WO2022239708A1 - 凝集を低減したシリカ粉末、及び樹脂組成物、並びに半導体封止材 - Google Patents
凝集を低減したシリカ粉末、及び樹脂組成物、並びに半導体封止材 Download PDFInfo
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- WO2022239708A1 WO2022239708A1 PCT/JP2022/019592 JP2022019592W WO2022239708A1 WO 2022239708 A1 WO2022239708 A1 WO 2022239708A1 JP 2022019592 W JP2022019592 W JP 2022019592W WO 2022239708 A1 WO2022239708 A1 WO 2022239708A1
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- WIPO (PCT)
- Prior art keywords
- silica powder
- volume
- less
- resin
- resin composition
- Prior art date
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 232
- 239000000843 powder Substances 0.000 title claims abstract description 163
- 239000000377 silicon dioxide Substances 0.000 title claims abstract description 115
- 239000011342 resin composition Substances 0.000 title claims abstract description 44
- 239000004065 semiconductor Substances 0.000 title claims abstract description 25
- 239000003566 sealing material Substances 0.000 title claims abstract description 14
- 230000002776 aggregation Effects 0.000 title description 9
- 238000004220 aggregation Methods 0.000 title description 5
- 239000002245 particle Substances 0.000 claims abstract description 82
- 238000000034 method Methods 0.000 claims abstract description 47
- 230000001186 cumulative effect Effects 0.000 claims abstract description 44
- 229920005989 resin Polymers 0.000 claims abstract description 41
- 239000011347 resin Substances 0.000 claims abstract description 41
- 239000003822 epoxy resin Substances 0.000 claims abstract description 30
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 30
- 238000009826 distribution Methods 0.000 claims abstract description 23
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000004850 liquid epoxy resins (LERs) Substances 0.000 claims abstract description 8
- 229930185605 Bisphenol Natural products 0.000 claims abstract description 7
- 239000006185 dispersion Substances 0.000 claims abstract description 7
- 238000011156 evaluation Methods 0.000 claims abstract description 7
- 239000000203 mixture Substances 0.000 claims description 6
- 229920001187 thermosetting polymer Polymers 0.000 claims description 4
- 230000004931 aggregating effect Effects 0.000 abstract 1
- 238000000691 measurement method Methods 0.000 abstract 1
- 239000002994 raw material Substances 0.000 description 41
- 239000011362 coarse particle Substances 0.000 description 19
- 239000007789 gas Substances 0.000 description 17
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 15
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 12
- 239000002184 metal Substances 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- 239000008393 encapsulating agent Substances 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 239000002002 slurry Substances 0.000 description 7
- 239000003795 chemical substances by application Substances 0.000 description 6
- 238000002485 combustion reaction Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 239000003607 modifier Substances 0.000 description 5
- 229920003986 novolac Polymers 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 238000005054 agglomeration Methods 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 239000007822 coupling agent Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 239000004593 Epoxy Substances 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 229910001873 dinitrogen Inorganic materials 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 238000010298 pulverizing process Methods 0.000 description 3
- 238000000790 scattering method Methods 0.000 description 3
- 239000011863 silicon-based powder Substances 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000001721 transfer moulding Methods 0.000 description 3
- JWAZRIHNYRIHIV-UHFFFAOYSA-N 2-naphthol Chemical compound C1=CC=CC2=CC(O)=CC=C21 JWAZRIHNYRIHIV-UHFFFAOYSA-N 0.000 description 2
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical compound C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000004438 BET method Methods 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- 239000006087 Silane Coupling Agent Substances 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 150000008065 acid anhydrides Chemical class 0.000 description 2
- 125000002723 alicyclic group Chemical group 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000000748 compression moulding Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 239000000446 fuel Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- QWVGKYWNOKOFNN-UHFFFAOYSA-N o-cresol Chemical compound CC1=CC=CC=C1O QWVGKYWNOKOFNN-UHFFFAOYSA-N 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- JTJMJGYZQZDUJJ-UHFFFAOYSA-N phencyclidine Chemical class C1CCCCN1C1(C=2C=CC=CC=2)CCCCC1 JTJMJGYZQZDUJJ-UHFFFAOYSA-N 0.000 description 2
- 150000002989 phenols Chemical class 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
- 229920001225 polyester resin Polymers 0.000 description 2
- 239000004645 polyester resin Substances 0.000 description 2
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 2
- GHMLBKRAJCXXBS-UHFFFAOYSA-N resorcinol Chemical compound OC1=CC=CC(O)=C1 GHMLBKRAJCXXBS-UHFFFAOYSA-N 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 150000004756 silanes Chemical class 0.000 description 2
- 239000004575 stone Substances 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000001993 wax Substances 0.000 description 2
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- ISPYQTSUDJAMAB-UHFFFAOYSA-N 2-chlorophenol Chemical compound OC1=CC=CC=C1Cl ISPYQTSUDJAMAB-UHFFFAOYSA-N 0.000 description 1
- CRBJBYGJVIBWIY-UHFFFAOYSA-N 2-isopropylphenol Chemical compound CC(C)C1=CC=CC=C1O CRBJBYGJVIBWIY-UHFFFAOYSA-N 0.000 description 1
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 1
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- WJQOZHYUIDYNHM-UHFFFAOYSA-N 2-tert-Butylphenol Chemical compound CC(C)(C)C1=CC=CC=C1O WJQOZHYUIDYNHM-UHFFFAOYSA-N 0.000 description 1
- LVNLBBGBASVLLI-UHFFFAOYSA-N 3-triethoxysilylpropylurea Chemical compound CCO[Si](OCC)(OCC)CCCNC(N)=O LVNLBBGBASVLLI-UHFFFAOYSA-N 0.000 description 1
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- MQJKPEGWNLWLTK-UHFFFAOYSA-N Dapsone Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=C1 MQJKPEGWNLWLTK-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229920000106 Liquid crystal polymer Polymers 0.000 description 1
- 239000004977 Liquid-crystal polymers (LCPs) Substances 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- 239000004640 Melamine resin Substances 0.000 description 1
- IGFHQQFPSIBGKE-UHFFFAOYSA-N Nonylphenol Natural products CCCCCCCCCC1=CC=C(O)C=C1 IGFHQQFPSIBGKE-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 229930040373 Paraformaldehyde Natural products 0.000 description 1
- JPYHHZQJCSQRJY-UHFFFAOYSA-N Phloroglucinol Natural products CCC=CCC=CCC=CCC=CCCCCC(=O)C1=C(O)C=C(O)C=C1O JPYHHZQJCSQRJY-UHFFFAOYSA-N 0.000 description 1
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 description 1
- 239000004695 Polyether sulfone Substances 0.000 description 1
- 239000004734 Polyphenylene sulfide Substances 0.000 description 1
- 241000519995 Stachys sylvatica Species 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229920001807 Urea-formaldehyde Polymers 0.000 description 1
- 238000005411 Van der Waals force Methods 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000003570 air Substances 0.000 description 1
- 150000001299 aldehydes Chemical class 0.000 description 1
- 239000004844 aliphatic epoxy resin Substances 0.000 description 1
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 1
- 150000004645 aluminates Chemical class 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- 239000001273 butane Substances 0.000 description 1
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000112 cooling gas Substances 0.000 description 1
- 229930003836 cresol Natural products 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 239000000539 dimer Substances 0.000 description 1
- XXBDWLFCJWSEKW-UHFFFAOYSA-N dimethylbenzylamine Chemical compound CN(C)CC1=CC=CC=C1 XXBDWLFCJWSEKW-UHFFFAOYSA-N 0.000 description 1
- ZZTCPWRAHWXWCH-UHFFFAOYSA-N diphenylmethanediamine Chemical compound C=1C=CC=CC=1C(N)(N)C1=CC=CC=C1 ZZTCPWRAHWXWCH-UHFFFAOYSA-N 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000000295 fuel oil Substances 0.000 description 1
- 239000003517 fume Substances 0.000 description 1
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 1
- -1 glycidyl ester Chemical class 0.000 description 1
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 125000000623 heterocyclic group Chemical group 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000003350 kerosene Substances 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 229940044600 maleic anhydride Drugs 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 239000006082 mold release agent Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- KBJFYLLAMSZSOG-UHFFFAOYSA-N n-(3-trimethoxysilylpropyl)aniline Chemical compound CO[Si](OC)(OC)CCCNC1=CC=CC=C1 KBJFYLLAMSZSOG-UHFFFAOYSA-N 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- FZZQNEVOYIYFPF-UHFFFAOYSA-N naphthalene-1,6-diol Chemical compound OC1=CC=CC2=CC(O)=CC=C21 FZZQNEVOYIYFPF-UHFFFAOYSA-N 0.000 description 1
- DFQICHCWIIJABH-UHFFFAOYSA-N naphthalene-2,7-diol Chemical compound C1=CC(O)=CC2=CC(O)=CC=C21 DFQICHCWIIJABH-UHFFFAOYSA-N 0.000 description 1
- SNQQPOLDUKLAAF-UHFFFAOYSA-N nonylphenol Chemical compound CCCCCCCCCC1=CC=CC=C1O SNQQPOLDUKLAAF-UHFFFAOYSA-N 0.000 description 1
- SLYCYWCVSGPDFR-UHFFFAOYSA-N octadecyltrimethoxysilane Chemical compound CCCCCCCCCCCCCCCCCC[Si](OC)(OC)OC SLYCYWCVSGPDFR-UHFFFAOYSA-N 0.000 description 1
- 239000012188 paraffin wax Chemical class 0.000 description 1
- 229920002866 paraformaldehyde Polymers 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- QCDYQQDYXPDABM-UHFFFAOYSA-N phloroglucinol Chemical compound OC1=CC(O)=CC(O)=C1 QCDYQQDYXPDABM-UHFFFAOYSA-N 0.000 description 1
- 229960001553 phloroglucinol Drugs 0.000 description 1
- 239000011295 pitch Substances 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 229920000069 polyphenylene sulfide Polymers 0.000 description 1
- 150000007519 polyprotic acids Polymers 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000010334 sieve classification Methods 0.000 description 1
- 238000007873 sieving Methods 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 125000005480 straight-chain fatty acid group Chemical class 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- TXDNPSYEJHXKMK-UHFFFAOYSA-N sulfanylsilane Chemical class S[SiH3] TXDNPSYEJHXKMK-UHFFFAOYSA-N 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- 229920006337 unsaturated polyester resin Polymers 0.000 description 1
- 238000010333 wet classification Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 150000003739 xylenols Chemical class 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/113—Silicon oxides; Hydrates thereof
- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
- C01B33/18—Preparation of finely divided silica neither in sol nor in gel form; After-treatment thereof
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/34—Silicon-containing compounds
- C08K3/36—Silica
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L101/00—Compositions of unspecified macromolecular compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/60—Particles characterised by their size
- C01P2004/61—Micrometer sized, i.e. from 1-100 micrometer
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/12—Surface area
Definitions
- the present invention relates to a silica powder with reduced agglomeration, a resin composition, and a semiconductor sealing material.
- silica powder used for semiconductor encapsulant applications and insulating substrate applications aggregated particles and coarsened particles cause damage to packages, short circuits in lead wires, irregularities on substrates, white spots, etc. Therefore, it is desired to reduce it.
- silica powder containing coarse particles when silica powder containing coarse particles is blended with a resin, it causes a decrease in the fluidity of the resin, and when such a resin composition is used as a semiconductor encapsulant, damage to the semiconductor, molding defects, etc. are likely to occur. Become. From these points of view, there is a demand for a silica powder that is less likely to agglomerate and has less coarse particles.
- silica powder with an average particle size of 2.0 ⁇ m or less tends to agglomerate due to the forces acting on the silica powder (weight, liquid bridge force, van der Waals force, etc.).
- Silica powder having such a particle size has a high adhesion property to equipment and containers, and there is a problem that the silica powder clogs transportation pipes and feeders, resulting in poor handling.
- silica powder with a particle size of 2.0 ⁇ m or less has a very poor yield when classified by a sieve or the like, and it is difficult to produce silica powder with few coarse particles.
- it is difficult to obtain the desired dispersibility when mixed with a resin because the particles aggregate and coarsen even when vibrated by a sieving device.
- Patent Document 1 discloses a silica powder having a BET of 2 m 2 /g or more and less than 30 m 2 /g and a particle content of 0.1% by mass or less with a particle diameter of 1.5 ⁇ m or more. Have been described. However, in Patent Document 1, since coarse particles are removed by wet classification, the particle size distribution and specific surface area change due to the reduction of fume components on the powder surface, and the dispersibility in the resin decreases.
- Patent Document 2 discloses a spherical silica fine powder having a maximum value of particle size distribution in the range of 1 ⁇ m to 10 ⁇ m in particle size, wherein the coarse particle residue on a sieve with an opening of 45 ⁇ m is 0.01% by weight or less. Spherical silica fine powder has been proposed. However, with the method of Patent Document 2, it is difficult to remove only coarse particles without changing the particle size distribution. Further, in these Patent Documents 1 and 2, no investigation is made on powders having a particle size of 2.0 ⁇ m or less.
- the present invention provides a silica powder having a particle size of 2.0 ⁇ m or less, which is less likely to aggregate, is easy to handle, and is easily dispersed when mixed with a resin, and a resin composition containing the silica powder. and to provide a semiconductor sealing material.
- silica powder having a maximum particle size (D max ) of 5.0 ⁇ m or less as measured with a grind gauge by a specific method can solve all of the above problems.
- the present invention has the following aspects.
- Silica powder having a volume-based cumulative diameter (D50) of 2.0 ⁇ m or less and a maximum particle diameter (D max ) of 5.0 ⁇ m or less as measured with a grind gauge by the following method. (Measuring method) Add 67 parts by mass of silica powder to 100 parts by mass of bisphenol F-type liquid epoxy resin, and mix using a rotation/revolution mixer at a temperature of 30 ° C.
- the resin composition was measured according to JIS K 5600-2-5 using a grind gauge with a width of 90 mm, a length of 240 mm, and a maximum depth of 100 ⁇ m, and the degree of dispersion of the silica powder in the epoxy resin was measured by a distribution map method. Evaluate and measure the maximum particle size (D max ). Moreover, the same evaluation is performed 5 times and the average value is adopted.
- the silica powder according to [1] which has a volume-based cumulative diameter (D90) of 2.5 ⁇ m or less.
- BET specific surface area
- the value of the volume-based frequency of the volume-based cumulative diameter (D90) with respect to the difference between the volume-based cumulative diameter (D100) and the volume-based cumulative diameter (D90) calculated from the following formula (1) is 1.
- a resin composition comprising the silica powder according to any one of [1] to [5] and a resin.
- the resin composition according to [6] wherein the resin contains a thermosetting resin.
- the silica powder according to the present invention has a volume-based cumulative diameter (D50) of 2.0 ⁇ m or less, and a maximum particle diameter (D max ) of 5.0 ⁇ m or less measured with a grind gauge by the following method. do. (Measuring method) Add 67 parts by mass of silica powder to 100 parts by mass of bisphenol F-type liquid epoxy resin, and mix using a rotation/revolution mixer at a temperature of 30 ° C. and a rotation speed of 2,000 rpm for 3 minutes and 1 minute of revolution. to prepare a resin composition.
- D50 volume-based cumulative diameter
- D max maximum particle diameter
- the resin composition was measured according to JIS K 5600-2-5 using a grind gauge with a width of 90 mm, a length of 240 mm, and a maximum depth of 100 ⁇ m, and the degree of dispersion of the silica powder in the epoxy resin was measured by distribution map method. Evaluate and measure the maximum particle size (D max ). Moreover, the same evaluation is performed 5 times and the average value is adopted.
- the silica powder according to the present invention does not easily agglomerate, is easy to handle, and is easy to disperse when mixed with a resin.
- the volume-based cumulative diameter (D50) (hereinafter sometimes referred to as “D50”) of the silica powder according to the present invention is 2.0 ⁇ m or less, preferably 1.5 ⁇ m or less, and 0.3 to 1.2 ⁇ m. is more preferable, and 0.4 to 1.0 ⁇ m is particularly preferable. Even if the silica powder according to the present invention has a D50 of 2.0 ⁇ m or less, it is difficult to agglomerate and is easy to handle. In addition, since the particles are less likely to agglomerate when mixed with the resin, the dispersibility is also good.
- the volume-based cumulative diameter (D50) of silica powder refers to a volume-based cumulative particle size distribution measured by a laser diffraction scattering method (refractive index: 1.50), where the cumulative value is 50%. It refers to the corresponding particle size.
- the cumulative particle size distribution is represented by a distribution curve in which the horizontal axis is the particle diameter ( ⁇ m) and the vertical axis is the cumulative value (%).
- the volume-based cumulative particle size distribution measured by a laser diffraction scattering method (refractive index: 1.50) was measured using a laser diffraction scattering particle size distribution analyzer (manufactured by Beckman Coulter, Inc., product name "LS-13 320XR”). using water (refractive index: 1.33) as a solvent, and dispersing using an ultrasonic generator (manufactured by SONICS MATERIALS INC., product name "VC-505") for 2 minutes as a pretreatment. Measure.
- the silica powder according to the present invention has a maximum particle size (D max ) of 5.0 ⁇ m or less as measured with a grind gauge by the method described above.
- the groove of the grind gauge is slanted and gradually becomes shallower. Therefore, if particles having a particle diameter larger than the depth of the groove exist, a linear trace remains on the formed film. Therefore, by checking the traces of the formed film against the scale on the grind gauge, the presence or absence of aggregates and their particle sizes can be confirmed.
- the “maximum particle size (D max )” refers to the linear trace left on the forming film of the grind gauge, which is left at the position where the particle size is the largest. Denotes linear trace value. In the present invention, the above evaluation is performed 5 times and the average value is defined as the "maximum particle size (D max )".
- Grind gauge measurement is performed with a resin composition in which silica powder is dispersed in a bisphenol F liquid epoxy resin, as described above.
- the silica powder according to the present invention has a maximum particle size (D max ) of 5.0 ⁇ m or less as measured with a grind gauge by the method described above, which means that aggregation of the silica powder is suppressed in the resin. do. That is, the silica powder according to the present invention is easily dispersed when mixed with a resin, and is difficult to agglomerate.
- the bisphenol F type liquid epoxy resin used for grind gauge measurement has a viscosity of 3,000 to 4,500 mPa ⁇ s (25° C.) and an epoxy equivalent of 160 to 175 g/eq. is preferably used.
- the maximum particle diameter (D max ) is preferably 4.5 ⁇ m or less, particularly preferably 4.0 ⁇ m or less.
- the volume-based cumulative diameter (D90) (hereinafter sometimes referred to as “D90”) of the silica powder according to the present invention is preferably 2.5 ⁇ m or less, more preferably 2.2 ⁇ m or less, and further 2.0 ⁇ m or less. preferable.
- D90 refers to a particle diameter corresponding to a cumulative value of 90% in a volume-based cumulative particle size distribution measured in the same manner as D50.
- a D90 of 2.5 ⁇ m or less means that the silica powder has fewer aggregated and coarsened particles.
- the volume-based cumulative diameter (D100) (hereinafter sometimes referred to as “D100”) of the silica powder according to the present invention is preferably 4.7 ⁇ m or less, more preferably 4.2 ⁇ m or less, and further 4.0 ⁇ m or less. preferable.
- D100 refers to the particle diameter corresponding to a cumulative value of 100% in the volume-based cumulative particle size distribution measured in the same manner as D50 and D90.
- “D100 is 4.7 ⁇ m or less” means that coarse particles exceeding 4.7 ⁇ m are substantially absent in the silica powder.
- the phrase "substantially absent” means that the proportion of coarse particles of more than 4.7 ⁇ m in the silica powder is less than 0.1% by mass.
- Such silica powder tends to be easier to handle, and when it is made into a resin composition for a semiconductor encapsulant, it is easier to reduce the risk of short circuits caused by coarse particles entering between wiring gaps.
- the volume-based frequency of the volume-based cumulative diameter (D90) with respect to the difference between the volume-based cumulative diameter (D100) and the volume-based cumulative diameter (D90) calculated from the following formula (1) is preferably 1.0 to 3.0, more preferably 1.5 to 3.0, even more preferably 2.0 to 3.0.
- volume-based frequency of volume-based cumulative diameter (D90) (volume-based cumulative diameter (D100) - volume-based cumulative diameter (D90)) (1)
- volume-based frequency of D90 is obtained by the above-mentioned laser diffraction scattering method (refractive index: 1. 50) means the frequency of particle diameters corresponding to a cumulative value of 90% in the volume-based cumulative particle size distribution measured by the method 50). If the volume-based frequency of D90 with respect to the difference between D100 and D90 of the silica powder is within the above range, aggregation is less likely to occur and coarse particles are less.
- Such silica powder tends to be easier to handle, and when it is made into a resin composition for a semiconductor encapsulant, it is easier to reduce the risk of short circuits caused by coarse particles entering between wiring gaps.
- the difference (D100-D90) between D100 and D90 is preferably 2.3 ⁇ m or less, more preferably 2.0 ⁇ m or less. If the difference between D100 and D90 is within the above range, the silica powder will have a narrower particle size distribution. Such silica powder has fewer coarse particles and tends to have better dispersibility in resin.
- the ratio of D50 to D90 (D90/D50) of the silica powder according to the present invention is preferably 2.2 or less, more preferably 2.0 or less, and still more preferably 1.4 to 2.0. If D90/D50 is 2.2 or less, the silica powder tends to have a narrower particle size distribution. Such silica powder is preferable because it is less likely to agglomerate and is easier to handle.
- the ratio of D50 to D100 (D100/D50) of the silica powder according to the present invention is preferably 5.0 or less, more preferably 4.0 or less. 3.0 to 4.0 is more preferable. If D100/D50 is 5.0 or less, the silica powder tends to have a narrower particle size distribution. Such silica powder is preferable because it is less likely to agglomerate and is easier to handle.
- the specific surface area measured by the BET method is preferably 2 to 15 m 2 /g, more preferably 3 to 12 m 2 /g, and 3 to 8 m 2 /g. is more preferred.
- the silica powder according to the present invention can have a relatively small specific surface area while having a D50 of 2.0 ⁇ m or less.
- the silica powder according to the invention has a relatively narrow particle size distribution and a low proportion of finer particles.
- the measurement of the specific surface area by the BET method was performed using "Macsorb HM model-1208" (manufactured by Mountec).
- the silica powder according to the present invention brings the thermal expansion coefficients of the semiconductor chip and the liquid sealing material close to each other, solder heat resistance, moisture resistance, and low abrasion of the mold.
- Amorphous silica powder produced by a method is more preferable.
- the silica powder according to the present invention is preferably spherical silica powder, more preferably spherical amorphous silica powder.
- degree of "sphericity” an average sphericity of 0.85 or more is preferable.
- the average sphericity is obtained by analyzing particle images taken with a stereoscopic microscope (for example, product name "Model SMZ-10", manufactured by Nikon Corporation), scanning electron microscope, transmission electron microscope, etc. , manufactured by Nippon Avionics Co., Ltd.), and can be measured and calculated as follows. That is, the projected area (A) and perimeter (PM) of the grain are measured from the photograph.
- the sphericity of 200 arbitrary particles thus obtained can be obtained, and the average value thereof can be taken as the average sphericity.
- the silica powder may be treated with a surface modifier.
- the particles are less likely to agglomerate, and the dispersibility in the resin tends to be better.
- silica powder is treated with a surface modifier, the entire surface of the particles may be modified, or a portion of the surface may be modified.
- the surface modifier is not particularly limited as long as it has the effect of the present invention, and surface modifiers conventionally used for fillers such as silica powder can be used as appropriate.
- surface modifiers conventionally used for fillers such as silica powder can be used as appropriate.
- examples thereof include silane compounds, silazane compounds, aluminate coupling agents, titanate coupling agents and the like. These may be used individually by 1 type, and may use 2 or more types together.
- the silica powder according to this embodiment can be produced by classifying a raw material powder prepared by a conventionally known method.
- raw material powder means silica powder containing coarse particles before classification.
- the powder for preparing the raw material powder is described as "coarse raw material powder".
- a method for producing the raw material powder conventionally known methods can be employed. For example, a method of directly supplying the raw material powder into a high-temperature flame formed in a furnace to obtain the raw material powder, or a method of obtaining a raw material powder, or a slurry containing the crude raw material powder. is sprayed into a flame to remove the solvent to obtain raw material powder.
- Methods for classifying raw material powders are generally divided into dry methods and wet methods.
- the dry method includes, for example, a sieve classification method, an airflow classification method, and the like.
- As a wet method for example, after dispersing the raw material powder in a solvent, it is passed through a filter or the like to remove coarse particles. and fluid classification.
- the raw material powder is airflow classified to obtain coarse particles. preferably includes removing the
- Airflow classification is a method of dispersing raw material powder in an airflow and removing coarse particles by utilizing the gravity, inertial force, centrifugal force, and the like of the particles.
- inertial force for example, a guide vane or the like is installed inside the classifier to create a swirl flow of air, and coarse particles are removed when the raw material powder, which is energized by the air flow, is bent into a curve.
- impactor type semi-free vortex centrifugal type in which raw material powder is classified by exerting centrifugal force
- Coanda type using Coanda effect are examples of Coanda effect.
- Classifiers using inertial force include cascade impactor, viable impactor, aerofine classifier, eddy classifier, elbow jet, hyperplex, and coanda block.
- a method using centrifugal force for example, there is a method of removing coarse particles using a swirling air current.
- Devices include free vortex and forced vortex types. Free vortex devices include cyclones without guide vanes, multi-stage cyclones, turboplexes that use secondary air to promote the elimination of agglomeration, dispersion separators with guide vanes for improved classification accuracy, microspins, and microcuts. be done.
- the forced vortex type is a device that improves classification accuracy by applying centrifugal force to particles with a rotating body inside the device and creating another air flow inside the device, such as turbo classifier and Donaserec.
- the airflow temperature is preferably less than 150°C, more preferably 40 to 130°C, and even more preferably 60 to 120°C.
- the method for producing silica powder according to the present embodiment may include, for example, the following steps. (i) optionally pulverizing and classifying the ore to obtain a crude raw material powder; (ii) A step of feeding the crude raw material powder into a high-temperature flame in a reaction vessel to obtain a raw material powder (molten powder); (iii) The raw material powder is treated at an airflow temperature of less than 150 ° C. by airflow classification using the Coanda effect, D50 is 2.0 ⁇ m or less, and the maximum particle diameter (D max ) is 5.0 ⁇ m or less to obtain a silica powder.
- the raw material used in step (i) is preferably of high purity (for example, 95% or higher purity).
- raw materials include metallic silicon and silica stone. These may be used individually by 1 type, and may use 2 or more types together. Among these, it is more preferable to contain metallic silicon.
- Pulverization is carried out with a pulverizer such as a vibration mill or a ball mill to prepare a crude raw material powder having a desired particle size.
- the D50 of the coarse raw material powder is preferably 5 to 40 ⁇ m, more preferably 5 to 20 ⁇ m, from the viewpoints of handleability, oxidation, and spheroidization.
- step (ii) the crude raw material powder obtained in step (i) is injected into a high-temperature flame formed by a combustible gas and a combustion supporting gas using a burner to reach a temperature equal to or higher than the melting point or boiling point of the crude raw material powder.
- a combustible gas and a combustion supporting gas using a burner to reach a temperature equal to or higher than the melting point or boiling point of the crude raw material powder.
- silica silica
- it is fused and spheroidized at a temperature of 1600° C. or higher), classified and repaired while being cooled to obtain a spheroidized raw material powder (fused powder).
- the metal powder slurry is supplied to a high-temperature flame composed of a combustible gas and a combustion supporting gas in a production furnace at a temperature of 2400 ° C. or higher, and the metal powder is vaporized and oxidized in the flame.
- Raw material powder is obtained by In step (ii), D50 of the raw material powder is preferably 0.2 to 2.0 ⁇ m, more preferably 0.2 to 1.5 ⁇ m.
- Combustible gases include hydrocarbon gases such as acetylene, ethylene, propane, butane and methane; gaseous fuels such as LPG, LNG and hydrogen; and liquid fuels such as kerosene and heavy oil. Oxygen, oxygen-rich cooling gas, and air can be used as combustion support gas.
- the D50 of the raw material powder may be adjusted by adjusting the powder supply amount, powder temperature, combustible gas, combustion support gas temperature, and the like.
- step (iii) the raw material powder obtained in step (ii) is treated at an airflow temperature of less than 150 ° C. by airflow classification using the Coanda effect, and has a D50 of 2.0 ⁇ m or less, and is ground by the above method.
- a silica powder having a maximum particle size (D max ) of 5.0 ⁇ m or less as measured by a gauge is obtained.
- the airflow temperature is more preferably 40 to 130°C, more preferably 60 to 120°C.
- the gas species used for the airflow may be air, oxygen, nitrogen, helium, argon, carbon dioxide, or the like.
- the airflow velocity at the Coanda block inlet is preferably less than 80 m/s, more preferably 30 to 75 m/s, and even more preferably 35 to 50 m/s.
- the resin composition according to the present invention contains the silica powder described above and a resin.
- the content of silica powder in the resin composition is not particularly limited, and can be appropriately adjusted according to the purpose. From the viewpoint of heat resistance, thermal expansion coefficient, etc., the proportion of silica powder in the resin composition is preferably 40 to 90% by mass, more preferably 70 to 90% by mass, relative to the total mass of the resin composition.
- the silica powder according to the present invention has a D50 of 2.0 ⁇ m or less and a maximum particle diameter (D max ) measured with a grind gauge by the above method of 5.0 ⁇ m or less. is good.
- Such a resin composition can be suitably used as a semiconductor sealing material and a semiconductor package substrate.
- thermosetting resin is preferable as the resin.
- the thermosetting resin is not particularly limited as long as it is commonly used in the field of semiconductor sealing materials.
- epoxy resin epoxy resin; silicone resin; phenol resin; melamine resin; urea resin; unsaturated polyester resin; fluorine resin; polyester resin; polyphenylene sulfide resin; wholly aromatic polyester resin; polysulfone resin; liquid crystal polymer resin; polyether sulfone resin; resin (acrylonitrile-ethylene-propylene-diene rubber-styrene resin);
- epoxy resin silicone resin
- phenol resin phenol resin
- melamine resin urea resin
- unsaturated polyester resin fluorine resin
- polyester resin polyphenylene sulfide resin
- wholly aromatic polyester resin polysulfone resin
- liquid crystal polymer resin polyether sulfone resin
- resin acrylonitrile-ethylene-propylene-diene rubber-styrene resin
- Epoxy resins are not particularly limited, and examples include phenol novolak type epoxy resins, ortho-cresol novolak type epoxy resins, epoxidized novolak resins of phenols and aldehydes, and glycidyls such as bisphenol A, bisphenol F and bisphenol S.
- Ether type epoxy resins glycidyl ester acid epoxy resins (bisphenol type epoxy resins) obtained by reacting polybasic acids such as phthalic acid and dimer acid with epochlorhydrin, linear aliphatic epoxy resins, alicyclic epoxy resins , heterocyclic epoxy resins, alkyl-modified polyfunctional epoxy resins, ⁇ -naphthol novolac type epoxy resins, 1,6-dihydroxynaphthalene type epoxy resins, 2,7-dihydroxynaphthalene type epoxy resins, bishydroxybiphenyl type epoxy resins, and further Epoxy resin into which a halogen such as bromine is introduced for imparting flame retardancy.
- a halogen such as bromine
- epoxy resins such as bisphenol A type epoxy resin and bisphenol F type epoxy resin, and alicyclic epoxy resins.
- the resin composition preferably further includes a curing agent.
- a curing agent for example, one or a mixture of two or more selected from the group of phenol, cresol, xylenol, resorcinol, chlorophenol, t-butylphenol, nonylphenol, isopropylphenol, octylphenol, etc., and formaldehyde, paraformaldehyde or para Novolac type resin obtained by reacting with xylene under an oxidation catalyst, polyparahydroxystyrene resin, bisphenol compounds such as bisphenol A and bisphenol S, trifunctional phenols such as pyrogallol and phloroglucinol, maleic anhydride, phthalic anhydride and acid anhydrides such as pyromellitic anhydride, and aromatic amines such as metaphenylenediamine, diaminodiphenylmethane and diaminodiphenyls
- the content of the curing agent is preferably blended so that the active hydrogen equivalent (or acid anhydride equivalent) of the curing agent is 0.01 to 1.25 with respect to the epoxy equivalent of 1 of the epoxy resin.
- the resin composition may contain curing accelerators, mold release agents, coupling agents, colorants, etc., as long as they do not impair the effects of the present invention.
- the curing accelerator is not particularly limited, and includes 1,8-diazabicyclo(5,4,0)undecene-7, triphenylphosphine, benzyldimethylamine, 2-methylimidazole and the like.
- release agents include natural waxes, synthetic waxes, metal salts of straight-chain fatty acids, acid amides, esters, and paraffin.
- a silane coupling agent is mentioned as a coupling agent.
- Silane coupling agents include epoxysilanes such as ⁇ -glycidoxypropyltrimethoxysilane and ⁇ -(3,4-epoxycyclohexyl)ethyltrimethoxysilane; aminopropyltriethoxysilane, ureidopropyltriethoxysilane, N- aminosilanes such as phenylaminopropyltrimethoxysilane; hydrophobic silane compounds such as phenyltrimethoxysilane, methyltrimethoxysilane and octadecyltrimethoxysilane; and mercaptosilanes.
- epoxysilanes such as ⁇ -glycidoxypropyltrimethoxysilane and ⁇ -(3,4-epoxycyclohexyl)ethyltrimethoxysilane
- One aspect of the resin composition according to the present invention contains the silica powder according to the present invention and a bisphenol F type epoxy resin, and the maximum particle size (D max ) of the grind gauge measured under the following conditions is 5.0 ⁇ m.
- the resin composition is as follows.
- the maximum particle size (D max ) may be 4.0 ⁇ m.
- (Measuring method) Add 67 parts by mass of silica powder to 100 parts by mass of bisphenol F-type liquid epoxy resin, and mix using a rotation/revolution mixer at a temperature of 30 ° C. and a rotation speed of 2,000 rpm for 3 minutes and 1 minute of revolution. to prepare a resin composition.
- the resin composition was measured according to JIS K 5600-2-5 using a grind gauge with a width of 90 mm, a length of 240 mm, and a maximum depth of 100 ⁇ m, and the degree of dispersion of the silica powder in the epoxy resin was measured by distribution map method. Evaluate and measure the maximum particle size (D max ). Moreover, the same evaluation is performed 5 times and the average value is adopted.
- the method for producing the resin composition is not particularly limited, and the resin composition can be produced by stirring, dissolving, mixing, and dispersing predetermined amounts of each material.
- the device for mixing, stirring, dispersing, etc. of these mixtures is not particularly limited, but a lykai machine equipped with a stirring and heating device, a three-roll mill, a ball mill, a planetary mixer, or the like can be used. Moreover, you may use these apparatuses in combination suitably.
- the semiconductor sealing material according to the present invention uses the resin composition of the present invention. Specifically, first, the resin composition is kneaded while being heated with a roll, an extruder, or the like, and the kneaded product is stretched into a sheet and cooled. Thereafter, the semiconductor encapsulant can be obtained as a pulverized product of the resin composition by pulverizing, or extruding the kneaded product into a linear shape, cooling it, and then cutting it.
- the pulverized product may be molded into a shape such as a tablet shape or a pellet shape.
- a method for encapsulating a semiconductor using the semiconductor encapsulating material according to the present invention conventionally known methods such as a transfer molding method and a compression molding method can be employed.
- a transfer molding method for example, a tablet-shaped semiconductor sealing material is loaded into a pot provided in a mold of a transfer molding machine, heated to melt, pressurized with a plunger, and further heated. A method of curing the encapsulant may be mentioned.
- the compression molding method for example, a pellet-shaped or tablet-shaped sealing material is directly placed in a mold and melted, and then the bonded chip or wafer is immersed in the molten resin and cured by heating. .
- Examples 1 to 4 and Comparative Examples 1 to 7 (Production of raw material powder: steps (i) to (ii)) A combustible gas supply pipe, a combustion support gas supply pipe, and a metal silicon powder slurry supply pipe are assembled in this order from the outermost part. A raw material powder was produced using an apparatus connected to a classification and collection system (produced particles were sucked by a blower and collected by a bag filter). Further, three peripheral burners for forming a peripheral flame are installed on the periphery of the burner.
- a metal silicon powder (average particle diameter (D50): 10 ⁇ m) dispersed in methyl alcohol was prepared by dispersing the metal silicon slurry in the flame through a metal silicon powder slurry supply pipe using a slurry pump, thereby producing a raw material powder. (Spherical silica powder) was collected from a cyclone or bag filter at a powder temperature of 110°C to 200°C.
- the particle size and specific surface area of the raw material powder were adjusted by adjusting the concentration of the slurry to control the metal silicon concentration in the furnace. Through these operations, raw material powders having D50 values of 0.5 ⁇ m, 0.7 ⁇ m, 1.0 ⁇ m, 1.5 ⁇ m, 1.9 ⁇ m and 2.6 ⁇ m were obtained.
- the maximum particle size (D max ) of the silica powder obtained in each example was measured under the following conditions.
- Bisphenol F type liquid epoxy resin manufactured by Mitsubishi Chemical Corporation, product name “807”, viscosity: 3,000 to 4,500 mPa s, epoxy equivalent: 160 to 175 g / eq.
- silica Add 67 parts by mass of powder, and use a rotation and revolution mixer (manufactured by Thinky Co., Ltd., product name “ARE-310”) at a temperature of 30 ° C. and a rotation speed of 2,000 rpm for 3 minutes and 1 minute for revolution. processed to prepare a resin composition.
- the silica powders of Examples 1 to 4 had a maximum particle size (D max ) of 5.0 ⁇ m or less as measured by a grind gauge while D50 was 2.0 ⁇ m or less.
- D max maximum particle size
- a silica powder was obtained which was hard to agglomerate even when mixed with a resin and was easy to disperse. It was also found that such silica powder can be easily obtained by classifying raw material particles using nitrogen gas at a lower gas temperature and a lower flow rate.
- Comparative Examples 1 to 7 when the classification treatment was not performed and when the classification treatment was performed in the air, the silica powder tended to agglomerate in the resin.
- the silica powder according to the present invention has a D50 of 2.0 ⁇ m or less, and is characterized by being resistant to agglomeration, being easy to handle, and being easily dispersed when mixed with a resin.
- a resin composition containing such a silica powder can be suitably used as a semiconductor sealing material.
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Abstract
Description
すなわち、本発明は以下の態様を有する。
[1]体積基準累積径(D50)が2.0μm以下であり、下記方法でグラインドゲージにより測定された最大粒子径(Dmax)が5.0μm以下である、シリカ粉末。
(測定方法)
ビスフェノールF型液状エポキシ樹脂100質量部に対して、シリカ粉末67質量部を添加し、自転公転混合機を用いて、温度30℃、回転数2,000rpmで自転3分間、公転1分間で混合処理して樹脂組成物を調製する。前記樹脂組成物をJIS K 5600-2-5に沿って、幅90mm、長さ240mm、最大深さ100μmのグラインドゲージを用いて、分布図法にて前記エポキシ樹脂への前記シリカ粉末の分散度を評価し、最大粒子径(Dmax)を測定する。また、同様の評価を5回行い、その平均値を採用する。
[2]体積基準累積径(D90)が2.5μm以下である、[1]に記載のシリカ粉末。
[3]体積基準累積径(D100)が4.7μm以下である、[1]または[2]に記載のシリカ粉末。
[4]比表面積(BET)が2~15m2/gである、[1]から[3]のいずれかに記載のシリカ粉末。
[5]下記式(1)から算出される、体積基準累積径(D100)と体積基準累積径(D90)との差分に対する、体積基準累積径(D90)の体積基準頻度の値が、1.0~3.0である、[1]から[4]のいずれかに記載のシリカ粉末。
(体積基準累積径(D90)の体積基準頻度)/(体積基準累積径(D100)-体積基準累積径(D90)) ・・・(1)
[6][1]から[5]のいずれかに記載のシリカ粉末と、樹脂とを含む、樹脂組成物。
[7]前記樹脂が熱硬化性樹脂を含む、[6]に記載の樹脂組成物。
[8][6]または[7]に記載の樹脂組成物を用いてなる、半導体封止材。
本発明に係るシリカ粉末は、体積基準累積径(D50)が2.0μm以下であり、下記方法でグラインドゲージにより測定された最大粒子径(Dmax)が5.0μm以下であることを特徴とする。
(測定方法)
ビスフェノールF型液状エポキシ樹脂100質量部に対して、シリカ粉末67質量部を添加し、自転公転混合機を用いて、温度30℃、回転数2,000rpmで自転3分間、公転1分間で混合処理して樹脂組成物を調製する。前記樹脂組成物をJIS K 5600-2-5に沿って、幅90mm、長さ240mm、最大深さ100μmのグラインドゲージを用いて、分布図法にて前記エポキシ樹脂への前記シリカ粉末の分散度を評価し、最大粒子径(Dmax)を測定する。また、同様の評価を5回行い、その平均値を採用する。
グラインドゲージの溝部は傾斜状で徐々に溝が浅くなっている。そのため、溝の深さよりも粒径の大きな粒子が存在すると、形成膜に線状の痕跡が残ることとなる。したがって、形成膜の痕跡をグラインドゲージ上の目盛りと照らし合わせて確認することで、凝集体の有無と、その粒子径を確認することができる。本発明に係るグラインドゲージの測定方法において、「最大粒子径(Dmax)」とは、グラインドゲージの形成膜上に残された線状の痕跡のうち、最も粒子径の大きな位置に残された線状痕跡の値を意味する。本発明では、上記の評価を5回行ってその平均値を、「最大粒子径(Dmax)」とする。
グラインドゲージの測定に用いられるビスフェノールF型液状エポキシ樹脂としては、粘度が3,000~4,500mPa・s(25℃)であり、かつエポキシ当量が160~175g/eq.のものを用いることが好ましい。
前記最大粒子径(Dmax)は、4.5μm以下が好ましく、4.0μm以下が特に好ましい。
(体積基準累積径(D90)の体積基準頻度)/(体積基準累積径(D100)-体積基準累積径(D90)) ・・・(1)
式(1)において、「体積基準累積径(D90)の体積基準頻度」(以下、「D90の体積基準頻度」と記載することもある)は、前述のレーザー回折散乱法(屈折率:1.50)により測定される体積基準の累積粒度分布において、累積値が90%に相当する粒子径の頻度を意味する。シリカ粉末の、D100とD90との差分に対する、D90の体積基準頻度が前記範囲内であれば、凝集がより起こりにくく、粗大粒子がより少ない。このようなシリカ粉末は、ハンドリングがより良好となりやすく、また半導体封止材用樹脂組成物とした際に、配線のギャップ間に粗大粒子が入り込んで、短絡不良を起こすリスクをより低減しやすい。
また、D100とD90との差分(D100-D90)は、2.3μm以下であることが好ましく、2.0μm以下であることがより好ましい。D100とD90との差分が前記範囲内であれば、粒度分布がより狭いシリカ粉末となる。このようなシリカ粉末は粗大粒子がより少なく、かつ樹脂への分散性がより良好となりやすい。
次に、本発明に係るシリカ粉末の製造方法の一実施形態について説明する。
本実施形態に係るシリカ粉末は、従来公知の方法で調製した原料粉末を分級することによって製造できる。本明細書において、「原料粉末」とは、分級処理前の粗大粒子を含むシリカ粉末のことを意味する。また、原料粉末を調製するための粉末を「粗原料粉末」と記載する。
原料粉末の製造方法としては、従来公知の方法が採用でき、例えば、炉内に形成された高温の火炎中に粗原料粉末を直接供給して原料粉末を得る方法、又は粗原料粉末を含むスラリーを火炎中に噴霧して溶媒を除去し、原料粉末を得る方法等が挙げられる。
乾式法としては、例えば、篩分級法、気流分級法等が挙げられる。湿式法としては、例えば、原料粉末を溶媒に分散させたうえで、フィルター等を通過させて粗大粒子を除去するフィルター分級と、流体状にして沈降速度の差を利用して粗大粒子を除去する流体分級とが挙げられる。
本実施形態に係る製造方法は、収率が低下しにくく、また粒度分布や比表面積が変化して樹脂への分散性が低下することを防ぐ観点から、原料粉末を気流分級して、粗大粒子を除去することを含むことが好ましい。
慣性力を利用する方法としては、例えば、分級装置の内部に案内羽根等を設けて空気の旋回流を作ることで、気流で勢いをつけた原料粉末を曲線に曲げる際に粗大粒子を除去するインパクタ型;原料粉末に遠心力を働かせて分級する半自由渦遠心式;コアンダ効果を利用したコアンダ型等が挙げられる。また、慣性力を利用した分級装置としては、カスケードインパクタ、バイアブルインパクタ、エアロファインクラシファイア、エディクラシファイア、エルボージェット、ハイパープレックス、コアンダブロック等が挙げられる。
遠心力を利用する方法としては、例えば、渦状気流を利用して粗大粒子を除去する方法が挙げられる。装置としては、自由渦型と強制渦型が挙げられる。自由渦型装置は案内羽根のないサイクロン、多段サイクロン、二次エアーを使用し凝集の解消を促すターボプレックス、案内羽根を設けて分級精度を高めたディスパージョンセパレータ、マイクロスピン、マイクロカット等が挙げられる。強制渦型は装置内部の回転体で粒子に遠心力を働かせ、さらに装置内部に別の気流を作ることにより分級精度を高めた装置で、ターボクラシファイアやドナセレックなどが挙げられる。
(i)必要に応じて、鉱石を粉砕及び分級して粗原料粉末を得る工程;
(ii)粗原料粉末を反応容器内の高温火炎中に供給して原料粉末(溶融紛)とする工程;
(iii)原料粉末を、コアンダ効果を利用した気流分級により、気流温度150℃未満で処理して、D50が2.0μm以下であり、前記方法でグラインドゲージにより測定された最大粒子径(Dmax)が5.0μm以下であるシリカ粉末を得る工程。
工程(i)において用いる原料は、高純度(例えば、95%以上の純度)のものが好ましい。原料としては、金属ケイ素、珪石等が挙げられ。これらは1種単独で用いられてもよく、2種以上を併用してもよい。このうち、金属ケイ素を含むことがより好ましい。粉砕は、振動ミル、ボールミル等の粉砕機で粉砕することで、所望の粒子径を有する粗原料粉末を調製する。なお、粗原料粉末のD50は、ハンドリング性、酸化、球状化の観点から、5~40μmであることが好ましく、5~20μmであることがより好ましい。
工程(ii)では、工程(i)で得られた粗原料粉末を、バーナーを用いて可燃ガスと助燃ガスとによって形成される高温火炎中に噴射して粗原料粉末の融点又は沸点以上の温度(例えば、シリカ(珪石)の場合は、1600℃以上の温度)で溶融球状化し、冷却しながら分級及び補修し、球状化された原料粉末(溶融粉)を得る。また、金属ケイ素の場合は、2400℃以上の温度で、金属粉末スラリーを製造炉で可燃性ガスと助燃性ガスとからなる高温火炎中に供給し、前記火炎中で前記金属粉末を気化、酸化させることにより原料粉末を得る。工程(ii)において、原料粉末のD50は、0.2~2.0μmであることが好ましく、0.2~1.5μmであることがより好ましい。
可燃ガスとしては、アセチレン、エチレン、プロパン、ブタン、メタン等の炭化水素系ガス;LPG、LNG、水素等の気体燃料;灯油、重油等の液体燃料が使用できる。助燃ガスとしては、酸素、酸素リッチ冷却ガス、空気が使用できる。
工程(iii)では、工程(ii)で得られた原料粉末を、コアンダ効果を利用した気流分級により、気流温度150℃未満で処理して、D50が2.0μm以下であり、前記方法でグラインドゲージにより測定された最大粒子径(Dmax)が5.0μm以下であるシリカ粉末を得る。
気流温度は、前述の通り、40~130℃がより好ましく、60~120℃がさらに好ましい。気流に用いるガス種は、空気、酸素、窒素、ヘリウム、アルゴン、二酸化炭素等のいずれであってもよい。シリカ粉末の体積基準累積径(D50)を2.0μm以下とするには、より凝集し難い観点から、窒素を導入することで調整してもよい。気流の流速は、コアンダブロック入口の流速で80m/s未満とすることが好ましく、30~75m/sがより好ましく、35~50m/sがさらに好ましい。これらの条件を合わせることで、装置との摩擦により生じる摩耗を抑えかつ、気流中の粒子の分散性がより高まり、コアンダ効果が向上しやすくなる。
本発明に係る樹脂組成物は、上述のシリカ粉末と、樹脂とを含む。
樹脂組成物中のシリカ粉末の含有量は特に限定されず、目的に応じて適宜調整し得る。耐熱性、熱膨張係数等の観点からは、樹脂組成物中のシリカ粉末の割合は、樹脂組成物の総質量に対して、40~90質量%が好ましく、70~90質量%がより好ましい。本発明に係るシリカ粉末は、D50が2.0μm以下であり、かつ前記方法で、グラインドゲージにより測定される最大粒子径(Dmax)が5.0μm以下であるため、樹脂中での分散性が良好である。このような樹脂組成物は、半導体封止材、半導体パッケージ用基板として好適に利用できる。
樹脂としては、熱硬化性樹脂が好ましい。熱硬化性樹脂としては、半導体封止材の分野に通常用いられるものであれば、特に限定されない。例えばエポキシ樹脂;シリコーン樹脂;フェノール樹脂;メラミン樹脂;ユリア樹脂;不飽和ポリエステル樹脂;フッ素樹脂;ポリイミド樹脂、ポリアミドイミド樹脂、ポリエーテルイミド樹脂等のポリイミド系樹脂;ポリブチレンテレフタレート樹脂、ポリエチレンテレフタレート樹脂等のポリエステル系樹脂;ポリフェニレンスルフィド樹脂;全芳香族ポリエステル樹脂;ポリスルホン樹脂;液晶ポリマー樹脂;ポリエーテルスルホン樹脂;ポリカーボネート樹脂;マレイミド変成樹脂;ABS樹脂、AAS樹脂(アクリロニトリル-アクリルゴム-スチレン樹脂)、AES樹脂(アクリロニトリル-エチレン-プロピレン-ジエンゴム-スチレン樹脂)等;を挙げることができる。これらは1種単独で用いられてもよく、2種以上を併用してもよい。このうち、エポキシ樹脂を含むことがより好ましい。
樹脂としてエポキシ樹脂を含む場合、樹脂組成物はさらに硬化剤を含むことが好ましい。硬化剤としては、例えば、フェノール、クレゾール、キシレノール、レゾルシノール、クロロフェノール、t-ブチルフェノール、ノニルフェノール、イソプロピルフェノール、オクチルフェノール等の群から選ばれた1種又は2種以上の混合物をホルムアルデヒド、パラホルムアルデヒド又はパラキシレンとともに酸化触媒下で反応させて得られるノボラック型樹脂、ポリパラヒドロキシスチレン樹脂、ビスフェノールAやビスフェノールS等のビスフェノール化合物、ピロガロールやフロログルシノール等の3官能フェノール類、無水マレイン酸、無水フタル酸や無水ピロメリット酸等の酸無水物、メタフェニレンジアミン、ジアミノジフェニルメタン、ジアミノジフェニルスルホン等の芳香族アミン等を挙げることができる。
樹脂組成物には、本発明の効果を阻害しない範囲で、硬化促進剤、離型剤、カップリング剤、着色剤等を配合することができる。
硬化促進剤としては、特に限定されず、1,8-ジアザビシクロ(5,4,0)ウンデセン-7、トリフェニルホスフィン、ベンジルジメチルアミン、2-メチルイミダゾール等が挙げられる。
離型剤としては、天然ワックス類、合成ワックス類、直鎖脂肪酸の金属塩、酸アミド類、エステル類、パラフィン等が挙げられる。
カップリング剤としては、シランカップリング剤が挙げられる。シランカップリング剤としては、γ-グリシドキシプロピルトリメトキシシラン、β-(3,4-エポキシシクロヘキシル)エチルトリメトキシシラン等のエポキシシラン;アミノプロピルトリエトキシシラン、ウレイドプロピルトリエトキシシラン、N-フェニルアミノプロピルトリメトキシシラン等のアミノシラン;フェニルトリメトキシシラン、メチルトリメトキシシラン、オクタデシルトリメトキシシラン等の疎水性シラン化合物やメルカプトシラン等が挙げられる。
(測定方法)
ビスフェノールF型液状エポキシ樹脂100質量部に対して、シリカ粉末67質量部を添加し、自転公転混合機を用いて、温度30℃、回転数2,000rpmで自転3分間、公転1分間で混合処理して樹脂組成物を調製する。前記樹脂組成物をJIS K 5600-2-5に沿って、幅90mm、長さ240mm、最大深さ100μmのグラインドゲージを用いて、分布図法にて前記エポキシ樹脂への前記シリカ粉末の分散度を評価し、最大粒子径(Dmax)を測定する。また、同様の評価を5回行い、その平均値を採用する。
樹脂組成物の製造方法は、特に限定されず、各材料の所定量を撹拌、溶解、混合、分散させることにより製造することができる。これらの混合物の混合、撹拌、分散等の装置は特に限定されないが、撹拌、加熱装置を備えたライカイ機、3本ロール、ボールミル、プラネタリーミキサー等を用いることができる。またこれらの装置を適宜組み合わせて使用してもよい。
本発明に係る半導体封止材は、本発明の樹脂組成物を用いてなる。
具体的には、まず、前記樹脂組成物をロール又は押し出し機等で加熱しながら混練し、その混練物をシート状に伸ばして冷却する。その後、粉砕する、又は混練物を線状に押し出して冷却した後に切断する等により、樹脂組成物の粉砕物としての半導体封止材を得ることができる。前記粉砕物は、タブレット状、ペレット状等の形状に成形されてもよい。
トランスファーモールド法としては、例えば、タブレット状の半導体封止材をトランスファー成形機の金型に備えられたポットに装填し、加熱して溶融させた後、プランジャーで加圧し、更に加熱することによって封止材を硬化させる方法が挙げられる。
また、コンプレッションモールド法としては、例えば、金型に直接ペレット状又はタブレット状の封止材を配置して溶融させたのち、ボンディング済みのチップあるいはウェーハを溶融樹脂に浸し加熱硬化させる方法が挙げられる。
(原料粉末の製造:工程(i)~(ii))
最外部より、可燃性ガス供給管、助燃性ガス供給管、金属シリコン粉末スラリー供給管の順に組まれた三重巻管構造のバーナーが製造炉の頂部に設置されており、製造炉の下部がサイクロン等の分級及び捕集系(生成した粒子をブロワーで吸引しバッグフィルターにて捕集)に接続されてなる装置を用い、原料粉末を製造した。なお、バーナーの外周には外周火炎を形成させる外周バーナーが更に3本設置されている。可燃性ガス供給管からLPGを7Nm3/hr、助燃性ガス供給管から酸素を12Nm3/hr供給して、製造炉内に高温火炎を形成した。金属シリコン粉末(平均粒子径(D50):10μm)をメチルアルコールに分散させて調製した金属シリコンスラリーを、スラリーポンプを用いて、金属シリコン粉末スラリー供給管から火炎中に供給し、生成した原料粉末(球状シリカ粉末)を粉体温度が110℃から200℃の状態でサイクロンまたはバグフィルターより捕集した。なお、原料粉末の粒子径及び比表面積は、スラリー濃度の調整により、炉内の金属シリコン濃度を制御することで調製した。これらの操作によって、D50が0.5μm、0.7μm、1.0μm、1.5μm、1.9μm、2.6μmの原料粉末を得た。
上記で得られた各原料粉末を、表1に示す条件で分級して、各例のシリカ粉末を得た。分級操作は、ブロワーでコアンダブロック構造を有する気流分級機((株)マツボー製、商品名「エルボージェット分級機」)に原料粉末を送給して気流分級した後、バグフィルターで捕集した。気流に用いるガスは窒素ガス又は空気(露点温度:-5℃)を使用した。また、気流のガス温度及びコアンダ部の流速は、表1に示す通りとした。
各例で得られたシリカ粉末の最大粒子径(Dmax)を以下の条件で測定した。
ビスフェノールF型液状エポキシ樹脂(三菱ケミカル(株)製、製品名「807」、粘度:3,000~4,500mPa・s、エポキシ当量:160~175g/eq.)100質量部に対して、シリカ粉末67質量部を添加し、自転公転混合機((株)シンキー製、製品名「ARE-310」)を用いて、温度30℃、回転数2,000rpmで自転3分間、公転1分間で混合処理して樹脂組成物を調製した。得られた樹脂組成物をJIS K 5600-2-5に沿って、幅90mm、長さ240mm、最大深さ100μmのグラインドゲージを用いて、分布図法にて前記エポキシ樹脂への前記シリカ粉末の分散度を評価し、最大粒子径(Dmax)を測定した。また、同様の評価を5回行い、その平均値を採用した。結果を表1に示す。
各例で得られたシリカ粉末について、粒度分布測定機(ベックマン・コールター(株)製、製品名「LS-13 320XR」)を用いて、溶媒に水(屈折率:1.33)を用い、前処理として2分間、超音波発生器(SONICS MATERIALS INC社製、製品名「VC-505」)を用いて分散処理したのち、レーザー回折光散乱法による体積基準の頻度粒度分布を測定した。また、D90の体積基準頻度と、D100及びD90の値を上記の式(1)に当てはめて計算した。これらの結果を表1に示す。
各例で得られたシリカ粉末について、シリカ粉末を1.0g計量し、測定用のセルに投入し、前処理後、窒素ガスを用いて、BET比表面積値を測定した。測定機はMACSORB社製「Macsorb HM model-1208」を使用した。以下の条件で比表面積を測定した。結果を表1に示す。
脱気温度:300℃
脱気時間:18分
冷却時間:4分。
Claims (8)
- 体積基準累積径(D50)が2.0μm以下であり、下記方法でグラインドゲージにより測定された最大粒子径(Dmax)が5.0μm以下である、シリカ粉末。
(測定方法)
ビスフェノールF型液状エポキシ樹脂100質量部に対して、シリカ粉末67質量部を添加し、自転公転混合機を用いて、温度30℃、回転数2,000rpmで自転3分間、公転1分間で混合処理して樹脂組成物を調製する。前記樹脂組成物をJIS K 5600-2-5に沿って、幅90mm、長さ240mm、最大深さ100μmのグラインドゲージを用いて、分布図法にて前記エポキシ樹脂への前記シリカ粉末の分散度を評価し、最大粒子径(Dmax)を測定する。また、同様の評価を5回行い、その平均値を採用する。 - 体積基準累積径(D90)が2.5μm以下である、請求項1に記載のシリカ粉末。
- 体積基準累積径(D100)が4.7μm以下である、請求項1または2に記載のシリカ粉末。
- 比表面積(BET)が2~15m2/gである、請求項1または2に記載のシリカ粉末。
- 下記式(1)から算出される、体積基準累積径(D100)と体積基準累積径(D90)との差分に対する、体積基準累積径(D90)の体積基準頻度の値が、1.0~3.0である、請求項1または2に記載のシリカ粉末。
(体積基準累積径(D90)の体積基準頻度)/(体積基準累積径(D100)-体積基準累積径(D90)) ・・・(1) - 請求項1または2に記載のシリカ粉末と、樹脂とを含む、樹脂組成物。
- 前記樹脂が熱硬化性樹脂を含む、請求項6に記載の樹脂組成物。
- 請求項6に記載の樹脂組成物を用いてなる、半導体封止材。
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