(搬運帶〇及m衫震置内的光線路徑分別 文τ )及下側(掇钻 攝影機:設置拍攝上側(搬運帶5)的攝設置2台 (探針81)的攝影機亦可。 攝衫機及拍攝下側 繼之’說明針對捲帶式封裝 之-例。該位置對準動作,係可以丄2的位置對準動作 實際動作t的動作,也可 ,,’、捲以封裝處理器2 動作。 ’、、、*動作前的初期設定時的 捲帶式封裝處理器2,藉由 攝影機6b 、6b,拍攝2192-9454-PF 16 200903683 Move in the vertical and horizontal directions of the plane (x-axis - γ-axis direction). Further, the figure shows the exit state of the second cameras 6b and 6b', and shows the insertion state of the second cameras 6b and 6b. The second camera 6b, 6b can display the upper side and the lower side. Therefore, for example, the camera second camera 6b, 6b inserts the transport belt. The second camera 6b, 6b, can simultaneously capture the 对准 alignment mark and the tip end portion of the probe 81. With the cymbal pad or 6b', it is possible to directly shoot the camera 讣 from the lower side, (and the contact surface of the test cymbal), so the tip end of the connection terminal is the position of the tip end. Obtain the test 塾 or alignment mark of the probe, so it can be two == photo-mark information). In /, location data (seat: two second camera 6b, the energy side (transport π 5) and the lower side (probe 81) are taken by the camera itself to reverse or cut the kernel, not as In the limit, the camera on the upper side (the light path in the transport belt and the m-shirt is placed separately) and the camera on the lower side (the drill camera: the camera on the upper side (handling belt 5) is set to 2 (probe 81)) Yes, the camera and the lower side of the shooting are followed by the description of the tape-and-reel package. This positional alignment action can be used to align the position of the 丄 2 with the action of the actual action t, or, ', volume The package processor 2 operates. The tape and reel package processor 2 at the initial setting before the operation of ',, and * is photographed by the cameras 6b and 6b.
2192-9454-PF 200903683 搬運到測試位置的2個T C P的欠7m、, 各個測試墊或對準標記,並 且拍攝對應之探針卡8a、8b的禊4+ 81免,日 繼夕的探針81,取得其座標資料。 ,‘’盧之,异出各TCP的測試塾和禊斜8 夹们a使探針卡83移動,藉二:1的位置偏移量,藉由 以夹甜^使探針卡8b移動, 以使仔該位置偏移量在特定量以下。 如上所述,藉由使2個探針,8a、8b 當2個TCP的位置偏移方向彼 9 ^ rrv ^J f也此夠分別針對 ^個KP執行個別的位置對準。因此,能夠使各似 试墊與各探針卡8a、8b的探針81 、 低接觸錯誤。 確貫地接觸,而能夠降 再者’在2個TCP的位詈德较士人上 π,、…+ 幻位置偏移方向相同的情況下,也 可乂在上述探針卡8a、8b移動 ^ οα _ n 精由推進平台4 #推 進早凡3移動’而使搬運帶整體移動。之後 使探針卡8a、8b移動亦可。 依據而要 上述說明的實施型態,係記 解,並非記載用於限定本發發明的理 露的各元件,係包含本發明技術領:中 更或均等物。 T所屬的所有設計變 例如,在上述實施型態中,抓持住探針卡^ 鉗7a、7b兩者都可以移動,但 、夾 一側的夹鉗7a (或夾鉗7b)可以移 疋於此, 7b (或夾鉗7a )固定亦可。 —側的夾鉗 在此情況下’最初藉由推進平A 之使搬運帶5移動,針物TCP: l吏推進:元3’繼 τ之―,執行和固定2192-9454-PF 200903683 Two TCPs owed to the test position, 7m, each test pad or alignment mark, and the corresponding probe card 8a, 8b 禊4+ 81 free, the probe of the day and night 81. Obtain the coordinates of the data. , ''Luzhi, different TCP test 禊 and skew 8 clips a move the probe card 83, by the position offset of two: 1, by moving the probe card 8b with the clip, So that the positional offset is below a certain amount. As described above, by making the two probes, 8a, 8b, the positional deviation of the two TCPs is 9^rrv^Jf, respectively, so that individual alignments can be performed for each of the KPs. Therefore, it is possible to make the respective test pads and the probes 81 of the probe cards 8a and 8b have a low contact error. Surely contact, and can be reduced again. In the case where the two TCP bits are the same in the π, ..., + phantom position offset direction, the probe cards 8a, 8b can also be moved. ^ οα _ n Fine propulsion platform 4 #Advance early 3 move 'and move the carrying belt as a whole. Then, the probe cards 8a and 8b can be moved. It is to be understood that the above-described embodiments are not intended to limit the various elements of the invention, and are intended to include the invention. For all the design changes to which T belongs, for example, in the above embodiment, both of the probe card clamps 7a, 7b can be moved, but the clamp 7a (or the clamp 7b) on the side of the clip can be moved. Here, 7b (or the clamp 7a) may be fixed. - Side clamp In this case, the carrier belt 5 is initially moved by pushing the flat A, and the needle TCP: l吏 advancement: the element 3' follows the τ, execution and fixation
2192-9454-PF 18 200903683 的^卡叫或探針卡8a)的探針8i㈣置_ 加上該移動量,藉由可以移動的夾钳;之’ 針卡8a (或探針卡8b)移動,針對剩下的吏探 該探針卡83 (或探針卡8b)的探針81之位置對準丁 在上述構成中,相較於上述實施型態 間早化,且郎省空間’而能夠降低成本。 再^也可以對應於探針卡的數量而設置複數個介面 第6圖:裝置而使其和探針卡-起移動。例如,如 I补用的介面元件此,探針卡8a及介面元件 向鉗γ::抓持’藉由圖未顯示的驅動機構而能夠在X軸方 係由4向以及繞著2軸移動’探針卡肋及介面元件9b 軸甜7b所抓持’藉由圖未顯示的驅動機構而能夠在χ 軸方向]軸方向以及繞著2轴移動。 夠在Χ 8b及精人^ Μ構成’探針卡^及介面元# 9a,及探針卡 8& 〃面%件9b係分別以—體的方式移動’所以探針卡 "面元件9a、9b之間無須設置有彈性的導線。 17使第2攝影機6b、6b’設置在測試頭1 〇的上部, 也不曰因為導線而阻礙該攝影裝置視野 將探針卡8a、π沾古— 、 的兩度設定成和過去一樣,所以能夠使使 用過去的决相·,2192-9454-PF 18 200903683's ^ card or probe card 8a) probe 8i (four) set _ plus the amount of movement, by the movable clamp; the 'needle card 8a (or probe card 8b) moves The position of the probe 81 for the remaining probe card 83 (or the probe card 8b) is aligned with the above configuration, and is earlier than the above-described embodiment, and the space is saved. Can reduce costs. Further, a plurality of interfaces may be provided corresponding to the number of probe cards. Fig. 6: The device is moved to move with the probe card. For example, if the interface component is replaced by I, the probe card 8a and the interface component can be gripped by the clamp γ:: 'by the drive mechanism not shown by the figure, the X-axis can be moved in the 4 direction and around the 2 axis. 'The probe rib and the interface member 9b are gripped by the shaft sweetness 7b' and can be moved in the axial direction and around the two axes by the drive mechanism not shown. It is enough to form the 'probe card ^ and the interface element # 9a in the Χ 8b and the fine person ^ ,, and the probe card 8 & 〃 % % % 9 b b 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以 所以There is no need to provide elastic wires between 9b. 17 that the second cameras 6b and 6b' are placed on the upper portion of the test head 1 ,, and the two views of the probe card 8a and the π-disintegration are set to be the same as in the past due to the wire. Able to make use of past decisions,
’ 而使處理器的設計變更控制在最小限度。 穿再者,在上述實施型態中,探針卡及使探針卡移動的 、(失鉗)的個數為2,但本發明並不限於此,也可以 2192-9454-PF 19 200903683 設置3個以上的整數,例 α如α又置3個、4個等。 產業上的利用性 本發明,可用於在捲帶或4 你俺ν式封裝管控裝置的初 實際運作時,用以正確執行掇斜I& 期自又疋或And make the design changes of the processor to a minimum. In addition, in the above embodiment, the number of the probe card and the (clamp) that moves the probe card is two, but the present invention is not limited thereto, and may be set by 2192-9454-PF 19 200903683. For three or more integers, for example, α such as α is set to 3, 4, and the like. Industrial Applicability The present invention can be used to properly perform skew I& during self-operation in the initial operation of a reel or a package control device.
唯執仃探針卡的探針和TCP 的位置對準作業。 β别a塾 【圖式簡單說明】 第1圖顯示使用本發明一實 器之似測試裝置之正面圖。 〜、之捲帶式封裝處理 第2圖為同實施型態的捲帶式封裝處 之側面圖。 63 隹進早 第3圖為同實施型態的捲帶式封裝處理器 … 及測試頭上部的正面圖。 遠早7〇 第4圖為另一實施型態的捲帶式封裝 元及測試頭上部的正面圖。 益的推進單 第5(a)、(b)圖為第4圖所示的 之推進單元、探針卡及攝影機的側面圖。Λ料處理器中 第6圖為另一實施型態的捲帶式封裝 70及測試頭上部的正面圖。 益之推進單 【主要元件符號說明】 TCP測試裝置1 捲帶式封裝處理器2 推進單元3Only the probe of the probe card and the position of the TCP are aligned.别别 a塾 [Simplified description of the drawings] Fig. 1 shows a front view of a test apparatus using an implement of the present invention. ~ Tape and Reel Packaging Process Figure 2 is a side view of the tape and reel package of the same embodiment. 63 隹进早 Fig. 3 is a front view of the same type of tape and reel package processor ... and the upper part of the test head. 7 am. Figure 4 is a front view of the tape and reel package of another embodiment and the upper part of the test head. The propulsion sheet of the benefits is shown in Figure 5(a) and (b) are side views of the propulsion unit, probe card and camera shown in Figure 4. Fig. 6 is a front view of another embodiment of the tape and reel package 70 and the upper portion of the test head.益之推单 [Main component symbol description] TCP test device 1 Tape and reel package processor 2 Propulsion unit 3
2192-9454-PF 20 200903683 推進器30a、30b 搬運帶5 第2攝影機(攝影裝置)6b、6b 夾鉗(測定部移動裝置)7a、7b 探針卡(測定部)8a、8b 探針(連接端子)81 介面元件9、9a、9b 導線91 測試頭1 0 2192-9454-PF 212192-9454-PF 20 200903683 Propellers 30a and 30b Transport belts 5 Second cameras (photographic devices) 6b, 6b Clamps (measurement unit moving devices) 7a, 7b Probe cards (measurement units) 8a, 8b Probes (connections) Terminal) 81 interface component 9, 9a, 9b conductor 91 test head 1 0 2192-9454-PF 21
Claims (1)
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TW97107456A TW200903683A (en) | 2007-03-29 | 2008-03-04 | TCP handling apparatus |
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JP (1) | JPWO2008120518A1 (en) |
KR (1) | KR20090122306A (en) |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI456212B (en) * | 2010-09-21 | 2014-10-11 | Tesec Kk | TCP test set |
TWI709519B (en) * | 2020-01-22 | 2020-11-11 | 鴻勁精密股份有限公司 | Testing equipment and tape changing method thereof |
TWI715499B (en) * | 2020-05-19 | 2021-01-01 | 鴻勁精密股份有限公司 | Detection device, correction method and test equipment using the same |
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KR101443315B1 (en) * | 2014-03-19 | 2014-09-26 | 피앤티솔루션 주식회사 | Probe contact detecting device of tape carrier package |
KR102014496B1 (en) * | 2019-04-08 | 2019-10-21 | 박형수 | Handler for film-type chip |
KR102016395B1 (en) * | 2019-04-08 | 2019-10-21 | 류호민 | Handler for film-type chip |
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JPS644044A (en) * | 1987-06-25 | 1989-01-09 | Nec Corp | Handling device of tab-type ic |
JPH10253688A (en) * | 1997-03-10 | 1998-09-25 | Sony Corp | Apparatus and method for continuity inspection of flexible circuit board |
JP4098306B2 (en) * | 2003-01-31 | 2008-06-11 | 日本エンジニアリング株式会社 | TCP handling device and misalignment correction method in the device |
-
2008
- 2008-02-28 JP JP2009507436A patent/JPWO2008120518A1/en active Pending
- 2008-02-28 WO PCT/JP2008/053516 patent/WO2008120518A1/en active Application Filing
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI456212B (en) * | 2010-09-21 | 2014-10-11 | Tesec Kk | TCP test set |
TWI709519B (en) * | 2020-01-22 | 2020-11-11 | 鴻勁精密股份有限公司 | Testing equipment and tape changing method thereof |
TWI715499B (en) * | 2020-05-19 | 2021-01-01 | 鴻勁精密股份有限公司 | Detection device, correction method and test equipment using the same |
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WO2008120518A1 (en) | 2008-10-09 |
JPWO2008120518A1 (en) | 2010-07-15 |
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