WO2015194385A1 - プローブピン - Google Patents
プローブピン Download PDFInfo
- Publication number
- WO2015194385A1 WO2015194385A1 PCT/JP2015/066222 JP2015066222W WO2015194385A1 WO 2015194385 A1 WO2015194385 A1 WO 2015194385A1 JP 2015066222 W JP2015066222 W JP 2015066222W WO 2015194385 A1 WO2015194385 A1 WO 2015194385A1
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- WO
- WIPO (PCT)
- Prior art keywords
- probe pin
- plunger
- contact portion
- elastic arm
- pin according
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Definitions
- the present invention relates to a probe pin, in particular, a probe pin having a wiping function.
- a probe pin having a wiping function for example, a first member formed of a metal plate material, which is a first opening extending from one end portion with a certain length in the longitudinal direction. And a pair of contact portions that can be elastically deformed by the first opening, and the pair of contact portions is at least a first portion that is separated by a first distance and a first distance greater than the first distance.
- the first portion includes a second portion separated by a distance of 2 and extending from the pair of contact portions toward the other end facing the one end.
- a spring member that urges the first member and the second member in a direction away from the first member;
- the engaging portion of the second member is positioned in the first opening of the first member, and at least one of the extending portions of the first member is in the second opening of the second member.
- the first member and the second member intersect so that the portion is located, When the first member moves in a direction approaching the second member, the engaging portion moves from the second region of the pair of contact portions to the first region, and the pair of contact portions
- a probe pin that is opened is disclosed (see Patent Document 1). As shown in FIGS. 8, 10, and 14, the probe pin secures a wiping function by opening the pair of contact portions 220 a and 220 b as the contact enlarged portion 320 slides.
- an object of the present invention is to provide a probe pin that can be arranged at a narrow pitch and has a high integration density.
- the probe pin according to the present invention includes a coil spring, A first plunger inserted from one end of the coil spring and exposing one end; A probe pin that is inserted from the other end of the coil spring and has a second plunger that contacts one end of the coil spring and exposes the other end; The tip of at least one elastic arm extending from the other end of the second plunger is provided with a contact portion that can be displaced in a direction intersecting the axial direction by a pressing force in the axial direction. .
- the contact portion is displaced and a wiping operation is performed, so that contact failure with the object to be tested can be prevented and the life of the probe pin can be extended.
- the contact part As other embodiment of this invention, you may arrange
- the probe pin that performs the wiping operation at a narrow pitch is obtained by displacing the contact portion located at the action point toward the axial center.
- a contact portion that is displaced toward the axial center side by a pressing force in the axial direction at the tip of at least one elastic arm portion extending from the other end portion of the second plunger, It may be provided. According to this embodiment, since the contact portion is displaced toward the axial center, a probe pin that performs a wiping operation at a narrow pitch is obtained.
- the elastic arm portions may be arranged symmetrically. According to this embodiment, since a pair of contact part performs wiping operation
- a curved connection portion may be provided between the elastic arm portion and the contact portion. According to the present embodiment, the distance between the fulcrum and the action point is increased by the connecting portion, and a probe pin with a larger wiping amount can be obtained.
- the contact portion may be V-shaped, corrugated, or pointed. According to these embodiments, a probe pin in which the contact portion performs a more effective wiping operation can be obtained.
- the contact portion may have an arc shape. According to the present embodiment, a probe pin that easily deforms elastically and performs a wiping operation while faithfully tracing the surface of the device under test can be obtained.
- a step portion may be formed at least from the elastic arm portion toward the contact portion in the one-side edge portion of the second plunger. According to this embodiment, since the front and back surfaces of the second plunger are not line-symmetric, a torsional moment acts on the elastic arm portion, and a wiping operation is performed while the contact portion rotates. For this reason, a more preferable wiping action is obtained.
- At least a cross-sectional area from the elastic arm portion to the contact portion of the second plunger may be trapezoidal. According to this embodiment, since the front and back surfaces of the second plunger are not line-symmetric, a torsional moment acts on the elastic arm portion, and a wiping operation is performed while the contact portion rotates. For this reason, a more preferable wiping action is obtained.
- the contact portion may be displaced in a direction crossing the axial direction by pressure.
- a probe pin with a large amount of wiping can be obtained.
- the elastic arm portion is easily elastically deformed, a probe pin that performs a wiping operation with a low contact pressure can be obtained.
- a position restricting protrusion may be provided on at least one base of the elastic arm portion. According to the present embodiment, the position restricting protrusion restricts the position of the connecting portion, thereby obtaining a probe pin that can prevent the elastic arm portion from being damaged.
- the contact portion may be displaced in a direction intersecting the axial direction by a pressing force in the axial direction.
- a probe pin with a large amount of wiping can be obtained.
- the elastic arm portion is easily elastically deformed, a probe pin that performs a wiping operation with a low contact pressure can be obtained.
- the electronic device has a configuration using the probe pin described above. According to the present invention, when the contact portion is displaced, a wiping operation is performed, so that contact failure with the device under test can be prevented and the life of the probe pin can be extended. Further, the contact portion located at the action point is displaced so as to approach the direction intersecting the axial direction, in particular, toward the axial center side by the pressing force in the axial direction. For this reason, the probe pins can be arranged at a narrow pitch, and an electronic device having a high integration density of probe pins can be obtained.
- FIGS. A, B, C, and D are a front view, a right side view, an enlarged plan view, and an enlarged bottom view showing a first embodiment of a probe pin according to the present invention.
- FIGS. A, B, and C are a perspective view, a front view, and a right side view of the first plunger shown in FIG.
- FIGS. A, B, C, and D are a perspective view, a front view, a partially enlarged front view, and a right side view of the second plunger shown in FIG.
- FIGS. A, B and C are a perspective view and a longitudinal sectional view showing before and after assembly of the probe pin shown in FIG. FIGS.
- FIGS. A and B are a perspective view and a partially enlarged view showing a second embodiment of the probe pin according to the present invention.
- FIGS. C and D are a perspective view and a partially enlarged view showing a third embodiment of the probe pin according to the present invention.
- FIGS. E and F are a perspective view and a partially enlarged view showing a probe pin according to a fourth embodiment of the present invention.
- FIGS. G and H are a perspective view and a partially enlarged view showing a fifth embodiment of the probe pin according to the present invention. is there.
- FIGS. A, B, and C show a sixth embodiment of the probe pin according to the present invention, and are a perspective view, a partially enlarged side view, and a partially enlarged perspective view of the second plunger.
- FIGS. A, B, C and D show a seventh embodiment of the probe pin according to the present invention, and are a perspective view, a partially enlarged front view, a partially enlarged side view and a partially enlarged perspective view of the second plunger.
- FIGS. A, B, C, and D are a front view, a right side view, an enlarged plan view, and an enlarged bottom view showing an eighth embodiment of the probe pin according to the present invention.
- FIGS. A, B, and C are a perspective view, a front view, and a right side view of the first plunger shown in FIG.
- FIGS. A, B, C, and D are a perspective view, a front view, a partially enlarged front view, and a right side view of the second plunger shown in FIG.
- FIGS. A, B and C are a perspective view and a longitudinal sectional view showing before and after assembly of the probe pin shown in FIG.
- FIGS. A, B, C, and D are a front view, a right side view, an enlarged plan view, and an enlarged bottom view showing a ninth embodiment of a probe pin according to the present invention.
- FIGS. A, B, and C are a perspective view, a front view, and a right side view of the first plunger shown in FIG.
- FIGS. A, B, C, and D are a perspective view, a front view, a partially enlarged front view, and a right side view of the second plunger shown in FIG. FIGS.
- FIG. 1 A, B and C are a perspective view and a longitudinal sectional view showing before and after assembly of the probe pin shown in FIG. 2 is a diagram illustrating an analysis result of Example 1.
- FIG. FIGS. A and B are photographs showing the operation before and after the probe pin according to the second embodiment.
- FIGS. A and B are photographs showing the operation before and after the probe pin according to the third embodiment. It is drawing which illustrated the analysis result of Example 4.
- FIG. It is drawing which illustrated the analysis result of Example 5.
- FIGS. 1 to 4 An embodiment of a probe pin according to the present invention will be described with reference to the accompanying drawings of FIGS.
- the probe pin according to the first embodiment is inserted from a coil spring 10, a first plunger 20 inserted from one end of the coil spring 10, and the other end of the coil spring 10.
- the 2nd plunger 30 which clamps and contacts the said 1st plunger 20 is comprised.
- the coil spring 10 has an outer diameter D1 and an inner diameter D2, and is made of, for example, carbon steel or stainless steel.
- the coil spring 10 is compressed when the first and second plungers 20 and 30 are assembled, and has a length dimension capable of urging the first and second plungers 20 and 30 in the axial direction by the spring force. Have.
- the first plunger 20 is made of electroforming made of a long conductive plate-like body having a width dimension W1 and a thickness dimension T1, and a wide part 21 having a width dimension W2 at an intermediate portion thereof.
- the width dimension W1 of the first plunger 20 is smaller than the inner diameter dimension D2 of the coil spring 10, and the width dimension W2 of the first plunger 20 is substantially the same as the outer diameter dimension D1 of the coil spring 10.
- the first plunger 20 has a contact portion 22 having a substantially V-shaped cross section at one end thereof, and a guide groove 23 having a width dimension W3 and a length dimension L1 is formed along the length direction on the other end side. It is.
- the second plunger 30 is made of electroforming made of a long conductive plate-like body having a width dimension W4 and a thickness dimension T2, and a wide portion 31 having a width dimension W5 at an intermediate portion thereof. have.
- the width dimension W4 of the second plunger 30 is smaller than the inner diameter dimension D2 of the coil spring 10, and the width dimension W5 of the second plunger 30 is substantially the same as the outer diameter dimension D1 of the coil spring 10.
- the thickness dimension T2 of the second plunger 30 is smaller than the width dimension W3 of the guide groove 23 of the first plunger 20.
- the second plunger 30 has a first elastic leg 32 and a second elastic leg 33 extending in parallel downward from one end of the second plunger 30 to form a slit 34 having a width W6.
- the width dimension W6 of the slit 34 is equal to or greater than the thickness dimension T1 of the first plunger 20.
- the first elastic leg portion 32 is longer than the second elastic leg portion 33 by a distance L2, and a movable contact portion 32a is provided at the lower edge portion of the inward surface, while the second elastic leg portion 33 is provided.
- a guide projection 33a is provided at the lower edge of the inward surface.
- the distance L2 is equal to or greater than the length dimension L1 of the guide groove 23.
- the second plunger 30 protrudes upward from the other end so that the pair of elastic arm portions 35 are line symmetrical.
- the other end of the first plunger 20 is inserted from one end of the coil spring 10, while the first and second elastic legs of the second plunger 30 are inserted from the other end of the coil spring 10. 32 and 33 are inserted.
- the first plunger 20 is displaced along the first elastic leg portion 32, and the guide protrusion 33 a of the second elastic leg portion 33 is fitted in the guide groove 23.
- the protruding distance L2 of the first elastic leg portion 32 is equal to or longer than the length dimension L1 of the guide groove 23. Therefore, the movable contact portion 32 a of the first elastic leg portion 32 is always in contact with the first plunger 20, and the guide protrusion 33 a of the second elastic leg portion 33 is in the guide groove 23 of the first plunger 20.
- first and second elastic legs 32 and 33 have a structure for sandwiching the first plunger. Further, the wide portion 21 of the first plunger 20 and the wide portion 31 of the second plunger 30 are respectively engaged with the opening portions at both ends of the coil spring 10 so as to be compressed. Therefore, the first and second plungers 20 and 30 are urged outward along the axial direction.
- the guide protrusion 33a of the second plunger 30 moves in the guide groove 23 of the second plunger 30, and the first 2
- the movable contact portion 32 a of the plunger 30 slides on the first plunger 20.
- a pressing force acts with the base portion of the elastic arm portion 35 of the second plunger 30 as a fulcrum 35a, a bending moment is generated by a horizontal component force, and the contact portion 37 of the connection portion 36 is on the axis 30a side, Move inward and perform wiping action.
- the elastic arm portions 35 do not necessarily have to be a pair, and may be one.
- the probe pin may have a substantially V-shaped shape (second embodiment) as shown in FIGS. 5A and 5B. It is good also as a waveform shape (3rd Embodiment).
- the shape of the contact portion 37 may be a pointed shape (fourth embodiment), or as shown in FIGS. 5G and 5H, a smooth arc shape (fifth embodiment) may be used. Good. Others are almost the same as those in the first embodiment, and the same parts are denoted by the same reference numerals and the description thereof is omitted.
- the probe pin according to the sixth embodiment is substantially the same as the first embodiment described above, except that a stepped portion 30 b is formed along one edge of the second plunger 30. It is.
- the cross-sectional shapes of the elastic arm portion 35, the connection portion 36, and the contact portion 37 are not line-symmetric on the front and back surfaces. For this reason, when a pressing force acts on the elastic arm portion 35 in the axial direction, a torsional moment is generated in the elastic arm portion 35 and the connecting portion 36, and the wiping action is performed while the contact portion 37 rotates. There is an advantage that a preferable wiping effect can be obtained.
- the other parts are almost the same as those of the first embodiment, and the same parts are denoted by the same reference numerals and the description thereof is omitted.
- the probe pin according to the seventh embodiment is substantially the same as the first embodiment described above, except that the cross-sectional shapes of the elastic arm portion 35, the connection portion 36, and the contact portion 37 are substantially trapezoidal. This is the point.
- the cross-sectional shapes of the elastic arm portion 35, the connection portion 36, and the contact portion 37 are not line-symmetric on the front and back surfaces. For this reason, when a pressing force acts on the elastic arm portion 35 in the axial direction, a torsional moment acts on the elastic arm portion 35 and the connection portion 36, and the wiping action is performed while the contact portion 37 rotates. A more preferable wiping effect can be obtained.
- the other parts are almost the same as those of the first embodiment, and the same parts are denoted by the same reference numerals and the description thereof is omitted.
- the probe pin according to the eighth embodiment is substantially the same as that of the first embodiment described above, except that a single bellows-shaped elastic arm 35 is provided on the tip surface. This is the point that the connecting portion 36 provided with the corrugated contact portion 37 is provided. In addition, position restricting projections 38a and 38b are projected from the both ends of the elastic arm portion 35 along the axial direction. This is to prevent the second plunger 30 from being damaged when a load exceeding the allowable range is applied.
- the contact portion 37 when the contact portion 37 is pressed against the object to be tested and a pressing force is applied, the elastic arm portion 35 is bent, and the connecting portion 36 is displaced in the arrow direction shown in FIGS.
- the contact part 37 performs a wiping action.
- the distance between the fulcrums of the elastic arm portion 35 is long and the displacement amount is large, there is an advantage that a large wiping amount can be secured and a desired wiping operation can be obtained with a low contact pressure.
- Others are the same as those in the first embodiment described above, and thus the same parts are denoted by the same reference numerals and description thereof is omitted.
- the shape of the contact portion 37 may be, for example, a substantially V shape, a pointed shape, or an arc shape as in the above-described embodiment.
- the probe pin according to the ninth embodiment is substantially the same as that of the first embodiment described above.
- a vertically long connecting portion 36 is integrally provided at the tip, and the tip is a contact portion 37.
- the elastic arm portion 35 when the contact portion 37 is pressed against the object to be tested and a pressing force is applied, the elastic arm portion 35 is bent and the connection portion 36 is rotated.
- the contact portion 37 performs a wiping operation.
- the elastic arm portion 35 has a long fulcrum distance, a large amount of displacement, and the connecting portion 36 rotates. For this reason, there is an advantage that a large amount of wiping can be secured and a desired wiping operation can be obtained with a low contact pressure.
- Others are the same as those in the first embodiment described above, and thus the same parts are denoted by the same reference numerals and description thereof is omitted.
- the shape of the contact portion 37 may be, for example, substantially V-shaped, corrugated, pointed, or arc-shaped as in the above-described embodiment.
- the behavior of the probe pin according to the first embodiment of the present invention was numerically analyzed.
- the coil spring constituting the probe pin was 0.58 mm in outer diameter, the first and second plungers having width dimensions W1, W4 of 0.32 mm, and thickness dimensions T1, T2 of 0.12 mm. Then, the behavior of the contact portion when a load of 21 g was applied in the axial direction of the probe pin was calculated. The calculation results are shown in FIG.
- the probe pin according to the first embodiment of the present invention was pressed onto a flat surface under the same conditions as in Example 1, and photographs were taken before and after the operation of the contact portion. Imaging results are shown in FIGS. 17A and 17B.
- the contact portion of the probe pin according to the first embodiment of the present invention was pressed onto a dome-shaped ball solder having a diameter of 0.2 mm with a pressing force of 21 g, and photographs were taken before and after the operation of the contact portion.
- the imaging results are shown in FIGS. 18A and 18B.
- the behavior of the probe pin according to the eighth embodiment of the present invention was numerically analyzed.
- the coil spring constituting the probe pin was 0.58 mm in outer diameter, the first and second plungers having width dimensions W1, W4 of 0.32 mm, and thickness dimensions T1, T2 of 0.12 mm. Then, the behavior of the contact portion when a load of 21 g was applied in the axial direction of the probe pin was calculated. The calculation results are shown in FIG.
- the behavior of the ninth embodiment according to the present invention was numerically analyzed.
- the coil spring constituting the probe pin was 0.58 mm in outer diameter, the first and second plungers having width dimensions W1, W4 of 0.32 mm, and thickness dimensions T1, T2 of 0.12 mm. Then, the behavior of the contact portion when a load of 21 g was applied in the axial direction of the probe pin was calculated. The calculation results are shown in FIG.
- probe pin according to the present invention is not limited to the above-described embodiment, but may have other shapes.
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Abstract
Description
金属製の板材から形成された第2の部材であって、前記第1の部材と係合する係合部が一方の端部に形成され、当該係合部から長手方向に一定の長さで延在する第2の開口が形成され、前記係合部は、前記第1の領域の第1の距離よりも大きい板厚の部分を含む、前記第2の部材と、
前記第1の部材と前記第2の部材とを離れる方向に付勢するバネ部材とを有し、
前記第1の部材の第1の開口内に前記第2の部材の前記係合部が位置し、前記第2の部材の第2の開口内に前記第1の部材の延在部の少なくとも一部が位置するように第1の部材と第2の部材とが交差し、
前記第1の部材が前記第2の部材に接近する方向に移動したとき、前記係合部が前記一対の接点部の第2の領域から第1の領域へ移動し、前記一対の接点部が開かれる、プローブピンが開示されている(特許文献1参照)。
そして、前記プローブピンは、その図8,10,14に示すように、接点拡大部320の摺動に伴って一対の接点部220a,220bが開くことにより、ワイピング機能を確保している。
本発明は、前記問題点に鑑み、挟ピッチで配置でき、集積密度の高いプローブピンを提供することを課題とする。
前記コイルバネの一端側から挿入し、一端部を露出する第1プランジャと、
前記コイルバネの他端側から挿入し、一端部を前記第1プランジャに接触するとともに、他端部を露出する第2プランジャと、からなるプローブピンであって、
前記第2プランジャの他端部から延在した少なくとも1本の弾性腕部の先端に、軸心方向の押圧力によって前記軸心方向に交差する方向に変位できる接触部を、設けた構成としてある。
本実施形態によれば、作用点に位置する接触部が軸心側に変位し、挟ピッチでワイピング動作を行うプローブピンが得られる。
本実施形態によれば、前記接触部が軸心側に変位するので、挟ピッチでワイピング動作を行うプローブピンが得られる。
本実施形態によれば、左右から内側に向けて一対の接触部がワイピング動作を行うので、より好ましいワイピング動作を行うプローブピンが得られる。
本実施形態によれば、前記接続部により支点と作用点との間の距離が長くなり、ワイピング量のより大きいプローブピンが得られる。
これらの実施形態によれば、前記接触部がより効果的なワイピング動作を行うプローブピンが得られる。
本実施形態によれば、接触部が弾性変形しやすく、被試験体の表面を忠実になぞりながらワイピング動作を行うプローブピンが得られる。
本実施形態によれば、第2プランジャの表裏面が線対称にならないので、前記弾性腕部に捩じりモーメントが作用し、前記接触部が回転しながらワイピング動作を行う。このため、より一層好ましいワイピング作用が得られる。
本実施形態によれば、第2プランジャの表裏面が線対称にならないので、前記弾性腕部に捩じりモーメントが作用し、前記接触部が回転しながらワイピング動作を行う。このため、より一層好ましいワイピング作用が得られる。
本実施形態によれば、前記蛇腹形状の弾性腕部の基部から前記接触部までの実質的な支点間距離が長くなるので、ワイピング量の大きいプローブピンが得られる。
また、前記弾性腕部が弾性変形しやすいので、低接触圧でワイピング動作を行うプローブピンが得られる。
本実施形態によれば、前記位置規制突起が接続部の位置規制を行うことにより、前記弾性腕部の破損を防止できるプローブピンが得られる。
本実施形態によれば、非対称に湾曲した前記弾性腕部の基部から前記接触部までの実質的な支点間距離が長くなるので、ワイピング量の大きいプローブピンが得られる。
また、前記弾性腕部が弾性変形しやすいので、低接触圧でワイピング動作を行うプローブピンが得られる。
本発明によれば、前記接触部が変位することにより、ワイピング動作を行うことにより、被試験体との接触不良を防止でき、プローブピンの寿命を延ばすことができる。
また、作用点に位置する接触部が、軸心方向の押圧力によって前記軸心方向に交差する方向、特に、軸心側に近づくように変位する。このため、プローブピンを挟ピッチで配置でき、プローブピンの集積密度の高い電子デバイスが得られるという効果がある。
第1実施形態に係るプローブピンは、図1ないし図4に示すように、コイルバネ10と、前記コイルバネ10の一端部から挿入される第1プランジャ20と、前記コイルバネ10の他端部から挿入され、かつ、前記第1プランジャ20を挟持して接触する第2プランジャ30と、で構成されている。
また、前記第1プランジャ20は、その一端部に断面略V字形状の接触部22を有する一方、その他端側に巾寸法W3、長さ寸法L1のガイド溝23を長さ方向に沿って形成してある。
また、前記第2プランジャ30は、その一端部から下方側に第1弾性脚部32および第2弾性脚部33を平行に延在し、巾寸法W6のスリット34を形成している。なお、前記スリット34の巾寸法W6は第1プランジャ20の厚さ寸法T1と同等以上である。
そして、前記第1弾性脚部32は前記第2弾性脚部33よりも距離L2だけ長いとともに、その内向面の下方縁部に可動接点部32aを設けてある一方、前記第2弾性脚部33の内向面の下方縁部にガイド突起33aを設けてある。なお、前記距離L2は前記ガイド溝23の長さ寸法L1と同等以上である。
さらに、前記第2プランジャ30は、その他端部から上方に一対の弾性腕部35を線対称となるように突出している。前記弾性腕部35の先端部には内側に屈曲した接続部36が延在しており、その上端部が平坦な接触部37となっている。
したがって、第2プランジャ30の軸心30aと弾性腕部35の基部に位置する支点35aとの間に、作用点として接触部37が位置する。
また、第1プランジャ20の巾広部21および第2プランジャ30の巾広部31が前記コイルバネ10の両端開口部にそれぞれ係合し、押し縮める構成となっている。このため、前記第1,第2プランジャ20,30は軸心方向に沿って外方にそれぞれ付勢されている。
なお、前記弾性腕部35は必ずしも一対である必要はなく、1本であってもよいことは勿論である。
また、図5E,5Fに示すように、接触部37の形状を尖端形状(第4実施形態)としてもよく、図5G,5Hに示すように、滑らかな円弧形状(第5実施形態)としてもよい。
他は前述の第1実施形態とほぼ同様であるので、同一部分については同一番号を付して説明を省略する。
本実施形態によれば、前記段差部30bを形成することにより、前記弾性腕部35,接続部36,接触部37の断面形状が表裏面において線対称とならない。このため、前記弾性腕部35に軸心方向に押圧力が作用した場合に弾性腕部35,接続部36に捩じりモーメントが生じ、接触部37が回転しながらワイピング作用を行うので、より好ましいワイピング効果が得られるという利点がある。
他は前述の第1実施形態とほぼ同様であるので、同一部分については同一番号を付して説明を書略する。
本実施形態によれば、前記弾性腕部35,接続部36,接触部37の断面形状が表裏面において線対称とならない。このため、前記弾性腕部35に軸心方向に押圧力が作用した場合に弾性腕部35,接続部36に捩じりモーメントが作用し、接触部37が回転しながらワイピング作用を行うので、より一層好ましいワイピング効果が得られる。
他は前述の第1実施形態とほぼ同様であるので、同一部分については同一番号を付して説明を書略する。
また、前記弾性腕部35の両端基部に位置規制突起38a,38bを軸心方向に沿って突設してある。許容範囲以上の負荷が作用した場合に、第2プランジャ30の破損を防止するためである。
また、本実施形態よれば、前記弾性腕部35の支点間距離が長く、変位量が多いので、大きなワイピング量を確保できるととともに、低い接触圧力で所望のワイピング動作が得られるという利点がある。
他は前述の第1実施形態と同様であるので、同一部分には同一番号を付して説明を省略する。
なお、接触部37の形状を前述の実施形態のように、例えば、略V字形状、尖端形状、円弧形状としてもよいことは勿論である。
また、本実施形態よれば、前記弾性腕部35によって支点間距離が長く、変位量が多いとともに、前記接続部36が回転する。このため、大きなワイピング量を確保できるととともに、低い接触圧力で所望のワイピング動作が得られるという利点がある。
他は前述の第1実施形態と同様であるので、同一部分には同一番号を付して説明を省略する。
なお、接触部37の形状を前述の実施形態のように、例えば、略V字形状、波型形状、尖端形状、円弧形状としてもよいことは勿論である。
プローブピンを構成するコイルバネは外径0.58mm、第1,第2プランジャは巾寸法W1,W4が0.32mm、厚さ寸法T1,T2が0.12mmのものを使用した。そして、前記プローブピンの軸心方向に21gの負荷を加えた場合の接触部の挙動を計算した。計算結果を図16に図示する。
この結果、数値解析と実際の挙動実験とで接触部がワイピング動作を行うことを確認できた。
プローブピンを構成するコイルバネは外径0.58mm、第1,第2プランジャは巾寸法W1,W4が0.32mm、厚さ寸法T1,T2が0.12mmのものを使用した。そして、前記プローブピンの軸心方向に21gの負荷を加えた場合の接触部の挙動を計算した。計算結果を図19に図示する。
プローブピンを構成するコイルバネは外径0.58mm、第1,第2プランジャは巾寸法W1,W4が0.32mm、厚さ寸法T1,T2が0.12mmのものを使用した。そして、前記プローブピンの軸心方向に21gの負荷を加えた場合の接触部の挙動を計算した。計算結果を図20に図示する。
20 第1プランジャ
21 巾広部
22 接触部
23 ガイド溝
30 第2プランジャ
30a 軸心
30b 段差部
31 巾広部
32 第1弾性脚部
32a 可動接点部
33 第2弾性脚部
33a ガイド突起
34 スリット
35 弾性腕部
35a 支点
36 接続部
37 接触部
38a,38b 位置規制突起
Claims (15)
- コイルバネと、
前記コイルバネの一端側から挿入し、一端部を露出する第1プランジャと、
前記コイルバネの他端側から挿入し、一端部を前記第1プランジャに接触するとともに、他端部を露出する第2プランジャと、からなるプローブピンであって、
前記第2プランジャの他端部から延在した少なくとも1本の弾性腕部の先端に、軸心方向の押圧力によって前記軸心方向に交差する方向に変位できる接触部を、設けたことを特徴とするプローブピン。 - 前記弾性腕部の基部に位置する支点と軸心との間に、接触部を作用点として配置したことを特徴とする請求項1に記載のプローブピン。
- 前記第2プランジャの他端部から延在した少なくとも1本の前記弾性腕部の先端に、前記軸心方向の押圧力によって軸心側に変位する接触部を、設けたことを特徴とする請求項1または2に記載のプローブピン。
- 前記弾性腕部を左右対称に配置したことを特徴とする請求項1ないし3のいずれか1項に記載のプローブピン。
- 前記弾性腕部と前記接触部との間に湾曲した接続部を設けたことを特徴とする請求項1ないし4のいずれか1項に記載のプローブピン。
- 前記接触部がV字形状であることを特徴とする請求項1ないし5のいずれか1項に記載のプローブピン。
- 前記接触部が波型形状であることを特徴とする請求項1ないし6のいずれか1項に記載のプローブピン。
- 前記接触部が尖端形状であることを特徴とする請求項1ないし7のいずれか1項に記載のプローブピン。
- 前記接触部が円弧形状であることを特徴とする請求項1ないし8のいずれか1項に記載のプローブピン。
- 前記第2プランジャの片面縁部のうち、少なくとも前記弾性腕部から前記接触部に向かって段差部を形成したことを特徴とする請求項1ないし9のいずれか1項に記載のプローブピン。
- 前記第2プランジャのうち、少なくとも前記弾性腕部から前記接触部までの断面積を台形形状としたことを特徴とする請求項1ないし10のいずれか1項に記載のプローブピン。
- 前記第2プランジャの他端部から蛇腹形状に延在する前記弾性腕部の先端に、前記接触部を有する接続部を設けることにより、前記軸心方向の押圧力によって前記軸心方向に交差する方向に前記接触部が変位することを特徴とする請求項1に記載のプローブピン。
- 前記弾性腕部の少なくともいずれか一方の基部に、位置規制突起を設けたことを特徴とする請求項12に記載のプローブピン。
- 前記第2プランジャの他端部から非対称に湾曲するように延在した前記弾性腕部の先端に、先端に前記接触部を有する接続部を設けることにより、前記軸心方向の押圧力によって前記軸心方向に交差する方向に前記接触部が変位することを特徴とする請求項1に記載のプローブピン。
- 請求項1ないし請求項14のいずれか1項に記載のプローブピンを備えたことを特徴とする電子デバイス。
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EP15810229.3A EP3156806B1 (en) | 2014-06-16 | 2015-06-04 | Probe pin |
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KR1020167032708A KR101948401B1 (ko) | 2014-06-16 | 2015-06-04 | 프로브 핀 |
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JP2008516398A (ja) * | 2004-10-06 | 2008-05-15 | プラストロニックス・ソケット・パートナーズ, エルピー | 電子デバイスのためのコンタクト |
JP2006132982A (ja) * | 2004-11-02 | 2006-05-25 | Tokyo Electron Ltd | プローブ |
US7479237B2 (en) * | 2005-12-30 | 2009-01-20 | Industrial Technology Research Institute | Method of fabricating vertical probe head |
JP2008032620A (ja) * | 2006-07-31 | 2008-02-14 | Tokyo Electron Ltd | プローブピン |
JP2010243411A (ja) * | 2009-04-08 | 2010-10-28 | Japan Electronic Materials Corp | 垂直型プローブ |
US8052491B2 (en) * | 2009-07-14 | 2011-11-08 | Hon Hai Precision Ind. Co., Ltd. | Electrical contact having upper contact with thickened base portion |
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WO2017217042A1 (ja) * | 2016-06-17 | 2017-12-21 | オムロン株式会社 | プローブピン |
JP2017223629A (ja) * | 2016-06-17 | 2017-12-21 | オムロン株式会社 | プローブピン |
KR20180016616A (ko) * | 2016-06-17 | 2018-02-14 | 오므론 가부시키가이샤 | 프로브 핀 |
CN107850624A (zh) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | 探针 |
KR101910123B1 (ko) * | 2016-06-17 | 2018-10-22 | 오므론 가부시키가이샤 | 프로브 핀 |
KR20190009277A (ko) * | 2016-06-17 | 2019-01-28 | 오므론 가부시키가이샤 | 프로브 핀 |
KR102099139B1 (ko) | 2016-06-17 | 2020-04-09 | 오므론 가부시키가이샤 | 프로브 핀 |
JP2020170008A (ja) * | 2016-06-17 | 2020-10-15 | オムロン株式会社 | プローブピン |
CN107850624B (zh) * | 2016-06-17 | 2021-05-14 | 欧姆龙株式会社 | 探针 |
Also Published As
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JP6337633B2 (ja) | 2018-06-06 |
US10145862B2 (en) | 2018-12-04 |
CN106415278A (zh) | 2017-02-15 |
KR20160145807A (ko) | 2016-12-20 |
KR101948401B1 (ko) | 2019-02-14 |
JP2016003921A (ja) | 2016-01-12 |
EP3156806A1 (en) | 2017-04-19 |
EP3156806B1 (en) | 2019-04-03 |
US20170115324A1 (en) | 2017-04-27 |
EP3156806A4 (en) | 2018-01-24 |
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