USD1030689S1 - Semiconductor probe pin - Google Patents

Semiconductor probe pin Download PDF

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Publication number
USD1030689S1
USD1030689S1 US29/858,093 US202229858093F USD1030689S US D1030689 S1 USD1030689 S1 US D1030689S1 US 202229858093 F US202229858093 F US 202229858093F US D1030689 S USD1030689 S US D1030689S
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US
United States
Prior art keywords
probe pin
semiconductor probe
semiconductor
pin
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/858,093
Inventor
Bum Mo Ahn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Point Engineering Co Ltd
Original Assignee
Point Engineering Co Ltd
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Filing date
Publication date
Application filed by Point Engineering Co Ltd filed Critical Point Engineering Co Ltd
Assigned to POINT ENGINEERING CO., LTD. reassignment POINT ENGINEERING CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AHN, BUM MO
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Publication of USD1030689S1 publication Critical patent/USD1030689S1/en
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Description

FIG. 1 is a perspective view of a semiconductor probe pin showing my new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a semiconductor probe pin, as shown and described.
US29/858,093 2022-04-29 2022-10-28 Semiconductor probe pin Active USD1030689S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR30-2022-0017284 2022-04-29
KR20220017284 2022-04-29

Publications (1)

Publication Number Publication Date
USD1030689S1 true USD1030689S1 (en) 2024-06-11

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ID=88880621

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/858,093 Active USD1030689S1 (en) 2022-04-29 2022-10-28 Semiconductor probe pin

Country Status (2)

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US (1) USD1030689S1 (en)
TW (1) TWD226028S (en)

Citations (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2811702A (en) * 1956-06-21 1957-10-29 Malco Tool & Mfg Co Terminal pin for printed circuit board
US4681392A (en) * 1986-04-21 1987-07-21 Bead Chain Manufacturing Company Swaged compliant connector pins for printed circuit boards
US5124646A (en) * 1989-12-15 1992-06-23 Kabushiki Kaisha Toshiba Universal probe card for use in a semiconductor chip die sorter test
USD344029S (en) * 1992-09-28 1994-02-08 Sullivan Frank K Measuring belt
US5487684A (en) * 1992-07-01 1996-01-30 Berg Technology, Inc. Electrical contact pin for printed circuit board
US6032994A (en) * 1998-11-25 2000-03-07 Promos Technologies Inc. Tools for positioning semiconductor chip test probes
US6056627A (en) * 1997-09-03 2000-05-02 Mitsubishi Denki Kabushiki Kaisha Probe cleaning tool, probe cleaning method and semiconductor wafer testing method
US6098281A (en) * 1996-11-06 2000-08-08 Weidmuller Interface Gmbh & Co. Electrical pins and method for their insertion into apertures of a circuit board
US6137296A (en) * 1997-09-08 2000-10-24 Samsung Electronics, Co., Ltd. Probe card for testing semiconductor devices
US6294922B1 (en) * 1996-02-13 2001-09-25 Nihon Denshizairyo Kabushiki Kaisha Probe for testing a semiconductor integrated circuit
US20060252172A1 (en) * 2003-04-10 2006-11-09 Hong-Sik Park Method of fabricating semiconductor probe with resistive tip
US20070051169A1 (en) * 2005-09-03 2007-03-08 Samsung Electronics Co., Ltd. Semiconductor probe with high resolution resistive tip and method of fabricating the same
US20100244869A1 (en) * 2009-03-25 2010-09-30 Kabushiki Kaisha Toshiba Probe for electrical inspection, method for fabricating the same, and method for fabricating a semiconductor device
US20120249174A1 (en) * 2011-03-29 2012-10-04 Yamaichi Electronics., Co. Ltd. Contact probe and semiconductor device socket including contact probe
US20120289102A1 (en) * 2011-05-11 2012-11-15 Tyco Electronics Corporation Contact having a profiled compliant pin
US20140266277A1 (en) * 2013-03-18 2014-09-18 Cheng Yun Technology Co., Ltd. Semiconductor testing probe needle
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD764331S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD764330S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD769747S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769754S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD769752S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769750S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD769751S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD775984S1 (en) * 2015-03-04 2017-01-10 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD788615S1 (en) * 2016-02-15 2017-06-06 Omron Corporation Probe pin
USD789223S1 (en) * 2016-02-15 2017-06-13 Omron Corporation Probe pin
USD789224S1 (en) * 2016-02-15 2017-06-13 Omron Corporation Probe pin
US20170184632A1 (en) * 2015-12-28 2017-06-29 Texas Instruments Incorporated Force biased spring probe pin assembly
USD792255S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
USD792254S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
USD792256S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
USD792253S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
USD811912S1 (en) * 2016-04-12 2018-03-06 Qualmax Testech, Inc. Plunger for semiconductor chip-testing probe
US20190094269A1 (en) * 2016-06-17 2019-03-28 Omron Corporation Probe pin
TWD197914S (en) 2017-12-27 2019-06-01 日商歐姆龍股份有限公司 Probe pin for continuity test
US20190361049A1 (en) * 2016-09-21 2019-11-28 Omron Corporation Probe pin and inspection unit
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe

Patent Citations (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2811702A (en) * 1956-06-21 1957-10-29 Malco Tool & Mfg Co Terminal pin for printed circuit board
US4681392A (en) * 1986-04-21 1987-07-21 Bead Chain Manufacturing Company Swaged compliant connector pins for printed circuit boards
US5124646A (en) * 1989-12-15 1992-06-23 Kabushiki Kaisha Toshiba Universal probe card for use in a semiconductor chip die sorter test
US5487684A (en) * 1992-07-01 1996-01-30 Berg Technology, Inc. Electrical contact pin for printed circuit board
USD344029S (en) * 1992-09-28 1994-02-08 Sullivan Frank K Measuring belt
US6294922B1 (en) * 1996-02-13 2001-09-25 Nihon Denshizairyo Kabushiki Kaisha Probe for testing a semiconductor integrated circuit
US6098281A (en) * 1996-11-06 2000-08-08 Weidmuller Interface Gmbh & Co. Electrical pins and method for their insertion into apertures of a circuit board
US6056627A (en) * 1997-09-03 2000-05-02 Mitsubishi Denki Kabushiki Kaisha Probe cleaning tool, probe cleaning method and semiconductor wafer testing method
US6137296A (en) * 1997-09-08 2000-10-24 Samsung Electronics, Co., Ltd. Probe card for testing semiconductor devices
US6032994A (en) * 1998-11-25 2000-03-07 Promos Technologies Inc. Tools for positioning semiconductor chip test probes
US20060252172A1 (en) * 2003-04-10 2006-11-09 Hong-Sik Park Method of fabricating semiconductor probe with resistive tip
US20070051169A1 (en) * 2005-09-03 2007-03-08 Samsung Electronics Co., Ltd. Semiconductor probe with high resolution resistive tip and method of fabricating the same
US20100244869A1 (en) * 2009-03-25 2010-09-30 Kabushiki Kaisha Toshiba Probe for electrical inspection, method for fabricating the same, and method for fabricating a semiconductor device
US20120249174A1 (en) * 2011-03-29 2012-10-04 Yamaichi Electronics., Co. Ltd. Contact probe and semiconductor device socket including contact probe
US20120289102A1 (en) * 2011-05-11 2012-11-15 Tyco Electronics Corporation Contact having a profiled compliant pin
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
US20140266277A1 (en) * 2013-03-18 2014-09-18 Cheng Yun Technology Co., Ltd. Semiconductor testing probe needle
USD764331S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD764330S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD769751S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769752S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769747S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD775984S1 (en) * 2015-03-04 2017-01-10 Omron Corporation Probe pin
USD769754S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD769750S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD792254S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
USD792253S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
USD792256S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
USD792255S1 (en) * 2015-11-12 2017-07-18 Omron Corporation Probe pin
US20170184632A1 (en) * 2015-12-28 2017-06-29 Texas Instruments Incorporated Force biased spring probe pin assembly
USD789224S1 (en) * 2016-02-15 2017-06-13 Omron Corporation Probe pin
USD789223S1 (en) * 2016-02-15 2017-06-13 Omron Corporation Probe pin
USD788615S1 (en) * 2016-02-15 2017-06-06 Omron Corporation Probe pin
USD811912S1 (en) * 2016-04-12 2018-03-06 Qualmax Testech, Inc. Plunger for semiconductor chip-testing probe
US20190094269A1 (en) * 2016-06-17 2019-03-28 Omron Corporation Probe pin
US20190361049A1 (en) * 2016-09-21 2019-11-28 Omron Corporation Probe pin and inspection unit
TWD197914S (en) 2017-12-27 2019-06-01 日商歐姆龍股份有限公司 Probe pin for continuity test
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
"Notice of Allowance of Taiwan Counterpart Application," issued on May 2, 2023, pp. 1-6.

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TWD226028S (en) 2023-06-21

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