USD788615S1 - Probe pin - Google Patents
Probe pin Download PDFInfo
- Publication number
- USD788615S1 USD788615S1 US29/573,425 US201629573425F USD788615S US D788615 S1 USD788615 S1 US D788615S1 US 201629573425 F US201629573425 F US 201629573425F US D788615 S USD788615 S US D788615S
- Authority
- US
- United States
- Prior art keywords
- probe pin
- view
- probe
- pin
- broken lines
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Description
The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.
Claims (1)
- The ornamental design for a probe pin, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-003160 | 2016-02-15 | ||
JPD2016-3160F JP1567318S (en) | 2016-02-15 | 2016-02-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD788615S1 true USD788615S1 (en) | 2017-06-06 |
Family
ID=57806254
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/573,425 Active USD788615S1 (en) | 2016-02-15 | 2016-08-05 | Probe pin |
Country Status (2)
Country | Link |
---|---|
US (1) | USD788615S1 (en) |
JP (1) | JP1567318S (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8715015B2 (en) * | 2010-05-27 | 2014-05-06 | Hicon Co., Ltd. | Structure for a spring contact |
US9124012B2 (en) * | 2011-10-14 | 2015-09-01 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
-
2016
- 2016-02-15 JP JPD2016-3160F patent/JP1567318S/ja active Active
- 2016-08-05 US US29/573,425 patent/USD788615S1/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8715015B2 (en) * | 2010-05-27 | 2014-05-06 | Hicon Co., Ltd. | Structure for a spring contact |
US9124012B2 (en) * | 2011-10-14 | 2015-09-01 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9130290B2 (en) * | 2011-10-14 | 2015-09-08 | Omron Corporation | Bellows body contactor having a fixed touch piece |
US9322846B2 (en) * | 2011-10-14 | 2016-04-26 | Omron Corporation | Contactor |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Also Published As
Publication number | Publication date |
---|---|
JP1567318S (en) | 2017-01-23 |
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