USD750783S1 - X-ray residual stress measuring instrument - Google Patents

X-ray residual stress measuring instrument Download PDF

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Publication number
USD750783S1
USD750783S1 US29496723 US201429496723F USD750783S1 US D750783 S1 USD750783 S1 US D750783S1 US 29496723 US29496723 US 29496723 US 201429496723 F US201429496723 F US 201429496723F US D750783 S1 USD750783 S1 US D750783S1
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US
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Grant
Patent type
Design
Prior art keywords
fig
view
elevational
residual
stress
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29496723
Inventor
Shoichi Yasukawa
Suguru Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Grant date

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Description

FIG. 1 is a front elevational view of a X-ray residual stress measuring instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view therefore;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a cross-sectional view thereof, taken along the line 7-7 of FIG. 1;

FIG. 8 is a cross-sectional view thereof, taken along the line 8-8 of FIG. 2;

FIG. 9 is a perspective view thereof; and,

FIG. 10 is a perspective view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a X-ray residual stress measuring instrument, as shown and described.
US29496723 2014-02-19 2014-07-16 X-ray residual stress measuring instrument Active USD750783S1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014-003304 2014-02-19
JP2014003304 2014-02-19

Publications (1)

Publication Number Publication Date
USD750783S1 true USD750783S1 (en) 2016-03-01

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US29496723 Active USD750783S1 (en) 2014-02-19 2014-07-16 X-ray residual stress measuring instrument

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD798173S1 (en) * 2015-12-22 2017-09-26 Sintokogio, Ltd. Residual stress measuring device
USD798753S1 (en) * 2015-12-22 2017-10-03 Sintokogio, Ltd. Residual stress measuring device

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4694480A (en) * 1985-07-30 1987-09-15 Kevex Corporation Hand held precision X-ray source
USD371197S (en) * 1994-07-05 1996-06-25 X-ray machine
USD554754S1 (en) * 2004-09-01 2007-11-06 Hamamatsu Photonics K.K. X-ray device
US7515684B2 (en) * 2001-12-04 2009-04-07 X-Ray Optical Systems, Inc. Detection apparatus for x-ray analysis, including semiconductor detectors having uncooled active areas
USD628296S1 (en) * 2009-09-28 2010-11-30 Shimadzu Corporation X-ray collimator
USD676554S1 (en) * 2011-08-10 2013-02-19 Samsung Electronics Co., Ltd. Medical X-ray collimator
USD724214S1 (en) * 2013-08-27 2015-03-10 Shimadzu Corporation Analyzing machine having X-ray
US9146203B2 (en) * 2010-07-30 2015-09-29 Rigaku Corporation X-ray stress measuring apparatus

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4694480A (en) * 1985-07-30 1987-09-15 Kevex Corporation Hand held precision X-ray source
USD371197S (en) * 1994-07-05 1996-06-25 X-ray machine
US7515684B2 (en) * 2001-12-04 2009-04-07 X-Ray Optical Systems, Inc. Detection apparatus for x-ray analysis, including semiconductor detectors having uncooled active areas
USD554754S1 (en) * 2004-09-01 2007-11-06 Hamamatsu Photonics K.K. X-ray device
USD628296S1 (en) * 2009-09-28 2010-11-30 Shimadzu Corporation X-ray collimator
US9146203B2 (en) * 2010-07-30 2015-09-29 Rigaku Corporation X-ray stress measuring apparatus
USD676554S1 (en) * 2011-08-10 2013-02-19 Samsung Electronics Co., Ltd. Medical X-ray collimator
USD724214S1 (en) * 2013-08-27 2015-03-10 Shimadzu Corporation Analyzing machine having X-ray

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD798173S1 (en) * 2015-12-22 2017-09-26 Sintokogio, Ltd. Residual stress measuring device
USD798753S1 (en) * 2015-12-22 2017-10-03 Sintokogio, Ltd. Residual stress measuring device

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