TWD226028S - 半導體檢測針 - Google Patents
半導體檢測針 Download PDFInfo
- Publication number
- TWD226028S TWD226028S TW111305316F TW111305316F TWD226028S TW D226028 S TWD226028 S TW D226028S TW 111305316 F TW111305316 F TW 111305316F TW 111305316 F TW111305316 F TW 111305316F TW D226028 S TWD226028 S TW D226028S
- Authority
- TW
- Taiwan
- Prior art keywords
- probe pin
- semiconductor probe
- semiconductor
- item
- design
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract description 7
- 239000000523 sample Substances 0.000 title 1
- 239000000463 material Substances 0.000 abstract description 2
- 239000002184 metal Substances 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 abstract description 2
- 230000002950 deficient Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 230000007547 defect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
Images
Abstract
【物品用途】;本設計物品是一種半導體檢測針，用於通過接觸半導體晶片或半導體器件等物體來檢查物體是否有缺陷。本設計物品的材質為金屬。;【設計說明】;無。
Description
本設計物品是一種半導體檢測針，用於通過接觸半導體晶片或半導體器件等物體來檢查物體是否有缺陷。本設計物品的材質為金屬。
無。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR20220017284 | 2022-04-29 | ||
| KR30-2022-0017284 | 2022-04-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD226028S true TWD226028S (zh) | 2023-06-21 |
Family
ID=88880621
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111305316F TWD226028S (zh) | 2022-04-29 | 2022-10-27 | 半導體檢測針 |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWD226028S (zh) |
-
2022
- 2022-10-27 TW TW111305316F patent/TWD226028S/zh unknown
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