USD788615S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD788615S1
USD788615S1 US29/573,425 US201629573425F USD788615S US D788615 S1 USD788615 S1 US D788615S1 US 201629573425 F US201629573425 F US 201629573425F US D788615 S USD788615 S US D788615S
Authority
US
United States
Prior art keywords
probe pin
view
probe
pin
broken lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/573,425
Inventor
Hirotada Teranishi
Takahiro Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TERANISHI, HIROTADA, SAKAI, TAKAHIRO
Application granted granted Critical
Publication of USD788615S1 publication Critical patent/USD788615S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof;
FIG. 7 is a bottom view thereof; and,
FIG. 8 is an exploded perspective view thereof.
The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.

Claims (1)

    CLAIM
  1. The ornamental design for a probe pin, as shown and described.
US29/573,425 2016-02-15 2016-08-05 Probe pin Active USD788615S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-003160 2016-02-15
JPD2016-3160F JP1567318S (en) 2016-02-15 2016-02-15

Publications (1)

Publication Number Publication Date
USD788615S1 true USD788615S1 (en) 2017-06-06

Family

ID=57806254

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/573,425 Active USD788615S1 (en) 2016-02-15 2016-08-05 Probe pin

Country Status (2)

Country Link
US (1) USD788615S1 (en)
JP (1) JP1567318S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US9124012B2 (en) * 2011-10-14 2015-09-01 Omron Corporation Bellows body contactor having a fixed touch piece
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8715015B2 (en) * 2010-05-27 2014-05-06 Hicon Co., Ltd. Structure for a spring contact
US9124012B2 (en) * 2011-10-14 2015-09-01 Omron Corporation Bellows body contactor having a fixed touch piece
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Also Published As

Publication number Publication date
JP1567318S (en) 2017-01-23

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