ATE476088T1 - Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten - Google Patents
Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeitenInfo
- Publication number
- ATE476088T1 ATE476088T1 AT02798480T AT02798480T ATE476088T1 AT E476088 T1 ATE476088 T1 AT E476088T1 AT 02798480 T AT02798480 T AT 02798480T AT 02798480 T AT02798480 T AT 02798480T AT E476088 T1 ATE476088 T1 AT E476088T1
- Authority
- AT
- Austria
- Prior art keywords
- ray
- ray source
- analysis
- ray tube
- application
- Prior art date
Links
- 238000004458 analytical method Methods 0.000 title abstract 2
- 239000007788 liquid Substances 0.000 title abstract 2
- 238000000034 method Methods 0.000 abstract 3
- 239000012530 fluid Substances 0.000 abstract 2
- 238000004876 x-ray fluorescence Methods 0.000 abstract 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 abstract 1
- 230000008878 coupling Effects 0.000 abstract 1
- 238000010168 coupling process Methods 0.000 abstract 1
- 238000005859 coupling reaction Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 239000003989 dielectric material Substances 0.000 abstract 1
- 239000000446 fuel Substances 0.000 abstract 1
- 239000007789 gas Substances 0.000 abstract 1
- 239000003208 petroleum Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 229910052717 sulfur Inorganic materials 0.000 abstract 1
- 239000011593 sulfur Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/12—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/12—Cooling
- H01J2235/1225—Cooling characterised by method
- H01J2235/1291—Thermal conductivity
- H01J2235/1295—Contact between conducting bodies
Landscapes
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
- Luminescent Compositions (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US33658401P | 2001-12-04 | 2001-12-04 | |
| US38399002P | 2002-05-29 | 2002-05-29 | |
| US39896802P | 2002-07-26 | 2002-07-26 | |
| US39896602P | 2002-07-26 | 2002-07-26 | |
| US39896502P | 2002-07-26 | 2002-07-26 | |
| US10/206,531 US6781060B2 (en) | 2002-07-26 | 2002-07-26 | Electrical connector, a cable sleeve, and a method for fabricating an electrical connection |
| PCT/US2002/038493 WO2003049510A2 (en) | 2001-12-04 | 2002-12-04 | X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE476088T1 true ATE476088T1 (de) | 2010-08-15 |
Family
ID=27558986
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02798480T ATE476088T1 (de) | 2001-12-04 | 2002-12-04 | Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten |
Country Status (8)
| Country | Link |
|---|---|
| US (3) | US7515684B2 (de) |
| EP (1) | EP1454513B1 (de) |
| JP (2) | JP4999256B2 (de) |
| CN (2) | CN101183083B (de) |
| AT (1) | ATE476088T1 (de) |
| AU (3) | AU2002364525A1 (de) |
| DE (1) | DE60237168D1 (de) |
| WO (3) | WO2003048745A2 (de) |
Families Citing this family (133)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ATE476088T1 (de) * | 2001-12-04 | 2010-08-15 | X Ray Optical Sys Inc | Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten |
| KR20040098687A (ko) * | 2003-05-15 | 2004-11-26 | 삼성전자주식회사 | 접합 공정의 실시간 모니터링 시스템 및 그 방법 |
| EP1661439A2 (de) | 2003-08-04 | 2006-05-31 | X-Ray Optical Systems, Inc. | Röntgenquellenbaugruppe mit verbesserter ausgangsstabilität unter verwendung von röhrenleistungseinstellungen und fernkalibration |
| FI20031753A7 (fi) | 2003-12-01 | 2005-06-02 | Metorex Int Oy | Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten |
| US7286644B2 (en) * | 2004-04-28 | 2007-10-23 | Varian Medical Systems Technologies, Inc. | Systems, methods and devices for x-ray device focal spot control |
| DE102004025119B4 (de) * | 2004-05-21 | 2012-08-02 | Siemens Ag | Röntgenstrahler |
| FR2882886B1 (fr) * | 2005-03-02 | 2007-11-23 | Commissariat Energie Atomique | Source monochromatique de rayons x et microscope a rayons x mettant en oeuvre une telle source |
| US20060228238A1 (en) * | 2005-04-06 | 2006-10-12 | Andrews Gregory C | Coolant pump for x-ray device |
| CN101356589B (zh) | 2005-08-01 | 2013-02-27 | 纽约州立大学研究基金会 | 采用点聚焦、弯曲单色光学器件的x射线成像系统 |
| ATE423382T1 (de) | 2005-08-22 | 2009-03-15 | Unisantis Fze | Vorrichtung und verfahren zum positionieren einer röntgenlinse und röntgengerät mit einer solchen vorrichtung |
| JP4954525B2 (ja) * | 2005-10-07 | 2012-06-20 | 浜松ホトニクス株式会社 | X線管 |
| US20070189459A1 (en) * | 2006-02-16 | 2007-08-16 | Stellar Micro Devices, Inc. | Compact radiation source |
| US9324535B2 (en) * | 2006-02-16 | 2016-04-26 | Stellarray, Incorporaated | Self contained irradiation system using flat panel X-ray sources |
| US20100189223A1 (en) * | 2006-02-16 | 2010-07-29 | Steller Micro Devices | Digitally addressed flat panel x-ray sources |
| US20100189222A1 (en) * | 2006-02-16 | 2010-07-29 | Steller Micro Devices | Panoramic irradiation system using flat panel x-ray sources |
| JP4559377B2 (ja) * | 2006-03-23 | 2010-10-06 | 株式会社ジョブ | X線発生装置 |
| US7599469B2 (en) * | 2006-04-28 | 2009-10-06 | Cameron International Corporation | Non-intrusive pressure gage |
| US7409037B2 (en) * | 2006-05-05 | 2008-08-05 | Oxford Instruments Analytical Oy | X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure |
| JP5102549B2 (ja) * | 2006-07-14 | 2012-12-19 | 独立行政法人科学技術振興機構 | X線分析装置及びx線分析方法 |
| US20080037706A1 (en) * | 2006-08-08 | 2008-02-14 | Panalytical B.V. | Device and method for performing X-ray analysis |
| DE102006062452B4 (de) * | 2006-12-28 | 2008-11-06 | Comet Gmbh | Röntgenröhre und Verfahren zur Prüfung eines Targets einer Röntgenröhre |
| SE532723C2 (sv) * | 2007-05-03 | 2010-03-23 | Lars Lantto | Anordning för alstring av röntgenstrålning med stort reellt fokus och behovsanpassat virtuellt fokus |
| JP5196872B2 (ja) * | 2007-05-28 | 2013-05-15 | 株式会社東芝 | X線管用高電圧コネクタ |
| US7629593B2 (en) * | 2007-06-28 | 2009-12-08 | Asml Netherlands B.V. | Lithographic apparatus, radiation system, device manufacturing method, and radiation generating method |
| FR2918501B1 (fr) | 2007-07-02 | 2009-11-06 | Xenocs Soc Par Actions Simplif | Dispositif de delivrance d'un faisceau de rayons x a haute energie |
| US9305735B2 (en) | 2007-09-28 | 2016-04-05 | Brigham Young University | Reinforced polymer x-ray window |
| JP5414167B2 (ja) * | 2007-11-02 | 2014-02-12 | 株式会社東芝 | X線管装置 |
| US7742566B2 (en) * | 2007-12-07 | 2010-06-22 | General Electric Company | Multi-energy imaging system and method using optic devices |
| FR2926924B1 (fr) * | 2008-01-25 | 2012-10-12 | Thales Sa | Source radiogene comprenant au moins une source d'electrons associee a un dispositif photoelectrique de commande |
| US8050382B2 (en) * | 2008-02-25 | 2011-11-01 | X-Ray Optical Systems, Inc. | Sample module with sample stream spaced from window, for x-ray analysis system |
| WO2009111454A1 (en) * | 2008-03-05 | 2009-09-11 | X-Ray Optical Systems, Inc | Xrf system having multiple excitation energy bands in highly aligned package |
| WO2009126868A1 (en) * | 2008-04-11 | 2009-10-15 | Rigaku Innovative Technologies, Inc. | X-ray generator with polycapillary optic |
| RU2508052C2 (ru) * | 2008-05-09 | 2014-02-27 | Конинклейке Филипс Электроникс Н.В. | Система для рентгеновского обследования со встроенным приводным средством для выполнения поступательного и/или поворотного перемещений фокусного пятна, по меньшей мере, одного анода, испускающего рентгеновское излучение, относительно неподвижного опорного положения и со средством для компенсации происходящих в результате параллельного и/или углового сдвигов испускаемых пучков рентгеновского излучения |
| US8080791B2 (en) | 2008-12-12 | 2011-12-20 | Fei Company | X-ray detector for electron microscope |
| FR2939896B1 (fr) | 2008-12-12 | 2011-05-06 | Geoservices Equipements | Dispositif d'emission d'un premier faisceau de photons gamma de haute energie et d'un deuxieme faisceau de photons gamma de plus basse energie, ensemble de mesure et procede associe |
| CN102307527B (zh) * | 2009-02-10 | 2013-08-21 | 皇家飞利浦电子股份有限公司 | 用于显示x射线图像的医学查看系统 |
| US8130908B2 (en) * | 2009-02-23 | 2012-03-06 | X-Ray Optical Systems, Inc. | X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic |
| JP5740078B2 (ja) * | 2009-03-06 | 2015-06-24 | 株式会社東芝 | X線管装置 |
| US8625737B2 (en) * | 2010-02-09 | 2014-01-07 | X-Ray Optical Systems, Inc. | Sample module with sample stream supported and spaced from window, for X-ray analysis system |
| US9244026B2 (en) | 2010-02-10 | 2016-01-26 | Schlumberger Norge As | X-ray fluorescence analyzer |
| CA2789299C (en) * | 2010-02-10 | 2020-11-17 | Schlumberger Norge As | Automated drilling fluid analyzer |
| US8223925B2 (en) | 2010-04-15 | 2012-07-17 | Bruker Axs Handheld, Inc. | Compact collimating device |
| WO2011146758A2 (en) * | 2010-05-19 | 2011-11-24 | Silver Eric H | Hybrid x-ray optic apparatus and methods |
| WO2012032435A1 (en) | 2010-09-06 | 2012-03-15 | Koninklijke Philips Electronics N.V. | X-ray imaging with pixelated detector |
| US8526574B2 (en) * | 2010-09-24 | 2013-09-03 | Moxtek, Inc. | Capacitor AC power coupling across high DC voltage differential |
| EP2721396B1 (de) * | 2011-06-20 | 2018-04-04 | X-Ray Optical Systems, Inc. | Online-überwachung von verunreinigungen in roh- und schweren kraftstoffen sowie raffinerieanwendungen dafür |
| JP2013020792A (ja) * | 2011-07-11 | 2013-01-31 | Canon Inc | 放射線発生装置及びそれを用いた放射線撮影装置 |
| JP6175436B2 (ja) | 2011-08-06 | 2017-08-02 | リガク イノベイティブ テクノロジーズ インコーポレイテッド | X線光子及び中性子を導くナノチューブ素材の装置 |
| EP2745101B1 (de) | 2011-08-15 | 2019-11-06 | X-Ray Optical Systems, Inc. | Vorrichtung zur röntgenanalyse |
| DE102011083729A1 (de) * | 2011-09-29 | 2013-04-04 | Siemens Aktiengesellschaft | Verfahren und Vorrichtung zur Bestimmung des Verschleißes einer Röntgenanode |
| JP5850059B2 (ja) * | 2011-10-04 | 2016-02-03 | 株式会社ニコン | X線を用いた形状測定装置、形状計測方法、及び構造物の製造方法 |
| CN103946693B (zh) | 2011-10-06 | 2017-05-03 | X射线光学系统公司 | 可移除式x‑射线分析仪用的可移动型运输及屏蔽装置 |
| US20140294157A1 (en) | 2011-10-26 | 2014-10-02 | X-Ray Optical Systems, Inc. | Support structure and highly aligned monochromating x-ray optics for x-ray analysis engines and analyzers |
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| CN102595754B (zh) * | 2012-01-06 | 2015-05-13 | 同方威视技术股份有限公司 | 辐射器件安装箱、油冷循环系统以及x射线发生器 |
| CN103414050A (zh) * | 2012-02-14 | 2013-11-27 | 通用电气传感与检测科技股份有限公司 | 用于高电压电缆的高电压连接器组件、高电压连接器、以及制造高电压连接器组件的方法 |
| US9449780B2 (en) * | 2012-02-28 | 2016-09-20 | X-Ray Optical Systems, Inc. | X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics |
| EP2690645A1 (de) * | 2012-07-26 | 2014-01-29 | Agilent Technologies, Inc. | Gespanntes flaches Elektronenemitterband |
| GB201213789D0 (en) | 2012-08-02 | 2012-09-12 | Commw Scient Ind Res Org | An X-ray fluorescence analyser |
| CN103635002B (zh) | 2012-08-21 | 2016-03-16 | 同方威视技术股份有限公司 | 一体式飞点x光机 |
| CN104662644B (zh) * | 2012-09-27 | 2018-11-27 | 斯克林集团公司 | 处理液供给装置及方法、处理液及基板处理装置及方法 |
| US9068927B2 (en) * | 2012-12-21 | 2015-06-30 | General Electric Company | Laboratory diffraction-based phase contrast imaging technique |
| CN103175857B (zh) * | 2013-03-14 | 2015-06-03 | 中国科学院高能物理研究所 | 专用于掠入射xafs实验的装置及其调整方法 |
| JP6082634B2 (ja) * | 2013-03-27 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光x線分析装置 |
| JP6081260B2 (ja) * | 2013-03-28 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光x線分析装置 |
| US9173623B2 (en) | 2013-04-19 | 2015-11-03 | Samuel Soonho Lee | X-ray tube and receiver inside mouth |
| JP2014232579A (ja) * | 2013-05-28 | 2014-12-11 | 株式会社日立メディコ | X線管装置 |
| US9883793B2 (en) | 2013-08-23 | 2018-02-06 | The Schepens Eye Research Institute, Inc. | Spatial modeling of visual fields |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| CN103731966B (zh) * | 2014-01-03 | 2015-12-30 | 中国原子能科学研究院 | 一体化荧光发生装置 |
| USD726921S1 (en) * | 2014-01-17 | 2015-04-14 | Kabushiki Kaisha Toshiba | X-ray tube for medical device |
| USD727508S1 (en) * | 2014-01-17 | 2015-04-21 | Kabushiki Kaisha Toshiba | X-ray tube for medical device |
| USD726922S1 (en) * | 2014-01-17 | 2015-04-14 | Kabushiki Kaisha Toshiba | X-ray tube for medical device |
| USD727507S1 (en) * | 2014-01-17 | 2015-04-21 | Kabushiki Kaisha Toshiba | X-ray tube for medical device |
| USD726920S1 (en) * | 2014-01-17 | 2015-04-14 | Kabushiki Kaisha Toshiba | X-ray tube for medical device |
| USD750783S1 (en) * | 2014-02-19 | 2016-03-01 | Rigaku Corporation | X-ray residual stress measuring instrument |
| JP6328451B2 (ja) * | 2014-03-17 | 2018-05-23 | 株式会社日立ハイテクサイエンス | 蛍光x線分析装置及びその制御方法 |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| JP6397690B2 (ja) * | 2014-08-11 | 2018-09-26 | 株式会社日立ハイテクノロジーズ | X線透過検査装置及び異物検出方法 |
| JP6320898B2 (ja) | 2014-10-27 | 2018-05-09 | 株式会社日立ハイテクサイエンス | X線発生源及び蛍光x線分析装置 |
| JP6069609B2 (ja) * | 2015-03-26 | 2017-02-01 | 株式会社リガク | 二重湾曲x線集光素子およびその構成体、二重湾曲x線分光素子およびその構成体の製造方法 |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| CN104990946A (zh) * | 2015-07-03 | 2015-10-21 | 中国计量科学研究院 | K荧光x射线辐射装置 |
| JP2017037774A (ja) * | 2015-08-10 | 2017-02-16 | 東芝電子管デバイス株式会社 | X線管、x線管装置、及びx線管装置の製造方法 |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| CN105204059B (zh) * | 2015-09-11 | 2017-12-15 | 中国工程物理研究院激光聚变研究中心 | 一种局部区域软x射线辐射流定量测量装置与测量方法 |
| US10178748B1 (en) * | 2016-06-20 | 2019-01-08 | Moxtek, Inc. | X-ray spot stability |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| WO2018175570A1 (en) | 2017-03-22 | 2018-09-27 | Sigray, Inc. | Method of performing x-ray spectroscopy and x-ray absorption spectrometer system |
| EP3416181A1 (de) * | 2017-06-15 | 2018-12-19 | Koninklijke Philips N.V. | Röntgenstrahlquelle und verfahren zur herstellung einer röntgenstrahlquelle |
| CN107228871B (zh) * | 2017-07-21 | 2023-07-04 | 中国地质大学(武汉) | 一种便携式x射线分析装置 |
| WO2019027761A1 (en) * | 2017-07-31 | 2019-02-07 | Sigray, Inc. | SPECTROMETER SYSTEM WITH X-RAY TRANSMISSION |
| EP3462150A1 (de) * | 2017-09-27 | 2019-04-03 | Rolls-Royce Corporation | Temperaturbestimmung unter verwendung von strahlungsdiffraktion |
| CN109725343A (zh) * | 2017-10-27 | 2019-05-07 | 曲阜师范大学 | 离轴抛线型x射线平行弯晶谱仪装置 |
| CN108088862B (zh) * | 2018-02-09 | 2023-05-23 | 丹东市祯晟科技有限公司 | 一种无线集成化x射线探伤机控制系统 |
| US10502701B2 (en) * | 2018-03-30 | 2019-12-10 | General Electric Company | Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| JP7048396B2 (ja) | 2018-04-12 | 2022-04-05 | 浜松ホトニクス株式会社 | X線管 |
| US11360036B2 (en) | 2018-04-20 | 2022-06-14 | Outotec (Finland) Oy | X-ray fluorescence analyzer, and a method for performing X-ray fluorescence analysis |
| JP7195341B2 (ja) | 2018-06-04 | 2022-12-23 | シグレイ、インコーポレイテッド | 波長分散型x線分光計 |
| DE112019003777B4 (de) | 2018-07-26 | 2025-09-11 | Sigray, Inc. | Röntgenreflexionsquelle mit hoher helligkeit |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| CN109029310B (zh) * | 2018-08-10 | 2021-07-30 | 深圳市善时仪器有限公司 | 一种高性能微焦点x射线测厚仪 |
| EP3837536B1 (de) * | 2018-08-17 | 2025-02-12 | Microtrace Pty Limited | Vorrichtung zur messung von mineralischen schlämmen |
| CN112638261B (zh) | 2018-09-04 | 2025-06-27 | 斯格瑞公司 | 利用滤波的x射线荧光的系统和方法 |
| CN112823280B (zh) | 2018-09-07 | 2024-11-05 | 斯格瑞公司 | 用于深度可选x射线分析的系统和方法 |
| WO2020084890A1 (ja) * | 2018-10-25 | 2020-04-30 | 株式会社堀場製作所 | X線分析装置及びx線発生ユニット |
| WO2021046059A1 (en) | 2019-09-03 | 2021-03-11 | Sigray, Inc. | System and method for computed laminography x-ray fluorescence imaging |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| US11217357B2 (en) | 2020-02-10 | 2022-01-04 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles |
| WO2021237237A1 (en) | 2020-05-18 | 2021-11-25 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
| WO2022061347A1 (en) | 2020-09-17 | 2022-03-24 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| US11686692B2 (en) | 2020-12-07 | 2023-06-27 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| JP7659168B2 (ja) * | 2021-03-16 | 2025-04-09 | 株式会社不二越 | X線回折測定装置 |
| US11701072B2 (en) * | 2021-04-02 | 2023-07-18 | AlxSCAN, Inc. | Modular X-ray source and method of X-ray source tube replacement for motion compensated tomosynthesis imaging system |
| GB202106959D0 (en) | 2021-05-14 | 2021-06-30 | Malvern Panalytical Bv | Apparatus and method for x-ray fluorescence analysis |
| US11892421B2 (en) | 2021-12-06 | 2024-02-06 | Schlumberger Technology Corporation | System and method for cleaning electrical stability probe |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| DE112023001408T5 (de) | 2022-03-15 | 2025-02-13 | Sigray, Inc. | System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung |
| DE102022202726B4 (de) * | 2022-03-21 | 2024-02-15 | Siemens Healthcare Gmbh | Röntgenhochspannungsgenerator mit einem Zwei-Phasen-Kühlsystem |
| DE112023002079T5 (de) | 2022-05-02 | 2025-02-27 | Sigray, Inc. | Sequenzielles wellenlängendispersives röntgenspektrometer |
| US12247934B2 (en) | 2022-07-29 | 2025-03-11 | X-Ray Optical Systems, Inc. | Polarized, energy dispersive x-ray fluorescence system and method |
| CN121013975A (zh) | 2023-02-16 | 2025-11-25 | 斯格瑞公司 | 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统 |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| WO2025101530A1 (en) | 2023-11-07 | 2025-05-15 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| WO2025151383A1 (en) | 2024-01-08 | 2025-07-17 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| US12431256B2 (en) | 2024-02-15 | 2025-09-30 | Sigray, Inc. | System and method for generating a focused x-ray beam |
Family Cites Families (62)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE692555C (de) * | 1933-10-20 | 1940-06-21 | Ernst Pohl | Wassergekuehlte hochspannungs- und strahlensichere Roentgenroehre mit an Hochspannung liegender Anode |
| US2121630A (en) * | 1936-05-11 | 1938-06-21 | Gen Electric X Ray Corp | X-ray apparatus |
| US2825816A (en) | 1952-11-13 | 1958-03-04 | Machlett Lab Inc | System for maintaining constant quantity rate and constant quality of x-radiation from an x-ray generator |
| US2831977A (en) * | 1954-03-11 | 1958-04-22 | California Inst Of Techn | Low angle x-ray diffraction |
| US3246146A (en) * | 1963-07-11 | 1966-04-12 | Ass Elect Ind | Apparatus for the X-ray analysis of a liquid suspension of specimen material |
| US4039811A (en) | 1975-03-21 | 1977-08-02 | Sybron Corporation | Method of operating and power supply for x-ray tubes |
| JPS5391A (en) | 1976-06-23 | 1978-01-05 | Seiko Instr & Electronics Ltd | Agc circuit for x-ray generator |
| US4134012A (en) * | 1977-10-17 | 1979-01-09 | Bausch & Lomb, Inc. | X-ray analytical system |
| US4355410A (en) * | 1980-10-27 | 1982-10-19 | X-Ray Manufacturing & Supply, Inc. | Industrial X-ray machine |
| JPS5879900U (ja) * | 1981-11-18 | 1983-05-30 | 株式会社東芝 | 回転陽極形x線管装置 |
| JPS58111000U (ja) * | 1982-01-25 | 1983-07-28 | セイコーインスツルメンツ株式会社 | X線管放射軸調整装置 |
| US4674109A (en) * | 1984-09-29 | 1987-06-16 | Kabushiki Kaisha Toshiba | Rotating anode x-ray tube device |
| US4694480A (en) * | 1985-07-30 | 1987-09-15 | Kevex Corporation | Hand held precision X-ray source |
| US4810776A (en) * | 1986-07-14 | 1989-03-07 | Ciba-Geigy Corporation | Process for producing epoxy resin having a low-EHC-content from chlorine-substituted crude epoxy resin of high EHC-content and apparatus for automatically controlling such process |
| US5016267A (en) | 1986-08-15 | 1991-05-14 | Commonwealth Scientific And Industrial Research | Instrumentation for conditioning X-ray or neutron beams |
| US4891829A (en) * | 1986-11-19 | 1990-01-02 | Exxon Research And Engineering Company | Method and apparatus for utilizing an electro-optic detector in a microtomography system |
| DE8704182U1 (de) * | 1987-03-20 | 1987-07-09 | Siemens AG, 1000 Berlin und 8000 München | Computertomograph |
| US4916721A (en) * | 1987-08-05 | 1990-04-10 | The United States Of America As Represented By The United States Department Of Energy | Normal incidence X-ray mirror for chemical microanalysis |
| US4964148A (en) * | 1987-11-30 | 1990-10-16 | Meicor, Inc. | Air cooled metal ceramic x-ray tube construction |
| GB2214769A (en) * | 1988-03-04 | 1989-09-06 | Le N Proizv Ob Burevestnik | Multichannel x-ray spectrometer |
| US4930145A (en) | 1988-08-15 | 1990-05-29 | General Electric Company | X-ray exposure regulator |
| JPH0291200U (de) * | 1988-12-28 | 1990-07-19 | ||
| US5012499A (en) * | 1989-10-19 | 1991-04-30 | Hughes Aircraft Company | γ-ray detecting device using dislocation-free crystal |
| US4979199A (en) * | 1989-10-31 | 1990-12-18 | General Electric Company | Microfocus X-ray tube with optical spot size sensing means |
| DE58905921D1 (de) * | 1989-11-09 | 1993-11-18 | Siemens Ag | Röngenstrahler. |
| US5281822A (en) * | 1990-07-11 | 1994-01-25 | Mcdonnell Douglas Corporation | Advanced neutron detector |
| US5497008A (en) * | 1990-10-31 | 1996-03-05 | X-Ray Optical Systems, Inc. | Use of a Kumakhov lens in analytic instruments |
| US5177774A (en) | 1991-08-23 | 1993-01-05 | Trustees Of Princeton University | Reflection soft X-ray microscope and method |
| US5581591A (en) * | 1992-01-06 | 1996-12-03 | Picker International, Inc. | Focal spot motion control for rotating housing and anode/stationary cathode X-ray tubes |
| US5461654A (en) * | 1992-04-07 | 1995-10-24 | Grodzins; Lee | X-ray fluorescence detector |
| JPH05329143A (ja) * | 1992-06-01 | 1993-12-14 | Toshiba Corp | Ctスキャナ |
| US5272618A (en) | 1992-07-23 | 1993-12-21 | General Electric Company | Filament current regulator for an X-ray system |
| JPH08136480A (ja) * | 1994-11-11 | 1996-05-31 | Dkk Corp | 油中硫黄分測定装置 |
| US5550889A (en) * | 1994-11-28 | 1996-08-27 | General Electric | Alignment of an x-ray tube focal spot using a deflection coil |
| JP3628749B2 (ja) * | 1995-03-17 | 2005-03-16 | 株式会社東芝 | X線管制御装置 |
| US5650635A (en) * | 1995-07-14 | 1997-07-22 | Northwestern University | Multiple stacked Sb-based heterostructures |
| WO1997011494A1 (en) * | 1995-09-19 | 1997-03-27 | Astralux, Incorporated | X-ray detector |
| DE19540195C2 (de) * | 1995-10-30 | 2000-01-20 | Fraunhofer Ges Forschung | Verfahren der Röntgenfluoreszenzmikroskopie |
| US5693948A (en) * | 1995-11-21 | 1997-12-02 | Loral Fairchild Corporation | Advanced CCD-based x-ray image sensor system |
| US5778039A (en) * | 1996-02-21 | 1998-07-07 | Advanced Micro Devices, Inc. | Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF) |
| JPH1064695A (ja) * | 1996-08-21 | 1998-03-06 | Rigaku Corp | X線発生装置及びそれを用いたx線装置 |
| US5982847A (en) * | 1996-10-28 | 1999-11-09 | Utah State University | Compact X-ray fluorescence spectrometer for real-time wear metal analysis of lubrucating oils |
| JP2885398B2 (ja) * | 1997-04-01 | 1999-04-19 | 株式会社東芝 | X線装置 |
| DE69727370T2 (de) * | 1997-06-11 | 2004-12-09 | Istituto Nazionale Di Fisica Nucleare | Mehrstufiger Diffraktor hergestellt mit konstantem Stufenbreite Winkel (mehrstufiger Monochromator) |
| JP4043571B2 (ja) | 1997-12-04 | 2008-02-06 | 浜松ホトニクス株式会社 | X線管 |
| DE19810346C1 (de) | 1998-03-10 | 1999-10-07 | Siemens Ag | Röntgenröhre und deren Verwendung |
| DE19820321B4 (de) * | 1998-05-07 | 2004-09-16 | Bruker Axs Gmbh | Kompaktes Röntgenspektrometer |
| DE19820861B4 (de) * | 1998-05-09 | 2004-09-16 | Bruker Axs Gmbh | Simultanes Röntgenfluoreszenz-Spektrometer |
| JP3062685B2 (ja) * | 1998-07-23 | 2000-07-12 | セイコーインスツルメンツ株式会社 | 蛍光x線分析計 |
| US6206565B1 (en) * | 1998-08-19 | 2001-03-27 | General Electric Company | Continuous conditioning of dielectric fluid in an x-ray tube |
| FR2784261B1 (fr) * | 1998-10-05 | 2001-07-27 | Ge Medical Syst Sa | Materiau d'isolation electrique et de refroidissement de conductivite thermique accrue et application a l'isolation d'un dispositif d'alimentation haute tension |
| US6185276B1 (en) | 1999-02-02 | 2001-02-06 | Thermal Corp. | Collimated beam x-ray tube |
| US6498830B2 (en) * | 1999-02-12 | 2002-12-24 | David B. Wittry | Method and apparatus for fabricating curved crystal x-ray optics |
| DE19932275B4 (de) | 1999-07-06 | 2005-08-04 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung zur Röntgenfluoreszenzanalyse |
| US6345086B1 (en) * | 1999-09-14 | 2002-02-05 | Veeco Instruments Inc. | X-ray fluorescence system and method |
| US6361208B1 (en) * | 1999-11-26 | 2002-03-26 | Varian Medical Systems | Mammography x-ray tube having an integral housing assembly |
| JP2001281345A (ja) * | 2000-03-31 | 2001-10-10 | Fuji Photo Film Co Ltd | エネルギー線検出装置およびその温度調整方法 |
| IL140025A0 (en) * | 2000-11-30 | 2002-02-10 | Medirad I R T Ltd | X-ray tube with fluid cooling |
| DE10143668C1 (de) * | 2001-09-06 | 2003-04-03 | Instrumentarium Imaging Ziehm | Halterung für eine Röntgenröhre einer Röntgendiagnostikeinrichtung |
| ATE476088T1 (de) * | 2001-12-04 | 2010-08-15 | X Ray Optical Sys Inc | Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten |
| DE10159828B4 (de) * | 2001-12-06 | 2007-09-20 | Rigaku Industrial Corporation, Takatsuki | Röntgenfluoreszenzspektrometer |
| US6668039B2 (en) * | 2002-01-07 | 2003-12-23 | Battelle Memorial Institute | Compact X-ray fluorescence spectrometer and method for fluid analysis |
-
2002
- 2002-12-04 AT AT02798480T patent/ATE476088T1/de not_active IP Right Cessation
- 2002-12-04 WO PCT/US2002/038792 patent/WO2003048745A2/en not_active Ceased
- 2002-12-04 CN CN2007101367041A patent/CN101183083B/zh not_active Expired - Fee Related
- 2002-12-04 AU AU2002364525A patent/AU2002364525A1/en not_active Abandoned
- 2002-12-04 CN CNB028278453A patent/CN100336422C/zh not_active Expired - Fee Related
- 2002-12-04 WO PCT/US2002/038493 patent/WO2003049510A2/en not_active Ceased
- 2002-12-04 WO PCT/US2002/038803 patent/WO2003049138A2/en not_active Ceased
- 2002-12-04 EP EP02798480A patent/EP1454513B1/de not_active Expired - Lifetime
- 2002-12-04 DE DE60237168T patent/DE60237168D1/de not_active Expired - Lifetime
- 2002-12-04 AU AU2002363962A patent/AU2002363962A1/en not_active Abandoned
- 2002-12-04 AU AU2002357069A patent/AU2002357069A1/en not_active Abandoned
- 2002-12-04 JP JP2003550565A patent/JP4999256B2/ja not_active Expired - Fee Related
-
2004
- 2004-06-01 US US10/858,549 patent/US7515684B2/en not_active Expired - Fee Related
- 2004-06-01 US US10/858,173 patent/US7072439B2/en not_active Expired - Lifetime
- 2004-06-03 US US10/859,901 patent/US7209545B2/en not_active Expired - Lifetime
-
2010
- 2010-10-12 JP JP2010230027A patent/JP2011071120A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US7072439B2 (en) | 2006-07-04 |
| US7209545B2 (en) | 2007-04-24 |
| JP2005512288A (ja) | 2005-04-28 |
| JP4999256B2 (ja) | 2012-08-15 |
| WO2003048745A2 (en) | 2003-06-12 |
| WO2003048745A3 (en) | 2004-02-12 |
| AU2002364525A1 (en) | 2003-06-17 |
| CN1618258A (zh) | 2005-05-18 |
| WO2003049138A2 (en) | 2003-06-12 |
| WO2003049510A2 (en) | 2003-06-12 |
| AU2002364525A8 (en) | 2003-06-17 |
| AU2002363962A1 (en) | 2003-06-17 |
| AU2002357069A8 (en) | 2003-06-17 |
| AU2002357069A1 (en) | 2003-06-17 |
| WO2003049510A3 (en) | 2004-01-22 |
| US20050053197A1 (en) | 2005-03-10 |
| CN100336422C (zh) | 2007-09-05 |
| US7515684B2 (en) | 2009-04-07 |
| JP2011071120A (ja) | 2011-04-07 |
| EP1454513A2 (de) | 2004-09-08 |
| WO2003049138A3 (en) | 2004-04-15 |
| AU2002363962A8 (en) | 2003-06-17 |
| CN101183083B (zh) | 2013-03-20 |
| US20050041773A1 (en) | 2005-02-24 |
| EP1454513B1 (de) | 2010-07-28 |
| CN101183083A (zh) | 2008-05-21 |
| DE60237168D1 (de) | 2010-09-09 |
| US20050031073A1 (en) | 2005-02-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ATE476088T1 (de) | Röntgenquelle mit verbesserter strahlstabilität und ihre anwendung in der analyse von strömenden flüssigkeiten | |
| Lelea | The performance evaluation of Al2O3/water nanofluid flow and heat transfer in microchannel heat sink | |
| Sitprasert et al. | A thermal conductivity model for nanofluids including effect of the temperature-dependent interfacial layer | |
| BR0111436A (pt) | Fluido de poço a base de óleo, compreendendo um sistema emulsionante estável em temperatura e não-poluente | |
| Yasuda et al. | Visualization of the working fluid in a flat-plate pulsating heat pipe by neutron radiography | |
| Shankar Goud et al. | Induced magnetic field effect on MHD free convection flow in nonconducting and conducting vertical microchannel walls | |
| Walelign et al. | Analytical study of heat and mass transfer in unsteady MHD radiant flow of Williamson nanofluid over stretching sheet with heat generation and chemical reaction | |
| Panhwer et al. | Thermal deformity and thermolysis of magnetized and fractional Newtonian fluid with rheological investigation | |
| Rafiq et al. | Effects of variable viscosity on asymmetric flow of non-Newtonian fluid driven through an expanding/contracting channel containing porous walls | |
| Zhou et al. | Constructing the Phase Diagram of an Aqueous Solution of Poly (N‐isopropyl acrylamide) by Controlled Microevaporation in a Nanoliter Microchamber | |
| Giordano et al. | Distilling small volumes of crude oil | |
| Kratzer et al. | In situ trapping of bismuthine in externally heated quartz tube atomizers for atomic absorption spectrometry | |
| Omidvarborna et al. | Effect of electrohydrodynamic (EHD) on condensation of R-134a in presence of non-condensable gas | |
| ATE418786T1 (de) | Anordnung für röntgenanalytische anwendungen | |
| Jafarimoghaddam et al. | On the implementation of Cu/Ethylene Glycol nanofluids inside an annular pipe under a constant wall temperature boundary condition | |
| CN217820204U (zh) | 电感耦合—色谱仪 | |
| CN215493382U (zh) | 一种气体光学检测装置 | |
| Iyahraja et al. | Studies on heat transfer and pressure drop in turbulent flow of silver-water nanofluids through a circular tube at constant wall heat flux | |
| Hong et al. | Zero-Power consumption based evaporative cooling for rated current conduction in SiC mosfets | |
| Singh et al. | Mass transfer to newtonian and non-newtonian fluids from rotating cylinders | |
| Varahadpande et al. | Oscillatory flow of dusty fluid through a narrowed channel in the presence of magnetic field | |
| Analytical Methods Committee vandenewman@ tiscali. co. uk | Evaluation of analytical instrumentation. Part XIX CHNS elemental analysers | |
| FI20011362A7 (fi) | Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi | |
| Bobovnikov et al. | Reliability of Quartz Glass-to-Stainless Steel Connection Performed by Ultrasonic Soldering for NaI: Tl Ruggedized Detector | |
| Nguyen | New temperature dependent thermal conductivity data of water based nanofluids |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |