USD894025S1 - Electric characteristic measuring probe - Google Patents
Electric characteristic measuring probe Download PDFInfo
- Publication number
- USD894025S1 USD894025S1 US29/670,517 US201829670517F USD894025S US D894025 S1 USD894025 S1 US D894025S1 US 201829670517 F US201829670517 F US 201829670517F US D894025 S USD894025 S US D894025S
- Authority
- US
- United States
- Prior art keywords
- measuring probe
- characteristic measuring
- electric characteristic
- view
- elevational view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Description
The broken line portions of the design are included to show unclaimed portions and form no part of the claimed design. Annotated drawings showing one non-limiting example of the article in use is provided in the accompanying Appendix, which may be deleted prior to printing of any patent that grants from the present application.
Claims (1)
- The ornamental design for an electric characteristic measuring probe, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018-010760 | 2018-01-25 | ||
JPD2018-10760F JP1624757S (en) | 2018-05-16 | 2018-05-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD894025S1 true USD894025S1 (en) | 2020-08-25 |
Family
ID=65359084
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/670,517 Active USD894025S1 (en) | 2018-05-16 | 2018-11-16 | Electric characteristic measuring probe |
Country Status (3)
Country | Link |
---|---|
US (1) | USD894025S1 (en) |
JP (1) | JP1624757S (en) |
TW (1) | TWD198372S (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507198S1 (en) * | 2003-06-11 | 2005-07-12 | K&S Interconnect, Inc. | Straight protruding probe beam contour surfaces |
US7671610B2 (en) * | 2007-10-19 | 2010-03-02 | Microprobe, Inc. | Vertical guided probe array providing sideways scrub motion |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
US10132833B2 (en) * | 2013-07-09 | 2018-11-20 | Formfactor, Inc. | Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates |
-
2018
- 2018-05-16 JP JPD2018-10760F patent/JP1624757S/ja active Active
- 2018-11-16 US US29/670,517 patent/USD894025S1/en active Active
- 2018-11-16 TW TW107306751F patent/TWD198372S/en unknown
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507198S1 (en) * | 2003-06-11 | 2005-07-12 | K&S Interconnect, Inc. | Straight protruding probe beam contour surfaces |
USD510043S1 (en) * | 2003-06-11 | 2005-09-27 | K&S Interconnect, Inc. | Continuously profiled probe beam |
US7671610B2 (en) * | 2007-10-19 | 2010-03-02 | Microprobe, Inc. | Vertical guided probe array providing sideways scrub motion |
US10132833B2 (en) * | 2013-07-09 | 2018-11-20 | Formfactor, Inc. | Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates |
USD769748S1 (en) * | 2014-12-15 | 2016-10-25 | Omron Corporation | Probe pin |
USD776551S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD776552S1 (en) * | 2014-12-15 | 2017-01-17 | Omron Corporation | Probe pin |
USD769749S1 (en) * | 2014-12-19 | 2016-10-25 | Omron Corporation | Probe pin |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Also Published As
Publication number | Publication date |
---|---|
JP1624757S (en) | 2019-02-18 |
TWD198372S (en) | 2019-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |