WO2014069305A1 - 基板及び基板の製造方法 - Google Patents

基板及び基板の製造方法 Download PDF

Info

Publication number
WO2014069305A1
WO2014069305A1 PCT/JP2013/078704 JP2013078704W WO2014069305A1 WO 2014069305 A1 WO2014069305 A1 WO 2014069305A1 JP 2013078704 W JP2013078704 W JP 2013078704W WO 2014069305 A1 WO2014069305 A1 WO 2014069305A1
Authority
WO
WIPO (PCT)
Prior art keywords
metal layer
solder
substrate
groove
soldering
Prior art date
Application number
PCT/JP2013/078704
Other languages
English (en)
French (fr)
Inventor
公教 尾崎
靖弘 小池
裕明 浅野
仁 志満津
川口 茂樹
智朗 浅井
Original Assignee
株式会社 豊田自動織機
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社 豊田自動織機 filed Critical 株式会社 豊田自動織機
Priority to CN201380056539.2A priority Critical patent/CN104756614A/zh
Priority to EP13851622.4A priority patent/EP2916630A4/en
Priority to BR112015009213A priority patent/BR112015009213A2/pt
Priority to US14/437,059 priority patent/US9655240B2/en
Priority to KR1020157013270A priority patent/KR20150064224A/ko
Publication of WO2014069305A1 publication Critical patent/WO2014069305A1/ja

Links

Images

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/111Pads for surface mounting, e.g. lay-out
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/27Manufacturing methods
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/181Printed circuits structurally associated with non-printed electric components associated with surface mounted components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/4007Surface contacts, e.g. bumps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/2612Auxiliary members for layer connectors, e.g. spacers
    • H01L2224/26152Auxiliary members for layer connectors, e.g. spacers being formed on an item to be connected not being a semiconductor or solid-state body
    • H01L2224/26175Flow barriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/27Manufacturing methods
    • H01L2224/273Manufacturing methods by local deposition of the material of the layer connector
    • H01L2224/2731Manufacturing methods by local deposition of the material of the layer connector in liquid form
    • H01L2224/2732Screen printing, i.e. using a stencil
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001Core members of the layer connector
    • H01L2224/2901Shape
    • H01L2224/29012Shape in top view
    • H01L2224/29013Shape in top view being rectangular or square
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001Core members of the layer connector
    • H01L2224/2901Shape
    • H01L2224/29016Shape in side view
    • H01L2224/29017Shape in side view being non uniform along the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001Core members of the layer connector
    • H01L2224/2901Shape
    • H01L2224/29016Shape in side view
    • H01L2224/29018Shape in side view comprising protrusions or indentations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001Core members of the layer connector
    • H01L2224/29099Material
    • H01L2224/291Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/32227Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the layer connector connecting to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319Arrangement of the layer connectors prior to mounting
    • H01L2224/83192Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8338Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/83385Shape, e.g. interlocking features
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/83801Soldering or alloying
    • H01L2224/83815Reflow soldering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L24/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0364Conductor shape
    • H05K2201/0373Conductors having a fine structure, e.g. providing a plurality of contact points with a structured tool
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09209Shape and layout details of conductors
    • H05K2201/09372Pads and lands
    • H05K2201/09427Special relation between the location or dimension of a pad or land and the location or dimension of a terminal
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09209Shape and layout details of conductors
    • H05K2201/09654Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
    • H05K2201/09745Recess in conductor, e.g. in pad or in metallic substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09818Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/09827Tapered, e.g. tapered hole, via or groove
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/20Details of printed circuits not provided for in H05K2201/01 - H05K2201/10
    • H05K2201/2072Anchoring, i.e. one structure gripping into another
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/01Tools for processing; Objects used during processing
    • H05K2203/0104Tools for processing; Objects used during processing for patterning or coating
    • H05K2203/0108Male die used for patterning, punching or transferring
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/04Soldering or other types of metallurgic bonding
    • H05K2203/0465Shape of solder, e.g. differing from spherical shape, different shapes due to different solder pads
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components
    • H05K3/3442Leadless components having edge contacts, e.g. leadless chip capacitors, chip carriers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Definitions

  • the technology of the present disclosure relates to a substrate including an insulating substrate, a metal layer formed on one surface of the insulating substrate, and an electronic component mounted on the surface of the metal layer by soldering, and a method for manufacturing the substrate.
  • soldering reliability is improved by suppressing the wetting and spreading of the solder and sufficiently keeping the solder within a predetermined range.
  • a technique for suppressing the spread of solder from the soldering region by making the entire soldering region a lower solder reservoir than other portions is known (see Patent Document 1).
  • the mask having a predetermined opening is applied to the surface of the metal layer and paste-like solder is applied, and then the mask is removed and applied.
  • a method of mounting an electronic component on solder is generally used.
  • the solder may be peeled off from the metal layer together with the mask when the mask is removed.
  • An object of the present disclosure is to provide a substrate that can easily apply solder to the surface of a metal layer using a mask and can suppress the spread of the solder, and a method for manufacturing the substrate.
  • a substrate for achieving the above object includes an insulating substrate, a metal layer formed on one surface of the insulating substrate, and an electronic component soldered to the surface of the metal layer.
  • the metal layer is formed from a metal plate.
  • the surface of the metal layer has a soldering region and a groove located on the outer periphery of the soldering region.
  • a substrate manufacturing method for achieving the above object includes an insulating substrate, a metal layer made of a metal plate formed on one surface of the insulating substrate, and an electronic component mounted on the surface of the metal layer by soldering.
  • a method of manufacturing a substrate comprising: applying solder using a mask to an application portion set on the surface of the metal layer; and mounting the electronic component on the solder.
  • the metal layer a metal layer in which a groove is formed outside the application part is used.
  • FIG. 2 is a sectional view taken along line 2-2 of FIG. The enlarged view of a groove part. The figure which shows the method of mounting an electronic component.
  • the substrate 10 includes an insulating substrate 11, a pair of metal layers 12 bonded to each other on the upper surface of the insulating substrate 11 at a predetermined interval, and upper surfaces of the pair of metal layers 12. And an electronic component 13 mounted so as to straddle.
  • the metal layer 12 is formed from a metal plate having a predetermined pattern shape, and is formed by stamping a predetermined pattern shape from a metal plate material with a press (press processing).
  • a metal plate for forming the metal layer 12 a copper plate or a metal plate made of a conductive metal material such as aluminum plated on a soldered portion can be used.
  • the thickness of the metal plate is preferably 0.4 to 2.0 mm, more preferably 0.5 to 1.0 mm. In the present embodiment, a copper plate having a thickness of 0.5 mm is used.
  • a groove 20 having a square frame shape in a top view is provided on the upper surface of the metal layer 12.
  • the groove 20 is annular, in other words, endless.
  • the groove 20 includes a bottom surface 21, a first side surface 22 that is a side surface on the inner peripheral side, and a second side surface 23 that is a side surface on the outer peripheral side.
  • the bottom surface 21 is a plane parallel to the top surface of the metal layer 12, and the first side surface 22 and the second side surface 23 are inclined surfaces that connect the bottom surface 21 and the top surface of the metal layer 12.
  • the groove portion 20 is formed by pressing a forming die having a protrusion corresponding to the groove portion 20 against the upper surface of the metal plate and partially denting the upper surface of the metal plate. Can be formed.
  • the angle ⁇ formed between the upper surface of the metal layer 12 and the first side surface 22 and the angle ⁇ formed between the upper surface of the metal layer 12 and the second side surface 23 are set in the range of 95 to 150 degrees, respectively. It is preferable to do. In the present embodiment, the angle ⁇ is 135 degrees, the angle ⁇ is 95 degrees, and the angle ⁇ is larger than the angle ⁇ . Moreover, in this embodiment, the depth of the groove part 20 is 0.12 mm.
  • solder 30 is applied to the region surrounded by the groove 20 on the upper surface of the metal layer 12.
  • the groove portion surrounds the soldering region. 20 is provided.
  • An electronic component 13 such as a semiconductor element is mounted on the upper surface of the metal layer 12 via the solder 30.
  • an application portion R (region inside the broken line in FIG. 4) for applying solder is set on the upper surface of the metal layer 12 bonded to the upper surface of the insulating substrate 11, and the groove portion 20 is an application portion. It is formed in an endless shape surrounding R.
  • the groove 20 extends along the edge of the application part R and is spaced from the edge of the application part R.
  • the mask 40 having the opening 41 having a shape corresponding to the application part R is overlaid on the upper surface of the metal layer 12 (in FIG. 4, the mask 40 is indicated by a one-dot chain line). At this time, the groove 20 formed outside the application part R is covered with the mask 40. Then, after applying paste-like solder from the opening 41 of the mask 40 to the upper surface of the metal layer 12 using a squeegee or the like, the mask 40 is removed from the metal layer 12. Thereby, solder is applied to the upper surface of the application portion R of the metal layer 12.
  • the groove part 20 is not provided in the application part R which is a part to which the solder is applied. Therefore, a bonding surface between the upper surface of the flat application portion R and the solder is secured, and the solder is sufficiently bonded to the metal layer 12. Therefore, it is possible to prevent the solder from being peeled off from the metal layer 12 together with the mask 40.
  • the electronic component 13 is placed on the solder applied to the application portion R of the metal layer 12. Then, the substrate 10 is heated to melt the solder, and then cooled to solidify the solder. Thereby, the electronic component 13 is mounted on the upper surface of the metal layer 12 by soldering.
  • the groove 20 provided around the application portion R prevents the solder from spreading over the groove 20.
  • the flux that flows prior to the solder tends to spread over the metal layer 12 beyond the groove 20, but the solder wetting and spreading is regulated by the groove 20, and the solder tends to be retained inside the groove 20.
  • the entire region surrounded by the groove portion 20 becomes a soldering region.
  • the groove part 20 will be located in the outer periphery of the soldering area
  • the substrate 10 includes an insulating substrate 11, a metal layer 12 formed on the upper surface of the insulating substrate 11, and an electronic component 13 mounted on the upper surface of the metal layer 12 by soldering.
  • the metal layer 12 is formed from a metal plate.
  • a groove 20 is provided on the outer periphery of the soldering region on the upper surface of the metal layer 12.
  • the solder of the metal layer 12 is applied when the solder is applied to the surface of the metal layer 12 using a mask.
  • a bonding surface between the application region (application portion R) and the solder is secured, and the metal layer 12 and the solder are sufficiently bonded. Therefore, when removing the mask, the applied solder is hardly peeled off, and the solder can be easily applied.
  • the groove portion 20 is formed in an endless shape surrounding the soldering region. In other words, the groove 20 continuously extends around the entire soldering area. According to the above configuration, wetting and spreading of the solder 30 from the soldering region in all directions can be suppressed.
  • the groove portion 20 includes a flat bottom surface 21, a first side surface 22 that is a side surface on the inner peripheral side (the side closer to the soldering region), and a second side surface that is the outer peripheral side (the far side from the soldering region). And a side surface 23.
  • the groove 20 is formed by pressing a mold having a protrusion corresponding to the groove 20 against the metal layer 12 a defect such as rounding or chipping occurs at the tip of the protrusion of the mold as the mold is repeatedly used. May occur.
  • the tip of the protrusion provided on the mold also has a flat shape.
  • the angle ⁇ formed between the surface of the metal layer 12 and the first side surface 22 in the groove 20 is in the range of 95 to 150 degrees, and the angle ⁇ formed between the surface of the metal layer 12 and the second side surface 23 is 95 to 150 °.
  • the range is 150 degrees.
  • wetting and spreading of the solder 30 beyond the groove 20 can be suitably suppressed.
  • the above angle when the mold 20 is pressed against the metal layer 12 to form the groove portion 20, the biting between the metal layer 12 and the mold is suppressed and the mold from the metal layer 12 is suppressed. Good mold release.
  • the angle ⁇ formed between the surface of the metal layer 12 and the first side surface 22 is made larger than the angle ⁇ formed between the surface of the metal layer 12 and the second side surface 23.
  • the second side surface 23 located on the outer side has a slope shape that is closer to vertical, so that wetting and spreading of the solder 30 beyond the groove 20 can be more suitably suppressed.
  • the groove 20 is not limited to an endless shape, in other words, a continuous shape, and may be an endless shape, in other words, a non-continuous shape.
  • an endless shape in other words, a continuous shape
  • the cross-sectional shape of the groove 20 is not particularly limited.
  • the bottom surface 21 may be formed in a concave curved surface shape, and also in this case, the effect (3) can be obtained.
  • the angle ⁇ formed by the surface of the metal layer 12 and the first side surface 22 may be the same as the angle ⁇ formed by the surface of the metal layer 12 and the second side surface 23. Further, the angle ⁇ may be smaller than the angle ⁇ .
  • the electronic component 13 is mounted so as to straddle the upper surfaces of the two metal layers 12 that are spaced apart from each other.
  • the electronic component 13 is mounted only on the upper surface of one of the metal layers 12. Also good.
  • the substrate 10 may be a double-sided substrate in which another metal layer is bonded to the lower surface of the insulating substrate 11, or may be a multilayer substrate further having an inner layer having a predetermined pattern.

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

 基板は、絶縁基板と、前記絶縁基板の一面に形成された金属層と、前記金属層の表面に半田付けされた電子部品と、を備える。前記金属層は金属板から形成される。前記金属層の表面は、半田付け領域と、該半田付け領域の外周に位置する溝部とを有する。

Description

基板及び基板の製造方法
 本開示の技術は、絶縁基板と、絶縁基板の一面に形成された金属層と、金属層の表面に半田付けにより実装された電子部品とを備える基板及びその基板の製造方法に関する。
 絶縁基板の一面に形成された金属層の表面に対して、半田付けにより電子部品を実装する場合には、金属層の表面に半田が必要以上に濡れ広がることを抑制する必要がある。半田の濡れ広がりを抑制して所定の範囲内に半田を十分に留まらせることによって、半田付けの信頼性が高められる。例えば、半田付け領域の全体を他の部分より低い半田溜まり部とすることによって、半田付け領域からの半田の濡れ広がりを抑制する技術が知られている(特許文献1参照)。
特開2011-151368号公報
 ところで、金属層の表面に半田付けにより電子部品を実装する場合には、所定の開口部を有するマスクを金属層の表面に重ねてペースト状の半田を塗布した後、マスクを取り外すとともに塗布された半田上に電子部品を実装する方法が一般的に用いられている。しかしながら、半田付け領域の全体を半田溜まり部とした金属層に対して上記の実装方法を採用した場合には、マスクを取り外す際にマスクと共に半田が金属層から剥がれてしまうことがあった。
 本開示の目的は、マスクを用いて金属層の表面に半田を容易に塗布することができるとともに、半田の濡れ広がりを抑制することのできる基板及びその基板の製造方法を提供することにある。
 上記の目的を達成するための基板は、絶縁基板と、前記絶縁基板の一面に形成された金属層と、前記金属層の表面に半田付けされた電子部品と、を備える。前記金属層は金属板から形成される。前記金属層の表面は、半田付け領域と、該半田付け領域の外周に位置する溝部とを有する。
 上記の目的を達成するための基板の製造方法は、絶縁基板と、前記絶縁基板の一面に形成された金属板かならなる金属層と、前記金属層の表面に半田付けにより実装された電子部品とを備える基板の製造方法であって、前記金属層の表面に設定される塗布部にマスクを用いて半田を塗布することと、前記半田の上に前記電子部品を実装することと、有する。前記金属層として、前記塗布部の外側に溝部を形成した金属層を用いる。
実施形態の基板の上面図。 図1の2-2線断面図。 溝部の拡大図。 電子部品を実装する方法を示す図。
 以下、一実施形態の基板を図面にしたがって説明する。
 図1及び図2に示すように、基板10は、絶縁基板11と、絶縁基板11の上面において、所定の間隔をあけて接着された一対の金属層12と、一対の金属層12の上面に跨るように実装された電子部品13とを備えている。
 金属層12は、所定のパターン形状を有する金属板から形成されるものであり、金属板材料から所定のパターン形状をプレスにて打ち抜くこと(プレス加工)によって成形されている。金属層12を形成する金属板としては、銅板や、半田付け部分にメッキ処理したアルミニウム等の導電性金属材料からなる金属板を用いることができる。金属板の厚さは、好ましくは0.4~2.0mmであり、より好ましくは0.5~1.0mmである。なお、本実施形態では、厚さが0.5mmの銅板を用いている。
 図1及び図2に示すように、金属層12の上面には、上面視四角枠状をなす溝部20が設けられている。溝部20は環状、言い換えれば無端状をなしている。図3に示すように、溝部20は、底面21と、内周側の側面である第1側面22と、外周側の側面である第2側面23とを有する。底面21は、金属層12の上面と平行な平面であり、第1側面22及び第2側面23は底面21と金属層12の上面とを接続する傾斜面である。溝部20は、例えば、金属層12をプレス加工により形成する際に、溝部20に対応する突部を有する成形型を金属板の上面に押し付けて、金属板の上面を部分的に凹ませることによって形成することができる。
 図3に示すように、金属層12の上面と第1側面22とがなす角度α、及び金属層12の上面と第2側面23とがなす角度βは、それぞれ95~150度の範囲に設定することが好ましい。本実施形態においては、角度αを135度とするとともに、角度βを95度とし、角度αを角度βよりも大きくしている。また、本実施形態においては、溝部20の深さを0.12mmとしている。
 図1及び図2に示すように、金属層12の上面における溝部20で囲まれた領域には、半田30が塗布されている。換言すれば、金属層12に塗布された半田30の外周、即ち、金属層12の上面における半田が施された領域(半田付け領域)の外周に沿って、その半田付け領域を囲むように溝部20が設けられている。そして、半田30を介して金属層12の上面に半導体素子等の電子部品13が実装されている。
 次に、金属層12の上面に半田付けにより電子部品13を実装する方法を説明するとともに、本実施形態の基板10の作用を説明する。
 図4に示すように、絶縁基板11の上面に接着された金属層12の上面には、半田を塗布する塗布部R(図4における破線の内側の領域)が設定され、溝部20は塗布部Rを囲む無端状に形成されている。また、溝部20は塗布部Rの縁に沿って延びるとともに、塗布部Rの縁から間隔を有して配置されている。
 この金属層12の上面に、塗布部Rに対応する形状の開口部41を有するマスク40を重ねる(図4においては、マスク40を一点鎖線で示している。)。このとき、塗布部Rの外側に形成された溝部20はマスク40によって覆われる。そして、マスク40の開口部41から金属層12の上面にスキージ等を用いてペースト状の半田を塗布した後、金属層12からマスク40を取り外す。これにより、金属層12の塗布部Rの上面に半田が塗布される。
 本実施形態では、半田が塗布される部位である塗布部Rには溝部20が設けられていない。そのため、平らな塗布部Rの上面と半田との接着面が確保されて、金属層12に対して半田が十分に接着される。そのため、マスク40と共に半田が金属層12から剥がれることが抑制される。
 次に、金属層12の塗布部Rに塗布された半田の上に電子部品13を載置する。そして、基板10を加熱して半田を溶融させた後、冷却して半田を固化させる。これにより、金属層12の上面に半田付けにより電子部品13が実装される。
 半田が溶融する際には、塗布部Rの外側へと半田が濡れ広がるが、塗布部Rの周囲に設けられている溝部20によって、溝部20を越えて半田が濡れ広がることが抑制される。なお、半田に先立って流れるフラックスは溝部20を越えて金属層12上に広がり易いが、半田の濡れ広がりは溝部20にて規制されて、溝部20の内側に半田が留められる傾向がある。また、金属層12の上面において、塗布部Rと溝部20との間の領域内に塗布部Rから半田が濡れ広がった結果として、溝部20で囲まれた領域全体が半田付け領域になる。そして、その半田付け領域の外周に溝部20が位置することになる。
 本実施形態によれば、以下に記載する効果を得ることができる。
 (1)基板10は、絶縁基板11と、絶縁基板11の上面に形成された金属層12と、金属層12の上面に半田付けにより実装された電子部品13とを備えている。金属層12は金属板から形成されている。金属層12の上面における半田付け領域の外周に溝部20が設けられている。
 上記構成によれば、半田付け領域自体ではなく、半田付け領域の外周に溝部20が設けられているため、マスクを用いて金属層12の表面に半田を塗布する際に、金属層12の半田付け領域(塗布部R)と半田との接着面が確保されて、金属層12と半田とが十分に接着する。そのため、マスクを取り外す際に、塗布された半田が剥がれ難くなって、半田を容易に塗布することができる。
 また、半田を溶融すべく基板10を加熱した際に、溝部20を越えて半田が濡れ広がることが抑制されるとともに溝部20の内側に半田が留められる。これにより、金属層12と電子部品13との間に十分な量の半田が確保されて、半田付けの信頼性が向上する。
 (2)溝部20は、半田付け領域を囲む無端状に形成されている。言い換えれば、溝部20は、半田付け領域の周囲全体を連続的に延びている。上記構成によれば、半田付け領域から全方位へ向かう半田30の濡れ広がりを抑制することができる。
 (3)溝部20は、平らな底面21と、内周側(半田付け領域に近い方)の側面である第1側面22と、外周側(半田付け領域から遠い方)の側面である第2側面23とを有する。
 溝部20に対応する突部を有する成形型を金属層12に押し付けることによって溝部20を形成する場合には、成形型の繰り返し使用に伴って成形型の突部の先端に丸まりや欠け等の欠損が生じることがある。上記のように、溝部20を平らな底面21を有する形状とすると、成形型に設けられる突部の先端も同様に平らな形状となる。これにより、溝部20を形成する際に、成形型の突部の先端に作用する応力が緩和されて、突部の先端に欠損が生じ難くなる。
 (4)溝部20における金属層12の表面と第1側面22とがなす角度αを95~150度の範囲とするとともに、金属層12の表面と第2側面23とがなす角度βを95~150度の範囲としている。
 上記構成によれば、溝部20を越えた半田30の濡れ広がりを好適に抑制することができる。また、上記の角度に設定することにより、成形型を金属層12に押し付けて溝部20を形成する際に、金属層12と成形型と間の噛み込みが抑制されて金属層12からの成形型の型抜けが良好になる。
 (5)金属層12の表面と第1側面22とがなす角度αを、金属層12の表面と第2側面23とがなす角度βよりも大きくしている。上記構成によれば、外側に位置する第2側面23が、より垂直に近い斜面形状になることによって、溝部20を越えた半田30の濡れ広がりを更に好適に抑制することができる。
 なお、上記実施形態は以下のように変更してもよい。
 溝部20は無端状のもの、言い換えれば連続的なものに限定されず、有端状のもの、言い換えれば非連続的なものであってもよい。例えば、金属層12のパターン形状等に応じて、金属層12の上面には、多少の半田の濡れ広がりが許容される部位と、許容できない部位とが存在する場合がある。このような場合には、半田の濡れ広がりが許容できない部位と半田付け領域(塗布部R)との間にのみ溝部20を設けることも可能である。
 溝部20の断面形状は特に限定されるものではない。例えば、底面21を凹曲面状に形成してもよく、この場合にも上記(3)の効果を得ることができる。また、底面21のない断面逆三角形状の溝部20としてもよい。
 金属層12の表面と第1側面22とがなす角度αと、金属層12の表面と第2側面23とがなす角度βを同じにしてもよい。また、上記角度αを上記角度βよりも小さくしてもよい。
 上記実施形態では、離間して配置された二つの金属層12の上面に跨るようにして電子部品13が実装されていたが、一方の金属層12の上面のみに電子部品13が実装されていてもよい。
 基板10は絶縁基板11の下面に別の金属層を接着した両面基板であってもよいし、所定のパターンを有する内層を更に有する多層基板であってもよい。

Claims (5)

  1.  絶縁基板と、
     前記絶縁基板の一面に形成された金属層と、
     前記金属層の表面に半田付けされた電子部品と、を備え、
     前記金属層は金属板から形成され、
     前記金属層の表面は、半田付け領域と、該半田付け領域の外周に位置する溝部とを有する基板。
  2.  前記溝部は、前記半田付け領域を囲む無端状に形成されている請求項1に記載の基板。
  3.  前記溝部は、底面と、第1側面と、第2側面とを有し、前記第1側面は前記半田付け領域と前記第2側面との間に位置し、
     前記金属層の表面と前記第1側面とがなす角度が95~150度の範囲であり、
     前記金属層の表面と前記第2側面とがなす角度が95~150度の範囲である請求項2に記載の基板。
  4.  前記金属層の表面と前記第1側面とがなす角度は、前記金属層の表面と前記第2側面とがなす角度よりも大きい請求項3に記載の基板。
  5.  絶縁基板と、前記絶縁基板の一面に形成された金属板からなる金属層と、前記金属層の表面に半田付けにより実装された電子部品とを備える基板の製造方法であって、
     前記金属層の表面に設定される塗布部にマスクを用いて半田を塗布することと、
     前記半田の上に前記電子部品を実装することと、有し、
     前記金属層として、前記塗布部の外側に溝部を形成した金属層を用いる、基板の製造方法。
PCT/JP2013/078704 2012-11-01 2013-10-23 基板及び基板の製造方法 WO2014069305A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN201380056539.2A CN104756614A (zh) 2012-11-01 2013-10-23 基板以及基板的制造方法
EP13851622.4A EP2916630A4 (en) 2012-11-01 2013-10-23 SUBSTRATE AND METHOD FOR THE PRODUCTION OF THE SUBSTRATE
BR112015009213A BR112015009213A2 (pt) 2012-11-01 2013-10-23 substrato e método para a produção de substrato
US14/437,059 US9655240B2 (en) 2012-11-01 2013-10-23 Substrate
KR1020157013270A KR20150064224A (ko) 2012-11-01 2013-10-23 기판

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012-241898 2012-11-01
JP2012241898A JP5516696B2 (ja) 2012-11-01 2012-11-01 基板

Publications (1)

Publication Number Publication Date
WO2014069305A1 true WO2014069305A1 (ja) 2014-05-08

Family

ID=50627214

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2013/078704 WO2014069305A1 (ja) 2012-11-01 2013-10-23 基板及び基板の製造方法

Country Status (7)

Country Link
US (1) US9655240B2 (ja)
EP (1) EP2916630A4 (ja)
JP (1) JP5516696B2 (ja)
KR (1) KR20150064224A (ja)
CN (1) CN104756614A (ja)
BR (1) BR112015009213A2 (ja)
WO (1) WO2014069305A1 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6713334B2 (ja) * 2016-04-21 2020-06-24 スタンレー電気株式会社 基板構造
US10879211B2 (en) 2016-06-30 2020-12-29 R.S.M. Electron Power, Inc. Method of joining a surface-mount component to a substrate with solder that has been temporarily secured
FR3056073B1 (fr) * 2016-09-09 2018-08-17 Valeo Systemes De Controle Moteur Unite electronique, convertisseur de tension la comprenant et equipement electrique comprenant un tel convertisseur de tension
WO2020003908A1 (ja) * 2018-06-29 2020-01-02 日本電産株式会社 配線基板および電子部品実装基板
WO2020003907A1 (ja) * 2018-06-29 2020-01-02 日本電産株式会社 配線基板および電子部品実装基板
CN110094624B (zh) * 2019-05-17 2020-12-18 北京深醒科技有限公司 一种门禁机安装容错机构

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06112634A (ja) * 1992-09-29 1994-04-22 Taiyo Yuden Co Ltd 厚膜回路基板の製造方法
JPH07254775A (ja) * 1994-03-16 1995-10-03 Sankyo Seiki Mfg Co Ltd 回路基板
JPH07263849A (ja) * 1994-03-24 1995-10-13 Mitsubishi Electric Corp 印刷回路基板
JP2003110205A (ja) * 2001-09-28 2003-04-11 Dowa Mining Co Ltd 金属−セラミックス回路基板
JP2004140226A (ja) * 2002-10-18 2004-05-13 Yazaki Corp チップ部品のバスバーへの接合構造
JP2006114587A (ja) * 2004-10-13 2006-04-27 Tohoku Ricoh Co Ltd プリント配線基板
JP2011151368A (ja) 2009-12-24 2011-08-04 Furukawa Electric Co Ltd:The 射出成形基板と実装部品との取付構造

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0258368U (ja) * 1988-10-19 1990-04-26
US6246587B1 (en) * 1998-12-03 2001-06-12 Intermedics Inc. Surface mounted device with grooves on a termination lead and methods of assembly
US6448507B1 (en) * 2000-06-28 2002-09-10 Advanced Micro Devices, Inc. Solder mask for controlling resin bleed
JP2003124416A (ja) * 2001-10-16 2003-04-25 Yazaki Corp チップ部品のバスバーへの接合構造
JP2004006454A (ja) 2002-05-31 2004-01-08 Nippon Mektron Ltd 回路基板のランド構造
JP2008277340A (ja) 2007-04-25 2008-11-13 Denso Corp 配線金属板
JP5153574B2 (ja) * 2007-11-05 2013-02-27 パナソニック株式会社 実装構造体
JP5482791B2 (ja) * 2009-07-27 2014-05-07 株式会社豊田自動織機 配線基板および配線基板の製造方法
JP5641230B2 (ja) 2011-01-28 2014-12-17 株式会社豊田自動織機 電子機器

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06112634A (ja) * 1992-09-29 1994-04-22 Taiyo Yuden Co Ltd 厚膜回路基板の製造方法
JPH07254775A (ja) * 1994-03-16 1995-10-03 Sankyo Seiki Mfg Co Ltd 回路基板
JPH07263849A (ja) * 1994-03-24 1995-10-13 Mitsubishi Electric Corp 印刷回路基板
JP2003110205A (ja) * 2001-09-28 2003-04-11 Dowa Mining Co Ltd 金属−セラミックス回路基板
JP2004140226A (ja) * 2002-10-18 2004-05-13 Yazaki Corp チップ部品のバスバーへの接合構造
JP2006114587A (ja) * 2004-10-13 2006-04-27 Tohoku Ricoh Co Ltd プリント配線基板
JP2011151368A (ja) 2009-12-24 2011-08-04 Furukawa Electric Co Ltd:The 射出成形基板と実装部品との取付構造

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2916630A4

Also Published As

Publication number Publication date
JP5516696B2 (ja) 2014-06-11
EP2916630A1 (en) 2015-09-09
US20150289371A1 (en) 2015-10-08
CN104756614A (zh) 2015-07-01
EP2916630A4 (en) 2016-07-13
JP2014093360A (ja) 2014-05-19
KR20150064224A (ko) 2015-06-10
US9655240B2 (en) 2017-05-16
BR112015009213A2 (pt) 2017-07-04

Similar Documents

Publication Publication Date Title
WO2014069305A1 (ja) 基板及び基板の製造方法
JP5533619B2 (ja) 半導体装置
TWI446844B (zh) 印刷電路板及印刷電路板之製造方法
GB2603403A (en) Prevention of bridging between solder joints
US7807932B2 (en) Printed circuit board and method for manufacturing the same
US20180332699A1 (en) Printed circuit board
JP5889160B2 (ja) 電子機器の製造方法
TWI387420B (zh) 切邊定位型銲接結構及防止引腳偏移的方法
KR20170041161A (ko) 회로기판 및 제조방법
JP4585147B2 (ja) 半導体装置
JP6488669B2 (ja) 基板
JP6091824B2 (ja) 回路基板の表面実装構造、該表面実装構造を備えたプリント基板
JP2000031371A (ja) リードフレームおよびそれを用いて構成された半導体装置
TWI759083B (zh) 金屬電路圖案及金屬電路圖案之製造方法
WO2020261969A1 (ja) 電子モジュール
TW200715432A (en) Soldering process for a substrate
JP2018014464A (ja) 位置決め治具、半導体装置の製造方法
TW200608864A (en) Heat dissipating circuit board and method for fabricating the same
TW201720258A (zh) 焊墊及焊墊製作方法
JP2013004570A (ja) はんだ塗布方法
JP2013016765A (ja) はんだ吸い取りシート
JP5651430B2 (ja) 電子部品の実装方法
JP4581722B2 (ja) 熱伝導性基板の製造方法
US8309859B2 (en) Method of manufacturing a substrate, substrate, device provided with a substrate, and determining method
TW200614476A (en) Package substrate with nsmd pads

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 13851622

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 14437059

Country of ref document: US

WWE Wipo information: entry into national phase

Ref document number: 2013851622

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: DE

REG Reference to national code

Ref country code: BR

Ref legal event code: B01A

Ref document number: 112015009213

Country of ref document: BR

ENP Entry into the national phase

Ref document number: 20157013270

Country of ref document: KR

Kind code of ref document: A

ENP Entry into the national phase

Ref document number: 112015009213

Country of ref document: BR

Kind code of ref document: A2

Effective date: 20150424