TWD173715S - Probe pin for ic socket - Google Patents
Probe pin for ic socketInfo
- Publication number
- TWD173715S TWD173715S TW104303281F TW104303281F TWD173715S TW D173715 S TWD173715 S TW D173715S TW 104303281 F TW104303281 F TW 104303281F TW 104303281 F TW104303281 F TW 104303281F TW D173715 S TWD173715 S TW D173715S
- Authority
- TW
- Taiwan
- Prior art keywords
- integrated circuit
- socket
- probe pin
- case
- article
- Prior art date
Links
- 239000000523 sample Substances 0.000 title abstract 3
- 238000007689 inspection Methods 0.000 abstract 1
- 230000000007 visual effect Effects 0.000 abstract 1
Abstract
【物品用途】;本案設計之物品係積體電路插座用探針引腳,連接於積體電路之通電檢查所使用之積體電路插座。;【設計說明】;本案設計係新穎獨特之樣式,藉由獨特地設計積體電路插座用探針引腳,可顯現出先前技藝所未有之視覺效果。[Use of article] The article designed in this case is a probe pin for an integrated circuit socket, which is connected to the integrated circuit socket used for power inspection of the integrated circuit. ;[Design Description];The design of this case is a novel and unique style. By uniquely designing the probe pins for integrated circuit sockets, it can show visual effects that have never been seen before.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2014-28580F JP1529612S (en) | 2014-12-19 | 2014-12-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
TWD173715S true TWD173715S (en) | 2016-02-11 |
Family
ID=53764639
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104303281F TWD173715S (en) | 2014-12-19 | 2015-06-17 | Probe pin for ic socket |
Country Status (3)
Country | Link |
---|---|
US (1) | USD769749S1 (en) |
JP (1) | JP1529612S (en) |
TW (1) | TWD173715S (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD758970S1 (en) * | 2014-05-27 | 2016-06-14 | Vishay Dale Electronics, Llc | Edge-wound resistor |
USD869305S1 (en) * | 2017-02-10 | 2019-12-10 | Kabushiki Kaisha Nihon Micronics | Probe pin |
JP1592871S (en) * | 2017-02-10 | 2017-12-11 | ||
JP1622970S (en) * | 2018-02-02 | 2019-01-28 | ||
JP1622968S (en) * | 2018-02-02 | 2019-01-28 | ||
JP1622969S (en) * | 2018-02-02 | 2019-01-28 | ||
JP1623279S (en) * | 2018-02-02 | 2019-01-28 | ||
JP1623280S (en) * | 2018-02-02 | 2019-01-28 | ||
USD873161S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
JP1626667S (en) * | 2018-02-02 | 2019-03-18 | ||
JP1626668S (en) * | 2018-02-02 | 2019-03-18 | ||
JP1624757S (en) * | 2018-05-16 | 2019-02-18 | ||
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
USD1015282S1 (en) * | 2022-02-01 | 2024-02-20 | Johnstech International Corporation | Spring pin tip |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
WO2011036800A1 (en) * | 2009-09-28 | 2011-03-31 | 株式会社日本マイクロニクス | Contactor and electrical connection device |
KR101058146B1 (en) * | 2009-11-11 | 2011-08-24 | 하이콘 주식회사 | Spring contacts and sockets with spring contacts |
USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
TWM390564U (en) * | 2010-03-18 | 2010-10-11 | Hon Hai Prec Ind Co Ltd | Electrical contact |
JP4998838B2 (en) * | 2010-04-09 | 2012-08-15 | 山一電機株式会社 | Probe pin and IC socket having the same |
JP5352525B2 (en) | 2010-04-28 | 2013-11-27 | 日本航空電子工業株式会社 | Probe pin contact, probe pin, and connection jig for electronic devices |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
JP5699899B2 (en) * | 2011-10-14 | 2015-04-15 | オムロン株式会社 | Contact |
JP5708430B2 (en) * | 2011-10-14 | 2015-04-30 | オムロン株式会社 | Contact |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
-
2014
- 2014-12-19 JP JPD2014-28580F patent/JP1529612S/ja active Active
-
2015
- 2015-06-16 US US29/530,394 patent/USD769749S1/en active Active
- 2015-06-17 TW TW104303281F patent/TWD173715S/en unknown
Also Published As
Publication number | Publication date |
---|---|
USD769749S1 (en) | 2016-10-25 |
JP1529612S (en) | 2015-07-27 |
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