WO2011036935A1 - Contacteur et dispositif de connexion électrique - Google Patents

Contacteur et dispositif de connexion électrique Download PDF

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Publication number
WO2011036935A1
WO2011036935A1 PCT/JP2010/062251 JP2010062251W WO2011036935A1 WO 2011036935 A1 WO2011036935 A1 WO 2011036935A1 JP 2010062251 W JP2010062251 W JP 2010062251W WO 2011036935 A1 WO2011036935 A1 WO 2011036935A1
Authority
WO
WIPO (PCT)
Prior art keywords
contact
plunger
plungers
coil spring
contactor
Prior art date
Application number
PCT/JP2010/062251
Other languages
English (en)
Japanese (ja)
Inventor
研 木村
勝之 柿崎
衛知 大里
昌志 長谷川
Original Assignee
株式会社日本マイクロニクス
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日本マイクロニクス filed Critical 株式会社日本マイクロニクス
Priority to EP10818612.3A priority Critical patent/EP2485335B1/fr
Priority to US13/384,771 priority patent/US8460010B2/en
Priority to JP2011532930A priority patent/JP5568563B2/ja
Priority to CN201080043076.2A priority patent/CN102549848B/zh
Priority to SG2012005526A priority patent/SG177757A1/en
Priority to KR1020117026877A priority patent/KR101310672B1/ko
Priority to TW099125090A priority patent/TWI415341B/zh
Publication of WO2011036935A1 publication Critical patent/WO2011036935A1/fr

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2464—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point
    • H01R13/2492—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point multiple contact points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Definitions

  • the present invention relates to a contactor and an electrical connection device that are in contact with electrodes provided on a wiring board, a semiconductor integrated circuit, or the like.
  • a contactor for electrically connecting electrical circuits of wiring boards arranged opposite to each other is generally known.
  • Examples of such contacts include those described in Patent Document 1 and Patent Document 2, for example.
  • the contact 1 of Patent Document 1 includes two contact pins 2 having the same shape and a coil spring 3.
  • the contact pin 2 is mainly composed of a locking claw 4, a locking hole 5, a flange portion 6, and a pin tip portion 2A.
  • Two locking claws 4 are provided opposite to each other and supported by a flexible support bar 4A. Thereby, the two latching claws 4 come close to and away from each other.
  • the locking hole 5 is a hole into which the locking claw 4 is fitted, and is formed in a rectangular shape according to the width of the locking claw 4.
  • the flange portion 6 is a portion with which the coil spring 3 is abutted.
  • both ends of the coil spring 3 come into contact with the flange portions 6 and the contact 1 is assembled.
  • Both ends of the contact 1 assembled in a state in which the two contact pins 2 are fitted to each other are used as pin tip portions 2A that are in contact with and electrically connected to electrodes or the like.
  • Patent Document 2 is composed of a plunger 8 and a spring 9 as shown in FIG.
  • the plunger 8 is formed in a long and narrow plate shape, and a wide portion 8A for receiving the spring 9 is provided on an upper portion thereof, and a terminal portion 8B that is in contact with the electrode is formed on the upper portion of the wide portion 8A.
  • a mandrel portion 8C that is inserted into the spring 9 so as to be movable up and down is formed at the lower portion of the wide portion 8A.
  • the spring 9 is formed to have an inner diameter into which the mandrel portion 8C can be inserted up and down. The lower end of the spring 9 is narrowed down and brought into contact with an electrode or the like.
  • FIG. 1 In the socket for electrical components of Patent Document 3, a contact member that contacts a terminal of the electrical component, a board conduction member that is formed of a conductive plate material and is connected to a printed circuit board, and the contact member and the board conduction member A coil spring that is disposed between the two and electrically connects the two.
  • the contact member and the substrate conducting member are not in contact with each other, and are connected by a coil spring.
  • the contact claw 4 of one contact pin 2 is engaged with the engagement hole 5 of the other contact pin 2 and is engaged with the expansion and contraction of the contact 1.
  • the locking claw 4 and the support bar portion 4A may be damaged due to wear or the like, resulting in lack of durability.
  • each contact pin 2 has only a locking claw 4 fitted in the other locking hole 5 and has a small contact area with each other, so that the coil spring 3 is mainly responsible for electrical connection. .
  • the coil spring 3 is connected to the contact pin. It is difficult to make the inner diameter enough to tighten 2.
  • the coil spring 3 is a compression spring and there are few contact points with the contact pin 2, the adhesiveness between each contact pin 2 and the coil spring 3 becomes weak. For this reason, the contact portion between the flange portion 6 of each contact pin 2 and the coil spring 3 becomes a central passage through which electricity flows.
  • the contact area is small, and wear, corrosion, etc. are likely to occur, and the electrical contact property is poor. . For this reason, there exists a problem that it is easy to raise
  • the plunger 8 and the spring 9 are in contact with each other.
  • the electrical contact is poor due to the failure.
  • the plunger 8 and the spring 9 are electrically connected mainly at the contact point between the wide portion 8 ⁇ / b> A of the plunger 8 and the upper end portion of the spring 9.
  • the contact area is narrow and contact failure is liable to occur due to wear, corrosion, etc., the electrical contact property is poor and the durability is insufficient.
  • the present invention has been made in view of the above problems, and provides a low-cost contact having improved electrical contact and improved durability, and an electrical connection device using the contact. With the goal.
  • the contact according to the present invention is made to solve the above-described problem, and includes a plate-like first plunger that contacts one member and a plate-like second plunger, A second plunger that contacts the other member in a state of being overlapped with the first plunger and cooperates with the first plunger to electrically connect the one member and the other member; A member for coupling the first plunger and the second plunger, covering the outer periphery of the coupling portion of the first plunger and the second plunger, and on each spring receiving portion of each plunger And a compression coil spring that abuts and supports each plunger so as to be relatively slidable.
  • the electrical connection device is an electrical connection device that performs a test by contacting an electrode of an object to be inspected.
  • the electrical connection device is disposed at a position corresponding to each electrode of the object to be inspected and contacts the electrode. And the above-described contact was used as the contact.
  • the first plunger coupling portion and the second plunger coupling portion overlap each other and are electrically connected to each other.
  • the plunger and the second plunger cooperate to electrically connect the one member and the other member.
  • FIG. 8 is a cross-sectional view (a cross-sectional view taken along line AA in FIG. 7) showing the electrical connection device according to the first embodiment of the present invention.
  • FIG. 8 is a cross-sectional view (a cross-sectional view taken along line BB in FIG. 7) showing the electrical connection device according to the first embodiment of the present invention.
  • It is a top view which shows the electrical connection apparatus which concerns on 1st Embodiment of this invention.
  • FIG. 2 is a cross-sectional view taken along line DD in FIG. 1. It is a front view which shows the 1st plunger of the contactor which concerns on 1st Embodiment of this invention. It is a front view which shows the 2nd plunger of the contactor which concerns on 1st Embodiment of this invention. It is a front view which shows the compression coil spring of the contactor which concerns on 1st Embodiment of this invention. It is a perspective view which shows the state which the protrusion of the contact piece of the contactor which concerns on 1st Embodiment of this invention bites into a bump electrode.
  • FIG. 19 is a cross-sectional view taken along line EE in FIG. 18. It is a front view which shows the contact which concerns on 3rd Embodiment of this invention. It is a side view which shows the contactor which concerns on 3rd Embodiment of this invention. It is a front view which shows the 2nd plunger of the contactor which concerns on 3rd Embodiment of this invention.
  • the electrical connection device 11 is a device used for an energization test of the device under test 12 or the like.
  • the device under test 12 is a semiconductor device such as an integrated circuit.
  • the inspected object 12 is provided with a plurality of bump electrodes 13 (see FIG. 8) on the lower surface thereof.
  • the bump electrode 13 is an electrode provided on the lower surface of the inspection object 12.
  • Each bump electrode 13 is provided on the lower surface of the object to be inspected 12 in a single row, a plurality of rows, a matrix, or other arrangement.
  • the electrical connection device 11 mainly includes a wiring board 15, a lower housing 16, an upper housing 17, a frame 18, a guide plate 19, and a contact 20 (see FIG. 8). .
  • the wiring board 15 is a plate-like wiring board that supports the lower housing 16, the upper housing 17, and the like.
  • the wiring of this wiring board 15 is connected to the wiring of a tester body (not shown) for testing the object to be inspected.
  • the wiring board 15 is a member constituting an electrode on the tester main body side, and the lower end portion of the contact 20 comes into contact with a contact pad 22 provided on the upper surface of the wiring board 15 and is electrically connected.
  • the lower housing 16 is a member for supporting the contact 20 in a state of being combined with the upper housing 17.
  • the lower housing 16 is provided with a first support hole 16 ⁇ / b> A into which the lower end of the contact 20 is inserted with a diameter slightly larger than the outer diameter of the contact 20.
  • the first support holes 16 ⁇ / b> A are provided at positions corresponding to the bump electrodes 13 on the lower surface of the device under test 12.
  • a lower receiving portion 16B that receives and supports the contact 20 is formed in the first support hole 16A.
  • the lower receiving portion 16B is formed by reducing the inner diameter of the lower end portion of the first support hole 16A.
  • a lower support shoulder 73 of the contact 20 to be described later is caught on the lower receiving portion 16B, and the inner diameter of the lower receiving portion 16B is set so that the lower end portion of the contact 20 penetrates. Since the lower support shoulder 73 of the contact 20 is caught on the lower receiving portion 16B, the contact 20 is supported by the lower receiving portion 16B.
  • the lower housing 16 is overlaid on the upper side of the wiring board 15.
  • contact pads 22 connected to the tester body by wiring are provided at positions corresponding to the first support holes 16A.
  • Each contact pad 22 is pressed and electrically contacted with the lower end portion of the contact 20 inserted into the first support hole 16A.
  • the lower housing 16 is provided with a pin head fitting hole 23 (see FIG. 5).
  • the pin head fitting hole 23 is a hole for fitting a head 39 of a guide pin 37 described later.
  • the inner diameter of the pin head fitting hole 23 is set to be approximately the same as the outer diameter of the head 39 of the guide pin 37 so that the head 39 of the guide pin 37 is fitted without play. .
  • the upper housing 17 is a member for supporting the entire contact 20 in cooperation with the lower housing 16.
  • the upper housing 17 is superposed on the lower housing 16, and the lower housing 16 and the upper housing 17 support the contact 20 in a state in which the contact 20 can freely expand and contract.
  • the upper housing 17 is provided with a second support hole 17A at a position corresponding to the first support hole 16A of the lower housing 16.
  • the second support hole 17A is formed to have the same inner diameter as the upper opening of the first support hole 16A (a diameter slightly larger than the outer diameter of the contactor 20), and the contactor 20 is slidably accommodated therein and supported. To do.
  • the second support holes 17A are provided at positions corresponding to the respective bump electrodes 13 provided on the lower surface of the device under test 12 so that the upper ends of the respective contacts 20 are in electrical contact with the respective bump electrodes 13. It has become.
  • an upper receiving portion 17B that supports the contact 20 from above is formed in the second support hole 17A.
  • the upper receiving portion 17B is formed by reducing the inner diameter of the upper end portion of the second support hole 17A.
  • An upper support shoulder 79 of the contact 20 to be described later is caught on the upper receiver 17B, and the upper end of the contact 20 penetrates, so that the contact 20 is supported by the upper receiver 17B.
  • An inner diameter of 17B is set.
  • the first support hole 16A and the second support hole 17A constitute a contact support hole 27 that receives and supports the entire contact 20.
  • the contact 20 In a state where the contact 20 is received in the contact support hole 27, the contact 20 is in a preloaded state (a contracted state), and a lower end portion of the contact 20 is provided on the upper surface of the wiring board 15. The contact pad 22 is pressed.
  • the upper housing 17 is provided with a pin shaft portion fitting hole 28 (see FIG. 5).
  • the pin shaft portion fitting hole 28 is a hole for fitting a shaft portion 40 of a guide pin 37 described later.
  • the inner diameter of the pin shaft portion fitting hole 28 is set to be approximately the same as the outer diameter of the shaft portion 40 of the guide pin 37 so that the shaft portion 40 of the guide pin 37 is fitted without play. .
  • the frame 18 is a member for fixing and supporting the wiring board 15, the lower housing 16 and the upper housing 17 integrally, and supporting the guide plate 19 so as to be movable up and down.
  • the frame 18 includes an outer frame portion 31, a fixing flange portion 32, and a vertically moving support flange portion 33.
  • the outer frame portion 31 is formed in a rectangular frame shape so as to surround the peripheral portions of the lower housing 16, the upper housing 17 and the guide plate 19.
  • Positioning pins or positioning holes are provided on the lower side surface of the outer frame portion 31, and positioning pins or positioning holes on the outer frame portion 31 side are provided on the upper side surface of the wiring board 15. Are provided with positioning holes or positioning pins (both not shown).
  • the positioning pin or positioning hole on the lower surface of the outer frame portion 31 fits into the positioning hole or positioning pin on the upper surface of the wiring substrate 15 so that the outer frame portion 31 and the wiring substrate 15 are accurately positioned. It is positioned and supported.
  • Fixing screws 35 are attached to the four corners of the outer frame portion 31. The fixing screws 35 are screwed into screw holes (not shown) of the wiring board 15 through through holes (not shown) at the four corners of the outer frame part 31, and the outer frame part 31 and the wiring board 15 are connected to each other. It is fixed.
  • Each fixing flange portion 32 is provided opposite to each other on the inner side surfaces of the opposing sides (frames) of the opening of the rectangular outer frame portion 31.
  • Each fixing flange portion 32 is formed in a substantially semicircular shape extending horizontally inward from each other.
  • the height of the lower surface of each fixing flange portion 32 (height from the wiring board 15) is set to be approximately the same value as the height of the lower housing 16 and the upper housing 17 overlapped.
  • the lower housing 16 and the upper housing 17 stacked on the wiring board 15 are supported by being sandwiched between the fixing flange portions 32 and the wiring board 15.
  • the lower surface of the lower housing becomes the same as the lower surface of the outer frame portion 31.
  • a pin hole 38 into which the guide pin 37 is fitted is formed at the center of each fixing flange portion 32.
  • the inner diameter of the pin hole 38 is set to be approximately the same as the outer diameter of the shaft portion 40 of the guide pin 37.
  • the guide pin 37 is composed of a head portion 39 and a shaft portion 40.
  • the head 39 is formed in a disk shape having an outer diameter substantially the same as the inner diameter of the pin head fitting hole 23 of the lower housing 16.
  • the shaft portion 40 is formed in a circular rod shape having an outer diameter substantially the same as the inner diameter of the pin shaft portion fitting hole 28 of the upper housing 17 and the pin hole 38 of the fixing flange portion 32.
  • the pin head fitting hole 23 of the lower housing 16, the pin shaft part fitting hole 28 of the upper housing 17, and the pin hole 38 of each fixing flange part 32 can pass the guide pin 37 therethrough. Thus, they are provided on the same axis.
  • the head 39 of the guide pin 37 is fitted into the pin head fitting hole 23 of the lower housing 16, and the shaft portion 40 is connected to the pin shaft fitting hole 28 and the fixing flange portion 32 of the upper housing 17.
  • the lower housing 16, the upper housing 17 and the frame 18 are positioned by fitting into the pin holes 38. Further, the lower housing 16 and the upper housing 17 are sandwiched between the lower surface of each fixing flange portion 32 of the frame 18 and the wiring board 15 from above and below and supported in the opening of the frame 18, so that these wiring boards 15,
  • the side housing 16, the upper housing 17, and the frame 18 are accurately positioned and fixed integrally with each other.
  • the vertically moving support flange portion 33 is a portion for supporting the guide plate 19 in the opening of the frame 18 so as to be vertically movable.
  • the vertically moving support flange portions 33 are respectively formed at the four corners of the opening portion of the rectangular frame-shaped frame 18.
  • Each vertical movement support flange portion 33 includes a plate portion 42, a guide screw hole 43, and a spring hole 44.
  • the plate portion 42 is a plate material that is slanted over the four corners of the outer frame portion 31 of the frame 18.
  • the height of the lower surface of the plate portion 42 is set to be the same height as the lower surface of the fixing flange portion 32.
  • the height of the upper surface of the plate portion 42 is such that the upper surface of the plate portion 42 and the lower surface of the flange portion 54 of the guide plate 19 are in contact with each other, so that the bump electrode 13 of the device under test 12 and the contact 20 It is set so that the upper end is in optimum contact. Specifically, the upper surface of the plate portion 42 is brought into contact with the bump electrode 13 of the device under test 12 and the upper end of the contact 20 so that the contact 20 is compressed (the state shown in FIG. 9). The height of the side is set.
  • the plate portion 42 is provided with a guide screw hole 43 and a spring hole 44.
  • the guide screw hole 43 is a screw hole for screwing the guide screw 46.
  • One guide screw hole 43 is provided at the center of each plate portion 42 (see FIG. 7).
  • the spring hole 44 is a hole for supporting the spring 47. Two spring holes 44 are provided on both sides of each guide screw hole 43.
  • the guide screw 46 is a screw for positioning the guide plate 19 in the opening of the frame 18 and allowing the guide plate 19 to move up and down.
  • the guide screw 46 includes a head portion 48, a guide portion 49, and a screw rod portion 50.
  • the head 48 is a portion that suppresses the guide plate 19 and prevents it from falling off.
  • a minus groove 51 into which a minus driver is fitted is formed on the upper side surface of the head 48.
  • the guide portion 49 is a portion that guides the vertical movement of the guide plate 19.
  • the guide portion 49 is provided between the head portion 48 and the screw rod portion 50 and is fitted into the guide hole 59 of the guide plate 19 to guide the vertical movement of the guide plate 19.
  • the length (height) of the guide portion 49 is such that the lower surface of the head 48 is in contact with and supported by the guide plate 19 (the guide plate 19 is pushed up by the spring 47).
  • the upper end portion is set so as to be received by the reduction portion 57 of the guide plate 19 (so as to be in the state of FIG. 8).
  • the screw rod portion 50 is a portion for fixing the guide screw 46 to the plate portion 42.
  • the screw rod portion 50 is screwed into the guide screw hole 43 of the plate portion 42 to fix the guide screw 46 to the plate portion 42.
  • the spring 47 is a member for elastically supporting the guide plate 19.
  • the spring 47 is mounted in the spring hole 44 of the plate portion 42 and is in contact with the back surface of the flange portion 54 of the guide plate 19. Accordingly, a total of eight springs 47 urge the guide plate 19 supported by the guide portions 49 of the four guide screws 46 so as to be vertically movable from below. As a result, the flange portion 54 of the guide plate 19 is pushed upward until it contacts the lower surface of the head 48 of the guide screw 46, and is in a standby state before contact.
  • the guide plate 19 positions and supports the device under test 12 when mounting the device under test 12 to the electrical connection device 11, and also supports the bump electrodes 13 and the contacts 20 of the device under test 12. It is a member for alignment.
  • the guide plate 19 includes a receiving recess 53 and a flange portion 54.
  • the receiving recess 53 is a part that receives and supports the object to be inspected 12.
  • the receiving recess 53 is formed in a substantially square dish shape.
  • the inner bottom portion of the receiving recess 53 is formed in a quadrangular shape, and its size is set slightly larger than that of the device under test 12.
  • the inner bottom portion of the receiving recess 53 is also formed in a square shape.
  • the inner bottom portion of the receiving recess 53 is also inspected.
  • the shape matches the body 12.
  • the inspection object 12 is positioned in a state where the inspection object 12 is mounted on the inner bottom portion of the receiving recess 53.
  • a large number of guide holes 56 are provided in the bottom plate portion 55 of the receiving recess 53.
  • the guide hole 56 is an opening for guiding and receiving each bump electrode 13 of the device under test 12.
  • Each guide hole 56 is formed slightly larger than the bump electrode 13 so that the bump electrode 13 can be easily received. That is, by receiving the inspection object 12 in the receiving recess 53, each bump electrode 13 of the inspection object 12 can be easily fitted into each guide hole 56 from above.
  • a reduced portion 57 that receives the upper end portion of the contact 20 without passing through the bump electrode 13 is formed at the lower end portion of the guide hole 56. This reduction part 57 allows the contact 20 to contact the bump electrode 13 by accepting and penetrating the upper end of the contact 20.
  • An inclined surface 53B is formed below the upper opening 53A of the receiving recess 53.
  • the inclined surface 53 ⁇ / b> B is a surface for guiding the inspection object 12 and guiding it to the bottom of the receiving recess 53.
  • the flange portion 54 is formed at a position corresponding to the four-sided support flange portion 33 of the frame 18 at the four corners of the receiving recess 53.
  • Each flange portion 54 is provided with a counterbore portion 58 with which the head portion 48 of the guide screw 46 abuts.
  • the counterbore portion 58 is provided with a guide hole 59 that fits in the guide portion 49 of the guide screw 46 so as to be movable up and down. Accordingly, the guide hole 59 of the flange portion 54 is fitted to the guide portion 49 of the guide screw 46 so as to be movable up and down, and the guide plate 19 is urged upward by the spring 47.
  • the inspection object 12 is mounted in the receiving recess 53 and pushed downward, whereby the guide plate 19 is pushed down, and the bump electrode 13 of the inspection object 12 and the upper end of the contact 20 come into contact with each other for inspection. Is to be done.
  • the contact 20 is composed of a first plunger 62, two second plungers 63, and a compression coil spring 64, as shown in FIGS.
  • the first plunger 62 is a plate-like plunger for making contact with an electrode or the like (here, the contact pad 22 of the wiring board 15) as one member, and is cut or pressed by a conductive material. Alternatively, it is manufactured by plating using a photolithographic technique.
  • One first plunger 62 is provided.
  • the 1st plunger 62 is comprised from the connection part 66, the spring receiving part 67, and the contact piece 68 (refer FIG. 13).
  • the length of the first plunger 62 is substantially equal to the height dimension of the upper surface of the upper housing 17 from the contact pad 22 of the wiring board 15 when assembled to the electrical connection device 11.
  • the coupling portion 66 is directly overlapped when the first plunger 62 and the two second plungers 63 are coupled to each other, so that the first plunger 62 and the second plunger 63 are in electrical contact with each other. It is a part of.
  • the coupling portion 66 includes a coupling rod portion 69, a tip insertion portion 70, and a retaining portion 71.
  • the coupling portion 66 is formed in a long plate shape, and can be stably brought into contact with the second plunger 63 in as wide an area as possible.
  • the connecting rod portion 69 is a portion that is supported by a compression coil spring 64 described later, and is set to have a slightly longer dimension than the compression coil spring 64.
  • the width dimension of the connecting rod portion 69 is set to be approximately the same as the inner diameter of the contact small diameter portion 84 of the compression coil spring 64. That is, the four corners of the cross-sectional shape of the connecting rod portion 69 are in contact with the inner diameter portion of the contact small diameter portion 84 of the compression coil spring 64, and the inner diameter portion of the contact small diameter portion 84 of the compression coil spring 64 is circumscribed by the connection rod portion 69. It is assembled in a state of being tightened slightly as a circle (see FIGS. 11 and 12).
  • the tip insertion portion 70 is a portion for guiding the insertion of the coupling rod portion 69 into the compression coil spring 64 during assembly.
  • the distal end insertion portion 70 is formed at the distal end portion (upper end portion in FIG. 13) of the connecting rod portion 69.
  • the tip insertion portion 70 has a gently curved inclined surface so as not to obstruct the insertion direction, and can be easily inserted into the compression coil spring 64.
  • the thickness dimension of the coupling portion 66 is such that when assembled, the distal end insertion portion 70 is positioned between contact pieces 77 of two second plungers 63 described later, and the interval between the projections 77A of the contact pieces 77 is stabilized. Is set to let
  • the stopper portion 71 is a portion for preventing the tip insertion portion 70 from coming off the compression coil spring 64 when the tip insertion portion 70 is inserted into the compression coil spring 64.
  • the retaining portion 71 is provided at the proximal end portion of the distal end insertion portion 70 (the boundary portion between the coupling rod portion 69 and the distal end insertion portion 70). That is, the retaining portion 71 is formed at the end opposite to the spring receiving portion 67.
  • the retaining portion 71 is formed by projecting the proximal end portion of the distal end insertion portion 70 on both sides. The width of the retaining portion 71 protruding on both sides is set so as to protrude slightly from the inner diameter of the contact small diameter portion 84 at the end of the compression coil spring 64 (see FIG. 11).
  • the spring receiving portion 67 is a portion for receiving the compression coil spring 64.
  • the spring receiving portion 67 is a step provided at a boundary portion between the coupling portion 66 and the contact piece 68.
  • the contact piece 68 is formed wider than the width of the coupling portion 66, and a step portion at the boundary thereof is a spring receiving portion 67.
  • the first plunger 62 is elastically supported by the contactor 22 by the compression coil spring 64 by the contact of the small diameter portion 84 at the end of the compression coil spring 64 with the spring receiving portion 67. .
  • the contact piece 68 is a member for contacting and electrically connecting to one member (contact pad 22 of the wiring board 15).
  • the contact piece 68 is provided integrally with the base end side (the lower side in FIG. 13) of the coupling portion 66.
  • the contact piece 68 has a substantially rectangular plate-like portion whose width is slightly smaller than the inner diameters of the first support hole 16A of the lower housing 16 and the second support hole 17A of the upper housing 17, followed by the lower housing. 16 is formed with a tip having a smaller width than the upper part of the rectangular plate penetrating the lower receiving portion 16B.
  • the front end portion of the contact piece 68 is formed in a curved shape so as to be in stable contact with the contact pad 22 of the flat surface wiring board 15.
  • a lower support shoulder 73 is formed at the boundary between the upper part of the rectangular plate and the tip part.
  • the lower support shoulder 73 is caught by the lower receiving portion 16B of the lower housing 16 so that the contact piece 68 does not fall out of the first support hole 16A.
  • the end portion of the contact piece 68 protrudes downward from the first support hole 16A. It has become.
  • the second plunger 63 cooperates with the first plunger 62 to electrically connect between one member (the contact pad 22 of the wiring board 15) and the other member (the bump electrode 13).
  • the plunger is in the shape of a conductive material and is manufactured by cutting, pressing or the like using a conductive material or by plating using a photolithographic technique.
  • the 2nd plunger 63 is comprised from the coupling
  • Two second plungers 63 are provided and assembled by a compression coil spring 64 with the first plunger 62 interposed therebetween.
  • the coupling portion 66 of the first plunger 62 is sandwiched with the coupling portions 75 of the two second plungers 63 facing each other.
  • the two second plungers 63 have the same shape. Good contact with the contacting member (bump electrode 13) can be achieved by configuring the same shaped plungers to face each other. Each second plunger 63 slides independently of each other with the first plunger 62 interposed therebetween. This is because when the shape of the contacting member (bump electrode 13) is non-uniform and when the contacting member (bump electrode 13) has a ball shape, the electrical contact is surely performed following the shape. It is to make it.
  • the coupling portion 75 is a portion for overlapping and electrically contacting the coupling portion 66 of the first plunger 62 when the first plunger 62 and the second plunger 63 are coupled to each other. That is, the coupling portion 66 of the first plunger 62 is overlapped so that the coupling portions 75 of the two second plungers 63 are sandwiched from both sides, and the first plunger 62 and the second plunger 63 are electrically connected. It comes to contact.
  • the coupling portion 75 includes a coupling rod portion 80, a tip insertion portion 81, and a retaining portion 82.
  • the coupling portion 75 is formed in a long plate shape, and can be brought into contact with the coupling portion 66 of the first plunger 62 over a wide area.
  • the connecting rod portion 80 is a portion that overlaps the connecting portion 66 of the first plunger 62 and is supported by the compression coil spring 64, and is set to have a slightly longer dimension than the compression coil spring 64.
  • the cross-sectional dimensions (width and thickness dimensions) of the connecting rod 80 are such that one connecting rod 69 and the two connecting rods 80 sandwich the connecting rod 69 of the first plunger 62 from both sides.
  • the eight corner portions (see FIG. 11) of the cross-sectional shape of the two connecting rod portions 80 sandwiched between are in a state in which they are in contact with the inner diameter portion of the contact small diameter portion 84 of the compression coil spring 64. That is, the inner diameter of the contact small-diameter portion 84 of the compression coil spring 64 is set to a dimension that forms a circumscribed circle having a cross-sectional shape to which the coupling rod portions 80, 69, 80 are coupled, and is assembled in a slightly tightened state (FIG. 11, 12).
  • the width dimension of the connecting rod portion 80 is narrower than the width dimension of the connecting rod portion 69 of the first plunger 62.
  • the tip insertion part 81 is a part for guiding the insertion of the connecting rod part 80 into the compression coil spring 64.
  • the distal end insertion portion 81 is formed at the distal end portion (the lower end portion in FIG. 14) of the connecting rod portion 80.
  • the distal end insertion portion 81 has a gently curved inclined surface so as not to obstruct the insertion direction, and can be smoothly inserted into the compression coil spring 64.
  • the stopper 82 is a part for preventing the tip insertion portion 81 from coming out of the compression coil spring 64 when the tip insertion portion 81 is inserted into the compression coil spring 64.
  • the retaining portion 82 is provided at the proximal end portion of the distal end insertion portion 81 (the boundary portion between the coupling rod portion 80 and the distal end insertion portion 81).
  • the retaining portion 82 is formed by projecting the proximal end portion of the distal end insertion portion 81 on both sides.
  • the width dimension of the retaining portion 82 protruding on both sides is set so as to slightly protrude from the inner diameter of the contact small diameter portion 84 at the end of the compression coil spring 64 when assembled (see FIG. 12).
  • the spring receiving portion 76 is a portion for receiving the compression coil spring 64.
  • the spring receiving portion 76 is a step provided at a boundary portion between the coupling portion 75 and the contact piece 77.
  • the contact piece 77 is formed wider than the width of the coupling portion 75, and a step portion at the boundary thereof is a spring receiving portion 76.
  • the contact piece 77 is a member for contacting and electrically connecting to the other member (bump electrode 13).
  • the contact piece 77 is provided integrally with the base end side (the upper side in FIG. 14) of the coupling portion 75.
  • the contact piece 77 penetrates the substantially rectangular plate-like portion whose width is slightly smaller than the inner diameter of the second support hole 17A of the upper housing 17 and the upper receiving portion 17B of the upper housing 17 having a smaller width.
  • the guide plate 19 is formed with a front end portion having a width that enters the reduced portion 57 of the guide plate 19.
  • An upper support shoulder 79 is formed on the contact piece 77 at the boundary between the upper part of the rectangular plate and the tip part.
  • the upper support shoulder 79 is caught by the upper receiving portion 17B of the upper housing 17 so that the contact piece 77 does not come out of the second support hole 17A.
  • the upper end portion (see FIG. 14) of the contact piece 77 protrudes upward from the second support hole 17A.
  • each contact piece 77 is formed in two protrusions. That is, the center of the tip of the contact piece 77 is recessed in a U shape to form a recess, and two protrusions 77A are formed on both sides thereof. Further, a tapered surface 77B (see FIG. 10) is formed on the protrusion 77A. Thus, the two protrusions 77A are formed in two cuts. A space formed by the two tapered surfaces 77B facing the concave portion serves as a space for receiving the top of the bump electrode 13.
  • the bump electrode 13 and the second plunger 63 are in contact with each other, the top of the bump electrode 13 is received in the space and is prevented from being crushed in contact with the tip surface of the second plunger 63.
  • the tapered surface 77B is arranged in a direction to open upward (see FIGS. 10 and 16).
  • the two protrusions 77A arranged in the direction of opening upward are surely in contact with the bump electrode 13 as shown in FIG. 16, and the four contact points as shown in FIG.
  • Each of the bump electrodes 13 is pierced by S to be surely electrically contacted.
  • the taper surface 77B exhibits the following functions.
  • the protrusion 77A try to contact the bump electrode 13
  • the protrusion 77A tries to slide in the circumferential direction on the spherical surface of the bump electrode, and a force that moves away from each other acts.
  • the force acts as a force for pressing the coupling portion 75, particularly the distal end insertion portion 81, located on the side opposite to the projection 77 ⁇ / b> A of the second plunger against the first plunger 62.
  • each protrusion 77A is pressed against the bump electrode 13, whereby the second plunger 63 is shifted downward.
  • the first plunger 62 and the second plunger 63 are rubbed and slid while being relatively pressed against each other at the coupling portions 66 and 75 so as to come into reliable contact.
  • the compression coil spring 64 covers the outer peripheries of the connecting rod portions 69 and 80 of the first plunger 62 and the second plunger 63 and abuts against the spring receiving portions 67 and 76, respectively. It is a member for elastically supporting the plungers 62 and 63 and electrically connecting the plungers 62 and 63.
  • the coupling portions 66 and 75 of the first plunger 62 and the second plunger 63 are stacked and supported at both ends of the compression coil spring 64.
  • the compression coil spring 64 has a large diameter at the intermediate portion thereof, that is, a size in which the cross-sectional shape formed by the coupling rod portion 69 of the first plunger 62 and the coupling rod portion 80 of the two second plungers 63 sandwiching the intermediate portion does not contact. (Refer to FIG. 11) to form a compression coil spring.
  • the outer diameter of the intermediate portion is set to be slightly larger than the maximum width dimension of the first plunger 62 and the second plunger -63. Both end portions of the compression coil spring 64 are formed with small diameter close contact small diameter portions 84.
  • the inner diameter of the contact small diameter portion 84 is slightly smaller than the diameter of the circumscribed circle circumscribing the cross-sectional shape formed by the coupling rod portion 69 of the first plunger 62 and the coupling rod portion 80 of the two second plungers 63 sandwiching it. It is set small.
  • the contact 20 allows the first plunger 62 and the second plunger 63 to be connected to the coupling portions 66 and 75 with the contact pieces 68 and 77 facing in opposite directions.
  • the compression coil springs 64 are superposed and integrated with each other, and the compression coil springs 64 are stopped at the positions of the respective spring receiving portions 67 and 76 so that they cannot be separated from each other, and are slidably assembled.
  • the contact 20 configured as described above is used as follows.
  • the device under test 12 is mounted on the electrical connection device 11. At this time, the device under test 12 is mounted in the receiving recess 53 of the guide plate 19. That is, the device under test 12 is mounted on the bottom plate portion 55 while being positioned along the inclined surface 53B of the upper opening 53A. Thereby, the bump electrode 13 of the device under test 12 is received in the guide hole 56 of the bottom plate portion 55. Further, the upper end portion of the contact piece 77 of the contact 20 is received by the reduction portion 57.
  • the protrusions 77A at the tips of the two contact pieces 77 of the two second plungers 63 try to contact the bump electrode 13
  • the protrusions 77A try to slide on the spherical surface of the bump electrode in the circumferential direction and away from each other.
  • a force that moves to the position of the second plunger is combined with the fact that the connecting rod portions 69 and 80 are supported by the small diameter portion of the compression coil spring 64, and the force is located on the side opposite to the projection 77A of the second plunger.
  • the coupling portion 75, particularly the distal end insertion portion 81 acts as a force that presses against the first plunger 62.
  • the compression coil spring 64 has the contact small diameter portions 84 at both ends pressed against the spring receiving portion 67 of the first plunger 62 and the spring receiving portion 76 of the second plunger 63, respectively. Are also reliably contacted electrically.
  • the two second plungers 63 are slid independently, the height of the contact portion of the two second plungers 63 with the protrusions 77A, such as when the bump electrode 13 is deformed. Even if the two are different, the two second plungers 63 come into contact with each other while following the shape.
  • each member (the wiring board 15 and the bump electrode 13) is electrically and reliably connected by the contactor 20. In this state, an electrical signal or the like is transmitted between the members via the contact 20.
  • the first plunger 62 and the second plunger 63 are in electrical contact with each other reliably, and the compression coil spring 64 and the plungers 62 and 63 are also electrically connected. Since the state is maintained, the electrical contact between each member (the wiring board 15 and the bump electrode 13) is greatly improved.
  • the contact 20 has a small number of parts and a simple structure, there are few causes of failure, so durability is improved. Since each plunger is formed in a plate shape, it can be easily manufactured by pressing or the like. Furthermore, since the structure of the contact 20 is simple and the number of parts is small, the cost can be reduced.
  • the inspection object 12 can be easily and accurately mounted on the electrical connection device 11 and the electrodes of the inspection object are not damaged, the inspection workability is improved and the inspection accuracy is also improved. .
  • the contact 20 Since the contact 20 has a small number of parts and a simple structure, the electrical contact can be maintained in a good state for a long time and the durability is improved. As a result, the reliability with respect to the contact 20 and the electrical connection device 11 is improved.
  • the contact according to this embodiment is configured by providing two first plungers to the contact 20 according to the first embodiment to form a Kelvin contact.
  • the overall configuration of the contact of this embodiment is substantially the same as that of the contact 20 of the first embodiment. That is, as shown in FIGS. 18 and 19, the contact 86 of the present embodiment has a different structure of the first plunger 87, and the material of the compression coil spring 64 is insulative. Other members are the same as those in the first embodiment. For this reason, the same code
  • two first plungers 87 are provided in the same manner as the second plunger 63.
  • the two first plungers 87 have the same shape, and an insulator 88 is provided between each first plunger 87.
  • the insulator 88 may be a plate-like member that can insulate between the two first plungers 87.
  • the insulator 88 insulates the two first plungers 87 and the two second plungers 63 that are in contact with the first plungers 87, respectively. These are integrally supported while being insulated by the compression coil spring 64. As shown in FIG.
  • the dimensions of the first plunger 87 and the second plunger 63 are such that the portions corresponding to the contact piece 68 and the retaining portion 71 of the first embodiment are compressed coil springs to prevent the retaining. It is set to be slightly larger than the 64 small contact diameter portion 84.
  • the close contact small diameter portion 84 is set so that the inner diameter portion is a circumscribed circle circumscribing the insulator 88, the two first plungers 87, and the two second plungers 63 in a stacked state. .
  • the small contact diameter portion 84, the first plunger 87, and the second plunger 63 are insulated from each other.
  • the number of contact pads 89 of the wiring board 15 is also two.
  • the compression coil spring 64 is made of an insulating material such as ceramic or engineer plastic. Further, an insulating coating may be applied to a normal metal spring material.
  • first plunger 87 and one second plunger 63 are electrically connected, and the other first plunger 87 and the other second plunger 63 are electrically connected, It is designed to transmit signals in two systems.
  • the contact piece 77 of the second plunger 63 of the contact 20 of the first embodiment is improved, and the four protrusions that contact the bump electrode 13 are free from each other in the radial direction or the like. It is configured to be supported so as to be able to approach and separate.
  • the whole structure of the contactor of this embodiment is substantially the same as the contactor 20 of the said 1st Embodiment, the same code
  • the contact piece 92 of the second plunger 91 of the contact 90 of the present embodiment includes two protrusions 92A as shown in FIGS.
  • the protrusion 92A is configured in the same manner as the protrusion 77A of the first embodiment, and includes a tapered surface 92B.
  • the contact piece 92 is provided with a slit 93.
  • the contact piece 92 is formed in a bifurcated shape.
  • a slit 93 is provided in the middle of the two protrusions 92 ⁇ / b> A of the contact piece 92.
  • the slit 93 is provided over the substantially entire length of the contact piece 92 in the longitudinal direction of the contact piece 92 from the middle of the two protrusions 92A.
  • a stopping hole 94 which is a circular through hole for preventing cracking due to stress concentration.
  • the contact piece 92 is formed in a bifurcated shape by the slit 93.
  • the bifurcated portions are two protruding rod portions 92C and 92D each having a protrusion 92A at the tip.
  • the two protruding rod portions 92C and 92D are bent so as to open and close around the portion of the stopping hole 94, so that the two protruding portions 92A are separated, that is, the two protruding portions 92A are moved closer to each other. It has become.
  • the second plunger 91 is disposed on both sides of the first plunger 62 so as to sandwich the first plunger 62. Thereby, the contact piece 92 of each 2nd plunger 91 is arrange
  • the hemispherical bump electrode 13 separates the four protrusions 92A from each other in the radial direction.
  • the first embodiment as shown in FIG. 17, there are two sets of contact points S of two protrusions 77 ⁇ / b> A whose intervals do not change, and the sets are separated so as to open left and right.
  • the four contact points S are separated so as to open in the radial direction.
  • the four protrusions 92A can be pierced into the bump electrodes 13 while being spaced apart so as to open in the radial direction, and can be reliably brought into electrical contact.
  • the tapered surface 92 ⁇ / b> B may be in pressure contact with the bump electrode 13. The same applies to the first embodiment.
  • the protruding rod portions 92C and 92D are bent to absorb the displacement.
  • the contact 90 and the bump electrode 13 come into contact with each other at a position displaced from each other (for example, a position displaced rightward in FIG. 23)
  • the direction in which the bump electrode 13 is displaced with respect to the contact 90 The protrusion rod portion 92D located in front of (hereinafter referred to as “shift direction”) (rightward front in FIG. 23) is greatly bent in the shift direction.
  • the protruding rod portion 92D located rearward in the shifting direction does not bend very much. Accordingly, the four protrusions 92A supported by the four protrusion rod portions 92C and 92D are surely in contact with the bump electrode 13. That is, when the contact 90 and the bump electrode 13 are displaced from each other, the protruding rod portions 92C and 92D are bent to absorb the displacement.
  • the contact 90 can be brought into electrical contact with the bump electrode 13 reliably.
  • the compression coil spring 64 has a large diameter at the center and a small diameter close contact diameter portion 84 formed at both ends thereof.
  • the compression coil spring 64 has a large diameter at the center and both ends. It may be a barrel shape that is formed so as to gradually become smaller in diameter toward both ends, and has a minimum diameter close contact small diameter portion 84 formed at both ends thereof, or may have another shape.
  • the inner diameter of the contact small-diameter portion 84 is slightly smaller than the diameter of the circumscribed circle that circumscribes the cross-sectional shape in which the coupling portions of the first plunger 62 and the second plunger 63 are overlapped. Although set, it may be set to the same diameter as the circumscribed circle. Further, the inner diameter of the contact small diameter portion 84 may be set to be significantly smaller than the diameter of the circumscribed circle. It is sufficient that the first plunger 62 and the second plunger 63 have a diameter that can be slidably supported while maintaining conductivity.
  • two second plungers 63 and one first plunger 62 are provided, but one second plunger 63 and one first plunger 62 may be provided.
  • the small contact portions 84 at both ends of the compression coil spring 64 support the second plunger 63 and the first plunger 62 one by one to constitute a contact.
  • one second plunger 63 and two first plungers 62 may be provided. In these cases, the same operations and effects as those of the first embodiment can be obtained. Moreover, this aspect is the same also in the contactor 90 of 3rd Embodiment.
  • the slit 93 having a narrow groove width is provided in the contact piece 92, but the width of the groove width can be appropriately set according to various conditions such as a force for supporting the protrusion 92A.
  • a U-shaped slit 95 having a wide groove width may be provided.
  • the rear side end of the slit 95 is formed in a semicircular shape to prevent stress concentration.
  • the protrusion rod part 92C, 92D can be bent with weak force.
  • the width of the slit 95 is appropriately set according to various conditions such as the size and hardness of the bump electrode 13. Also by this, the effect
  • the slits 93 and 95 are provided on the second plunger 91 side, but may be provided on the first plunger 62 side.
  • the projection 92A and the slits 93 and 95 may be provided on the first plunger 62 side.
  • two projections 92A are provided and one slit 93, 95 is provided.
  • three or more projections 92A and two or more slits 93, 95 are provided. Also good. It is appropriately set according to various conditions such as the size of the bump electrode 13.
  • the contact of the present invention can be used for all devices that come into contact with electrodes provided on a wiring board, a semiconductor integrated circuit, or the like.
  • the electrical connection device can be applied to all devices that can use the contact of the present invention.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Switch Cases, Indication, And Locking (AREA)

Abstract

L'invention concerne un contacteur à caractéristiques de contact électrique et à durabilité améliorées et à coût réduit. Le contacteur comprend : un premier plongeur en forme de plaque venant en contact avec un premier élément, un second plongeur en forme de plaque entrant en contact, quand il est superposé au premier plongeur, avec un second élément et réalisant en collaboration avec ledit premier plongeur la continuité électrique entre ledit premier élément et le second élément, et un ressort de compression, élément reliant le premier plongeur et le second plongeur dans un état dans lequel les pièces de contact de ceux-ci sont orientées dans des directions opposées, recouvrant la périphérie extérieure de ladite section joignant le premier plongeur et le second plongeur et portant chacun des plongeurs dans un état de coulissement l'un par rapport à l'autre, en venant au contact de sections de retenue sur chacun des plongeurs. Le contacteur est monté dans un dispositif de connexion électrique.
PCT/JP2010/062251 2009-09-28 2010-07-21 Contacteur et dispositif de connexion électrique WO2011036935A1 (fr)

Priority Applications (7)

Application Number Priority Date Filing Date Title
EP10818612.3A EP2485335B1 (fr) 2009-09-28 2010-07-21 Contacteur et dispositif de connexion électrique
US13/384,771 US8460010B2 (en) 2009-09-28 2010-07-21 Contact and electrical connecting apparatus
JP2011532930A JP5568563B2 (ja) 2009-09-28 2010-07-21 接触子及び電気的接続装置
CN201080043076.2A CN102549848B (zh) 2009-09-28 2010-07-21 触头以及电连接装置
SG2012005526A SG177757A1 (en) 2009-09-28 2010-07-21 Contact and electrical connecting apparatus
KR1020117026877A KR101310672B1 (ko) 2009-09-28 2010-07-21 접촉자 및 전기적 접속장치
TW099125090A TWI415341B (zh) 2009-09-28 2010-07-29 接觸元件及電性連接裝置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPPCT/JP2009/066787 2009-09-28
PCT/JP2009/066787 WO2011036800A1 (fr) 2009-09-28 2009-09-28 Contacteur et dispositif de connexion électrique

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Publication Number Publication Date
WO2011036935A1 true WO2011036935A1 (fr) 2011-03-31

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PCT/JP2009/066787 WO2011036800A1 (fr) 2009-09-28 2009-09-28 Contacteur et dispositif de connexion électrique
PCT/JP2010/062251 WO2011036935A1 (fr) 2009-09-28 2010-07-21 Contacteur et dispositif de connexion électrique

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US (1) US8460010B2 (fr)
EP (1) EP2485335B1 (fr)
KR (1) KR101310672B1 (fr)
CN (1) CN102549848B (fr)
MY (1) MY163614A (fr)
SG (1) SG177757A1 (fr)
TW (2) TWI431280B (fr)
WO (2) WO2011036800A1 (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140247065A1 (en) * 2011-08-02 2014-09-04 Nhk Spring Co., Ltd. Probe unit
JP2015516571A (ja) * 2012-04-13 2015-06-11 デラウェア キャピタル フォーメイション，インコーポレイテッド 試験プローブアセンブリおよび関連方法
JP2016024188A (ja) * 2014-07-17 2016-02-08 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． 検査用接触装置及び電気的検査ソケット
JP2016075709A (ja) * 2011-10-26 2016-05-12 ユニテクノ株式会社 コンタクトプローブおよびそれを備えた検査ソケット
EP3156805A4 (fr) * 2014-06-16 2018-01-31 Omron Corporation Borne de détection et dispositif électronique l'utilisant
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Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8324919B2 (en) * 2009-03-27 2012-12-04 Delaware Capital Formation, Inc. Scrub inducing compliant electrical contact
JP5726651B2 (ja) * 2011-06-22 2015-06-03 タイコエレクトロニクスジャパン合同会社 コンタクトおよびソケット
MY177561A (en) * 2011-07-19 2020-09-19 Nhk Spring Co Ltd Contact structure unit
JP5719933B2 (ja) * 2011-08-29 2015-05-20 株式会社日本マイクロニクス 接触子及び電気的接続装置
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TWI607606B (zh) * 2012-10-12 2017-12-01 日本麥克隆尼股份有限公司 Contact element and electrical connection device
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JP6297288B2 (ja) * 2013-09-18 2018-03-20 株式会社ヨコオ スプリングコネクタ
USD758970S1 (en) * 2014-05-27 2016-06-14 Vishay Dale Electronics, Llc Edge-wound resistor
US9396847B2 (en) 2014-05-27 2016-07-19 Vishay Dale Electronics, Llc Edge-wound resistor, resistor assembly, and method of making same
JP6404008B2 (ja) * 2014-06-23 2018-10-10 株式会社日本マイクロニクス 電気的接触子及び電気的接続装置
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TWD177827S (zh) * 2014-12-15 2016-08-21 歐姆龍股份有限公司 積體電路插座用探針引腳之部分
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JP1529607S (fr) * 2014-12-15 2015-07-27
JP1529612S (fr) * 2014-12-19 2015-07-27
JP1529613S (fr) * 2014-12-19 2015-07-27
US9853385B1 (en) 2015-02-19 2017-12-26 Ohio Associated Enterprises, Llc Axial compliant compression electrical connector
US10074923B1 (en) * 2015-02-19 2018-09-11 Ohio Associated Enterprises, Llc Axial compliant compression electrical connector
USD775984S1 (en) * 2015-03-04 2017-01-10 Omron Corporation Probe pin
JP1554473S (fr) * 2015-09-15 2016-07-25
JP1554474S (fr) * 2015-09-15 2016-07-25
JP6515877B2 (ja) * 2016-06-17 2019-05-22 オムロン株式会社 プローブピン
JP6432017B2 (ja) * 2016-11-30 2018-12-05 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JP6744209B2 (ja) * 2016-12-27 2020-08-19 株式会社エンプラス 電気接触子及び電気部品用ソケット
JP6881972B2 (ja) * 2016-12-27 2021-06-02 株式会社エンプラス 電気接触子及び電気部品用ソケット
US10069257B1 (en) * 2017-09-06 2018-09-04 Carlisle Interconnect Technologies, Inc. Inline compression RF connector
US10476191B2 (en) 2018-02-28 2019-11-12 Ohio Associated Enterprises, Llc Forked electrical contact pair with elastic tail
CN108957055A (zh) * 2018-09-08 2018-12-07 四川峰哲精密设备有限公司 一种测试针及其组成的测试接触片
KR102055773B1 (ko) * 2019-05-15 2019-12-13 황동원 스프링 콘택트 및 스프링 콘택트 내장 소켓
CN111951879A (zh) * 2019-05-16 2020-11-17 第一检测有限公司 检测设备
US11539167B2 (en) 2020-09-17 2022-12-27 Carlisle Interconnect Technologies, Inc. Adjustable push on connector/adaptor
US11802909B2 (en) 2020-10-06 2023-10-31 Johnstech International Corporation Compliant ground block and testing system having compliant ground block
US11502440B2 (en) 2020-10-23 2022-11-15 Carlisle Interconnect Technologies, Inc. Multiport connector interface system
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
USD1015282S1 (en) 2022-02-01 2024-02-20 Johnstech International Corporation Spring pin tip

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11317270A (ja) 1998-05-01 1999-11-16 Enplas Corp コンタクトピン及びこのコンタクトピンを用いた電気部品用ソケット
JP2004152495A (ja) 2002-10-28 2004-05-27 Yamaichi Electronics Co Ltd 狭ピッチｉｃパッケージ用ｉｃソケット
JP2006139977A (ja) * 2004-11-11 2006-06-01 Texas Instr Japan Ltd Ｂｇａ用ケット
JP2008516398A (ja) 2004-10-06 2008-05-15 プラストロニックス・ソケット・パートナーズ， エルピー 電子デバイスのためのコンタクト
JP2008275421A (ja) * 2007-04-27 2008-11-13 Sensata Technologies Massachusetts Inc プローブピンおよびそれを用いたソケット

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4029375A (en) * 1976-06-14 1977-06-14 Electronic Engineering Company Of California Miniature electrical connector
US6506082B1 (en) * 2001-12-21 2003-01-14 Interconnect Devices, Inc. Electrical contact interface
JP4695337B2 (ja) * 2004-02-04 2011-06-08 日本発條株式会社 導電性接触子および導電性接触子ユニット
KR101012712B1 (ko) * 2005-06-10 2011-02-09 델라웨어 캐피탈 포메이션, 인코포레이티드 컴플라이언트 전기적 상호접속체 및 전기적 접촉 프로브
CN201029131Y (zh) * 2007-03-02 2008-02-27 富士康(昆山)电脑接插件有限公司 电连接器端子
CN101669034A (zh) * 2007-04-27 2010-03-10 日本发条株式会社 导电性接触器
JP4900843B2 (ja) * 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11317270A (ja) 1998-05-01 1999-11-16 Enplas Corp コンタクトピン及びこのコンタクトピンを用いた電気部品用ソケット
JP2004152495A (ja) 2002-10-28 2004-05-27 Yamaichi Electronics Co Ltd 狭ピッチｉｃパッケージ用ｉｃソケット
JP2008516398A (ja) 2004-10-06 2008-05-15 プラストロニックス・ソケット・パートナーズ， エルピー 電子デバイスのためのコンタクト
JP2006139977A (ja) * 2004-11-11 2006-06-01 Texas Instr Japan Ltd Ｂｇａ用ケット
JP2008275421A (ja) * 2007-04-27 2008-11-13 Sensata Technologies Massachusetts Inc プローブピンおよびそれを用いたソケット

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2485335A4 *

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140247065A1 (en) * 2011-08-02 2014-09-04 Nhk Spring Co., Ltd. Probe unit
US9702905B2 (en) * 2011-08-02 2017-07-11 Nhk Spring Co., Ltd. Probe unit
JP2016075709A (ja) * 2011-10-26 2016-05-12 ユニテクノ株式会社 コンタクトプローブおよびそれを備えた検査ソケット
JP2015516571A (ja) * 2012-04-13 2015-06-11 デラウェア キャピタル フォーメイション，インコーポレイテッド 試験プローブアセンブリおよび関連方法
US9829506B2 (en) 2012-04-13 2017-11-28 Xcerra Corporation Test probe assembly and related methods
EP3156805A4 (fr) * 2014-06-16 2018-01-31 Omron Corporation Borne de détection et dispositif électronique l'utilisant
JP2016024188A (ja) * 2014-07-17 2016-02-08 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． 検査用接触装置及び電気的検査ソケット
WO2020026409A1 (fr) * 2018-08-02 2020-02-06 ユニテクノ株式会社 Sonde de contact et douille de test comprenant cette dernière
JPWO2020026409A1 (ja) * 2018-08-02 2021-08-02 ユニテクノ株式会社 コンタクトプローブおよびそれを備えた検査ソケット
US11394148B2 (en) 2018-08-02 2022-07-19 Unitechno Inc. Contact probe and inspection socket provided with contact probe
JP7148614B2 (ja) 2018-08-02 2022-10-05 ユニテクノ株式会社 コンタクトプローブおよびそれを備えた検査ソケット

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TW201111795A (en) 2011-04-01
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MY163614A (en) 2017-10-13
CN102549848A (zh) 2012-07-04
CN102549848B (zh) 2015-10-14
SG177757A1 (en) 2012-03-29
KR20120022924A (ko) 2012-03-12
TWI415341B (zh) 2013-11-11
WO2011036800A1 (fr) 2011-03-31
US20120129408A1 (en) 2012-05-24
US8460010B2 (en) 2013-06-11
EP2485335B1 (fr) 2016-06-29
EP2485335A4 (fr) 2014-01-22
TW201125223A (en) 2011-07-16
EP2485335A1 (fr) 2012-08-08

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