WO2017167211A1 - 一种光强调制方法 - Google Patents
一种光强调制方法 Download PDFInfo
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- WO2017167211A1 WO2017167211A1 PCT/CN2017/078717 CN2017078717W WO2017167211A1 WO 2017167211 A1 WO2017167211 A1 WO 2017167211A1 CN 2017078717 W CN2017078717 W CN 2017078717W WO 2017167211 A1 WO2017167211 A1 WO 2017167211A1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70083—Non-homogeneous intensity distribution in the mask plane
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70125—Use of illumination settings tailored to particular mask patterns
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
Abstract
Description
Claims (7)
- 一种光强调制方法,利用掩模版来实现,其特征在于,包括:步骤1:根据照明系统的弥散斑函数、照明视场的既有光强分布及目标光强分布,计算得到用于将所述既有光强分布调制为所述目标光强分布所需的掩模版的透过率分布;步骤2:根据所述目标光强分布的精度需求,对掩模版进行网格划分,根据所述掩模版的透过率分布和透过率分布精度需求,确定每个网格内不透光点的分布;步骤3:根据所述不透光点的分布,制作加工掩模版;然后,将所述掩模版设置在照明系统中。
- 根据权利要求1所述的光强调制方法,其特征在于,步骤2中所述根据目标光强分布的精度需求,对掩模版进行网格划分包括:对掩模版进行初始网格划分,再对划分的网格进行插值,且插值后相邻网格的光强梯度的最大值应小于所述目标光强分布的精度需求。
- 根据权利要求1所述的光强调制方法,其特征在于,步骤2中所述根据所述掩模版的透过率分布和透过率分布精度需求,确定每个网格内不透光点的分布包括:根据所述不透光点的面积与对应网格面积之比应不大于所述透过率分布精度需求,计算得到所述不透光点的面积,再根据所述掩模版的透过率分布和不透光点的面积,拟合得到每个网格内不透光点的数量和相邻不透光点间的间距。
- 根据权利要求1所述的光强调制方法,其特征在于,所述不透光点采用铬点结构。
- 根据权利要求1所述的光强调制方法,其特征在于,步骤3中,通过掩模版制版工艺制作加工所述掩模版。
- 根据权利要求1所述的光强调制方法,其特征在于,所述掩模版采用熔融石英材质。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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US16/090,032 US10416568B2 (en) | 2016-03-31 | 2017-03-30 | Light intensity modulation method |
JP2018550692A JP6843151B2 (ja) | 2016-03-31 | 2017-03-30 | 光強度調整方法 |
KR1020187031647A KR102110567B1 (ko) | 2016-03-31 | 2017-03-30 | 광 세기 변조 방법 |
SG11201808386RA SG11201808386RA (en) | 2016-03-31 | 2017-03-30 | Light intensity modulation method |
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CN201610200470.1A CN107290935B (zh) | 2016-03-31 | 2016-03-31 | 一种光强调制方法 |
CN201610200470.1 | 2016-03-31 |
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PCT/CN2017/078717 WO2017167211A1 (zh) | 2016-03-31 | 2017-03-30 | 一种光强调制方法 |
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US (1) | US10416568B2 (zh) |
JP (1) | JP6843151B2 (zh) |
KR (1) | KR102110567B1 (zh) |
CN (1) | CN107290935B (zh) |
SG (1) | SG11201808386RA (zh) |
TW (1) | TWI633386B (zh) |
WO (1) | WO2017167211A1 (zh) |
Cited By (1)
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CN115542679A (zh) * | 2022-09-05 | 2022-12-30 | 上海镭望光学科技有限公司 | 调制板透过率分布生成方法、调制板及光刻机照明系统 |
Families Citing this family (3)
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CN109657402B (zh) * | 2019-01-07 | 2021-02-26 | 中国科学院光电技术研究所 | 一种光强分布的建模方法、装置、电子设备及存储介质 |
CN110095491B (zh) * | 2019-05-09 | 2021-08-20 | 上海华力微电子有限公司 | 一种缺陷检测系统、检测方法及电子束扫描机台 |
CN114746806A (zh) * | 2019-11-19 | 2022-07-12 | Asml控股股份有限公司 | 使用非均匀照射强度分布进行优化 |
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- 2016-03-31 CN CN201610200470.1A patent/CN107290935B/zh active Active
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- 2017-03-30 TW TW106110906A patent/TWI633386B/zh active
- 2017-03-30 KR KR1020187031647A patent/KR102110567B1/ko active IP Right Grant
- 2017-03-30 WO PCT/CN2017/078717 patent/WO2017167211A1/zh active Application Filing
- 2017-03-30 JP JP2018550692A patent/JP6843151B2/ja active Active
- 2017-03-30 SG SG11201808386RA patent/SG11201808386RA/en unknown
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CN115542679B (zh) * | 2022-09-05 | 2024-04-26 | 上海镭望光学科技有限公司 | 调制板透过率分布生成方法、调制板及光刻机照明系统 |
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CN107290935B (zh) | 2019-01-29 |
US10416568B2 (en) | 2019-09-17 |
CN107290935A (zh) | 2017-10-24 |
KR20180132103A (ko) | 2018-12-11 |
SG11201808386RA (en) | 2018-10-30 |
JP6843151B2 (ja) | 2021-03-17 |
TWI633386B (zh) | 2018-08-21 |
JP2019511748A (ja) | 2019-04-25 |
KR102110567B1 (ko) | 2020-05-13 |
US20190113850A1 (en) | 2019-04-18 |
TW201736946A (zh) | 2017-10-16 |
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