JP1554473S - - Google Patents

Info

Publication number
JP1554473S
JP1554473S JPD2015-20448F JP2015020448F JP1554473S JP 1554473 S JP1554473 S JP 1554473S JP 2015020448 F JP2015020448 F JP 2015020448F JP 1554473 S JP1554473 S JP 1554473S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2015-20448F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2015-20448F priority Critical patent/JP1554473S/ja
Priority to US29/557,788 priority patent/USD769754S1/en
Priority to TW105301314F priority patent/TWD180086S/zh
Application granted granted Critical
Publication of JP1554473S publication Critical patent/JP1554473S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2015-20448F 2015-09-15 2015-09-15 Active JP1554473S (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JPD2015-20448F JP1554473S (fr) 2015-09-15 2015-09-15
US29/557,788 USD769754S1 (en) 2015-09-15 2016-03-11 Probe pin
TW105301314F TWD180086S (zh) 2015-09-15 2016-03-14 導通檢查用探針接腳之部分

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2015-20448F JP1554473S (fr) 2015-09-15 2015-09-15

Publications (1)

Publication Number Publication Date
JP1554473S true JP1554473S (fr) 2016-07-25

Family

ID=56414213

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2015-20448F Active JP1554473S (fr) 2015-09-15 2015-09-15

Country Status (3)

Country Link
US (1) USD769754S1 (fr)
JP (1) JP1554473S (fr)
TW (1) TWD180086S (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD226028S (zh) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 半導體檢測針

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (fr) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contacteur et dispositif de connexion électrique
KR101058146B1 (ko) * 2009-11-11 2011-08-24 하이콘 주식회사 스프링 콘택트 및 스프링 콘택트 내장 소켓
TWD138876S1 (zh) * 2010-01-27 2011-02-01 日本麥克隆尼股份有限公司 電接觸元件
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるｉｃソケット
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5699899B2 (ja) * 2011-10-14 2015-04-15 オムロン株式会社 接触子
JP5708430B2 (ja) * 2011-10-14 2015-04-30 オムロン株式会社 接触子
JP5788767B2 (ja) * 2011-11-07 2015-10-07 株式会社日本マイクロニクス プローブブロックとそれを備えるプローブカード並びにプローブ装置
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
USD769754S1 (en) 2016-10-25
TWD180086S (zh) 2016-12-11

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