CN100460554C - 制造显示器的方法和装置 - Google Patents
制造显示器的方法和装置 Download PDFInfo
- Publication number
- CN100460554C CN100460554C CNB2005101099034A CN200510109903A CN100460554C CN 100460554 C CN100460554 C CN 100460554C CN B2005101099034 A CNB2005101099034 A CN B2005101099034A CN 200510109903 A CN200510109903 A CN 200510109903A CN 100460554 C CN100460554 C CN 100460554C
- Authority
- CN
- China
- Prior art keywords
- insulating substrate
- infrared ray
- ray absorption
- vacuum chamber
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 50
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 33
- 239000000758 substrate Substances 0.000 claims abstract description 296
- 238000001816 cooling Methods 0.000 claims abstract description 123
- 238000010521 absorption reaction Methods 0.000 claims abstract description 117
- 238000000151 deposition Methods 0.000 claims abstract description 82
- 229910052751 metal Inorganic materials 0.000 claims abstract description 80
- 239000002184 metal Substances 0.000 claims abstract description 80
- 230000008569 process Effects 0.000 claims abstract description 13
- 239000000463 material Substances 0.000 claims description 64
- 238000001704 evaporation Methods 0.000 claims description 27
- 238000010438 heat treatment Methods 0.000 claims description 19
- 230000008020 evaporation Effects 0.000 claims description 12
- 238000007738 vacuum evaporation Methods 0.000 claims description 9
- 238000007740 vapor deposition Methods 0.000 claims description 8
- 239000011347 resin Substances 0.000 claims description 7
- 229920005989 resin Polymers 0.000 claims description 7
- 230000015572 biosynthetic process Effects 0.000 claims description 6
- 229910044991 metal oxide Inorganic materials 0.000 claims description 3
- 150000004706 metal oxides Chemical class 0.000 claims description 3
- 238000004544 sputter deposition Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 157
- 230000008021 deposition Effects 0.000 description 75
- 239000010408 film Substances 0.000 description 49
- 238000012546 transfer Methods 0.000 description 48
- 239000012044 organic layer Substances 0.000 description 25
- 238000009413 insulation Methods 0.000 description 24
- 230000005855 radiation Effects 0.000 description 20
- 230000005540 biological transmission Effects 0.000 description 14
- 238000009434 installation Methods 0.000 description 14
- 230000027756 respiratory electron transport chain Effects 0.000 description 10
- 239000004698 Polyethylene Substances 0.000 description 8
- 150000001875 compounds Chemical class 0.000 description 7
- 201000001438 hypomyelinating leukodystrophy 2 Diseases 0.000 description 7
- 229910052500 inorganic mineral Inorganic materials 0.000 description 7
- 239000011707 mineral Substances 0.000 description 7
- 208000017493 Pelizaeus-Merzbacher disease Diseases 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000011049 filling Methods 0.000 description 5
- 229920000297 Rayon Polymers 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 239000003292 glue Substances 0.000 description 4
- 150000002894 organic compounds Chemical class 0.000 description 4
- 239000011241 protective layer Substances 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 3
- 239000012790 adhesive layer Substances 0.000 description 3
- 230000007850 degeneration Effects 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000011368 organic material Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- IOLCXVTUBQKXJR-UHFFFAOYSA-M potassium bromide Chemical compound [K+].[Br-] IOLCXVTUBQKXJR-UHFFFAOYSA-M 0.000 description 2
- -1 small molecules organic compound Chemical class 0.000 description 2
- 229910052716 thallium Inorganic materials 0.000 description 2
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 2
- 239000002470 thermal conductor Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 description 1
- 229920001621 AMOLED Polymers 0.000 description 1
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910017083 AlN Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- WCUXLLCKKVVCTQ-UHFFFAOYSA-M Potassium chloride Chemical compound [Cl-].[K+] WCUXLLCKKVVCTQ-UHFFFAOYSA-M 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- QGCVKFGLKQOQOG-UHFFFAOYSA-L [Cl-].[Cs+].[I-].[Na+] Chemical compound [Cl-].[Cs+].[I-].[Na+] QGCVKFGLKQOQOG-UHFFFAOYSA-L 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000001464 adherent effect Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 1
- 229910001632 barium fluoride Inorganic materials 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- CODNYICXDISAEA-UHFFFAOYSA-N bromine monochloride Chemical compound BrCl CODNYICXDISAEA-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000012809 cooling fluid Substances 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- CBEQRNSPHCCXSH-UHFFFAOYSA-N iodine monobromide Chemical compound IBr CBEQRNSPHCCXSH-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000003507 refrigerant Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010301 surface-oxidation reaction Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78603—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the insulating substrate or support
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (21)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004267021A JP2006085933A (ja) | 2004-09-14 | 2004-09-14 | 表示装置の製造方法及び製造装置 |
JP2004267021 | 2004-09-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1754977A CN1754977A (zh) | 2006-04-05 |
CN100460554C true CN100460554C (zh) | 2009-02-11 |
Family
ID=36034561
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005101099034A Active CN100460554C (zh) | 2004-09-14 | 2005-09-14 | 制造显示器的方法和装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7521268B2 (zh) |
JP (1) | JP2006085933A (zh) |
KR (1) | KR100728851B1 (zh) |
CN (1) | CN100460554C (zh) |
TW (1) | TWI307073B (zh) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100377321B1 (ko) * | 1999-12-31 | 2003-03-26 | 주식회사 엘지화학 | 피-형 반도체 성질을 갖는 유기 화합물을 포함하는 전기소자 |
KR100721656B1 (ko) * | 2005-11-01 | 2007-05-23 | 주식회사 엘지화학 | 유기 전기 소자 |
KR100845694B1 (ko) * | 2006-01-18 | 2008-07-11 | 주식회사 엘지화학 | 적층형 유기발광소자 |
EP1992202B1 (en) * | 2006-03-07 | 2017-11-08 | LG Display Co., Ltd. | Oled and fabricating method of the same |
JP5089906B2 (ja) * | 2006-04-05 | 2012-12-05 | 株式会社アルバック | 縦型化学気相成長装置 |
JP4971723B2 (ja) * | 2006-08-29 | 2012-07-11 | キヤノン株式会社 | 有機発光表示装置の製造方法 |
KR101263005B1 (ko) * | 2006-12-19 | 2013-05-08 | 비코 인스트루먼츠 인코포레이티드 | 증착 장치 및 방법 |
EP2178550A4 (en) * | 2007-07-27 | 2010-08-04 | Immuneregen Biosciences Inc | METHODS AND COMPOSITIONS FOR STIMULATING THE PROLIFERATION OR DIFFERENTIATION OF STEM CELLS BY SUBSTANCE P OR AN ANALOGUE THEREOF |
US20090091242A1 (en) * | 2007-10-05 | 2009-04-09 | Liang-Sheng Liao | Hole-injecting layer in oleds |
US11975546B2 (en) | 2008-06-13 | 2024-05-07 | Kateeva, Inc. | Gas enclosure assembly and system |
US10434804B2 (en) | 2008-06-13 | 2019-10-08 | Kateeva, Inc. | Low particle gas enclosure systems and methods |
US7947531B1 (en) * | 2008-08-28 | 2011-05-24 | Intermolecular, Inc. | Combinatorial evaluation of dry semiconductor processes |
KR20110110187A (ko) * | 2008-12-18 | 2011-10-06 | 비코 인스트루먼트 아이엔씨. | 열확산 오리피스를 갖는 진공 증착원 |
KR20110138259A (ko) * | 2009-03-25 | 2011-12-26 | 비코 인스트루먼츠 인코포레이티드 | 고증기압재료의 증착 |
JP5854347B2 (ja) | 2009-12-23 | 2016-02-09 | 住友電工ハードメタル株式会社 | 光学部品 |
JP2012001762A (ja) * | 2010-06-16 | 2012-01-05 | Nippon Electric Glass Co Ltd | 蒸着方法および蒸着装置 |
DE102011075092B4 (de) * | 2010-12-07 | 2015-11-12 | Von Ardenne Gmbh | Verfahren zur Herstellung eines organischen lichtemittierenden Leuchtmittels |
DE102010054893A1 (de) | 2010-12-17 | 2012-06-21 | Osram Opto Semiconductors Gmbh | Strahlungsemittierende organisch-elektronische Vorrichtung und Verfahren zu deren Herstellung |
US9722212B2 (en) | 2011-02-14 | 2017-08-01 | Semiconductor Energy Laboratory Co., Ltd. | Lighting device, light-emitting device, and manufacturing method and manufacturing apparatus thereof |
KR101810683B1 (ko) | 2011-02-14 | 2017-12-20 | 삼성디스플레이 주식회사 | 자석 수단의 교체가 가능한 마스크 고정장치 및 이를 포함하는 증착장치 |
JP2013159841A (ja) * | 2012-02-08 | 2013-08-19 | Tokyo Electron Ltd | 成膜装置 |
KR101841980B1 (ko) * | 2012-10-18 | 2018-03-26 | 가부시키가이샤 알박 | 성막 장치 |
JP6196078B2 (ja) * | 2012-10-18 | 2017-09-13 | 株式会社アルバック | 成膜装置 |
KR101673016B1 (ko) * | 2013-08-27 | 2016-11-07 | 삼성디스플레이 주식회사 | 박막봉지 제조장치 및 이를 이용한 표시 장치의 제조방법 |
KR101970449B1 (ko) | 2013-12-26 | 2019-04-18 | 카티바, 인크. | 전자 장치의 열 처리를 위한 장치 및 기술 |
CN105637669B (zh) | 2014-01-21 | 2017-11-03 | 科迪华公司 | 用于电子装置封装的设备和技术 |
KR102315014B1 (ko) | 2014-04-30 | 2021-10-20 | 카티바, 인크. | 가스 쿠션 장비 및 기판 코팅 기술 |
CN108348954A (zh) * | 2015-11-16 | 2018-07-31 | 科迪华公司 | 用于基底的热处理的系统和方法 |
JP6440654B2 (ja) * | 2016-06-17 | 2018-12-19 | 住友化学株式会社 | 有機電子素子の製造方法及び機能層の製造方法 |
CN107190245B (zh) * | 2017-05-23 | 2019-04-02 | 京东方科技集团股份有限公司 | 用于蒸镀装置的载板及其蒸镀装置 |
CN108203812B (zh) * | 2018-01-25 | 2020-02-07 | 京东方科技集团股份有限公司 | 一种基板固定载具、蒸镀设备及蒸镀方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53100936A (en) * | 1977-02-15 | 1978-09-02 | Mitsubishi Heavy Ind Ltd | Vacuum evaporating method |
US4904362A (en) * | 1987-07-24 | 1990-02-27 | Miba Gleitlager Aktiengesellschaft | Bar-shaped magnetron or sputter cathode arrangement |
CN1107523A (zh) * | 1993-11-24 | 1995-08-30 | 应用材料有限公司 | 集成式溅射靶组合件 |
JP2004193083A (ja) * | 2002-12-13 | 2004-07-08 | Nippon Sheet Glass Co Ltd | 透明導電膜の形成方法 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR920003591B1 (ko) * | 1988-04-11 | 1992-05-04 | 미쯔비시주우고오교오 가부시기가이샤 | 연속진공증착장치 |
JPH07159768A (ja) * | 1993-12-03 | 1995-06-23 | Denkoo:Kk | 連続熱処理装置 |
JPH07216550A (ja) * | 1994-02-07 | 1995-08-15 | Kokusai Electric Co Ltd | 基板冷却装置 |
JPH09217169A (ja) | 1996-02-15 | 1997-08-19 | Nikon Corp | 基板の加熱方法とそれを用いた真空蒸着装置 |
JPH11264991A (ja) | 1998-01-13 | 1999-09-28 | Matsushita Electric Ind Co Ltd | 液晶表示素子の製造方法 |
JPH11329723A (ja) * | 1998-05-08 | 1999-11-30 | Toray Ind Inc | 有機電界発光素子の製造方法 |
EP1115268A1 (en) | 1999-07-07 | 2001-07-11 | Sony Corporation | Method and apparatus for manufacturing flexible organic el display |
US6547922B2 (en) * | 2000-01-31 | 2003-04-15 | Canon Kabushiki Kaisha | Vacuum-processing apparatus using a movable cooling plate during processing |
JP3754859B2 (ja) | 2000-02-16 | 2006-03-15 | キヤノン株式会社 | 画像表示装置の製造法 |
EP1199909A4 (en) * | 2000-03-22 | 2007-04-18 | Idemitsu Kosan Co | METHOD AND APPARATUS FOR MANUFACTURING ORGANIC ELECTROLUMINESCENCE DISPLAY |
JP2002270484A (ja) * | 2001-03-07 | 2002-09-20 | Tokyo Electron Ltd | 冷却処理装置及び冷却処理方法 |
KR100745062B1 (ko) * | 2001-06-30 | 2007-08-01 | 주식회사 하이닉스반도체 | 반도체 제조장치 |
KR100462046B1 (ko) * | 2001-11-05 | 2004-12-16 | 네오뷰코오롱 주식회사 | 유기물 디스플레이의 무기물막 증착 장치 |
JP4075425B2 (ja) * | 2002-03-20 | 2008-04-16 | セイコーエプソン株式会社 | 有機el装置、有機el装置の製造方法、有機el装置の製造装置、及び電子機器 |
JP4223743B2 (ja) | 2002-06-26 | 2009-02-12 | 光寶科技股▲分▼有限公司 | カラーセクションディスプレイユニットの製造方法 |
JP2004128383A (ja) * | 2002-10-07 | 2004-04-22 | Hitachi Kokusai Electric Inc | 基板処理装置 |
JP5072184B2 (ja) * | 2002-12-12 | 2012-11-14 | 株式会社半導体エネルギー研究所 | 成膜方法 |
US7239804B2 (en) * | 2004-03-23 | 2007-07-03 | Canon Kabushiki Kaisha | Cooling device, and apparatus and method for manufacturing image display panel using cooling device |
KR20050118574A (ko) * | 2004-06-14 | 2005-12-19 | 동부아남반도체 주식회사 | 기판 냉각 장치 및 이를 이용하는 기판 냉각 방법 |
-
2004
- 2004-09-14 JP JP2004267021A patent/JP2006085933A/ja active Pending
-
2005
- 2005-08-23 US US11/208,608 patent/US7521268B2/en active Active
- 2005-08-25 TW TW094129114A patent/TWI307073B/zh not_active IP Right Cessation
- 2005-09-13 KR KR1020050085030A patent/KR100728851B1/ko active IP Right Grant
- 2005-09-14 CN CNB2005101099034A patent/CN100460554C/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53100936A (en) * | 1977-02-15 | 1978-09-02 | Mitsubishi Heavy Ind Ltd | Vacuum evaporating method |
US4904362A (en) * | 1987-07-24 | 1990-02-27 | Miba Gleitlager Aktiengesellschaft | Bar-shaped magnetron or sputter cathode arrangement |
CN1107523A (zh) * | 1993-11-24 | 1995-08-30 | 应用材料有限公司 | 集成式溅射靶组合件 |
JP2004193083A (ja) * | 2002-12-13 | 2004-07-08 | Nippon Sheet Glass Co Ltd | 透明導電膜の形成方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200612381A (en) | 2006-04-16 |
JP2006085933A (ja) | 2006-03-30 |
CN1754977A (zh) | 2006-04-05 |
US20060057750A1 (en) | 2006-03-16 |
KR100728851B1 (ko) | 2007-06-15 |
US7521268B2 (en) | 2009-04-21 |
TWI307073B (en) | 2009-03-01 |
KR20060051234A (ko) | 2006-05-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN100460554C (zh) | 制造显示器的方法和装置 | |
JP5258467B2 (ja) | 薄膜電界効果型トランジスタおよびそれを用いた表示装置 | |
JP5339825B2 (ja) | 薄膜電界効果型トランジスタおよびそれを用いた表示装置 | |
JP5345359B2 (ja) | 薄膜電界効果型トランジスタおよびそれを用いた表示装置 | |
JP2008276211A (ja) | 有機電界発光表示装置およびパターニング方法 | |
US8206507B2 (en) | Evaporation method, evaporation device and method of fabricating light emitting device | |
US8202743B2 (en) | Light emitting device and manufacturing method thereof | |
US20070024185A1 (en) | Organic el display | |
TW200406498A (en) | Method of fabricating light-emitting device and apparatus for manufacturing light-emitting device | |
JP2008276212A (ja) | 有機電界発光表示装置 | |
JPWO2007139009A1 (ja) | 酸化物半導体、薄膜トランジスタ、及びそれらの製造方法 | |
TW201103142A (en) | Organic light emitting display device and fabricating method thereof | |
WO2008143021A1 (en) | Insulated gate type transistor and display device | |
TW201208081A (en) | Thin film transistor and display device | |
JP2007323044A (ja) | 有機発光表示装置及びその製造方法 | |
KR20140115955A (ko) | 표시 장치의 제조 방법 및 표시 장치 | |
JP2007134496A (ja) | 薄膜トランジスタ | |
US20150129854A1 (en) | Thin-film transistor, method of manufacturing the same, and organic light-emitting diode (oled) display including the same | |
CN101409964B (zh) | 显示装置及其制造方法 | |
JP2003114626A (ja) | 発光装置及びその作製方法 | |
CN106298645A (zh) | 一种tft基板的制备方法 | |
TWI658621B (zh) | 有機發光顯示裝置 | |
JP2004158337A (ja) | 蒸着装置 | |
JP2003217855A (ja) | エレクトロルミネッセンス表示装置及びその製造方法 | |
JP2009064631A (ja) | 表示装置の製造装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: TOSHIBA MOBILE DISPLAY CO., LTD. Free format text: FORMER NAME: TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY LTD. Owner name: JAPAN DISPLAY MIDDLE INC. Free format text: FORMER NAME: TOSHIBA MOBILE DISPLAY CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Saitama Prefecture, Japan Patentee after: JAPAN DISPLAY Inc. Address before: Saitama Prefecture, Japan Patentee before: Toshiba Mobile Display Co.,Ltd. |
|
CP03 | Change of name, title or address |
Address after: Saitama Prefecture, Japan Patentee after: Toshiba Mobile Display Co.,Ltd. Address before: Tokyo, Japan Patentee before: TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY Co.,Ltd. |