USD444721S1 - Electrical test probe probing head - Google Patents

Electrical test probe probing head Download PDF

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Publication number
USD444721S1
USD444721S1 US29/127,153 US12715300F USD444721S US D444721 S1 USD444721 S1 US D444721S1 US 12715300 F US12715300 F US 12715300F US D444721 S USD444721 S US D444721S
Authority
US
United States
Prior art keywords
test probe
electrical test
probing head
probe probing
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/127,153
Inventor
Julie A. Campbell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teledyne LeCroy Inc
Original Assignee
Lecroy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US29/127,153 priority Critical patent/USD444721S1/en
Application filed by Lecroy Corp filed Critical Lecroy Corp
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CAMPBELL, JULIE A.
Application granted granted Critical
Publication of USD444721S1 publication Critical patent/USD444721S1/en
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION CHANGE OF ADDRESS Assignors: LECROY CORPORATION
Assigned to BANK OF NEW YORK, THE, AS ADMINISTRATIVE AGENT reassignment BANK OF NEW YORK, THE, AS ADMINISTRATIVE AGENT GRANT OF SECURITY INTEREST Assignors: LECROY CORPORATION
Assigned to MANUFACTURERS AND TRADERS TRUST COMPANY reassignment MANUFACTURERS AND TRADERS TRUST COMPANY SECURITY AGREEMENT Assignors: LECROY CORPORATION
Assigned to MANUFACTURERS AND TRADERS TRUST COMPANY reassignment MANUFACTURERS AND TRADERS TRUST COMPANY SECURITY AGREEMENT Assignors: LECROY CORPORATION
Assigned to RBS CITIZENS, N.A., AS ADMINISTRATIVE AGENT reassignment RBS CITIZENS, N.A., AS ADMINISTRATIVE AGENT SECURITY AGREEMENT Assignors: LECROY CORPORATION
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
Assigned to TELEDYNE LECROY, INC. reassignment TELEDYNE LECROY, INC. MERGER (SEE DOCUMENT FOR DETAILS). Assignors: LECROY CORPORATION
Assigned to TELEDYNE LECROY, INC. reassignment TELEDYNE LECROY, INC. RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: RBS CITIZENS, N.A.
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: JP MORGAN CHASE BANK, N.A. AS ADMINISTRATIVE AGENT SUCCESSOR ADMINISTRATIVE AGENT TO THE BANK OF NEW YORK
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of an electrical test probe probing head with the probing head angled slightly away from the viewer showing the new design, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and form no part of the claimed design.
FIG. 2 is a perspective view of an electrical test probe probing head with the probing head angled slightly towards the viewer showing the new design, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and form no part of the claimed design.
FIG. 3 is a left side view of the electrical test probe probing head, the left right view being a mirror image thereof, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.
FIG. 4 is a top view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.
FIG. 5 is a front view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design,
FIG. 6 is a back view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design; and,
FIG. 7 is a bottom view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.

Claims (1)

  1. The ornamental design for an electrical test probe probing head, as shown and described.
US29/127,153 2000-07-31 2000-07-31 Electrical test probe probing head Expired - Lifetime USD444721S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/127,153 USD444721S1 (en) 2000-07-31 2000-07-31 Electrical test probe probing head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/127,153 USD444721S1 (en) 2000-07-31 2000-07-31 Electrical test probe probing head

Publications (1)

Publication Number Publication Date
USD444721S1 true USD444721S1 (en) 2001-07-10

Family

ID=22428576

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/127,153 Expired - Lifetime USD444721S1 (en) 2000-07-31 2000-07-31 Electrical test probe probing head

Country Status (1)

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US (1) USD444721S1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9810715B2 (en) 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10119992B2 (en) 2015-04-01 2018-11-06 Tektronix, Inc. High impedance compliant probe tip
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9810715B2 (en) 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10119992B2 (en) 2015-04-01 2018-11-06 Tektronix, Inc. High impedance compliant probe tip
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test

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