USD788616S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD788616S1
USD788616S1 US29/573,439 US201629573439F USD788616S US D788616 S1 USD788616 S1 US D788616S1 US 201629573439 F US201629573439 F US 201629573439F US D788616 S USD788616 S US D788616S
Authority
US
United States
Prior art keywords
probe pin
view
probe
pin
broken lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/573,439
Inventor
Hirotada Teranishi
Takahiro Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TERANISHI, HIROTADA, SAKAI, TAKAHIRO
Application granted granted Critical
Publication of USD788616S1 publication Critical patent/USD788616S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.
The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.

Claims (1)

    CLAIM
  1. The ornamental design for a probe pin, as shown and described.
US29/573,439 2016-02-15 2016-08-05 Probe pin Active USD788616S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2016-3161F JP1567319S (en) 2016-02-15 2016-02-15
JP2016-003161 2016-02-15

Publications (1)

Publication Number Publication Date
USD788616S1 true USD788616S1 (en) 2017-06-06

Family

ID=57806239

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/573,439 Active USD788616S1 (en) 2016-02-15 2016-08-05 Probe pin

Country Status (2)

Country Link
US (1) USD788616S1 (en)
JP (1) JP1567319S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US9124012B2 (en) * 2011-10-14 2015-09-01 Omron Corporation Bellows body contactor having a fixed touch piece
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US9124012B2 (en) * 2011-10-14 2015-09-01 Omron Corporation Bellows body contactor having a fixed touch piece
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO.
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,446, filed Aug. 5, 2016, in the USPTO.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Also Published As

Publication number Publication date
JP1567319S (en) 2017-01-23

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