ATE486349T1 - Gleichzeitige programmierung von nichtflüchtigem speicher - Google Patents
Gleichzeitige programmierung von nichtflüchtigem speicherInfo
- Publication number
- ATE486349T1 ATE486349T1 AT05755315T AT05755315T ATE486349T1 AT E486349 T1 ATE486349 T1 AT E486349T1 AT 05755315 T AT05755315 T AT 05755315T AT 05755315 T AT05755315 T AT 05755315T AT E486349 T1 ATE486349 T1 AT E486349T1
- Authority
- AT
- Austria
- Prior art keywords
- condition
- bit line
- value
- volatile storage
- common selection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/868,147 US7307884B2 (en) | 2004-06-15 | 2004-06-15 | Concurrent programming of non-volatile memory |
| PCT/US2005/019393 WO2006001979A1 (en) | 2004-06-15 | 2005-06-02 | Concurrent programming of non-volatile memory |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE486349T1 true ATE486349T1 (de) | 2010-11-15 |
Family
ID=34993202
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05755315T ATE486349T1 (de) | 2004-06-15 | 2005-06-02 | Gleichzeitige programmierung von nichtflüchtigem speicher |
Country Status (9)
| Country | Link |
|---|---|
| US (4) | US7307884B2 (de) |
| EP (1) | EP1759393B1 (de) |
| JP (1) | JP4647656B2 (de) |
| KR (1) | KR100868570B1 (de) |
| CN (1) | CN101057299B (de) |
| AT (1) | ATE486349T1 (de) |
| DE (1) | DE602005024394D1 (de) |
| TW (1) | TWI287228B (de) |
| WO (1) | WO2006001979A1 (de) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7307884B2 (en) * | 2004-06-15 | 2007-12-11 | Sandisk Corporation | Concurrent programming of non-volatile memory |
| US7885119B2 (en) | 2006-07-20 | 2011-02-08 | Sandisk Corporation | Compensating for coupling during programming |
| JP2008090451A (ja) * | 2006-09-29 | 2008-04-17 | Toshiba Corp | 記憶装置 |
| US8391061B2 (en) * | 2006-12-29 | 2013-03-05 | Intel Corporation | Flash memory and associated methods |
| US20080158986A1 (en) * | 2006-12-29 | 2008-07-03 | Daniel Elmhurst | Flash memory and associated methods |
| US7738291B2 (en) * | 2007-03-12 | 2010-06-15 | Micron Technology, Inc. | Memory page boosting method, device and system |
| CN101715596B (zh) * | 2007-05-07 | 2013-08-21 | 桑迪士克科技股份有限公司 | 使用沟道隔离切换的非易失性存储器的升压 |
| KR101296289B1 (ko) * | 2007-08-20 | 2013-08-14 | 삼성전자주식회사 | 비휘발성 메모리 장치의 프로그래밍 방법 |
| US8310872B2 (en) * | 2008-01-25 | 2012-11-13 | Rambus Inc. | Multi-page parallel program flash memory |
| KR101462488B1 (ko) * | 2008-03-31 | 2014-11-18 | 삼성전자주식회사 | 더미셀을 이용한 플래시 메모리 장치 및 그것의 동작 방법 |
| US8130528B2 (en) | 2008-08-25 | 2012-03-06 | Sandisk 3D Llc | Memory system with sectional data lines |
| US7950688B2 (en) * | 2008-09-17 | 2011-05-31 | Tk Holdings Inc. | Airbag module |
| US8027209B2 (en) | 2008-10-06 | 2011-09-27 | Sandisk 3D, Llc | Continuous programming of non-volatile memory |
| KR101448915B1 (ko) * | 2008-10-17 | 2014-10-14 | 삼성전자주식회사 | 프로그램 및 검증 동작을 수행하는 가변 저항 메모리 장치 |
| US8279650B2 (en) | 2009-04-20 | 2012-10-02 | Sandisk 3D Llc | Memory system with data line switching scheme |
| US7978511B2 (en) | 2009-05-28 | 2011-07-12 | Micron Technology, Inc. | Data line management in a memory device |
| US8169822B2 (en) | 2009-11-11 | 2012-05-01 | Sandisk Technologies Inc. | Data state-dependent channel boosting to reduce channel-to-floating gate coupling in memory |
| US8102712B2 (en) * | 2009-12-22 | 2012-01-24 | Intel Corporation | NAND programming technique |
| US8400822B2 (en) * | 2010-03-22 | 2013-03-19 | Qualcomm Incorporated | Multi-port non-volatile memory that includes a resistive memory element |
| JP2013534685A (ja) | 2010-07-21 | 2013-09-05 | モサイド・テクノロジーズ・インコーポレーテッド | フラッシュメモリのためのマルチページプログラム方式 |
| CN103366813B (zh) * | 2012-03-26 | 2016-02-10 | 上海华虹宏力半导体制造有限公司 | 非挥发性存储器的擦除方法 |
| US20140198576A1 (en) * | 2013-01-16 | 2014-07-17 | Macronix International Co, Ltd. | Programming technique for reducing program disturb in stacked memory structures |
| JP6179206B2 (ja) * | 2013-06-11 | 2017-08-16 | 株式会社リコー | メモリ制御装置 |
| KR102175039B1 (ko) * | 2013-06-25 | 2020-11-05 | 삼성전자주식회사 | 불휘발성 메모리 장치의 데이터 기입 방법 |
| US9218851B2 (en) * | 2013-10-24 | 2015-12-22 | Sandisk Technologies Inc. | Power drop protection for a data storage device |
| KR102292183B1 (ko) | 2014-11-07 | 2021-08-25 | 삼성전자주식회사 | 불휘발성 메모리의 동작 방법 및 불휘발성 메모리를 포함하는 스토리지 장치의 동작 방법 |
| KR102340328B1 (ko) * | 2016-01-07 | 2021-12-16 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 이의 동작 방법 |
| US9812183B2 (en) * | 2016-03-04 | 2017-11-07 | Adesto Technologies Corporation | Read latency reduction in a memory device |
| US10381094B2 (en) | 2016-10-11 | 2019-08-13 | Macronix International Co., Ltd. | 3D memory with staged-level multibit programming |
| US10381085B2 (en) * | 2016-10-27 | 2019-08-13 | Micron Technogy, Inc. | Erasing memory cells |
| US11545221B2 (en) | 2018-06-29 | 2023-01-03 | Sandisk Technologies Llc | Concurrent programming of multiple cells for non-volatile memory devices |
| US10978156B2 (en) * | 2018-06-29 | 2021-04-13 | Sandisk Technologies Llc | Concurrent programming of multiple cells for non-volatile memory devices |
| JP2020009509A (ja) * | 2018-07-03 | 2020-01-16 | キオクシア株式会社 | 半導体記憶装置 |
| US11062759B1 (en) * | 2020-04-01 | 2021-07-13 | Macronix International Co., Ltd. | Memory device and programming method thereof |
| KR102897358B1 (ko) * | 2020-07-30 | 2025-12-05 | 삼성전자 주식회사 | 프로그래밍 동안 양방향 채널 프리차지를 수행하는 비휘발성 메모리 장치 |
| JP7608293B2 (ja) | 2021-08-17 | 2025-01-06 | キオクシア株式会社 | メモリデバイス及びメモリシステム |
| US12379846B2 (en) * | 2022-12-28 | 2025-08-05 | Quanta Computer Inc. | Synchronously programming multiple memory devices |
| US20250046387A1 (en) * | 2023-07-31 | 2025-02-06 | Western Digital Technologies, Inc. | Non-volatile memory with concurrent programming |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JPH07235193A (ja) * | 1993-12-28 | 1995-09-05 | Toshiba Corp | 半導体記憶装置 |
| KR100253868B1 (ko) * | 1995-11-13 | 2000-05-01 | 니시무로 타이죠 | 불휘발성 반도체기억장치 |
| KR100244864B1 (ko) * | 1996-03-18 | 2000-03-02 | 니시무로 타이죠 | 불휘발성 반도체 기억 장치 |
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| JP3905979B2 (ja) | 1998-06-03 | 2007-04-18 | 株式会社東芝 | 不揮発性半導体メモリ |
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| JP4154771B2 (ja) | 1998-11-10 | 2008-09-24 | ソニー株式会社 | 不揮発性半導体記憶装置およびそのデータ書き込み方法 |
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| US6859397B2 (en) * | 2003-03-05 | 2005-02-22 | Sandisk Corporation | Source side self boosting technique for non-volatile memory |
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| US7307884B2 (en) | 2004-06-15 | 2007-12-11 | Sandisk Corporation | Concurrent programming of non-volatile memory |
| KR101263167B1 (ko) | 2006-02-13 | 2013-05-09 | 삼성전자주식회사 | 메모리 셀에 대한 액세스 정보를 저장하는 반도체 메모리장치 |
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| US7468911B2 (en) * | 2006-11-02 | 2008-12-23 | Sandisk Corporation | Non-volatile memory using multiple boosting modes for reduced program disturb |
| US7525843B2 (en) * | 2006-12-30 | 2009-04-28 | Sandisk Corporation | Non-volatile storage with adaptive body bias |
-
2004
- 2004-06-15 US US10/868,147 patent/US7307884B2/en not_active Expired - Lifetime
-
2005
- 2005-06-02 KR KR1020077001028A patent/KR100868570B1/ko not_active Expired - Fee Related
- 2005-06-02 AT AT05755315T patent/ATE486349T1/de not_active IP Right Cessation
- 2005-06-02 JP JP2007516526A patent/JP4647656B2/ja not_active Expired - Fee Related
- 2005-06-02 WO PCT/US2005/019393 patent/WO2006001979A1/en not_active Ceased
- 2005-06-02 EP EP05755315A patent/EP1759393B1/de not_active Expired - Lifetime
- 2005-06-02 DE DE602005024394T patent/DE602005024394D1/de not_active Expired - Lifetime
- 2005-06-02 CN CN2005800251437A patent/CN101057299B/zh not_active Expired - Fee Related
- 2005-06-10 TW TW094119311A patent/TWI287228B/zh not_active IP Right Cessation
-
2007
- 2007-11-07 US US11/936,081 patent/US7821835B2/en not_active Expired - Fee Related
- 2007-11-07 US US11/936,086 patent/US7796444B2/en not_active Expired - Lifetime
- 2007-11-07 US US11/936,084 patent/US7570518B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| DE602005024394D1 (de) | 2010-12-09 |
| US20050276108A1 (en) | 2005-12-15 |
| JP2008503025A (ja) | 2008-01-31 |
| KR100868570B1 (ko) | 2008-11-13 |
| US20080056002A1 (en) | 2008-03-06 |
| US7570518B2 (en) | 2009-08-04 |
| WO2006001979A1 (en) | 2006-01-05 |
| US20080055994A1 (en) | 2008-03-06 |
| TW200623136A (en) | 2006-07-01 |
| US7307884B2 (en) | 2007-12-11 |
| US7796444B2 (en) | 2010-09-14 |
| EP1759393B1 (de) | 2010-10-27 |
| US20080056003A1 (en) | 2008-03-06 |
| CN101057299A (zh) | 2007-10-17 |
| KR20070069126A (ko) | 2007-07-02 |
| TWI287228B (en) | 2007-09-21 |
| JP4647656B2 (ja) | 2011-03-09 |
| EP1759393A1 (de) | 2007-03-07 |
| CN101057299B (zh) | 2010-06-16 |
| US7821835B2 (en) | 2010-10-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |