USD769750S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD769750S1
USD769750S1 US29/557,790 US201629557790F USD769750S US D769750 S1 USD769750 S1 US D769750S1 US 201629557790 F US201629557790 F US 201629557790F US D769750 S USD769750 S US D769750S
Authority
US
United States
Prior art keywords
probe pin
probe
pin
view
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/557,790
Inventor
Hirotada Teranishi
Takahiro Sakai
Makoto Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KONDO, MAKOTO, SAKAI, TAKAHIRO, TERANISHI, HIROTADA
Application granted granted Critical
Publication of USD769750S1 publication Critical patent/USD769750S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of a probe pin;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a probe pin, as shown and described.
US29/557,790 2015-09-15 2016-03-11 Probe pin Active USD769750S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2015-20449F JP1554474S (en) 2015-09-15 2015-09-15
JP2015-020449 2015-09-15

Publications (1)

Publication Number Publication Date
USD769750S1 true USD769750S1 (en) 2016-10-25

Family

ID=56414394

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/557,790 Active USD769750S1 (en) 2015-09-15 2016-03-11 Probe pin

Country Status (3)

Country Link
US (1) USD769750S1 (en)
JP (1) JP1554474S (en)
TW (1) TWD180087S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9207260B2 (en) * 2011-11-07 2015-12-08 Kabushiki Kaisha Nihon Micronics Probe block, probe card and probe apparatus both having the probe block
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor
US9207260B2 (en) * 2011-11-07 2015-12-08 Kabushiki Kaisha Nihon Micronics Probe block, probe card and probe apparatus both having the probe block
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
U.S. Appl. No. 29/557,788, filed Mar. 11, 2016; Teranishi et al.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin

Also Published As

Publication number Publication date
TWD180087S (en) 2016-12-11
JP1554474S (en) 2016-07-25

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