USD789224S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD789224S1
USD789224S1 US29/573,446 US201629573446F USD789224S US D789224 S1 USD789224 S1 US D789224S1 US 201629573446 F US201629573446 F US 201629573446F US D789224 S USD789224 S US D789224S
Authority
US
United States
Prior art keywords
probe pin
view
probe
pin
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/573,446
Inventor
Hirotada Teranishi
Takahiro Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TERANISHI, HIROTADA, SAKAI, TAKAHIRO
Application granted granted Critical
Publication of USD789224S1 publication Critical patent/USD789224S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a probe pin, as shown.
US29/573,446 2016-02-15 2016-08-05 Probe pin Active USD789224S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-003164 2016-02-15
JPD2016-3164F JP1567322S (en) 2016-02-15 2016-02-15

Publications (1)

Publication Number Publication Date
USD789224S1 true USD789224S1 (en) 2017-06-13

Family

ID=57806284

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/573,446 Active USD789224S1 (en) 2016-02-15 2016-08-05 Probe pin

Country Status (2)

Country Link
US (1) USD789224S1 (en)
JP (1) JP1567322S (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7789671B2 (en) * 2008-06-16 2010-09-07 Hon Hai Precision Ind. Co., Ltd. Electrical contact with overlapping structure
US7815440B2 (en) * 2008-08-11 2010-10-19 Hon Hai Precision Ind. Co., Ltd. Electrical contact with interlocking arrangement
US8033872B2 (en) * 2010-01-12 2011-10-11 Hon Hai Precision Ind. Co., Ltd. Contact terminal for test socket
US8547128B1 (en) * 2012-05-06 2013-10-01 Jerzy Roman Sochor Contact probe with conductively coupled plungers
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7789671B2 (en) * 2008-06-16 2010-09-07 Hon Hai Precision Ind. Co., Ltd. Electrical contact with overlapping structure
US7815440B2 (en) * 2008-08-11 2010-10-19 Hon Hai Precision Ind. Co., Ltd. Electrical contact with interlocking arrangement
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
US8033872B2 (en) * 2010-01-12 2011-10-11 Hon Hai Precision Ind. Co., Ltd. Contact terminal for test socket
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US8547128B1 (en) * 2012-05-06 2013-10-01 Jerzy Roman Sochor Contact probe with conductively coupled plungers

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,425, filed Aug. 5, 2016, in the USPTO.
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,439, filed Aug. 5, 2016, in the USPTO.
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Also Published As

Publication number Publication date
JP1567322S (en) 2017-01-23

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