USD789224S1 - Probe pin - Google Patents
Probe pin Download PDFInfo
- Publication number
- USD789224S1 USD789224S1 US29/573,446 US201629573446F USD789224S US D789224 S1 USD789224 S1 US D789224S1 US 201629573446 F US201629573446 F US 201629573446F US D789224 S USD789224 S US D789224S
- Authority
- US
- United States
- Prior art keywords
- probe pin
- view
- probe
- pin
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
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Description
Claims (1)
- The ornamental design for a probe pin, as shown.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-003164 | 2016-02-15 | ||
JPD2016-3164F JP1567322S (en) | 2016-02-15 | 2016-02-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD789224S1 true USD789224S1 (en) | 2017-06-13 |
Family
ID=57806284
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/573,446 Active USD789224S1 (en) | 2016-02-15 | 2016-08-05 | Probe pin |
Country Status (2)
Country | Link |
---|---|
US (1) | USD789224S1 (en) |
JP (1) | JP1567322S (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7789671B2 (en) * | 2008-06-16 | 2010-09-07 | Hon Hai Precision Ind. Co., Ltd. | Electrical contact with overlapping structure |
US7815440B2 (en) * | 2008-08-11 | 2010-10-19 | Hon Hai Precision Ind. Co., Ltd. | Electrical contact with interlocking arrangement |
US8033872B2 (en) * | 2010-01-12 | 2011-10-11 | Hon Hai Precision Ind. Co., Ltd. | Contact terminal for test socket |
US8547128B1 (en) * | 2012-05-06 | 2013-10-01 | Jerzy Roman Sochor | Contact probe with conductively coupled plungers |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
US8715015B2 (en) * | 2010-05-27 | 2014-05-06 | Hicon Co., Ltd. | Structure for a spring contact |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
-
2016
- 2016-02-15 JP JPD2016-3164F patent/JP1567322S/ja active Active
- 2016-08-05 US US29/573,446 patent/USD789224S1/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7789671B2 (en) * | 2008-06-16 | 2010-09-07 | Hon Hai Precision Ind. Co., Ltd. | Electrical contact with overlapping structure |
US7815440B2 (en) * | 2008-08-11 | 2010-10-19 | Hon Hai Precision Ind. Co., Ltd. | Electrical contact with interlocking arrangement |
US8808038B2 (en) * | 2009-11-11 | 2014-08-19 | Hicon Co., Ltd. | Spring contact and a socket embedded with spring contacts |
US8033872B2 (en) * | 2010-01-12 | 2011-10-11 | Hon Hai Precision Ind. Co., Ltd. | Contact terminal for test socket |
US8669774B2 (en) * | 2010-04-09 | 2014-03-11 | Yamaichi Electronics Co., Ltd. | Probe pin and an IC socket with the same |
US8715015B2 (en) * | 2010-05-27 | 2014-05-06 | Hicon Co., Ltd. | Structure for a spring contact |
US8547128B1 (en) * | 2012-05-06 | 2013-10-01 | Jerzy Roman Sochor | Contact probe with conductively coupled plungers |
Non-Patent Citations (3)
Title |
---|
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,425, filed Aug. 5, 2016, in the USPTO. |
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,439, filed Aug. 5, 2016, in the USPTO. |
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO. |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Also Published As
Publication number | Publication date |
---|---|
JP1567322S (en) | 2017-01-23 |
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