TWD180087S - Probe pin for continuity test - Google Patents

Probe pin for continuity test

Info

Publication number
TWD180087S
TWD180087S TW105301315F TW105301315F TWD180087S TW D180087 S TWD180087 S TW D180087S TW 105301315 F TW105301315 F TW 105301315F TW 105301315 F TW105301315 F TW 105301315F TW D180087 S TWD180087 S TW D180087S
Authority
TW
Taiwan
Prior art keywords
probe pin
continuity test
case
item
continuity check
Prior art date
Application number
TW105301315F
Other languages
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Makoto Kondo
Original Assignee
歐姆龍股份有限公司
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司, Omron Tateisi Electronics Co filed Critical 歐姆龍股份有限公司
Publication of TWD180087S publication Critical patent/TWD180087S/en

Links

Abstract

【物品用途】;本案設計之物品係導通檢查用探針接腳。;【設計說明】;本案設計係新穎獨特之樣式，藉由獨特地設計導通檢查用探針接腳，可顯現出先前技藝所未有之視覺效果。[Use of item]; The item designed in this case is a probe pin for continuity check. ;[Design Description];The design of this case is a novel and unique style. By uniquely designing the probe pins for continuity check, it can show a visual effect that has never been seen before.

TW105301315F 2015-09-15 2016-03-14 Probe pin for continuity test TWD180087S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2015-20449F JP1554474S (en) 2015-09-15 2015-09-15

Publications (1)

Publication Number Publication Date
TWD180087S true TWD180087S (en) 2016-12-11

Family

ID=56414394

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105301315F TWD180087S (en) 2015-09-15 2016-03-14 Probe pin for continuity test

Country Status (3)

Country Link
US (1) USD769750S1 (en)
JP (1) JP1554474S (en)
TW (1) TWD180087S (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
TWD226028S (en) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 Semiconductor probe pin

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2011036800A1 (en) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contactor and electrical connection device
KR101058146B1 (en) * 2009-11-11 2011-08-24 하이콘 주식회사 Spring contacts and sockets with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (en) * 2010-04-09 2012-08-15 山一電機株式会社 Probe pin and IC socket having the same
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5708430B2 (en) * 2011-10-14 2015-04-30 オムロン株式会社 Contact
JP5699899B2 (en) * 2011-10-14 2015-04-15 オムロン株式会社 Contact
JP5788767B2 (en) * 2011-11-07 2015-10-07 株式会社日本マイクロニクス Probe block, probe card including the same, and probe device
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead

Also Published As

Publication number Publication date
JP1554474S (en) 2016-07-25
USD769750S1 (en) 2016-10-25

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