USD444721S1 - Electrical test probe probing head - Google Patents
Electrical test probe probing head Download PDFInfo
- Publication number
- USD444721S1 USD444721S1 US29/127,153 US12715300F USD444721S US D444721 S1 USD444721 S1 US D444721S1 US 12715300 F US12715300 F US 12715300F US D444721 S USD444721 S US D444721S
- Authority
- US
- United States
- Prior art keywords
- test probe
- electrical test
- probing head
- probe probing
- head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a perspective view of an electrical test probe probing head with the probing head angled slightly away from the viewer showing the new design, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and form no part of the claimed design.
FIG. 2 is a perspective view of an electrical test probe probing head with the probing head angled slightly towards the viewer showing the new design, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and form no part of the claimed design.
FIG. 3 is a left side view of the electrical test probe probing head, the left right view being a mirror image thereof, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.
FIG. 4 is a top view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.
FIG. 5 is a front view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design,
FIG. 6 is a back view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design; and,
FIG. 7 is a bottom view of the electrical test probe probing head, wherein the broken line depictions of the cable and tip are included merely for illustrative purposes and forms no part of the claimed design.
Claims (1)
- The ornamental design for an electrical test probe probing head, as shown and described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/127,153 USD444721S1 (en) | 2000-07-31 | 2000-07-31 | Electrical test probe probing head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/127,153 USD444721S1 (en) | 2000-07-31 | 2000-07-31 | Electrical test probe probing head |
Publications (1)
Publication Number | Publication Date |
---|---|
USD444721S1 true USD444721S1 (en) | 2001-07-10 |
Family
ID=22428576
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/127,153 Expired - Lifetime USD444721S1 (en) | 2000-07-31 | 2000-07-31 | Electrical test probe probing head |
Country Status (1)
Country | Link |
---|---|
US (1) | USD444721S1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9810715B2 (en) | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
US10119992B2 (en) | 2015-04-01 | 2018-11-06 | Tektronix, Inc. | High impedance compliant probe tip |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
-
2000
- 2000-07-31 US US29/127,153 patent/USD444721S1/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9810715B2 (en) | 2014-12-31 | 2017-11-07 | Tektronix, Inc. | High impedance compliant probe tip |
US10119992B2 (en) | 2015-04-01 | 2018-11-06 | Tektronix, Inc. | High impedance compliant probe tip |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
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