JP1567319S - - Google Patents

Info

Publication number
JP1567319S
JP1567319S JPD2016-3161F JP2016003161F JP1567319S JP 1567319 S JP1567319 S JP 1567319S JP 2016003161 F JP2016003161 F JP 2016003161F JP 1567319 S JP1567319 S JP 1567319S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2016-3161F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2016-3161F priority Critical patent/JP1567319S/ja
Priority to US29/573,439 priority patent/USD788616S1/en
Application granted granted Critical
Publication of JP1567319S publication Critical patent/JP1567319S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2016-3161F 2016-02-15 2016-02-15 Active JP1567319S (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JPD2016-3161F JP1567319S (en) 2016-02-15 2016-02-15
US29/573,439 USD788616S1 (en) 2016-02-15 2016-08-05 Probe pin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2016-3161F JP1567319S (en) 2016-02-15 2016-02-15

Publications (1)

Publication Number Publication Date
JP1567319S true JP1567319S (en) 2017-01-23

Family

ID=57806239

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2016-3161F Active JP1567319S (en) 2016-02-15 2016-02-15

Country Status (2)

Country Link
US (1) USD788616S1 (en)
JP (1) JP1567319S (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101154519B1 (en) * 2010-05-27 2012-06-13 하이콘 주식회사 Structure of spring contacts
JP5842528B2 (en) * 2011-10-14 2016-01-13 オムロン株式会社 Contact
JP5708430B2 (en) * 2011-10-14 2015-04-30 オムロン株式会社 Contact
JP5699899B2 (en) * 2011-10-14 2015-04-15 オムロン株式会社 Contact

Also Published As

Publication number Publication date
USD788616S1 (en) 2017-06-06

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