USD788616S1 - Probe pin - Google Patents
Probe pin Download PDFInfo
- Publication number
- USD788616S1 USD788616S1 US29/573,439 US201629573439F USD788616S US D788616 S1 USD788616 S1 US D788616S1 US 201629573439 F US201629573439 F US 201629573439F US D788616 S USD788616 S US D788616S
- Authority
- US
- United States
- Prior art keywords
- probe pin
- view
- probe
- pin
- broken lines
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Description
The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.
Claims (1)
- The ornamental design for a probe pin, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2016-3161F JP1567319S (en) | 2016-02-15 | 2016-02-15 | |
JP2016-003161 | 2016-02-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD788616S1 true USD788616S1 (en) | 2017-06-06 |
Family
ID=57806239
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/573,439 Active USD788616S1 (en) | 2016-02-15 | 2016-08-05 | Probe pin |
Country Status (2)
Country | Link |
---|---|
US (1) | USD788616S1 (en) |
JP (1) | JP1567319S (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8715015B2 (en) * | 2010-05-27 | 2014-05-06 | Hicon Co., Ltd. | Structure for a spring contact |
US9124012B2 (en) * | 2011-10-14 | 2015-09-01 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
-
2016
- 2016-02-15 JP JPD2016-3161F patent/JP1567319S/ja active Active
- 2016-08-05 US US29/573,439 patent/USD788616S1/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8715015B2 (en) * | 2010-05-27 | 2014-05-06 | Hicon Co., Ltd. | Structure for a spring contact |
US9124012B2 (en) * | 2011-10-14 | 2015-09-01 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
Non-Patent Citations (2)
Title |
---|
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO. |
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,446, filed Aug. 5, 2016, in the USPTO. |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Also Published As
Publication number | Publication date |
---|---|
JP1567319S (en) | 2017-01-23 |
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