USD983681S1

USD983681S1 - Probe for testing device under test

Info

Publication number: USD983681S1
Application number: US29/786,073
Authority: US
Inventors: Tzu-Yang Chen; Che-Wei Lin; Chen-Rui Wu
Original assignee: MPI Corp
Current assignee: MPI Corp
Priority date: 2020-12-03
Filing date: 2021-05-28
Publication date: 2023-04-18
Anticipated expiration: 2038-04-18

Description

FIG. 1 is a perspective view of a first embodiment of a probe according to our design;

FIG. 2 is an enlarged, broken away perspective view taken along line A-A on FIG. 1 ;

FIG. 3 is an enlarged, broken away front view taken along line A-A on FIG. 1 ;

FIG. 4 is an enlarged, broken away rear view taken along line A-A on FIG. 1 ;

FIG. 5 is an enlarged left side elevational view of the first embodiment of the probe shown in FIG. 1 ;

FIG. 6 is an enlarged right side elevational view of the first embodiment of the probe shown in FIG. 1 ;

FIG. 7 is an enlarged, broken away top plan view taken along line A-A on FIG. 1 ;

FIG. 8 is an enlarged, broken away bottom plan view taken along line A-A on FIG. 1 ;

FIG. 9 is another enlarged, broken away perspective view taken along line A-A on FIG. 1 ;

FIG. 10 is a perspective view of a second embodiment of a probe according to our design;

FIG. 11 is an enlarged, broken away perspective view taken along line B-B on FIG. 10 ;

FIG. 12 is an enlarged, broken away front view taken along line B-B on FIG. 10 ;

FIG. 13 is an enlarged, broken away rear view taken along line B-B on FIG. 10 ;

FIG. 14 is an enlarged left side elevational view of the second embodiment of the probe shown in FIG. 10 ;

FIG. 15 is an enlarged right side elevational view of the second embodiment of the probe shown in FIG. 10 ;

FIG. 16 is an enlarged, broken away top plan view taken along line B-B on FIG. 10 ;

FIG. 17 is an enlarged, broken away bottom plan view taken along line B-B on FIG. 10 ; and,

FIG. 18 is another enlarged, broken away perspective view taken along line B-B on FIG. 10 .

The broken lines depict portions of the probe and form no part of the claimed design. The dash-dot-dash lines depict boundaries between claimed portion and unclaimed portion of the probe and form no part of the claimed design.

Claims

CLAIM

The ornamental design for a probe for testing a device under test, as shown and described.